CN100559326C - 低电压检测系统 - Google Patents

低电压检测系统 Download PDF

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Publication number
CN100559326C
CN100559326C CNB038250209A CN03825020A CN100559326C CN 100559326 C CN100559326 C CN 100559326C CN B038250209 A CNB038250209 A CN B038250209A CN 03825020 A CN03825020 A CN 03825020A CN 100559326 C CN100559326 C CN 100559326C
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CN
China
Prior art keywords
voltage level
voltage
voltage detection
interrupt
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB038250209A
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English (en)
Chinese (zh)
Other versions
CN1695103A (zh
Inventor
乔治·L·埃斯皮纳
威廉·L·卢卡斯
迈克尔·G·沃德
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP USA Inc
Original Assignee
Freescale Semiconductor Inc
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Filing date
Publication date
Application filed by Freescale Semiconductor Inc filed Critical Freescale Semiconductor Inc
Publication of CN1695103A publication Critical patent/CN1695103A/zh
Application granted granted Critical
Publication of CN100559326C publication Critical patent/CN100559326C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/32—Means for saving power
    • G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/28—Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/30—Means for acting in the event of power-supply failure or interruption, e.g. power-supply fluctuations

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Power Sources (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Microcomputers (AREA)
CNB038250209A 2002-11-12 2003-09-30 低电压检测系统 Expired - Fee Related CN100559326C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/292,323 2002-11-12
US10/292,323 US7293188B2 (en) 2002-11-12 2002-11-12 Low voltage detection system

Publications (2)

Publication Number Publication Date
CN1695103A CN1695103A (zh) 2005-11-09
CN100559326C true CN100559326C (zh) 2009-11-11

Family

ID=32229432

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB038250209A Expired - Fee Related CN100559326C (zh) 2002-11-12 2003-09-30 低电压检测系统

Country Status (7)

Country Link
US (1) US7293188B2 (enExample)
JP (1) JP4322810B2 (enExample)
KR (1) KR101031117B1 (enExample)
CN (1) CN100559326C (enExample)
AU (1) AU2003275307A1 (enExample)
TW (1) TWI331276B (enExample)
WO (1) WO2004044719A2 (enExample)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004078717A (ja) * 2002-08-21 2004-03-11 Matsushita Electric Ind Co Ltd セルライブラリデータベース、並びにこれを用いた集積回路のタイミング検証システム及び耐電圧検証システム
US7349190B1 (en) 2003-12-22 2008-03-25 Cypress Semiconductor Corp. Resistor-less accurate low voltage detect circuit and method for detecting a low voltage condition
CN100362452C (zh) * 2005-05-27 2008-01-16 佛山市顺德区顺达电脑厂有限公司 使用者操作阻断装置与方法
CN100362451C (zh) * 2005-05-27 2008-01-16 佛山市顺德区顺达电脑厂有限公司 使用者操作阻断装置与方法
CN100444490C (zh) * 2005-07-11 2008-12-17 佛山市顺德区顺达电脑厂有限公司 使用者操作阻断装置与方法
US7629769B2 (en) * 2006-03-10 2009-12-08 Atmel Corporation Power surge filtering in over-current and short circuit protection
JP4715760B2 (ja) * 2006-07-28 2011-07-06 株式会社デンソー マイクロコンピュータ及び制御システム
KR100897767B1 (ko) * 2007-02-07 2009-05-15 삼성전자주식회사 데이터 유지 시간을 늘릴 수 있는 마이크로 컨트롤러 유닛및 방법
US7917328B2 (en) * 2008-08-20 2011-03-29 International Business Machines Corporation Tracking thermal mini-cycle stress
US8174382B2 (en) * 2008-11-21 2012-05-08 Mahle International Gmbh Diagnostic system having a wake-up circuit
US8330502B2 (en) * 2009-11-25 2012-12-11 Freescale Semiconductor, Inc. Systems and methods for detecting interference in an integrated circuit
US8305068B2 (en) * 2009-11-25 2012-11-06 Freescale Semiconductor, Inc. Voltage reference circuit
JP2011210152A (ja) * 2010-03-30 2011-10-20 Renesas Electronics Corp マイクロコンピュータ
US8330526B2 (en) * 2010-07-15 2012-12-11 Freescale Semiconductor, Inc. Low voltage detector
US9130393B2 (en) * 2011-09-26 2015-09-08 Belkin International, Inc. Systems and methods to isolate lower amplitude signals for analysis in the presence of large amplitude transients
US8907807B2 (en) * 2013-03-15 2014-12-09 Oplink Communications, Inc. Security system power management
WO2014202692A2 (de) * 2013-06-21 2014-12-24 Fujitsu Technology Solutions Intellectual Property Gmbh Computersystem und überlastschutzschaltung
US9141177B1 (en) 2014-03-21 2015-09-22 Western Digital Technologies, Inc. Data storage device employing glitch compensation for power loss detection
US9047932B1 (en) 2014-03-21 2015-06-02 Western Digital Technologies, Inc. Data storage device adjusting a power loss threshold based on samples of supply voltage
US9696789B2 (en) * 2014-08-18 2017-07-04 Xilinx, Inc. Sub-system power management control
EP3811088B1 (en) * 2018-09-21 2023-06-14 Yangtze Memory Technologies Co., Ltd. Voltage detection system
JP6886545B1 (ja) 2020-05-07 2021-06-16 ウィンボンド エレクトロニクス コーポレーション パワーダウン検出回路および半導体記憶装置

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5203000A (en) * 1988-12-09 1993-04-13 Dallas Semiconductor Corp. Power-up reset conditioned on direction of voltage change
US5241680A (en) * 1989-06-12 1993-08-31 Grid Systems Corporation Low-power, standby mode computer
US5539910A (en) * 1993-05-03 1996-07-23 Siemens Aktiengesellschaft Circuit configuration for monitoring the supply voltage of a processor unit
EP1102158A1 (fr) * 1999-11-22 2001-05-23 EM Microelectronic-Marin SA Dispositif et procédé de contrôle de l'état de fonctionnement d'un système électronique en "zone grise"
JP2001188689A (ja) * 2000-01-04 2001-07-10 Mitsubishi Electric Corp データ処理装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5428252A (en) 1992-01-03 1995-06-27 Zilog, Inc. Power supply interruption detection and response system for a microcontroller
US5423045A (en) 1992-04-15 1995-06-06 International Business Machines Corporation System for distributed power management in portable computers
EP0777895B1 (en) * 1994-08-26 2003-10-08 Interlogix, Inc. Self-contained, self-adjusting smoke detector and method of operating it
JPH11119872A (ja) * 1997-10-13 1999-04-30 Sanyo Electric Co Ltd 電源電圧検出回路
KR100450963B1 (ko) * 2001-08-16 2004-10-02 삼성전자주식회사 외장형 디지털 가입자 라인 통신단말의 다잉 개스프 처리방법 및 장치

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5203000A (en) * 1988-12-09 1993-04-13 Dallas Semiconductor Corp. Power-up reset conditioned on direction of voltage change
US5241680A (en) * 1989-06-12 1993-08-31 Grid Systems Corporation Low-power, standby mode computer
US5539910A (en) * 1993-05-03 1996-07-23 Siemens Aktiengesellschaft Circuit configuration for monitoring the supply voltage of a processor unit
EP1102158A1 (fr) * 1999-11-22 2001-05-23 EM Microelectronic-Marin SA Dispositif et procédé de contrôle de l'état de fonctionnement d'un système électronique en "zone grise"
JP2001188689A (ja) * 2000-01-04 2001-07-10 Mitsubishi Electric Corp データ処理装置

Also Published As

Publication number Publication date
WO2004044719A3 (en) 2004-09-02
KR20050075397A (ko) 2005-07-20
CN1695103A (zh) 2005-11-09
AU2003275307A8 (en) 2004-06-03
US7293188B2 (en) 2007-11-06
TWI331276B (en) 2010-10-01
KR101031117B1 (ko) 2011-04-27
JP2006506617A (ja) 2006-02-23
WO2004044719A2 (en) 2004-05-27
TW200428193A (en) 2004-12-16
US20040093531A1 (en) 2004-05-13
JP4322810B2 (ja) 2009-09-02
AU2003275307A1 (en) 2004-06-03

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C06 Publication
PB01 Publication
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SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CP01 Change in the name or title of a patent holder
CP01 Change in the name or title of a patent holder

Address after: Texas in the United States

Patentee after: NXP USA, Inc.

Address before: Texas in the United States

Patentee before: FREESCALE SEMICONDUCTOR, Inc.

CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20091111

Termination date: 20210930