JP2006521006A - 直交加速飛行時間型質量分析のための新規な電子イオン化源 - Google Patents

直交加速飛行時間型質量分析のための新規な電子イオン化源 Download PDF

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JP2006521006A
JP2006521006A JP2006509064A JP2006509064A JP2006521006A JP 2006521006 A JP2006521006 A JP 2006521006A JP 2006509064 A JP2006509064 A JP 2006509064A JP 2006509064 A JP2006509064 A JP 2006509064A JP 2006521006 A JP2006521006 A JP 2006521006A
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ion
magnetic field
ions
electron
source
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Japanese (ja)
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JP2006521006A5 (https=
Inventor
リー，ミルトン
ユエ，ビンファン
リー，エドガー・ディー
ロックウッド，アラン・エル
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Brigham Young University
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Brigham Young University
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2006509064A 2003-03-03 2004-03-03 直交加速飛行時間型質量分析のための新規な電子イオン化源 Pending JP2006521006A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US45190803P 2003-03-03 2003-03-03
PCT/US2004/006536 WO2004079765A2 (en) 2003-03-03 2004-03-03 Novel electro ionization source for orthogonal acceleration time-of-flight mass spectrometry

Publications (2)

Publication Number Publication Date
JP2006521006A true JP2006521006A (ja) 2006-09-14
JP2006521006A5 JP2006521006A5 (https=) 2007-04-19

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ID=32962659

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JP2006509064A Pending JP2006521006A (ja) 2003-03-03 2004-03-03 直交加速飛行時間型質量分析のための新規な電子イオン化源

Country Status (4)

Country Link
US (1) US7060987B2 (https=)
EP (1) EP1602119A4 (https=)
JP (1) JP2006521006A (https=)
WO (1) WO2004079765A2 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008090600A1 (ja) * 2007-01-23 2008-07-31 Shimadzu Corporation 質量分析装置
JP2025000593A (ja) * 2023-06-19 2025-01-07 サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー 軸方向イオン源

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US6998622B1 (en) 2004-11-17 2006-02-14 Agilent Technologies, Inc. On-axis electron impact ion source
JP4806214B2 (ja) * 2005-01-28 2011-11-02 株式会社日立ハイテクノロジーズ 電子捕獲解離反応装置
EP1896161A2 (en) * 2005-05-27 2008-03-12 Ionwerks, Inc. Multi-beam ion mobility time-of-flight mass spectrometry with multi-channel data recording
GB0511083D0 (en) * 2005-05-31 2005-07-06 Thermo Finnigan Llc Multiple ion injection in mass spectrometry
CA2624926C (en) * 2005-10-11 2017-05-09 Leco Corporation Multi-reflecting time-of-flight mass spectrometer with orthogonal acceleration
US7459677B2 (en) * 2006-02-15 2008-12-02 Varian, Inc. Mass spectrometer for trace gas leak detection with suppression of undesired ions
WO2008044285A1 (fr) * 2006-10-11 2008-04-17 Shimadzu Corporation Spectroscope de masse quadripolaire
GB0700735D0 (en) * 2007-01-15 2007-02-21 Micromass Ltd Mass spectrometer
US20100123073A1 (en) * 2007-01-31 2010-05-20 University Of Manitoba Electron capture dissociation in a mass spectrometer
US8003936B2 (en) * 2007-10-10 2011-08-23 Mks Instruments, Inc. Chemical ionization reaction or proton transfer reaction mass spectrometry with a time-of-flight mass spectrometer
US8003935B2 (en) * 2007-10-10 2011-08-23 Mks Instruments, Inc. Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole mass spectrometer
US8334505B2 (en) 2007-10-10 2012-12-18 Mks Instruments, Inc. Chemical ionization reaction or proton transfer reaction mass spectrometry
GB2454241B (en) * 2007-11-02 2009-12-23 Microsaic Systems Ltd A mounting arrangement
US8653449B2 (en) * 2007-11-06 2014-02-18 The Arizona Board Of Regents On Behalf Of The University Of Arizona Sensitive ion detection device and method for analysis of compounds as vapors in gases
GB2454508B (en) * 2007-11-09 2010-04-28 Microsaic Systems Ltd Electrode structures
CN102150219B (zh) * 2008-07-28 2015-01-28 莱克公司 在射频场中使用网的离子操纵的方法和设备
GB0907619D0 (en) * 2009-05-01 2009-06-10 Shimadzu Res Lab Europe Ltd Ion analysis apparatus and method of use
US8525106B2 (en) * 2011-05-09 2013-09-03 Bruker Daltonics, Inc. Method and apparatus for transmitting ions in a mass spectrometer maintained in a sub-atmospheric pressure regime
JP5813536B2 (ja) 2012-03-02 2015-11-17 株式会社東芝 イオン源
US10840073B2 (en) * 2012-05-18 2020-11-17 Thermo Fisher Scientific (Bremen) Gmbh Methods and apparatus for obtaining enhanced mass spectrometric data
JP6553024B2 (ja) 2013-05-30 2019-07-31 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド インラインのイオン反応デバイスセルおよび動作方法
US9117617B2 (en) 2013-06-24 2015-08-25 Agilent Technologies, Inc. Axial magnetic ion source and related ionization methods
JP6231219B2 (ja) 2013-12-24 2017-11-15 ウオーターズ・テクノロジーズ・コーポレイシヨン 電気的に接地された電気スプレーための大気インターフェース
US9362098B2 (en) * 2013-12-24 2016-06-07 Waters Technologies Corporation Ion optical element
EP3178106B1 (en) * 2014-08-05 2024-02-14 DH Technologies Development PTE. Ltd. Band pass extraction from an ion trapping device and tof mass spectrometer sensitivity enhancement
US10176977B2 (en) 2014-12-12 2019-01-08 Agilent Technologies, Inc. Ion source for soft electron ionization and related systems and methods
US10490396B1 (en) 2017-03-28 2019-11-26 Thermo Finnigan Llc Ion source with mixed magnets
JP7210536B2 (ja) * 2017-04-03 2023-01-23 パーキンエルマー ヘルス サイエンス インコーポレイテッド 電子イオン化源からのイオンの移動
RU179352U1 (ru) * 2017-10-24 2018-05-11 Федеральное государственное бюджетное учреждение "Институт теоретической и экспериментальной физики имени А.И. Алиханова Национального исследовательского центра "Курчатовский институт" Двухступенчатый источник многозарядных ионов с электронным циклотронным резонансом
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808949D0 (en) * 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
US10985002B2 (en) * 2019-06-11 2021-04-20 Perkinelmer Health Sciences, Inc. Ionization sources and methods and systems using them
US11145502B2 (en) * 2019-12-19 2021-10-12 Thermo Finnigan Llc Emission current measurement for superior instrument-to-instrument repeatability
KR102132977B1 (ko) * 2020-02-25 2020-07-14 영인에이스 주식회사 질량분석기
CN117546267A (zh) * 2021-06-25 2024-02-09 Dh科技发展私人贸易有限公司 Tof仪器的数据存储
WO2023028696A1 (en) * 2021-08-30 2023-03-09 Kimia Analytics Inc. Method and apparatus to increase sensitivity of inductively coupled plasma mass spectrometry

Citations (2)

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JPS61263039A (ja) * 1985-05-16 1986-11-21 Ryuichi Shimizu 質量分析計
JP2000516762A (ja) * 1996-08-09 2000-12-12 アナリチカ オブ ブランフォード，インコーポレーテッド イオン蓄積式飛行時間型質量分析計

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DE2737852C2 (de) * 1977-08-23 1982-04-22 Bruker - Franzen Analytik GmbH, 2800 Bremen Ionenquellen zur chemischen Ionisierung
DE4200235C1 (https=) * 1992-01-08 1993-05-06 Hoffmeister, Helmut, Dr., 4400 Muenster, De
US5412207A (en) 1993-10-07 1995-05-02 Marquette Electronics, Inc. Method and apparatus for analyzing a gas sample
US7019285B2 (en) * 1995-08-10 2006-03-28 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
US5942752A (en) 1996-05-17 1999-08-24 Hewlett-Packard Company Higher pressure ion source for two dimensional radio-frequency quadrupole electric field for mass spectrometer
DE60210056T2 (de) * 2001-03-22 2006-11-16 Syddansk Universitet Massenspektrometrisches Verfahren mit Elektroneneinfang durch Ionen und Massenspektrometer zum Durchführen des Verfahrens

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61263039A (ja) * 1985-05-16 1986-11-21 Ryuichi Shimizu 質量分析計
JP2000516762A (ja) * 1996-08-09 2000-12-12 アナリチカ オブ ブランフォード，インコーポレーテッド イオン蓄積式飛行時間型質量分析計

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008090600A1 (ja) * 2007-01-23 2008-07-31 Shimadzu Corporation 質量分析装置
JP4947061B2 (ja) * 2007-01-23 2012-06-06 株式会社島津製作所 質量分析装置
US8299427B2 (en) 2007-01-23 2012-10-30 Shimadzu Corporation Mass spectrometer
JP2025000593A (ja) * 2023-06-19 2025-01-07 サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー 軸方向イオン源
JP7751694B2 (ja) 2023-06-19 2025-10-08 サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー 軸方向イオン源

Also Published As

Publication number Publication date
WO2004079765A2 (en) 2004-09-16
US7060987B2 (en) 2006-06-13
WO2004079765A3 (en) 2005-06-09
US20040238755A1 (en) 2004-12-02
EP1602119A2 (en) 2005-12-07
EP1602119A4 (en) 2010-05-12

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