JP2006308363A5 - - Google Patents
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- Publication number
- JP2006308363A5 JP2006308363A5 JP2005129468A JP2005129468A JP2006308363A5 JP 2006308363 A5 JP2006308363 A5 JP 2006308363A5 JP 2005129468 A JP2005129468 A JP 2005129468A JP 2005129468 A JP2005129468 A JP 2005129468A JP 2006308363 A5 JP2006308363 A5 JP 2006308363A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005129468A JP2006308363A (ja) | 2005-04-27 | 2005-04-27 | 走査機構 |
EP06732322A EP1752756A1 (en) | 2005-04-27 | 2006-04-25 | Scanning mechanism for scanning probe microscope |
PCT/JP2006/308662 WO2006118118A1 (ja) | 2005-04-27 | 2006-04-25 | 走査型プローブ顕微鏡用走査機構 |
US11/635,156 US20070085022A1 (en) | 2005-04-27 | 2006-12-07 | Scanning mechanism for scanning probe microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005129468A JP2006308363A (ja) | 2005-04-27 | 2005-04-27 | 走査機構 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006308363A JP2006308363A (ja) | 2006-11-09 |
JP2006308363A5 true JP2006308363A5 (ja) | 2008-04-17 |
Family
ID=37307917
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005129468A Withdrawn JP2006308363A (ja) | 2005-04-27 | 2005-04-27 | 走査機構 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20070085022A1 (ja) |
EP (1) | EP1752756A1 (ja) |
JP (1) | JP2006308363A (ja) |
WO (1) | WO2006118118A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8001831B2 (en) * | 2007-05-31 | 2011-08-23 | Sii Nano Technology Inc. | Positioning apparatus and scanning probe microscope employing the same |
JP4995767B2 (ja) * | 2007-05-31 | 2012-08-08 | エスアイアイ・ナノテクノロジー株式会社 | 位置決め装置及びこれを用いた走査型プローブ顕微鏡 |
JP5295814B2 (ja) * | 2009-02-17 | 2013-09-18 | オリンパス株式会社 | 走査機構および走査型プローブ顕微鏡 |
FR2975496B1 (fr) * | 2011-05-17 | 2015-04-03 | Concept Scient Instr | Dispositif de positionnement ultra-precis d'un element et systeme de positionnement comprenant un tel dispositif. |
KR101878753B1 (ko) * | 2012-12-20 | 2018-07-16 | 삼성전자주식회사 | 수직 장착이 가능한 현미경용 시료 스테이지 및 이를 채용한 주사 탐침 현미경 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5731587A (en) * | 1996-08-12 | 1998-03-24 | The Regents Of The University Of Michigan | Hot stage for scanning probe microscope |
US5854487A (en) * | 1997-02-28 | 1998-12-29 | Park Scientific Instruments | Scanning probe microscope providing unobstructed top down and bottom up views |
US6346710B1 (en) * | 1998-08-31 | 2002-02-12 | Olympus Optical Co., Ltd. | Stage apparatus including displacement amplifying mechanism |
US6323483B1 (en) * | 1999-09-20 | 2001-11-27 | Veeco Instruments Inc. | High bandwidth recoiless microactuator |
JP2001160637A (ja) * | 1999-09-20 | 2001-06-12 | Denso Corp | 圧電素子および圧電素子の製造方法 |
JP4797150B2 (ja) * | 2000-03-14 | 2011-10-19 | オリンパス株式会社 | 走査機構およびこれを用いた機械走査型顕微鏡 |
JP3602434B2 (ja) * | 2000-11-27 | 2004-12-15 | 株式会社ミツトヨ | 高精度移動機構 |
US6590208B2 (en) * | 2001-01-19 | 2003-07-08 | Veeco Instruments Inc. | Balanced momentum probe holder |
JP2004101206A (ja) * | 2002-09-04 | 2004-04-02 | Takano Co Ltd | 走査型プローブ顕微鏡用走査機構 |
JP4276890B2 (ja) * | 2003-05-08 | 2009-06-10 | オリンパス株式会社 | 走査機構およびこれを用いた走査型プローブ顕微鏡 |
JP4649136B2 (ja) * | 2003-07-31 | 2011-03-09 | キヤノン株式会社 | アクチュエータ、露光装置及びデバイス製造方法 |
-
2005
- 2005-04-27 JP JP2005129468A patent/JP2006308363A/ja not_active Withdrawn
-
2006
- 2006-04-25 EP EP06732322A patent/EP1752756A1/en not_active Withdrawn
- 2006-04-25 WO PCT/JP2006/308662 patent/WO2006118118A1/ja active Application Filing
- 2006-12-07 US US11/635,156 patent/US20070085022A1/en not_active Abandoned
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