JP2006308476A5 - - Google Patents

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Publication number
JP2006308476A5
JP2006308476A5 JP2005132778A JP2005132778A JP2006308476A5 JP 2006308476 A5 JP2006308476 A5 JP 2006308476A5 JP 2005132778 A JP2005132778 A JP 2005132778A JP 2005132778 A JP2005132778 A JP 2005132778A JP 2006308476 A5 JP2006308476 A5 JP 2006308476A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2005132778A
Other versions
JP2006308476A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2005132778A priority Critical patent/JP2006308476A/ja
Priority claimed from JP2005132778A external-priority patent/JP2006308476A/ja
Priority to EP06112042A priority patent/EP1717545A1/en
Priority to CNA2006100752390A priority patent/CN1854677A/zh
Priority to US11/406,710 priority patent/US20060243035A1/en
Publication of JP2006308476A publication Critical patent/JP2006308476A/ja
Publication of JP2006308476A5 publication Critical patent/JP2006308476A5/ja
Pending legal-status Critical Current

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JP2005132778A 2005-04-28 2005-04-28 表面粗さ／形状測定装置 Pending JP2006308476A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2005132778A JP2006308476A (ja) 2005-04-28 2005-04-28 表面粗さ／形状測定装置
EP06112042A EP1717545A1 (en) 2005-04-28 2006-03-30 Surface roughness/contour profile measuring instrument
CNA2006100752390A CN1854677A (zh) 2005-04-28 2006-04-17 表面粗糙度/外形轮廓测量仪
US11/406,710 US20060243035A1 (en) 2005-04-28 2006-04-18 Surface roughness/contour profile measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005132778A JP2006308476A (ja) 2005-04-28 2005-04-28 表面粗さ／形状測定装置

Publications (2)

Publication Number Publication Date
JP2006308476A JP2006308476A (ja) 2006-11-09
JP2006308476A5 true JP2006308476A5 (ja) 2008-04-17

Family

ID=36617395

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005132778A Pending JP2006308476A (ja) 2005-04-28 2005-04-28 表面粗さ／形状測定装置

Country Status (4)

Country Link
US (1) US20060243035A1 (ja)
EP (1) EP1717545A1 (ja)
JP (1) JP2006308476A (ja)
CN (1) CN1854677A (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2898410B1 (fr) * 2006-03-07 2008-05-09 Airbus France Sas Procede de caracterisation de la tenue en fatigue d'une piece a partir de son profil de surface
DE102007004423A1 (de) * 2007-01-23 2008-07-31 Carl Zeiss Industrielle Messtechnik Gmbh Steuerung eines Betriebes eines Koordinatenmessgerätes
EP2616796B1 (en) * 2010-09-15 2020-02-19 Fraunhofer USA, Inc. Methods and apparatus for detecting cross-linking in a polymer
JP6104557B2 (ja) * 2012-10-18 2017-03-29 株式会社ミツトヨ 表面粗さ測定ユニット、三次元測定装置
DE102014101577A1 (de) * 2014-02-07 2015-08-13 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Verfahren zur elektrischen Ansteuerung eines Messstativs sowie Messstativ zur Aufnahme einer Messsonde
JP6679215B2 (ja) * 2015-03-31 2020-04-15 株式会社東京精密 形状測定機、及びその制御方法
CN108375608A (zh) * 2018-03-12 2018-08-07 昆山国显光电有限公司 基板检测装置
CN108931229A (zh) * 2018-06-07 2018-12-04 太仓柏嘉装饰工程有限公司 室内装饰墙壁平面度检测工装
WO2022269302A1 (ja) * 2021-06-21 2022-12-29 日産自動車株式会社 塗装評価装置及び塗装評価方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3623602A1 (de) * 1986-07-12 1988-01-14 Zeiss Carl Fa Steuerung fuer koordinatenmessgeraete
JPH08338717A (ja) * 1995-06-14 1996-12-24 Nikon Corp 三次元座標測定装置
EP0849653B1 (de) * 1996-12-21 2004-04-28 Carl Zeiss Verfahren zur Steuerung eines Koordinatenmessgerätes und Koordinatenmessgerät
JP3402990B2 (ja) * 1997-02-25 2003-05-06 株式会社ミツトヨ 三次元測定機
JP3989108B2 (ja) * 1998-11-27 2007-10-10 株式会社ミツトヨ 測定機及びその移動パス決定方法
JP4408538B2 (ja) * 2000-07-24 2010-02-03 株式会社日立製作所 プローブ装置
JP3525432B2 (ja) * 2000-09-29 2004-05-10 株式会社東京精密 粗さ測定方法及び粗さ測定装置
JP4199450B2 (ja) * 2001-11-26 2008-12-17 株式会社ミツトヨ 表面性状測定装置、表面性状測定方法及び表面性状測定プログラム
JP2004017198A (ja) * 2002-06-14 2004-01-22 Mitsutoyo Corp パートプログラム生成装置、パートプログラム生成方法及びパートプログラム生成用プログラム
JP4024117B2 (ja) * 2002-09-17 2007-12-19 株式会社ミツトヨ 測定支援装置

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