JP2006515958A5 - - Google Patents

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JP2006515958A5
JP2006515958A5 JP2006501078A JP2006501078A JP2006515958A5 JP 2006515958 A5 JP2006515958 A5 JP 2006515958A5 JP 2006501078 A JP2006501078 A JP 2006501078A JP 2006501078 A JP2006501078 A JP 2006501078A JP 2006515958 A5 JP2006515958 A5 JP 2006515958A5
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JP2006501078A
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JP4799402B2 (ja
JP2006515958A (ja
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JP2006501078A 2003-01-17 2004-01-20 ２以上の計測された散乱計測信号間の比較によるプロセス最適化および制御の方法 Expired - Fee Related JP4799402B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US44104803P 2003-01-17 2003-01-17
US60/441,048 2003-01-17
PCT/US2004/001570 WO2004066028A2 (en) 2003-01-17 2004-01-20 Method for process optimization and control by comparison between 2 or more measured scatterometry signals

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JP2006515958A JP2006515958A (ja) 2006-06-08
JP2006515958A5 true JP2006515958A5 (enExample) 2007-03-08
JP4799402B2 JP4799402B2 (ja) 2011-10-26

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JP2006501078A Expired - Fee Related JP4799402B2 (ja) 2003-01-17 2004-01-20 ２以上の計測された散乱計測信号間の比較によるプロセス最適化および制御の方法

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US (1) US7352453B2 (enExample)
JP (1) JP4799402B2 (enExample)
WO (1) WO2004066028A2 (enExample)

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