JP2006332609A5 - - Google Patents

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Publication number
JP2006332609A5
JP2006332609A5 JP2006112082A JP2006112082A JP2006332609A5 JP 2006332609 A5 JP2006332609 A5 JP 2006332609A5 JP 2006112082 A JP2006112082 A JP 2006112082A JP 2006112082 A JP2006112082 A JP 2006112082A JP 2006332609 A5 JP2006332609 A5 JP 2006332609A5
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JP
Japan
Prior art keywords
conductive layer
organic compound
phase
data
voltage
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Application number
JP2006112082A
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English (en)
Japanese (ja)
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JP5089074B2 (ja
JP2006332609A (ja
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Priority to JP2006112082A priority Critical patent/JP5089074B2/ja
Priority claimed from JP2006112082A external-priority patent/JP5089074B2/ja
Publication of JP2006332609A publication Critical patent/JP2006332609A/ja
Publication of JP2006332609A5 publication Critical patent/JP2006332609A5/ja
Application granted granted Critical
Publication of JP5089074B2 publication Critical patent/JP5089074B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2006112082A 2005-04-28 2006-04-14 記憶装置 Expired - Fee Related JP5089074B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006112082A JP5089074B2 (ja) 2005-04-28 2006-04-14 記憶装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2005132816 2005-04-28
JP2005132816 2005-04-28
JP2006112082A JP5089074B2 (ja) 2005-04-28 2006-04-14 記憶装置

Publications (3)

Publication Number Publication Date
JP2006332609A JP2006332609A (ja) 2006-12-07
JP2006332609A5 true JP2006332609A5 (fr) 2009-05-28
JP5089074B2 JP5089074B2 (ja) 2012-12-05

Family

ID=37553921

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006112082A Expired - Fee Related JP5089074B2 (ja) 2005-04-28 2006-04-14 記憶装置

Country Status (1)

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JP (1) JP5089074B2 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5252827B2 (ja) * 2006-04-28 2013-07-31 株式会社半導体エネルギー研究所 記憶素子
JP2007324314A (ja) * 2006-05-31 2007-12-13 Univ Of Yamanashi メモリ素子、データ記録方法及びicタグ
JP5291894B2 (ja) * 2007-05-23 2013-09-18 国立大学法人山梨大学 メモリ素子、データ記録方法及びicタグ
US7692975B2 (en) 2008-05-09 2010-04-06 Micron Technology, Inc. System and method for mitigating reverse bias leakage
CN102231424B (zh) * 2011-06-24 2014-04-30 清华大学 相变存储单元及相变存储器

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61280046A (ja) * 1985-06-06 1986-12-10 Nec Corp 光記録方式
JP2815101B2 (ja) * 1991-06-10 1998-10-27 シャープ株式会社 不揮発性記録装置
JP3201863B2 (ja) * 1993-03-23 2001-08-27 シャープ株式会社 不揮発性記録装置およびその製造方法
JP4074719B2 (ja) * 1999-01-08 2008-04-09 大日本印刷株式会社 情報記録媒体
JP2001291594A (ja) * 2000-04-07 2001-10-19 Canon Inc 導電性液晶素子
JP2002170685A (ja) * 2000-11-29 2002-06-14 Canon Inc 導電性液晶素子及びこれを用いた有機エレクトロルミネッセンス素子
JP4585209B2 (ja) * 2003-03-19 2010-11-24 大日本印刷株式会社 有機双安定性メモリ装置
JP4883381B2 (ja) * 2004-03-29 2012-02-22 大日本印刷株式会社 液晶性有機半導体材料およびそれを用いた有機半導体構造物

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