JP2006292749A - ランダムジッタ成分とデターミニスティックジッタ成分の分離 - Google Patents

ランダムジッタ成分とデターミニスティックジッタ成分の分離 Download PDF

Info

Publication number
JP2006292749A
JP2006292749A JP2006104892A JP2006104892A JP2006292749A JP 2006292749 A JP2006292749 A JP 2006292749A JP 2006104892 A JP2006104892 A JP 2006104892A JP 2006104892 A JP2006104892 A JP 2006104892A JP 2006292749 A JP2006292749 A JP 2006292749A
Authority
JP
Japan
Prior art keywords
jitter
jitter component
component
distribution
random
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006104892A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006292749A5 (https=
Inventor
Ransom W Stephens
ランサム・ダブリュ・スティーブン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2006292749A publication Critical patent/JP2006292749A/ja
Publication of JP2006292749A5 publication Critical patent/JP2006292749A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Dc Digital Transmission (AREA)
JP2006104892A 2005-04-12 2006-04-06 ランダムジッタ成分とデターミニスティックジッタ成分の分離 Pending JP2006292749A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/104,124 US7191080B2 (en) 2005-04-12 2005-04-12 Separation of a random component of jitter and a deterministic component of jitter

Publications (2)

Publication Number Publication Date
JP2006292749A true JP2006292749A (ja) 2006-10-26
JP2006292749A5 JP2006292749A5 (https=) 2009-06-18

Family

ID=36539504

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006104892A Pending JP2006292749A (ja) 2005-04-12 2006-04-06 ランダムジッタ成分とデターミニスティックジッタ成分の分離

Country Status (4)

Country Link
US (1) US7191080B2 (https=)
JP (1) JP2006292749A (https=)
DE (1) DE102006001285A1 (https=)
GB (1) GB2425235A (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016133407A (ja) * 2015-01-20 2016-07-25 三菱電機株式会社 ジッタ分離装置
JP2016136728A (ja) * 2012-12-13 2016-07-28 インテル・コーポレーション Ｐａｍ送信機におけるジッタを測定する方法、送信された信号における歪みを測定する方法、抑制のための歪み測定、ｐａｍ送信機における偶数−奇数ジッタを測定する方法、クロックランダムジッタおよびクロック確定ジッタを計算する試験装置
JP2021511513A (ja) * 2018-01-23 2021-05-06 テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． ガウス分布及び有界成分を含むランダム・タイミング・ジッタの定量化

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7460592B2 (en) * 2005-05-04 2008-12-02 Advantest Corporation Apparatus for measuring jitter and method of measuring jitter
US7856463B2 (en) * 2006-03-21 2010-12-21 Advantest Corporation Probability density function separating apparatus, probability density function separating method, testing apparatus, bit error rate measuring apparatus, electronic device, and program
US20090213918A1 (en) * 2008-02-27 2009-08-27 Waschura Thomas E Separating jitter components in a data stream
US8271219B2 (en) * 2008-10-24 2012-09-18 Advantest Corporation Deterministic component model identifying apparatus, identifying method, program, recording medium, test system and electronic device
US8379754B2 (en) 2009-03-31 2013-02-19 Infineon Technologies Ag Method and device for predicting a figure of merit from a distribution
US9294237B2 (en) * 2014-07-30 2016-03-22 Tektronix, Inc. Method for performing joint jitter and amplitude noise analysis on a real time oscilloscope

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003052670A1 (en) * 2001-12-14 2003-06-26 Wavecrest Corporation Method and apparatus for analyzing a distribution

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1209631C (zh) * 1998-01-30 2005-07-06 波峰有限公司 用于抖动分析的方法
US6298315B1 (en) * 1998-12-11 2001-10-02 Wavecrest Corporation Method and apparatus for analyzing measurements
AU2001281363A1 (en) * 2000-08-01 2002-02-13 Wavecrest Corporation Electromagnetic and optical analyzer
US6832172B2 (en) 2001-06-15 2004-12-14 Tektronix, Inc. Apparatus and method for spectrum analysis-based serial data jitter measurement
US7206340B2 (en) * 2003-01-29 2007-04-17 Agilent Technologies, Inc. Characterizing jitter of repetitive patterns
DE60310886T2 (de) * 2003-05-22 2007-05-10 Agilent Technologies Inc., Santa Clara Polynomiale Anpassung für Zittertrennung
US6898535B2 (en) * 2003-10-14 2005-05-24 Agilent Technologies, Inc. Method and apparatus for decomposing signal jitter using multiple acquisitions
US7512196B2 (en) * 2004-06-28 2009-03-31 Guidetech, Inc. System and method of obtaining random jitter estimates from measured signal data

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003052670A1 (en) * 2001-12-14 2003-06-26 Wavecrest Corporation Method and apparatus for analyzing a distribution

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016136728A (ja) * 2012-12-13 2016-07-28 インテル・コーポレーション Ｐａｍ送信機におけるジッタを測定する方法、送信された信号における歪みを測定する方法、抑制のための歪み測定、ｐａｍ送信機における偶数−奇数ジッタを測定する方法、クロックランダムジッタおよびクロック確定ジッタを計算する試験装置
JP2016133407A (ja) * 2015-01-20 2016-07-25 三菱電機株式会社 ジッタ分離装置
JP2021511513A (ja) * 2018-01-23 2021-05-06 テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． ガウス分布及び有界成分を含むランダム・タイミング・ジッタの定量化
JP7425733B2 (ja) 2018-01-23 2024-01-31 テクトロニクス・インコーポレイテッド 試験測定装置及び入力信号のジッタを求める方法

Also Published As

Publication number Publication date
DE102006001285A1 (de) 2006-10-26
GB2425235A (en) 2006-10-18
US7191080B2 (en) 2007-03-13
GB0607000D0 (en) 2006-05-17
US20060229836A1 (en) 2006-10-12

Similar Documents

Publication Publication Date Title
US8594169B2 (en) Method for decomposing and analyzing jitter using spectral analysis and time-domain probability density
JP4204806B2 (ja) ジッタ測定方法
US9130751B2 (en) Methods and systems for analyzing decomposed uncorrelated signal impairments
JP5066077B2 (ja) 確率密度関数分離装置、確率密度関数分離方法、試験装置、ビット誤り率測定装置、電子デバイス、及びプログラム
JP5255442B2 (ja) 確率密度関数分離装置、確率密度関数分離方法、プログラム、試験装置、ビット誤り率測定装置、電子デバイス、および、ジッタ伝達関数測定装置
WO2003073115A1 (fr) Instrument et procede de mesure
CN100552462C (zh) 用于测量抖动的方法和设备
CN111474408B (zh) 抖动确定方法和测量仪器
JP2006292749A (ja) ランダムジッタ成分とデターミニスティックジッタ成分の分離
US11624781B2 (en) Noise-compensated jitter measurement instrument and methods
TWI405979B (zh) 機率密度函數分離裝置、機率密度函數分離方法、雜訊分離裝置、雜訊分離方法、測試裝置、測試方法、計算裝置、計算方法、程式以及記錄媒體
US9363045B2 (en) Bounded uncorrelated signal impairment deconvolution for total signal impairment extrapolation
JP7425733B2 (ja) 試験測定装置及び入力信号のジッタを求める方法
JP2004289388A (ja) アイマスクの範囲外に存在する多値データ信号のエラーを決定する方法及びその装置
JP2006053140A (ja) ２値サンプリング計測値からのアナログ波形情報
US20130070830A1 (en) Characterization of the jitter of a clock signal
US9673862B1 (en) System and method of analyzing crosstalk without measuring aggressor signal
WO2010047128A1 (ja) 確定成分モデル識別装置、確定成分モデル識別方法、プログラム、記憶媒体、試験システム、および、電子デバイス
JP2006276019A (ja) ジッタのランダム成分とデタミニスティック成分の分離
JP2005100368A (ja) スペクトラム拡散クロッキングのディジタル測定方法
Erb et al. Design specification for BER analysis methods using built-in jitter measurements
JP2007515816A (ja) 任意のテスト信号を使用するデジタルデータ信号のテスト
WO2024233410A1 (en) Method for separating and modeling n-ui jitter based on spectrum
Guenther Ward et al.
Hush et al. A comparison of methods for estimating broadband noise in the frequency domain

Legal Events

Date Code Title Description
RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20070511

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090403

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20090403

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20111220

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20111226

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20120522