JP2006242861A - Electromagnetic wave measuring instrument, probe for measuring electromagnetic wave, and probe array for measuring electromagnetic wave - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To quickly and easily measure an electromagnetic wave having orthogonal three-directional component at a single portion, in electromagnetic wave measurement by an optical sensor. <P>SOLUTION: Three magnetooptical crystals 13a-13c are provided to correspond respectively to three directions orthogonal to each other, and lights with polarization conditions changed respectively thereby get incident into analyzers 15a-15c under the polarization conditions, so as to be converted into lights of intensities in response to the respective polarization conditions. The respective intensity-converted lights are converted into lights having wavelengths different each other, by wavelength converting elements 16a-16c. The lights converted into the wavelengths different from each other are are subjected to wavelength division multiplexing, and an multiplied output is converted into an electric signal. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to an electromagnetic wave measuring device, an electromagnetic wave measuring probe, and an electromagnetic wave measuring probe array, and more particularly to an electromagnetic wave measuring device for measuring a near electromagnetic field of an object that emits radio waves, such as a mobile phone, an electromagnetic wave measuring probe used therefor, and an electromagnetic wave measurement It relates to a probe array.

In the development and design of a small terminal that emits radio waves, such as a mobile phone, EMC evaluation and setting of radiation characteristics are performed. In order to set the radiation characteristics appropriately, it is necessary to know the current distribution on the measurement target and the electric field distribution near the measurement target.
In recent years, sensors using optical technology have attracted attention in electromagnetic field measurement in the vicinity of a measurement target. This is because the optical sensor does not need to use a metal antenna when detecting an electromagnetic field, so that it does not disturb the electromagnetic field due to measurement, and the influence of an external RF signal is caused by using an optical signal for information transmission. This is because it has advantages such as not receiving it. For example, a technique for measuring an electric field by providing a light-transmitting voltage sensor in an optical sensor unit is known (see, for example, Patent Document 1).

Detection of electric field / magnetic field information by optical technology is performed using an optical crystal that changes the polarization state and refractive index of transmitted light in accordance with the applied electromagnetic field. Changes in the polarization state and refractive index of the light incident on the crystal are detected by being converted into light intensity by an analyzer (polarizing plate). In a sensor using this crystal, an electromagnetic field in a single direction corresponding to the characteristics of the crystal and the incident direction of light is detected.
JP 2004-93257 A

By the way, when performing electromagnetic field measurement in three orthogonal directions (three directions of X axis, Y axis, and Z axis orthogonal to each other) in the vicinity of the measurement object, the optical sensor is re-installed and measured so as to correspond to each direction. Often done. However, in this case, it is necessary to readjust the positional relationship with the object for each measurement, and the measurement time increases because the three directions cannot be measured simultaneously.
A configuration is also conceivable in which a sensor corresponding to each direction is simply prepared and measurement is performed simultaneously. However, in this case, a plurality of sensors and measuring devices are required, and the measurement becomes complicated.
The present invention has been made to solve the above-described problems of the prior art, and its purpose is to speed up and simplify electromagnetic field measurement of three orthogonal components at a single location in electromagnetic field measurement by an optical sensor. An electromagnetic wave measuring device, an electromagnetic wave measuring probe, and an electromagnetic wave measuring probe array that can be used.

  The electromagnetic wave measuring apparatus according to claim 1 of the present invention is an electromagnetic wave measuring apparatus that measures the magnetic field strength in three directions orthogonal to each other using an optical element in which the polarization state of transmitted light changes in accordance with the applied magnetic field. The three optical elements provided corresponding to the three directions, incident light generating means for generating incident light to the three optical elements, and the polarization state changed by the three optical elements, respectively. The light is incident on the polarization state, and the intensity conversion means for converting the light into the intensity corresponding to each polarization state is different from the light whose intensity is converted by the intensity conversion means corresponding to the three optical elements. Wavelength conversion means for converting the light into a wavelength, and wavelength division multiplexing means for performing wavelength division multiplexing on the lights converted into mutually different wavelengths by the wavelength conversion means; Characterized in that it comprises a photoelectric conversion means for converting the multiplexed output of said wavelength division multiplexing unit into an electric signal. By distributing light from a single direction in directions corresponding to the three axes and measuring the light of each component reflecting the added electromagnetic field information with a single receiver after wavelength conversion, High speed and simplification of simultaneous 3-axis measurement of electromagnetic fields can be realized.

The electromagnetic wave measuring apparatus according to a second aspect of the present invention is the polarization plane maintaining optical coupler according to the first aspect, wherein the incident light generating means distributes the light from the light source as linearly polarized light to each of the three optical elements. It is characterized by being. By distributing the light three times in advance outside the probe, the configuration of the probe can be simplified.
The electromagnetic wave measuring apparatus according to a third aspect of the present invention is the electromagnetic wave measuring apparatus according to the first aspect, wherein the incident light generating means is a prism that distributes a single light from a light source and makes it incident on each of the three optical elements. And By distributing the light into three within the probe, the device configuration for generating the light incident on the probe can be simplified.

An electromagnetic wave measuring apparatus according to a fourth aspect of the present invention is the electromagnetic wave measuring apparatus according to any one of the first to third aspects,
Three optical elements provided corresponding to the three directions, respectively, and light whose polarization state has been changed by the three optical elements are incident as they are in the polarization state, and light having an intensity corresponding to each polarization state is incident. Intensity converting means for converting;
Are integrally configured as an electromagnetic wave measurement probe. By adopting such a configuration, the configuration of the probe can be simplified, and the manufacturing cost of the probe can be reduced.
An electromagnetic wave measuring apparatus according to claim 5 of the present invention is characterized in that in claim 4, a plurality of the electromagnetic wave measuring probes are included. By adopting such a configuration, a probe array can be realized, and electromagnetic waves at a plurality of locations can be measured simultaneously.

  An electromagnetic wave measurement probe according to claim 6 of the present invention uses an optical element whose polarization state of transmitted light changes in accordance with an applied magnetic field, and measures magnetic field strength in three directions orthogonal to each other. The three optical elements provided corresponding to the three directions, respectively, and the light whose polarization state has been changed by the three optical elements are incident on the polarization state in accordance with the respective polarization states. Intensity conversion means for converting into intensity light and wavelength conversion means for converting the output light of the intensity conversion means corresponding to the three optical elements into different wavelengths. By using such a probe, light from a single direction is distributed in directions corresponding to three axes, and each component light reflecting the applied electromagnetic field information is converted into a single receiver after wavelength conversion. It is possible to achieve a high speed and simplification of simultaneous three-axis measurement of an electromagnetic field by an optical crystal.

According to a seventh aspect of the present invention, there is provided an electromagnetic wave measurement probe according to the sixth aspect, wherein the single incident light is distributed to light corresponding to the three optical elements and is incident on the three optical elements. It further includes distribution means. By distributing the light into three within the probe, the device configuration for generating the light incident on the probe can be simplified.
An electromagnetic wave measurement probe array according to claim 8 of the present invention includes a plurality of the electromagnetic wave measurement probes according to claim 6 or 7, wherein wavelengths converted by the wavelength conversion means provided in each of the electromagnetic wave measurement probes are mutually different. It is characterized by being different. By configuring the probe array in this way, electromagnetic waves at a plurality of locations can be measured simultaneously.

  As described above, the present invention distributes light from a single direction in directions corresponding to the three axes, and converts the light of each component reflecting the added electromagnetic field information into a single receiver after wavelength conversion. By measuring with this, there is an effect that it is possible to speed up and simplify the three-axis simultaneous measurement of the electromagnetic field by the optical crystal. In addition, by performing wavelength division multiplexing, not only three-axis simultaneous measurement but also the construction of an optical sensor array can be measured with a single receiver, which can greatly simplify the apparatus. .

Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the drawings referred to in the following description, the same parts as those in the other drawings are denoted by the same reference numerals.
First, an electromagnetic wave measurement apparatus using an optical crystal will be described with respect to a configuration that is not the configuration of simultaneous triaxial measurement.
FIG. 1 is a block diagram showing a configuration of an electromagnetic wave measuring apparatus having an electromagnetic wave measuring probe using an optical crystal. As shown in the figure, the electromagnetic wave measuring apparatus includes an LD (Laser Diode) 21, a polarization controller (PC) 22, a probe 10, an optical analyzer 24 such as an optical spectrum analyzer, and the like. It has the structure which detects the magnetic field radiated | emitted from the measuring object 20. The measurement target 20 is supplied with power from the power source 23. An optical amplifier such as an EDFA (Erbium Doped Fiber Amplifier) may be provided between the LD 21 and the PC 22.

  For example, as shown in FIG. 2, the probe 10 includes a magneto-optical crystal 13 for detecting an electromagnetic field between single-mode optical fibers 110 and 120, and an electromagnetic wave applied to the magneto-optical crystal 13. In this configuration, the analyzer 15 detects a polarization state that changes depending on the field. A prism 111 is provided to reflect the light transmitted by the optical fiber 110 toward the magneto-optic crystal 13, and a prism 121 is provided to allow the light transmitted through the magneto-optic crystal 13 to enter the optical fiber 120. ing.

In the above configuration, the light output from the LD 21 is linearly polarized by the PC 22 and is incident on the probe. This probe outputs a light intensity signal corresponding to the applied electromagnetic field, and this is analyzed by an optical analyzer such as an optical spectrum analyzer.
Here, in the electromagnetic wave measuring apparatus according to the present invention, in order to measure three directions simultaneously, a small probe configuration that distributes light from a single direction into three orthogonal directions (each direction of the X axis, Y axis, and Z axis) ( Hereinafter, the measurement system configuration (hereinafter referred to as the configuration (1)), which measures the light of each component reflecting the applied electric field (or magnetic field) information with a single receiver after wavelength conversion (hereinafter, referred to as the configuration (1)). Configuration (referred to as (2)) is adopted.

Hereinafter, each configuration will be described.
(Configuration (1): Small probe configuration that distributes light from a single direction into three orthogonal directions)
In measurement using an optical crystal (electro-optical crystal such as lithium niobate (LiNbO ₃ ) or magneto-optical crystal such as YIG (Y ₃ Fe ₅ O ₁₂ )), light incident on the crystal is in a linearly polarized state. There is a need. Therefore, the three-partition small probe of the above configuration (1) has one of the following configurations.

Configuration (A): Configuration in which single incident light to the probe is divided into three using a polarization maintaining three-axis orthogonal light distribution prism, and each distributed light is incident on the analyzer immediately after passing through the optical crystal. In the configuration, the incident light is single, and is divided into three by the action of the prism provided inside the probe. When the three distributed light passes through the optical crystal, the electromagnetic field information is reflected in the polarization state. And the light which passed this optical crystal is converted into the light intensity according to the polarization state in the analyzer.

Configuration (B): Light that has been distributed in three by the polarization maintaining optical coupler is incident on the probe, reflected in three orthogonal directions by the multidirectional reflecting prism, and detected immediately after each light passes through the optical crystal. In this configuration, light distributed in advance is incident on a probe, reflected in three orthogonal directions by the action of a prism provided inside the probe, and the reflected light passes through the optical crystal, thereby generating an electromagnetic field. Information is reflected in the polarization state. And the light which passed this optical crystal is converted into the light intensity according to the polarization state in the analyzer.

(Configuration (2): Measurement system configuration in which light of each component reflecting the applied electromagnetic field information is wavelength-converted and then measured with a single receiver)
This is a configuration in which a plurality of light intensity information is measured by a single receiver. Utilizing the property that lights having different wavelengths do not interfere with each other, first, a wavelength conversion element such as a nonlinear optical crystal is used to convert two (or three) wavelengths among three distributed light so as to correspond to the directions of three axes. Convert by. Next, each light is combined into a single light by an optical combiner, and the combined single light is input to one optical fiber. This is essentially based on the same principle as the well-known WDM (optical wavelength division multiplexing) used for communication purposes.
And about the light transmitted by this one optical fiber, the light intensity of each wavelength is analyzed with a single measuring device. For this analysis, a known optical analyzer such as an optical spectrum analyzer is used.
By combining the above configuration (1) and configuration (2), high-speed and simple multi-axis measurement by the optical sensor is realized.

FIG. 3 is a diagram showing Example 1 for the configuration (A). FIG. 4A is a top view of the probe of this embodiment as viewed from above, and shows a state where each optical element is developed. FIG. 2B is a side view of the probe in FIG. Arrows in FIG. 5B represent light and the traveling direction thereof.
In the figure, the probe 10 of the optical sensor according to the present example converts a polarization plane holding fiber 11 that can transmit light while maintaining a polarization state, and linearly polarized light transmitted by the polarization plane holding fiber 11 into light in three directions orthogonal to each other. The orthogonal three-way light distribution prism 12 to be distributed, the magneto-optical crystals 13a to 13c provided corresponding to the three directions distributed by the orthogonal three-way light distribution prism 12, and transmitting the distributed light, and the respective magneto-optics The prisms 14a to 14c provided corresponding to the crystals 13a to 13c and changing the light transmission direction, and the light provided corresponding to the prisms 14a to 14c and transmitted through the prism are converted into light having an intensity corresponding to the polarization direction. And analyzers 15a to 15c. That is, the light whose polarization state has been changed by the three magneto-optical crystals 13a to 13c is incident on the analyzers 15a to 15c acting as intensity conversion means while maintaining the polarization state, and has an intensity corresponding to each polarization state. Converted to light.

  In such a configuration, the linearly polarized light is divided into three by the polarization maintaining orthogonal three-way light distribution prism 12 disposed at the probe tip portion. In this example, the light from right above is distributed by the prism 12 in an obliquely upward direction. Then, this is rotated in accordance with the electromagnetic field strength by the magneto-optical crystals 13 a to 13 c arranged on the three surfaces of the prism 12. After the magneto-optical crystals 13a to 13c, the analyzers 15a to 15c are arranged via the prisms 14a to 14c, thereby performing intensity conversion according to the applied electromagnetic field information. In this embodiment, only the prisms 14a to 14c are provided between the optical crystal and the analyzer, and no optical fiber is provided, so that the polarization can be stabilized.

FIG. 4 is a diagram showing Example 2 for the configuration (A). FIG. 4A is a top view of the probe of this embodiment as viewed from above, and shows a state where each optical element is developed. FIG. 2B is a side view of the probe in FIG. Arrows in FIG. 5B represent light and the traveling direction thereof.
In the first embodiment, the light from right above is divided into three in the diagonally upward direction by the prism 12, but the light from right above is divided into three in the diagonally downward direction in the probe 10 of the second embodiment. For this reason, magneto-optic crystals 13 a to 13 c and prisms 14 a to 14 c are provided obliquely below the prism 12. The arrangement of the analyzers 15a to 15c is the same as that in the first embodiment.
In the first embodiment, since the prism 12 is provided at the lower end portion of the probe, no means for supporting it is required. However, in the second embodiment, the prism 12 is provided at a position other than the lower end portion of the probe, so that it is supported. Means are needed.

FIG. 5 is a diagram showing Example 3 of the configuration (A). FIG. 4A is a top view of the probe of this embodiment as viewed from above, and shows a state where each optical element is developed. FIG. 2B is a side view of the probe in FIG. Arrows in FIG. 5B represent light and the traveling direction thereof.
The probe 10 of Example 3 shown in the figure has a configuration in which wavelength conversion elements 16a to 16c such as nonlinear optical crystals are arranged immediately after the analyzers 15a to 15c of Example 1 above. Thereby, the light whose polarization state has changed is incident on the wavelength conversion elements 16a to 16c in the polarization state. In addition, this structure is the structure which has arrange | positioned the conversion element for performing the wavelength conversion mentioned later in a probe.

FIG. 6 is a diagram showing Example 4 of the configuration (A). FIG. 4A is a top view of the probe of this embodiment as viewed from above, and shows a state where each optical element is developed. FIG. 2B is a side view of the probe in FIG. Arrows in FIG. 5B represent light and the traveling direction thereof.
The probe 10 of Example 4 shown in the figure has a configuration in which wavelength conversion elements 16a to 16c are arranged immediately after the analyzers 15a to 15c of Example 2. Thereby, the light whose polarization state has changed is incident on the wavelength conversion elements 16a to 16c in the polarization state. In addition, this structure is the structure which has arrange | positioned the conversion element for performing the wavelength conversion mentioned later in a probe.

FIG. 7 is a diagram showing Example 5 for the configuration (B). FIG. 4A is a top view of the probe of this embodiment as viewed from above, and shows a state where each optical element is developed. FIG. 2B is a side view of the probe in FIG. Arrows in FIG. 5B represent light and the traveling direction thereof.
In the same figure, the probe 10 of the optical sensor according to the present example is configured to include polarization plane maintaining fibers 11a to 11c capable of transmitting light while maintaining a polarization state, and before entering linearly polarized light into the probe, In addition, the linearly polarized light is divided into three by an optical coupler (Optical coupler) provided separately. The three distributed linearly polarized light is transmitted by the polarization plane holding fibers 11a to 11c, and a polarization maintaining multi-directional light reflecting prism (input: parallel light three component, output: orthogonal light 3) provided at the tip of the probe. Component) 17. The polarization-maintaining multi-directional light reflecting prism 17 has an action of reflecting light from directly above obliquely upward and in three orthogonal directions.

FIG. 8 is a diagram showing Example 6 for the configuration (B). FIG. 4A is a top view of the probe of this embodiment as viewed from above, and shows a state where each optical element is developed. FIG. 2B is a side view of the probe in FIG. Arrows in FIG. 5B represent light and the traveling direction thereof.
In the fifth embodiment, the light from right above is divided into three in the diagonally upward direction by the prism 17, but the light from right above is divided into three in the diagonally downward direction in the probe 10 of the sixth embodiment. For this reason, magneto-optical crystals 13 a to 13 c and prisms 14 a to 14 c are provided obliquely below the prism 17. The arrangement of the analyzers 15a to 15c is the same as that in the fifth embodiment.
In the fifth embodiment, since the prism 17 is provided at the lower end of the probe, no means for supporting it is required. However, in the sixth embodiment, the prism 17 is provided at a position other than the lower end of the probe. A means to support is necessary.

FIG. 9 is a diagram showing Example 7 for the configuration (B). FIG. 4A is a top view of the probe of this embodiment as viewed from above, and shows a state where each optical element is developed. FIG. 2B is a side view of the probe in FIG. Arrows in FIG. 5B represent light and the traveling direction thereof.
The probe 10 of Example 7 shown in the figure has a configuration in which wavelength conversion elements 16a to 16c are arranged immediately after the analyzers 15a to 15c of Example 5. Thereby, the light whose polarization state has changed is incident on the wavelength conversion elements 16a to 16c in the polarization state. In addition, this structure is a structure which has arrange | positioned the wavelength conversion element for performing the wavelength conversion mentioned later in a probe.

FIG. 10 is a diagram showing Example 8 for the configuration (B). FIG. 4A is a top view of the probe of this embodiment as viewed from above, and shows a state where each optical element is developed. FIG. 2B is a side view of the probe in FIG. Arrows in FIG. 5B represent light and the traveling direction thereof.
The probe 10 of Example 8 shown in the figure has a configuration in which wavelength conversion elements 16a to 16c are arranged immediately after the analyzers 15a to 15c of Example 6. Thereby, the light whose polarization state has changed is incident on the wavelength conversion elements 16a to 16c in the polarization state. In addition, this structure is a structure which has arrange | positioned the wavelength conversion element for performing the wavelength conversion mentioned later in a probe.

FIG. 11 is a block diagram showing Example 9 for the configuration (2). In the figure, the electromagnetic wave measuring apparatus of the present embodiment employs the probe 10 (the first embodiment or the second embodiment) having the configuration (A). A wavelength conversion element 26 such as a nonlinear optical crystal and a light combiner 27 are provided on the output side of the probe 10.
In such a configuration, the optical signals corresponding to the three axes output from the probe 10 are subjected to wavelength conversion by the wavelength conversion element 26 that converts light having different wavelengths, and then the optical analysis device via the optical synthesizer 27. A single light is incident on 24.

FIG. 12 is a block diagram showing Example 10 for the configuration (2). In the figure, the probe 10 (the third embodiment or the fourth embodiment) having the configuration (A) is adopted, and the wavelength conversion element 26 of the ninth embodiment is mounted in the probe 10.
In such a configuration, the wavelength conversion element 26 in the probe 10 performs wavelength conversion for converting the optical signals corresponding to the three axes into light having different wavelengths, and then passes to the optical analysis device 24 via the optical synthesizer 27. A single light is incident.

FIG. 13 is a block diagram showing Example 11 for the configuration (2). In the figure, the electromagnetic wave measuring apparatus according to the present embodiment employs the probe 10 having the configuration (B) (the fifth embodiment or the sixth embodiment). A polarization maintaining optical coupler 28 is provided on the input side of the probe 10. A wavelength conversion element 26 and a light combiner 27 are provided on the output side of the probe 10.
In such a configuration, the light divided into three by the polarization maintaining optical coupler 28 enters the probe 10. The optical signals corresponding to the three axes output from the probe 10 are subjected to wavelength conversion by the wavelength conversion element 26 that converts the light into different wavelengths, and then the signal is transmitted to the optical analysis device 24 via the optical combiner 27. Of light.

FIG. 14 is a block diagram showing Example 11 for the configuration (2). In the figure, the probe 10 (the seventh embodiment or the eighth embodiment) having the configuration (B) is employed, and the wavelength conversion element 26 of the ninth embodiment is mounted in the probe 10.
In such a configuration, the light divided into three by the polarization maintaining optical coupler 28 enters the probe 10. Then, the wavelength conversion element 26 in the probe 10 performs wavelength conversion for converting the optical signals corresponding to the three axes into light having different wavelengths, and then passes the single light to the optical analyzer 24 via the optical combiner 27. Is incident.

  FIG. 15 is a block diagram showing the configuration of Embodiment 13 of the electromagnetic wave measuring apparatus according to the present invention. The present embodiment is configured to simultaneously measure electromagnetic waves at a plurality of locations by the probe array 100 provided with a plurality of probes 10 in the eleventh embodiment. For this reason, it is necessary to change the number of distribution of the optical coupler 28, convert the output light from each probe into light of different wavelengths in the wavelength conversion element 26, and further change the number of synthesis by the optical combiner 27. . As described above, by adopting a configuration in which the probes 10 are arrayed and increasing the number of optical multiplexing, it is possible to simultaneously measure the electromagnetic fields at a plurality of locations with a single measuring device. That is, if the probes are arranged in a straight line, the electromagnetic field at the position along the straight line can be measured with a high-speed and simple device. In addition, if the probes are arranged three-dimensionally, a spatial electromagnetic field can be measured with a high-speed and simple device.

(Summary)
By using the electromagnetic wave measuring apparatus and the electromagnetic wave measuring probe described above, light from a single direction is distributed in directions corresponding to the three axes, and the light of each component reflecting the added electromagnetic field information is wavelength. Measurement can be performed with a single receiver after conversion, and speeding up and simplification of three-axis simultaneous measurement of an electromagnetic field by an optical crystal can be realized. In addition, by using the above-described probe array for measuring electromagnetic waves and performing wavelength division multiplexing, not only three-axis simultaneous measurement but also the construction of an optical sensor array can be measured by a single receiver. The device can be greatly simplified.

  The present invention can be used when measuring an electromagnetic field in the vicinity of a mobile phone terminal or the like.

It is a block diagram which shows the structure of the electromagnetic wave measuring apparatus which has the probe for electromagnetic wave measurement using an optical crystal. It is a figure which shows the structure of the probe for electromagnetic wave measurement used for the electromagnetic wave measuring apparatus which is not the structure of 3 axis | shaft simultaneous measurement. It is a figure which shows the structure of Example 1 about the probe for electromagnetic waves measurement. It is a figure which shows the structure of Example 2 about the probe for electromagnetic waves measurement. It is a figure which shows the structure of Example 3 about the probe for electromagnetic waves measurement. It is a figure which shows the structure of Example 4 about the probe for electromagnetic waves measurement. It is a figure which shows the structure of Example 5 about the probe for electromagnetic wave measurement. It is a figure which shows the structure of Example 6 about the probe for electromagnetic waves measurement. It is a figure which shows the structure of Example 7 about the probe for electromagnetic waves measurement. It is a figure which shows the structure of Example 8 about the probe for electromagnetic wave measurement. It is a figure which shows the structure of Example 9 about a measurement system. It is a figure which shows the structure of Example 10 about a measurement system. It is a figure which shows the structure of Example 11 about a measurement system. It is a figure which shows the structure of Example 12 about a measurement system. It is a figure which shows the structure of Example 13 about a measurement system.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 Probe 11, 11a-11c Polarization plane holding fiber 12, 14a-14c, 17, 111, 121 Prism 13, 13a-13c Magneto-optic crystal 15, 15a-15c Analyzer 16a-16c Wavelength conversion element 20 Measuring object 21 LD
22 Polarization Controller 23 Power Supply 24 Optical Analysis Device 26 Wavelength Conversion Element 27 Optical Synthesizer 28 Polarization-Maintaining Optical Coupler 100 Probe Array 110, 120 Optical Fiber

Claims (8)

  An electromagnetic wave measuring apparatus that measures magnetic field strength in three directions orthogonal to each other using an optical element whose polarization state of transmitted light changes according to an applied magnetic field, and is provided corresponding to each of the three directions. The three optical elements, incident light generating means for generating incident light to each of the three optical elements, and light whose polarization state has been changed by the three optical elements are respectively incident in the polarization state. Intensity conversion means for converting the light into intensity according to the polarization state; wavelength conversion means for converting the light whose intensity has been converted by the intensity conversion means corresponding to the three optical elements into light having different wavelengths; and A wavelength division multiplexing means for performing wavelength division multiplexing on the lights converted to different wavelengths by the wavelength conversion means; and a multiplexed output of the wavelength division multiplexing means. Electromagnetic wave measuring apparatus comprising a photoelectric conversion means for converting.   2. The electromagnetic wave measuring apparatus according to claim 1, wherein the incident light generating means is a polarization-maintaining optical coupler that distributes light from a light source as linearly polarized light and makes it incident on each of the three optical elements.   The electromagnetic wave measuring apparatus according to claim 1, wherein the incident light generation unit is a prism that distributes a single light from a light source and causes the light to enter each of the three optical elements. at least,
Three optical elements provided corresponding to the three directions, respectively, and light whose polarization state has been changed by the three optical elements are incident as they are in the polarization state, and light having an intensity corresponding to each polarization state is incident. Intensity converting means for converting;
The electromagnetic wave measuring apparatus according to any one of claims 1 to 3, wherein the two are integrally configured as an electromagnetic wave measuring probe.   The electromagnetic wave measuring apparatus according to claim 4, comprising a plurality of the electromagnetic wave measuring probes.   An electromagnetic wave measurement probe that measures the magnetic field strength in three directions orthogonal to each other using an optical element whose polarization state of transmitted light changes according to the applied magnetic field, and is provided corresponding to each of the three directions. The three optical elements obtained, and the intensity conversion means for allowing the light whose polarization state has been changed by the three optical elements to enter the polarization state as it is and to convert the light into light having an intensity corresponding to each polarization state; An electromagnetic wave measurement probe comprising: wavelength conversion means for converting the output light of the intensity conversion means corresponding to one optical element into mutually different wavelengths.   7. The electromagnetic wave measurement device according to claim 6, further comprising light distribution means for distributing single incident light to light corresponding to each of the three optical elements and causing the light to enter each of the three optical elements. probe.   8. An electromagnetic wave measurement probe array comprising a plurality of the electromagnetic wave measurement probes according to claim 6 or 7, wherein wavelengths converted by the wavelength conversion means provided in each of the electromagnetic wave measurement probes are different from each other.

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