JP2006506617A5 - - Google Patents

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Publication number
JP2006506617A5
JP2006506617A5 JP2004551487A JP2004551487A JP2006506617A5 JP 2006506617 A5 JP2006506617 A5 JP 2006506617A5 JP 2004551487 A JP2004551487 A JP 2004551487A JP 2004551487 A JP2004551487 A JP 2004551487A JP 2006506617 A5 JP2006506617 A5 JP 2006506617A5
Authority
JP
Japan
Prior art keywords
voltage level
power supply
voltage detection
supply pin
interrupt handler
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004551487A
Other languages
English (en)
Japanese (ja)
Other versions
JP4322810B2 (ja
JP2006506617A (ja
Filing date
Publication date
Priority claimed from US10/292,323 external-priority patent/US7293188B2/en
Application filed filed Critical
Publication of JP2006506617A publication Critical patent/JP2006506617A/ja
Publication of JP2006506617A5 publication Critical patent/JP2006506617A5/ja
Application granted granted Critical
Publication of JP4322810B2 publication Critical patent/JP4322810B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2004551487A 2002-11-12 2003-09-30 集積回路および低電圧検出システム Expired - Fee Related JP4322810B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/292,323 US7293188B2 (en) 2002-11-12 2002-11-12 Low voltage detection system
PCT/US2003/030864 WO2004044719A2 (en) 2002-11-12 2003-09-30 Low voltage detection system

Publications (3)

Publication Number Publication Date
JP2006506617A JP2006506617A (ja) 2006-02-23
JP2006506617A5 true JP2006506617A5 (enExample) 2006-11-02
JP4322810B2 JP4322810B2 (ja) 2009-09-02

Family

ID=32229432

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004551487A Expired - Fee Related JP4322810B2 (ja) 2002-11-12 2003-09-30 集積回路および低電圧検出システム

Country Status (7)

Country Link
US (1) US7293188B2 (enExample)
JP (1) JP4322810B2 (enExample)
KR (1) KR101031117B1 (enExample)
CN (1) CN100559326C (enExample)
AU (1) AU2003275307A1 (enExample)
TW (1) TWI331276B (enExample)
WO (1) WO2004044719A2 (enExample)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004078717A (ja) * 2002-08-21 2004-03-11 Matsushita Electric Ind Co Ltd セルライブラリデータベース、並びにこれを用いた集積回路のタイミング検証システム及び耐電圧検証システム
US7349190B1 (en) 2003-12-22 2008-03-25 Cypress Semiconductor Corp. Resistor-less accurate low voltage detect circuit and method for detecting a low voltage condition
CN100362451C (zh) * 2005-05-27 2008-01-16 佛山市顺德区顺达电脑厂有限公司 使用者操作阻断装置与方法
CN100362452C (zh) * 2005-05-27 2008-01-16 佛山市顺德区顺达电脑厂有限公司 使用者操作阻断装置与方法
CN100444490C (zh) * 2005-07-11 2008-12-17 佛山市顺德区顺达电脑厂有限公司 使用者操作阻断装置与方法
US7629769B2 (en) * 2006-03-10 2009-12-08 Atmel Corporation Power surge filtering in over-current and short circuit protection
JP4715760B2 (ja) * 2006-07-28 2011-07-06 株式会社デンソー マイクロコンピュータ及び制御システム
KR100897767B1 (ko) * 2007-02-07 2009-05-15 삼성전자주식회사 데이터 유지 시간을 늘릴 수 있는 마이크로 컨트롤러 유닛및 방법
US7917328B2 (en) * 2008-08-20 2011-03-29 International Business Machines Corporation Tracking thermal mini-cycle stress
US8174382B2 (en) * 2008-11-21 2012-05-08 Mahle International Gmbh Diagnostic system having a wake-up circuit
US8330502B2 (en) * 2009-11-25 2012-12-11 Freescale Semiconductor, Inc. Systems and methods for detecting interference in an integrated circuit
US8305068B2 (en) * 2009-11-25 2012-11-06 Freescale Semiconductor, Inc. Voltage reference circuit
JP2011210152A (ja) * 2010-03-30 2011-10-20 Renesas Electronics Corp マイクロコンピュータ
US8330526B2 (en) * 2010-07-15 2012-12-11 Freescale Semiconductor, Inc. Low voltage detector
US8624424B2 (en) * 2011-09-26 2014-01-07 Belkin International, Inc. Systems and methods to emulate high frequency electrical signatures
US8907807B2 (en) * 2013-03-15 2014-12-09 Oplink Communications, Inc. Security system power management
WO2014202692A2 (de) * 2013-06-21 2014-12-24 Fujitsu Technology Solutions Intellectual Property Gmbh Computersystem und überlastschutzschaltung
US9141177B1 (en) 2014-03-21 2015-09-22 Western Digital Technologies, Inc. Data storage device employing glitch compensation for power loss detection
US9047932B1 (en) 2014-03-21 2015-06-02 Western Digital Technologies, Inc. Data storage device adjusting a power loss threshold based on samples of supply voltage
US9696789B2 (en) * 2014-08-18 2017-07-04 Xilinx, Inc. Sub-system power management control
KR102548611B1 (ko) * 2018-09-21 2023-06-28 양쯔 메모리 테크놀로지스 씨오., 엘티디. 전압 검출 시스템
JP6886545B1 (ja) 2020-05-07 2021-06-16 ウィンボンド エレクトロニクス コーポレーション パワーダウン検出回路および半導体記憶装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5203000A (en) * 1988-12-09 1993-04-13 Dallas Semiconductor Corp. Power-up reset conditioned on direction of voltage change
US5241680A (en) * 1989-06-12 1993-08-31 Grid Systems Corporation Low-power, standby mode computer
US5428252A (en) * 1992-01-03 1995-06-27 Zilog, Inc. Power supply interruption detection and response system for a microcontroller
US5423045A (en) * 1992-04-15 1995-06-06 International Business Machines Corporation System for distributed power management in portable computers
DE4314533C1 (de) * 1993-05-03 1994-05-19 Siemens Ag Schaltungsanordnung zur Überwachung der Versorgungsspannung einer Prozessoreinheit
WO1996007165A1 (en) * 1994-08-26 1996-03-07 Sentrol, Inc. Self-contained, self-adjusting smoke detector and method of operating it
JPH11119872A (ja) * 1997-10-13 1999-04-30 Sanyo Electric Co Ltd 電源電圧検出回路
EP1102158B1 (fr) * 1999-11-22 2012-08-08 EM Microelectronic-Marin SA Dispositif et procédé de contrôle de l'état de fonctionnement d'un système électronique en "zone grise"
JP2001188689A (ja) * 2000-01-04 2001-07-10 Mitsubishi Electric Corp データ処理装置
KR100450963B1 (ko) * 2001-08-16 2004-10-02 삼성전자주식회사 외장형 디지털 가입자 라인 통신단말의 다잉 개스프 처리방법 및 장치

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