JP2006332175A5 - - Google Patents

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Publication number
JP2006332175A5
JP2006332175A5 JP2005150872A JP2005150872A JP2006332175A5 JP 2006332175 A5 JP2006332175 A5 JP 2006332175A5 JP 2005150872 A JP2005150872 A JP 2005150872A JP 2005150872 A JP2005150872 A JP 2005150872A JP 2006332175 A5 JP2006332175 A5 JP 2006332175A5
Authority
JP
Japan
Prior art keywords
resistance value
trimming circuit
module
transistor
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2005150872A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006332175A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2005150872A priority Critical patent/JP2006332175A/ja
Priority claimed from JP2005150872A external-priority patent/JP2006332175A/ja
Priority to US11/403,395 priority patent/US7663470B2/en
Publication of JP2006332175A publication Critical patent/JP2006332175A/ja
Publication of JP2006332175A5 publication Critical patent/JP2006332175A5/ja
Pending legal-status Critical Current

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JP2005150872A 2005-05-24 2005-05-24 トリミング回路及び電子回路 Pending JP2006332175A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2005150872A JP2006332175A (ja) 2005-05-24 2005-05-24 トリミング回路及び電子回路
US11/403,395 US7663470B2 (en) 2005-05-24 2006-04-13 Trimming circuit and electronic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005150872A JP2006332175A (ja) 2005-05-24 2005-05-24 トリミング回路及び電子回路

Publications (2)

Publication Number Publication Date
JP2006332175A JP2006332175A (ja) 2006-12-07
JP2006332175A5 true JP2006332175A5 (enExample) 2008-04-10

Family

ID=37462024

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005150872A Pending JP2006332175A (ja) 2005-05-24 2005-05-24 トリミング回路及び電子回路

Country Status (2)

Country Link
US (1) US7663470B2 (enExample)
JP (1) JP2006332175A (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8143993B2 (en) * 2009-07-29 2012-03-27 Fairchild Semiconductor Corporation Method and circuit for recycling trimmed devices
US9059168B2 (en) * 2012-02-02 2015-06-16 Taiwan Semiconductor Manufacturing Company, Ltd. Adjustable meander line resistor
US8890222B2 (en) 2012-02-03 2014-11-18 Taiwan Semiconductor Manufacturing Company, Ltd. Meander line resistor structure
DE102013104142B4 (de) * 2013-04-24 2023-06-15 Infineon Technologies Ag Chipkarte
US9541456B2 (en) * 2014-02-07 2017-01-10 Sandisk Technologies Llc Reference voltage generator for temperature sensor with trimming capability at two temperatures
EP3401932B1 (en) * 2017-05-12 2023-01-25 ams AG An electric circuit for trimming a resistance of a resistor
CN110568801A (zh) * 2019-10-03 2019-12-13 青岛大学 基于数字电位器的低阻值可变电阻器
JP7603434B2 (ja) 2020-12-15 2024-12-20 エイブリック株式会社 抵抗回路及び当該抵抗回路を備える電流検出回路
TWI824664B (zh) * 2022-08-12 2023-12-01 新唐科技股份有限公司 電阻修整裝置與電子裝置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56132815A (en) * 1980-03-21 1981-10-17 Nec Corp Reference step voltage generating circuit
JPH0528907U (ja) * 1991-03-18 1993-04-16 アイシン精機株式会社 ポテンシヨメ−タ
US6147520A (en) * 1997-12-18 2000-11-14 Lucent Technologies, Inc. Integrated circuit having controlled impedance
TW429382B (en) * 1998-11-06 2001-04-11 Matsushita Electric Industrial Co Ltd Regulating resistor, semiconductor equipment and its production method
KR100343122B1 (ko) * 2000-07-18 2002-07-05 김철환 송전 선로에서 가변 무전압시간 제어를 이용한 적응적재폐로 방법
US7053751B2 (en) * 2001-05-14 2006-05-30 Ricoh Company, Ltd. Resistance hybrid, and voltage detection and constant voltage generating circuits incorporating such resistance hybrid
US7006252B2 (en) 2001-10-17 2006-02-28 Eastman Kodak Company Image processing system and method that maintains black level
KR100475736B1 (ko) 2002-08-09 2005-03-10 삼성전자주식회사 고속 테스트에 적합한 편이온도 검출회로를 갖는온도감지기 및 편이온도 검출방법

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