JP2006250620A - Contact probe, inspection device, and inspection device of coil product - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a contact probe capable of preventing adhesion of a contact part to the contact probe when the contact probe is separated from the contact part, and an inspection device and an inspection device of a coil product. <P>SOLUTION: This contact probe 1 is equipped with a contact probe body 11; and a pressing member 21 provided so that its tip is positioned near the tip of the contact probe body 11, whose tip is projected from the tip of the contact probe body 11 in the no-load state, and having springiness in the projection direction. When the contact probe body 11 is separated from the contact part 75, the contact part 75 is pressed by the pressing member 21. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a contact probe, an inspection device, and an inspection device for a coil product, which are in contact with an electrode such as a printed wiring board and conduct continuity inspection of electronic components such as circuits and coil products.

  Conventionally, an inspection apparatus provided with a contact probe has been used in an inspection after mounting a component on a printed wiring board or the like or after manufacturing an electronic component such as a coil product.

  As such a contact probe, a pin-shaped probe in which the tip portion is brought into point contact with an electrode is generally used. FIG. 10 shows an example of such a contact probe. The conventional contact probe 101 includes a spring 102, and the tip portion 103 is urged by the spring 102 to press the tip portion 103 against the electrode 110 with a constant pressure.

  Such a pin-shaped contact probe is disclosed in, for example, Japanese Patent Laid-Open No. 8-35986.

On the other hand, Patent Document 2 (Japanese Patent Laid-Open No. 7-273158) discloses a probe head that includes a leaf spring portion and can achieve stable contact with a substrate.
JP-A-8-35986 JP 7-273158 A

  When the pin-shaped contact probe 101 as described in Patent Document 1 is used, since the electrode and the contact probe 101 are in point contact, the contact resistance is large and it is difficult to ensure measurement accuracy. is there. Further, when the resin 111 or the like adheres to the tip of the contact probe 101 on the surface of the electrode 110, the contact may become unstable.

  Also, the probe head disclosed in Patent Document 2 has the same problem due to point contact.

  In order to improve the contact reliability, a contact probe 120 is proposed in which the tip portion is shaped like a knife edge and the tip edge is in line contact with the electrode. According to the contact probe 120, the tip edge thereof is in line contact, so that the contact resistance can be reduced as compared with the case of point contact. Further, by strongly pressing the tip of the contact probe 120 against the electrode 110, the sharp part of the tip breaks through the resin adhering to the surface of the electrode 110, and the contact probe 120 is reliably brought into contact with the electrode 110. Can do.

  Such adhesion of the resin is likely to occur when the wire coated with the resin on the electrode 110 in the previous step is dip-soldered. This is because, during dip soldering, the resin coating of the wire may melt and remain on the solder surface.

  As described above, when the knife-edge shaped tip is strongly pressed against the electrode 110, the tip will bite into the surface of the electrode 110 to some extent. In particular, when a preliminary solder is provided on the electrode 110 or an electric wire is soldered in the previous process, the knife-edge shaped tip is in contact with the solder, but the solder is relatively soft, The tip of the contact probe 120 is easy to bite.

  When the inspection target is a relatively light electronic component or the like, when the contact probe 120 is driven in a direction away from the electrode 110 with the tip of the contact probe 120 biting into the electrode 110, as shown in FIG. There is a problem that the electrode 110 adheres to the tip of the contact probe 120 and the electronic component rotates or the position shifts as the contact probe 120 moves.

  When the electronic component is a coil product as shown in FIGS. 10 and 11, the coil product main body in which the coil is accommodated is generally formed in a cylindrical shape, and the electrode 110 protrudes from the upper surface thereof. Such a coil product is inspected in a state where the circular lower surface is placed on the transfer table and the electrode 110 faces upward. Since such a coil product is easy to rotate in the inspection state, the electrode 110 may adhere to the contact probe 120 and may rotate significantly.

  As described above, when the inspection target product is rotated or displaced, there is a problem that the inspection target product cannot be accurately chucked in a later process.

  The present invention has been made to solve the above problems, and a contact probe that can prevent the contacted portion from adhering to the contact probe when the contact probe and the contacted portion are separated from each other. An object of the present invention is to provide a device and an inspection device for a coil product.

  According to the contact probe based on the present invention, the contact probe main body is designed to be electrically connected to the contacted portion by bringing the tip into contact with the contacted portion, and the tip is located near the tip of the contact probe main body. In the unloaded state, the distal end protrudes from the distal end of the contact probe main body, and includes a pressing member having a spring property in the protruding direction.

  According to this configuration, after the contact probe main body comes into contact with the contacted portion and the predetermined inspection is finished, the tip of the contact probe main body is unloaded from the contact probe main body even if the contact probe starts to move backward. The protruding presser member continues to press the contacted portion while gradually restoring the unloaded position. Even when the tip of the contact probe body bites into the contacted portion, it is pressed by the pressing member, so that the contacted portion does not adhere to the tip of the contact probe main body and the contacted portion can be prevented from moving. it can.

  In the contact probe, the pressing member may be formed of a bent leaf spring. In this case, it is possible to achieve a pressing member having a spring property in the protruding direction with a simple structure.

  In addition, when the tip of the contact probe body has a knife edge shape, the tip of the contact portion can penetrate through the surface of the contacted portion and the contact probe body can be reliably contacted. The tip of the bite is easy to bite into the contacted part. Even in this case, it is possible to prevent the contacted portion from adhering to the contact probe main body and moving by pressing the contacted portion with the pressing member.

  The following inspection apparatus can be configured using the contact probe. The contact probes described above are arranged to face each other, and a support part for positioning the contacted part is provided between the contact probes arranged to face each other. The contact probe is configured to be able to advance and retreat toward the contacted portion by a drive unit, and after the contact probe contacts the contacted portion and completes a predetermined inspection, the contact probe disposed above the contact probe The drive unit is controlled so that the pressing member is simultaneously separated from the contacted part.

  In this inspection apparatus, the contact probes are arranged to face each other and come into contact with the contacted part so as to sandwich the contacted part. In this state, even when the tip of the contact probe main body bites into the contacted portion, when the contact probe main body is separated from the contacted portion, the contacted portion is pressed by the pressing member, so that the position of the contacted portion is Retained. Further, since the pressing members of the contact probe facing each other are simultaneously separated from the contacted portion, the contacted portion is not displaced due to the spring property of the pressing member even when the pressing member is separated. Thus, the position of the contacted part does not change before and after the inspection.

  A coil product inspection device that inspects a coil product having a coil and an electrode that is electrically connected to the coil and protrudes to the outside can be configured with the same structure as the inspection device. Thereby, even if it is a product which rotates easily like a coil product, rotation can be prevented.

  Hereinafter, the structure of a contact probe and a coil product inspection apparatus according to each embodiment based on the present invention will be described with reference to the drawings. FIG. 1 and FIG. 2 are perspective views showing the structure of the contact probe according to the present embodiment and the inspection process using the same.

  In the following description, the case where the inspection object of the contact probe and the inspection apparatus is a coil product will be described, but the inspection object of the contact probe and the inspection apparatus of the present invention is not limited to this. For example, it can be used for inspection of various products such as inspection of electronic components such as sensors and substrates mounted with functional components.

  The contact probe 1 according to the present embodiment is provided such that a contact probe main body 11 that is brought into conduction with the contacted portion 75 by being brought into contact with the contacted portion 75 and a tip of the contact probe main body 11 are positioned near the tip of the contact probe main body 11. In the unloaded state, the tip protrudes from the tip of the contact probe main body 11 and includes a presser member 21 having a spring property in the protruding direction.

  The contact probe main body 11 is a plate-like member made of a metal plate, and is configured in a knife edge shape so that the tip thereof has an acute angle. As a material constituting the metal plate, for example, phosphor bronze having excellent mechanical properties and corrosion resistance can be used. The surface is preferably subjected to tin plating, for example.

  The contact probe body 11 shown in FIG. 1 has a single-edged knife edge shape whose tip is inclined so as to be connected from the upper surface to the tip edge, but this is formed from the upper and lower surfaces of the contact probe body 11 to the tip edge. It is good also as a double-edged knife edge shape inclined so that it may connect.

  Further, as shown in FIG. 1, the length of the tip edge may be made to coincide with the width of the contact probe main body 11, but when the object to be contacted is small, the width becomes narrower toward the tip. It may be.

  The tip edge of the contact probe main body 11 is substantially parallel to the surface of the contacted portion 75 and makes line contact with the contacted portion 75. The rear end portion of the contact probe main body 11 is bent at a right angle upward, and the bent portion is fixed to the inspection apparatus.

  A pressing member 21 made of a leaf spring bent at an obtuse angle at the center is provided below the contact probe main body 11. As a material constituting the pressing member 21, for example, phosphor bronze having excellent mechanical properties and corrosion resistance can be used as in the case of the contact probe main body 11. The surface is preferably subjected to tin plating, for example.

  The holding member 21 is configured to have substantially the same width as that of the contact probe main body 11, and a tip portion thereof protrudes from the contact probe main body 11 in the tip direction. The protruding length can be variously changed according to the structure of the inspection apparatus, but the holding member 21 presses the contacted portion 75 until the contact probe main body 11 is separated from the contacted portion 75. Therefore, it only needs to protrude slightly forward from the contact probe main body 11.

  Since the pressing member 21 is bent at the center, a stable spring property in the protruding direction can be obtained by the leaf spring. That is, when a load is applied to the tip of the leaf spring that constitutes the presser member 21, a reaction force is generated by bending the central portion more greatly. Since the presser member 21 has such a spring property, even if the presser member 21 comes into contact with the contacted part 75, the tip of the presser member 21 does not bite into the contacted part.

  Unlike the contact probe main body 11, the tip of the pressing member 21 is configured to be flat so as to make surface contact with the contacted portion 75. Thereby, the front-end | tip of the pressing member 21 is made hard to bite into the to-be-contacted part 75 further.

  The shape of the distal end portion of the pressing member 21 is not limited to this shape, and for example, the distal end portion may be rounded to make it difficult to bite. Further, when the biting into the contacted portion 75 can be sufficiently avoided due to the spring property of the pressing member 21, the tip of the pressing member 21 may have an acute angle.

  The tip of the contact probe main body 11 and the vicinity of the tip of the pressing member 21 are close to each other. In the state where the tip edge of the contact probe main body 11 is in contact with the contacted portion 75, the tip of the pressing member 21 is in the vicinity of the contact portion between the contact probe main body 11 and the contacted portion 75.

  The presser member 21 shown in FIG. 1 is bent at the center, but may be curved as a whole. Further, a coil spring, rubber, or the like may be provided on a part of the pressing member, thereby imparting a spring property in the protruding direction.

  In the present embodiment, the contacted portion 75 is configured by an electrode protruding upward from the coil product. As shown in FIG. 1, the coil product 76 has a cylindrically formed coil product main body 77 in which a coil is accommodated and two electrodes protruding from the upper surface thereof. The coil product 76 is placed on the transport table so that the circular lower surface thereof is in contact with the upper surface, and is inspected with the electrodes facing upward.

  The inspection process using the contact probe 1 will be described with reference to FIG. FIG. 3 is a side view showing an inspection process using the contact probe of the present embodiment.

  As shown in FIG. 1, the contact probe 1 is disposed so as to face each other so as to sandwich the electrodes constituting the contacted portion 75 from both sides. Here, since it contacts two electrodes, two pairs of contact probes 1 are arranged to face each other.

  When the contact probe 1 is advanced from both sides toward the contacted portion 75, first, the tip of the pressing member 21 comes into contact with the front and back surfaces of the contacted portion 75, and when the contact probe 1 is further advanced, the pressing member 21 becomes large. Next, as shown in FIG. 3B, the tip of the contact probe main body 11 comes into contact.

  At this time, since the tip edge of the contact probe main body 11 is in line contact, the contact resistance can be reduced as compared with the case of point contact. Further, since the tip end portion of the contact probe main body 11 has a knife edge shape, even if resin or the like adheres to the surface of the contacted portion 75, it can be broken through. As a result, high contact reliability can be obtained.

  When the inspection is performed in this state and the inspection is completed, the contact probe 1 is driven in the backward direction. When driving is started, first, the tip of the contact probe body 11 is separated from the contacted portion 75 (see FIGS. 2 and 3C). At this time, the tip of the pressing member 21 is still in contact with the contacted portion 75, and the contacted portion 75 is pressed in a direction opposite to the direction in which the contact probe main body 11 moves backward due to the spring property of the pressing member 21. .

  Thereby, even when the tip of the contact probe main body 11 bites into the solder or the like provided in the contacted portion 75, the tip of the contact probe main body 11 does not adhere to the contacted portion 75, and the contact probe The position does not shift as the main body 11 moves backward.

  Further, since the pressing member 21 presses both surfaces of the contacted portion 75, the biasing force due to the spring property of both pressing members 21 is balanced, and no positional deviation occurs. When the contact probe 1 is further retracted, the pressing member 21 is simultaneously separated from the contacted portion 75. Since the contacted portion 75 is simultaneously separated from the contacted portion 75, the contacted portion 75 is not displaced when the pressing member 21 is separated from the contacted portion 75.

  In the above description, the case in which the contact probes 1 are disposed to face each other has been described. However, the contact probes 1 do not necessarily have to be disposed to face each other. Alternatively, the contact probe 1 may be brought into contact only with.

  Subsequently, an inspection apparatus using the contact probe 1 will be described. 4 is a perspective view showing a structure of the entire inspection apparatus, FIG. 5 is a perspective view showing an apparatus for driving a contact probe, and FIGS. 6 and 7 are perspective views showing a structure for holding the contact probe. FIG. 8 is a plan view thereof, and FIG. 9 is a longitudinal sectional view thereof.

  As shown in FIG. 4, the inspection device 31 supports and conveys a holding unit 41 that holds the contact probe 1, a drive unit that includes an air cylinder 32 that drives the holding unit 41, and a coil product 76 that is an inspection target. And a controller (not shown) that controls the driving unit and the conveyance unit 51.

  The transport unit 51 includes a slide table 52 that supports a plurality of mounting tables 54 and a rail unit 53 that supports the slide table 52 in a slidable manner. On the upper surface of each mounting table 54, a circular recess in plan view is provided on which the coil product 76 is mounted. One coil product 76 is placed in each of the recesses.

  The holding portion 41 is disposed so as to protrude above the rail portion 53. As will be described later, two pairs of contact probes 1 are held in the holding portion 41 so as to inspect the coil product 76 placed on the placing table 54. At the time of inspection, the slide table 52 is driven in the horizontal direction, and the mounting table 54 positioned at the head is conveyed directly below the holding unit 41. After all the coil products 76 have been inspected in order, they are conveyed again to the position shown in FIG.

  As shown in FIG. 5, the holding portion 41 has a pair of bar-like members 42 and 43 provided in parallel and is positioned on both sides of the holding portion 41 at right angles so that the tip ends protrude to the tip side of the rod-like members 42 and 43. And a pair of L-shaped members 44 and 45 bent in a straight line. A gap G is provided between the distal ends of the rod-like members 42 and 43 and the bent portions of the L-shaped members 44 and 45, and the contact probe 1 is provided facing the gap G.

  Rods 42a, 43a, 44a, and 45a are projected in the horizontal direction from the rear ends of the rod-shaped members 42 and 43 and the rear ends of the L-shaped members 44 and 45, respectively. Coil springs 42b, 43b, 44b, and 45b are provided at rear ends of these rods 42a, 43a, 44a, and 45a, respectively. A first arm 46 is connected to the rear ends of the rods 42a and 43a provided on the rod-like members 42 and 43.

  One end of coil springs 42b and 43b is in contact with the first arm 46, and a contact piece 47 is in contact with the other end of the coil springs 42b and 43b. The contact piece 47 is fixed so as not to move. The first arm 46 is connected to the air cylinder 32 and can be driven to advance and retreat.

  When the first arm 46 is driven in the direction indicated by the arrow, the rods 42a and 43a are driven against the coil springs 42b and 43b, and accordingly, the rod-like members 42 and 43 are also driven in the direction indicated by the arrow. As a result, the contact probes 1 and 1 attached to the tip portions of the rod-shaped members 42 and 43 are driven toward the contacted portion.

  Since the first arm 46 drives the rods 42a and 43a while resisting the coil springs 42b and 43b, adjusting the strength of the coil springs 42b and 43b makes it possible to adjust the contact force to the contacted parts of the contact probes 1 and 1 respectively. Can be adjusted.

  End plates 44c and 45c are provided at the rear ends of the rods 44a and 45a provided on the L-shaped members 44 and 45, respectively. One ends of coil springs 44b and 45b are in contact with the end plates 44c and 45c, respectively, and the second arm 48 is in contact with the other ends of the coil springs 44b and 45b. The second arm 48 is Y-shaped with the upper part divided into two, and the second arm 48 is also driven by the air cylinder 32.

  When the second arm 48 is driven in the direction of the arrow by the air cylinder 32, the driving force is transmitted to the rods 44a and 45a via the coil springs 44b and 45b and the end plates 44c and 45c. Accordingly, the L-shaped members 44 and 45 are driven in the direction of the arrow. As a result, the contact probes 1, 1 attached to the L-shaped members 44, 45 are driven toward the contacted portion.

  Since the driving force of the air cylinder 32 is transmitted to the rods 44a and 45a via the coil springs 44b and 45b, adjusting the strength of the coil springs 44b and 45b makes contact with the contacted parts of the contact probes 1 and 1 respectively. The power can be adjusted.

  Next, with reference to FIGS. 6 and 7, a structure for attaching the contact probe 1 to the rod-shaped members 42 and 43 and the L-shaped members 44 and 45 will be described. The contact probe main body 11 and the pressing member are L-shaped, but the upright portions are screwed to the tips of the rod-shaped members 42 and 43 and the inner surfaces of the bent portions of the L-shaped members 44 and 45. A recess extending in the vertical direction is provided on the inner surface of the bent portions of the L-shaped members 44 and 45, and the upright portion of the contact probe 1 is in contact with the upright surface of the recess.

  As shown in FIGS. 8 and 9, the coil product 76 is conveyed by the conveyance unit controlled by the controller so that the contacted part 75 is positioned between the contact probes 1 and 1 that are arranged to face each other. Each contact probe 1 fixed to the rod-shaped members 42 and 43 and the L-shaped members 44 and 45 is driven toward the contacted portion 75 and controlled by the controller to operate as described above.

  By using the contact probe 1, the coil product 76 is not displaced during inspection. Accordingly, when the slide table 52 shown in FIG. 4 returns to the original position after the inspection is completed, each coil product 76 is located at the same position as before the inspection, so that each coil product 76 is mounted on the mounting table 54. It can be gripped by the same gripping robot as when it is placed and transferred to the next step.

  In addition, the said embodiment disclosed this time is an illustration in all the points, Comprising: It does not become the basis of limited interpretation. Therefore, the technical scope of the present invention is not interpreted only by the above-described embodiments, but is defined based on the description of the claims. Further, all modifications within the meaning and scope equivalent to the scope of the claims are included.

It is a perspective view which shows the structure of the contact probe in embodiment based on this invention, and the test | inspecting process using it. It is a perspective view which shows the structure of the contact probe in embodiment based on this invention, and the test | inspecting process using it. It is a side view which shows the test | inspection process using the contact probe in embodiment based on this invention. It is a perspective view which shows the structure of the whole test | inspection apparatus in embodiment based on this invention. It is a perspective view which shows the apparatus which drives the contact probe in embodiment based on this invention. It is a perspective view which shows the structure holding the contact probe in embodiment based on this invention. It is a perspective view which shows the structure holding the contact probe in embodiment based on this invention. It is a top view which shows the structure holding the contact probe in embodiment based on this invention. It is a longitudinal cross-sectional view which shows the structure holding the contact probe in embodiment based on this invention. It is a perspective view which shows the test | inspection process using the conventional contact probe. It is a perspective view explaining the subject of the present invention.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 Contact probe, 5 Contacted part, 11 Contact probe main body, 21 Holding member, 31 Inspection apparatus, 32 Air cylinder, 41 Holding part, 54 Mounting base (support part), 75 Contacted part, 76 Coil product.

Claims (5)

A contact probe main body for conducting electrical connection with the contacted portion by bringing the tip into contact with the contacted portion;
A contact provided with a tip located near the tip of the contact probe main body, the tip protruding from the tip of the contact probe main body in an unloaded state, and a pressing member having a spring property in the protruding direction. probe.   The contact probe according to claim 1, wherein the pressing member is a bent leaf spring.   The contact probe according to claim 1, wherein a distal end portion of the contact probe main body has a knife edge shape. The contact probe according to any one of claims 1 to 3, which is disposed to face each other,
A support part for positioning a contacted part between the contact probes arranged opposite to each other;
A drive unit that advances and retracts the contact probe toward the contacted part;
A controller that controls the drive unit so that the pressing members of the contact probes arranged opposite to each other are simultaneously separated from the contacted part after the contact probe has contacted the contacted part and finished a predetermined inspection. And inspection equipment. A coil product inspection device for inspecting a coil product having a coil and an electrode projecting outside, electrically connected to the coil,
The contact probe according to any one of claims 1 to 3, which is disposed to face each other,
A support part for supporting the coil product such that the electrode is positioned between the contact probes arranged opposite to each other;
A drive part for advancing and retracting the contact probe arranged opposite to the electrode;
A controller for controlling the drive unit so that the pressing member of the contact probe disposed opposite to the electrode is simultaneously separated from the electrode after the contact probe contacts the electrode and the predetermined inspection is completed; Coil product inspection equipment.

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