JP2006307277A - Method for manufacturing plated extra-fine wire - Google Patents

Method for manufacturing plated extra-fine wire Download PDF

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JP2006307277A
JP2006307277A JP2005130499A JP2005130499A JP2006307277A JP 2006307277 A JP2006307277 A JP 2006307277A JP 2005130499 A JP2005130499 A JP 2005130499A JP 2005130499 A JP2005130499 A JP 2005130499A JP 2006307277 A JP2006307277 A JP 2006307277A
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wire
plating layer
plated
copper
copper alloy
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Tsuyoshi Yamada
剛志 山田
Kunihiro Naoe
邦浩 直江
Shoji Mimura
彰治 味村
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Fujikura Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a plated extra-fine wire, which hardly breaks the wire and has superior production efficiency. <P>SOLUTION: This manufacturing method comprises the steps of: firstly forming an Ag-plated layer which is harder than a rod material made from copper or a copper alloy and has a Vickers hardness (Hv) of 100 to 150, on the surface of the rod material by using a cyan plating bath containing selenium of 20 to 40 ppm; and then wire-drawing the rod material having the Ag-plated layer formed thereon into the plated extra-fine wire having the diameter of less than 50 μm. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、携帯電話等の小型電子機器の極細同軸ケーブルに使用される直径が50μm未満の極細めっき線の製造方法に関する。   The present invention relates to a method of manufacturing an ultrafine plated wire having a diameter of less than 50 μm used for an ultrafine coaxial cable of a small electronic device such as a mobile phone.

近時、電子機器の小型化及び軽量化に伴い、電気的特性が優れた極細同軸ケーブルの需要が高まっており、特に、信号の高速伝送に対応するため、銅又は銅合金からなる素線の表面上にめっき層を形成した極細線の需要が高まっている。従来、このような極細めっき線を製造する場合には、銅又は銅合金からなる線材の表面上に純度が99.9質量%以上の銀(Ag)等からなるめっき層を形成した後、伸線加工が施されている。   Recently, with the miniaturization and weight reduction of electronic devices, the demand for ultra-fine coaxial cables with excellent electrical characteristics has increased. In particular, in order to support high-speed signal transmission, the strands of copper or copper alloy There is an increasing demand for extra fine wires having a plating layer formed on the surface. Conventionally, when manufacturing such an ultra-fine plated wire, after forming a plating layer made of silver (Ag) or the like having a purity of 99.9% by mass or more on the surface of a wire made of copper or a copper alloy, the wire is stretched. Line processing is given.

しかしながら、めっき層が形成された銅又は銅合金線材を伸線加工すると、めっき層に由来する金属粉がダイス穴に詰まり、めっき層が形成されていない銅又は銅合金線材を伸線加工する場合に比べて断線の発生頻度が増加し、生産効率が低下する。特に、直径が50μm未満の極細線を製造する際は、線材の線径が細く強度が低いため、伸線加工時に断線が多発しやすい。そこで、従来、伸線加工時の断線を防止するため、予め伸線加工された銅又は銅合金極細素線の表面上にめっき層を形成して極細めっき線とする方法が提案されている(例えば、特許文献1及び2参照。)。例えば、特許文献2に記載の極細めっき線の製造方法においては、素線の表面品質を向上させてめっき層と素線との密着性を向上させるため、伸線加工した線材を更に化学溶解又は電気化学溶解により縮径した後、その表面上にめっき層を形成している。   However, when copper or copper alloy wire with a plated layer is drawn, metal powder derived from the plated layer is clogged in the die hole, and copper or copper alloy wire with no plated layer is drawn The frequency of breakage increases compared to, and production efficiency decreases. In particular, when manufacturing an extra fine wire having a diameter of less than 50 μm, the wire diameter is thin and the strength is low. Therefore, conventionally, in order to prevent disconnection at the time of wire drawing, a method has been proposed in which a plating layer is formed on the surface of a copper or copper alloy ultrafine wire that has been previously drawn to form an ultrafine plated wire ( For example, see Patent Documents 1 and 2.) For example, in the method of manufacturing an ultrafine plated wire described in Patent Document 2, in order to improve the surface quality of the strand and improve the adhesion between the plating layer and the strand, the drawn wire is further chemically dissolved or After reducing the diameter by electrochemical dissolution, a plating layer is formed on the surface.

特許第2714922号公報Japanese Patent No. 2714922 特開2002−140935号公報JP 2002-140935 A

しかしながら、前述の従来の技術には以下に示す問題点がある。即ち、特許文献1及び2に記載のめっき細線の製造方法のように、伸線加工された素線の表面上にめっき層を形成すると、伸線加工時の断線頻度は減少するが、伸線加工された素線にめっき処理を施す際の張力制御が難しく、生産効率が低下するという問題点がある。   However, the conventional techniques described above have the following problems. That is, when the plating layer is formed on the surface of the drawn wire as in the manufacturing method of the fine wire described in Patent Documents 1 and 2, the frequency of wire breakage during wire drawing decreases, There is a problem in that it is difficult to control the tension when the processed wire is plated, and the production efficiency is lowered.

本発明はかかる問題点に鑑みてなされたものであって、断線が発生しにくく、且つ生産効率が優れた極細めっき線の製造方法を提供することを目的とする。   This invention is made | formed in view of this problem, Comprising: It aims at providing the manufacturing method of the ultra fine plating wire which was hard to generate | occur | produce a disconnection and was excellent in production efficiency.

本発明に係る極細めっき線の製造方法は、銅又は銅合金からなる素線の表面上に銀を含むめっき層が形成された直径が50μm未満の極細めっき線の製造方法において、銅又は銅合金からなる線材の表面上に銀を含み前記線材よりも硬いめっき層を形成する工程と、このめっき層が形成された線材を伸線加工して直径を50μm未満にする工程と、を有することを特徴とする。   The method for producing an ultrafine plated wire according to the present invention is the method for producing an ultrafine plated wire having a diameter of less than 50 μm in which a plating layer containing silver is formed on the surface of a wire made of copper or a copper alloy. A step of forming a plating layer containing silver on the surface of the wire material that is harder than the wire material, and a step of drawing the wire material on which the plating layer is formed to make the diameter less than 50 μm. Features.

本発明においては、めっき層を銅又は銅合金線材よりも硬くしているため、表面にめっき層が形成された線材を伸線加工しても、めっき層に由来する金属粉が発生しにくくなり、伸線加工時の断線を防止することができる。また、めっき層が形成された線材を伸線加工しているため、予め所定の径に伸線加工された極細素線の表面上にめっき層を形成するよりも、生産効率が向上する。   In the present invention, since the plating layer is harder than copper or copper alloy wire, even if the wire having the plating layer formed on the surface is drawn, metal powder derived from the plating layer is hardly generated. It is possible to prevent disconnection during wire drawing. In addition, since the wire rod on which the plating layer is formed is drawn, the production efficiency is improved as compared with the case where the plating layer is formed on the surface of the ultrafine wire previously drawn to a predetermined diameter.

前記めっき層を形成する工程において、シアン化セレンカリウムを含むめっき浴を使用してもよい。これにより、シアン化セレンカリウムの添加量を変えることにより、容易にめっき層の硬さを調節することができる。   In the step of forming the plating layer, a plating bath containing potassium selenium cyanide may be used. Thereby, the hardness of a plating layer can be easily adjusted by changing the addition amount of potassium selenium cyanide.

その場合、前記めっき浴中のセレン濃度を、20乃至40ppmとすることができる。これにより、断線にくく、光沢性が優れためっき層を形成することができる。   In that case, the selenium concentration in the plating bath can be 20 to 40 ppm. Thereby, the plating layer which is hard to disconnect and has excellent gloss can be formed.

また、前記めっき層の硬さは、例えばビッカース硬度で100乃至150である。   The plating layer has a Vickers hardness of 100 to 150, for example.

本発明によれば、Agめっき層を銅又は銅合金線材よりも硬くしているため、表面にAgめっき層が形成された線材を伸線加工しても、Agめっき層に由来する金属粉が発生しにくくなり、伸線加工時の断線を防止することができると共に、Agめっき層が形成された線材を伸線加工しているため、生産効率が優れている。   According to the present invention, since the Ag plating layer is harder than the copper or copper alloy wire, even if the wire having the Ag plating layer formed on the surface is drawn, the metal powder derived from the Ag plating layer is not present. It is less likely to occur, can prevent disconnection during wire drawing, and is excellent in production efficiency because the wire with the Ag plating layer formed thereon is wire drawn.

以下、本発明の実施形態に係る極細めっき線について具体的に説明する。本実施形態の極細めっき線は、直径が50μm未満であり、銅又は銅合金からなる素線の表面上に厚さが例えば1乃至3μmで、Agを含むめっき層が形成されている。そして、この極細めっき線におけるめっき層には、セレン(Se)及びアンチモン(Sb)等のAgめっき層を硬くする元素が添加されており、これにより、Agめっき層の硬さが素線の硬さよりも高くなっている。   Hereinafter, the ultrafine plated wire according to the embodiment of the present invention will be specifically described. The ultra fine plated wire of the present embodiment has a diameter of less than 50 μm, and has a thickness of, for example, 1 to 3 μm and a plated layer containing Ag on the surface of a wire made of copper or a copper alloy. In addition, an element for hardening the Ag plating layer, such as selenium (Se) and antimony (Sb), is added to the plating layer in the ultra fine plating wire. It is higher than that.

次に、本実施形態の極細めっき線の製造方法について説明する。先ず、銅又は銅合金からなり直径が例えば120μmの線材の表面上に、厚さが例えば6μmで、Agを含むめっき層を形成する。このとき、シアン化銀、シアン化カリウム及びシアン化セレンカリウムを含み、更に必要に応じて二硫化炭素等の光沢剤が添加されためっき浴を使用し、このめっき浴におけるシアン化セレンカリウムの添加量を調節することにより、めっき層が銅又は銅合金線材よりも硬くなるようにする。その後、表面にめっき層が形成された銅又は銅合金線材を、伸線機により直径が50μm未満になるように伸線して極細めっき線を得る。   Next, the manufacturing method of the ultra fine plated wire of this embodiment is demonstrated. First, a plating layer having a thickness of, for example, 6 μm and containing Ag is formed on the surface of a wire made of copper or a copper alloy and having a diameter of, for example, 120 μm. At this time, a plating bath containing silver cyanide, potassium cyanide and potassium selenium cyanide and further added with a brightening agent such as carbon disulfide if necessary is used. The amount of potassium selenium cyanide added in this plating bath is By adjusting, the plating layer is made harder than the copper or copper alloy wire. Thereafter, the copper or copper alloy wire having a plating layer formed on the surface is drawn by a wire drawing machine so that the diameter is less than 50 μm to obtain an ultra fine plated wire.

また、本実施形態の極細めっき線におけるめっき層のビッカース硬さ(Hv)は、100乃至150とすることが望ましい。めっき層のビッカース硬さ(Hv)が100未満の場合、伸線性が低下して伸線加工時に断線が多発することがある。一方、めっき層のビッカース硬さ(Hv)が150を超えると、めっき層の光沢性が低下することがある。なお、めっき層の硬さを上述の範囲にするためには、例えば、めっき浴のSe濃度を20乃至40ppmの範囲にすればよい。   In addition, it is desirable that the Vickers hardness (Hv) of the plating layer in the ultra fine plating wire of this embodiment is 100 to 150. When the Vickers hardness (Hv) of the plating layer is less than 100, the wire drawing property is lowered, and breakage may occur frequently during wire drawing. On the other hand, when the Vickers hardness (Hv) of the plating layer exceeds 150, the glossiness of the plating layer may be lowered. In addition, what is necessary is just to make Se density | concentration of a plating bath into the range of 20-40 ppm, for example, in order to make the hardness of a plating layer into the above-mentioned range.

表面にめっき層が形成された銅又は銅合金線材を伸線加工したときに、金属粉が発生する原因は、銅又は銅合金線材に比べてめっき層が軟らかいためである。そこで、本実施形態の極細めっき線の製造方法においては、めっき層にSe及びSb等のAgめっき層を硬くする効果がある元素を微量添加し、めっき層を銅又は銅合金線材よりも硬くしている。これにより、表面にめっき層が形成された線材を伸線加工しても、めっき層に由来する金属粉が発生しにくくなり、伸線加工時の断線を防止することができる。   The reason why metal powder is generated when a copper or copper alloy wire having a plating layer formed on the surface is drawn is that the plating layer is softer than copper or copper alloy wire. Therefore, in the manufacturing method of the ultra fine plated wire of this embodiment, a trace amount of an element that has an effect of hardening the Ag plated layer such as Se and Sb is added to the plated layer, and the plated layer is made harder than the copper or copper alloy wire. ing. Thereby, even if a wire having a plating layer formed on the surface is drawn, metal powder derived from the plating layer is hardly generated, and disconnection during the drawing can be prevented.

また、本実施形態の極細めっき線の製造方法においては、めっき層が形成された線材を伸線加工しているため、前述の特許文献1及び2に記載されている極細めっき線の製造方法のように、所定の径に伸線加工された極細素線の表面上にめっき層を形成するよりも、生産効率が優れている。   Moreover, in the manufacturing method of the ultra fine plated wire of this embodiment, since the wire in which the plating layer was formed is drawn, the manufacturing method of the ultra fine plated wire described in Patent Documents 1 and 2 described above is used. Thus, the production efficiency is superior to the case where the plating layer is formed on the surface of the ultrafine wire drawn to a predetermined diameter.

以下、本発明の効果について、本発明の範囲から外れる比較例と比較して説明する。先ず、Agを1.0質量%含有する銅合金からなり、直径が120μm、長さが1000m、ビッカース硬さ(Hv)が105の銅合金線材を5ボビン用意し、各銅合金線材の表面上に、夫々、厚さが6μmで、ビッカース硬さ(Hv)が40、75、100、125及び150で、Agを主成分とするめっき層を形成して比較例1乃至3並びに実施例1及び2のめっき線材を作製した。その際、シアン化銀を30g/リットル、シアン化カリウムを35g/リットル、炭酸カリウムを35g/リットル、硝酸カリウムを100g/リットル及びシアン化セレンカリウムを含有するめっき浴を使用し、シアン化セレンカリウム添加量を変えることによりめっき浴中のSe濃度を0乃至40ppmの範囲で調節し、各線材に形成するめっき層の硬さを調節した。   Hereinafter, the effect of the present invention will be described in comparison with a comparative example that is out of the scope of the present invention. First, 5 bobbins of a copper alloy wire made of a copper alloy containing 1.0% by mass of Ag, having a diameter of 120 μm, a length of 1000 m, and a Vickers hardness (Hv) of 105 are prepared on the surface of each copper alloy wire. In addition, a plating layer having a thickness of 6 μm, Vickers hardness (Hv) of 40, 75, 100, 125, and 150 and mainly composed of Ag was formed, and Comparative Examples 1 to 3 and Example 1 and 2 plating wire was produced. At this time, a plating bath containing 30 g / liter of silver cyanide, 35 g / liter of potassium cyanide, 35 g / liter of potassium carbonate, 100 g / liter of potassium nitrate and selenium potassium cyanide was used, and the amount of potassium selenium cyanide added was adjusted. By changing, the Se concentration in the plating bath was adjusted in the range of 0 to 40 ppm, and the hardness of the plating layer formed on each wire was adjusted.

また、同様の方法で、Agを1.0質量%含有する銅合金からなり、直径が120μm、長さが1000mで、熱処理又は加工方法によりビッカース硬さ(Hv)を60とした銅合金線材の表面に、厚さが6μmで、ビッカース硬さ(Hv)が100で、Agを主成分とするめっき層を形成して、実施例3のめっき線材を作製した。更に、Agを1.0質量%含有する銅合金からなり、直径が120μm、長さが1000m、熱処理又は加工方法によりビッカース硬さ(Hv)を130とした銅合金線材の表面に、厚さが6μmで、ビッカース硬さ(Hv)が100で、Agを主成分とするめっき層を形成して、比較例4のめっき線材を作製した。   Further, in the same manner, a copper alloy wire comprising a copper alloy containing 1.0% by mass of Ag, having a diameter of 120 μm and a length of 1000 m, and having a Vickers hardness (Hv) of 60 by heat treatment or processing method. A plating layer having a thickness of 6 μm, a Vickers hardness (Hv) of 100, and Ag as a main component was formed on the surface, and the plating wire of Example 3 was produced. Furthermore, it is made of a copper alloy containing 1.0% by mass of Ag, the diameter is 120 μm, the length is 1000 m, and the thickness of the copper alloy wire rod having a Vickers hardness (Hv) of 130 by heat treatment or processing method is set on the surface. A plated wire of Comparative Example 4 was produced by forming a plating layer having a Vickers hardness (Hv) of 100 μm and a main component of Ag at 6 μm.

次に、前述の実施例1乃至3及び比較例1乃至4のめっき線材を、直径が50μmになるように伸線機により伸線加工した後、更に直径が25μmになるように伸線加工し、各伸線加工工程における断線回数を調べた。その結果を下記表1に示す。   Next, the plated wires of Examples 1 to 3 and Comparative Examples 1 to 4 described above were drawn using a wire drawing machine so that the diameter was 50 μm, and then further drawn so that the diameter was 25 μm. The number of wire breaks in each wire drawing process was examined. The results are shown in Table 1 below.

Figure 2006307277
Figure 2006307277

上記表1に示すように、めっき層が銅合金線材よりも硬い実施例1乃至3のめっき線材では、伸線加工時に断線が発生しなかった。これに対して、めっき層が銅合金線材よりも軟らかい比較例1乃至4のめっき線材では、伸線加工時に断線が発生し、特に、直径を50μmから25μmにする加工において断線の発生回数が多かった。そこで、断線が発生しためっき線材について、断線箇所の破面をSEM(Scanning Electron Microscope:走査型電子顕微鏡)により観察し、断線原因を調査したところ、伸線時にめっき層に由来する金属粉が発生しており、この金属粉がダイスに詰まって断線が発生していた。   As shown in Table 1 above, in the plated wires of Examples 1 to 3 in which the plated layer was harder than the copper alloy wire, no breakage occurred during the wire drawing. On the other hand, in the plated wires of Comparative Examples 1 to 4 where the plating layer is softer than the copper alloy wire, breakage occurs during the wire drawing process, and in particular, the number of occurrences of breakage is large in the process of changing the diameter from 50 μm to 25 μm. It was. Therefore, the surface of the broken wire was observed by SEM (Scanning Electron Microscope) and the cause of the wire breakage was investigated. As a result, metal powder derived from the plating layer was generated during wire drawing. The metal powder was clogged in the die, and disconnection occurred.

Claims (4)

銅又は銅合金からなる素線の表面上に銀を含むめっき層が形成された直径が50μm未満の極細めっき線の製造方法において、銅又は銅合金からなる線材の表面上に銀を含み前記線材よりも硬いめっき層を形成する工程と、このめっき層が形成された線材を伸線加工して直径を50μm未満にする工程と、を有することを特徴とする極細めっき線の製造方法。 In the method for producing an ultrafine plated wire having a diameter of less than 50 μm in which a plating layer containing silver is formed on the surface of a wire made of copper or copper alloy, the wire contains silver on the surface of the wire made of copper or copper alloy A method for producing an ultrafine plated wire, comprising: forming a harder plating layer; and drawing the wire on which the plating layer is formed to reduce the diameter to less than 50 μm. 前記めっき層を形成する工程において、シアン化セレンカリウムを含むめっき浴を使用することを特徴とする請求項1に記載の極細めっき線の製造方法。 The method for producing an ultrafine plated wire according to claim 1, wherein a plating bath containing potassium selenium cyanide is used in the step of forming the plating layer. 前記めっき浴中のセレン濃度を20乃至40ppmとすることを特徴とする請求項2に記載の極細めっき線の製造方法。 The method for producing an ultrafine plated wire according to claim 2, wherein the selenium concentration in the plating bath is 20 to 40 ppm. 前記めっき層の硬さは、ビッカース硬度で100乃至150であることを特徴とする請求項1乃至3のいずれか1項に記載の極細めっき線の製造方法。 The method of manufacturing an ultra fine plated wire according to any one of claims 1 to 3, wherein the plating layer has a Vickers hardness of 100 to 150.
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