JP2006201173A5 - - Google Patents

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Publication number
JP2006201173A5
JP2006201173A5 JP2006009901A JP2006009901A JP2006201173A5 JP 2006201173 A5 JP2006201173 A5 JP 2006201173A5 JP 2006009901 A JP2006009901 A JP 2006009901A JP 2006009901 A JP2006009901 A JP 2006009901A JP 2006201173 A5 JP2006201173 A5 JP 2006201173A5
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JP
Japan
Prior art keywords
window period
data
dut
receiver
stopping
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006009901A
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English (en)
Japanese (ja)
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JP2006201173A (ja
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Publication date
Priority claimed from US11/038,345 external-priority patent/US7088088B1/en
Application filed filed Critical
Publication of JP2006201173A publication Critical patent/JP2006201173A/ja
Publication of JP2006201173A5 publication Critical patent/JP2006201173A5/ja
Pending legal-status Critical Current

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JP2006009901A 2005-01-19 2006-01-18 パルスドｒｆネットワーク測定を行うためのトリガ型狭帯域方法 Pending JP2006201173A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/038,345 US7088088B1 (en) 2005-01-19 2005-01-19 Triggered narrow-band method for making pulsed-RF networking measurements

Publications (2)

Publication Number Publication Date
JP2006201173A JP2006201173A (ja) 2006-08-03
JP2006201173A5 true JP2006201173A5 (enExample) 2009-03-05

Family

ID=36683209

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006009901A Pending JP2006201173A (ja) 2005-01-19 2006-01-18 パルスドｒｆネットワーク測定を行うためのトリガ型狭帯域方法

Country Status (2)

Country Link
US (1) US7088088B1 (enExample)
JP (1) JP2006201173A (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7623989B2 (en) * 2005-09-29 2009-11-24 Agilent Technologies, Inc. System and method for pulsed signal device characterization utilizing an adaptive matched filterbank
US7720137B2 (en) * 2006-10-18 2010-05-18 Tektronix, Inc. Characterization of a frequency response for a frequency translation device
JP4110196B1 (ja) 2007-07-24 2008-07-02 株式会社アドバンテスト 波形発生装置、波形生成装置、試験装置およびプログラム
JP4110197B1 (ja) 2007-07-24 2008-07-02 株式会社アドバンテスト 波形発生装置、波形生成装置、試験装置およびプログラム
US20090167323A1 (en) * 2007-12-31 2009-07-02 Shoulders Robert E Dynamic Range Recovery for Pulse-Modulated Measurements
JP5235078B2 (ja) * 2008-02-01 2013-07-10 株式会社アドバンテスト 波形発生装置、波形生成装置、試験装置およびプログラム
US20100060507A1 (en) * 2008-09-09 2010-03-11 Lockheed Martin Corporation Electronic warfare receiver having digital antenna
JP2010282516A (ja) * 2009-06-05 2010-12-16 Fujitsu Ltd 電磁界シミュレーション装置、電磁界シミュレーションプログラムおよび近傍界測定装置
US9602225B2 (en) 2011-06-28 2017-03-21 Keysight Technologies, Inc. Impairment compensation
US9667358B2 (en) 2011-06-28 2017-05-30 Keysight Technologies, Inc. Impairment compensation
FR2994276B1 (fr) * 2012-08-06 2014-09-05 Commissariat Energie Atomique Procede de mesure de parametres s en mode pulse
US9395407B2 (en) * 2014-04-03 2016-07-19 X-Com Systems, Llc Enhanced dynamic range RF pulse measurement system
PT109137B (pt) * 2016-02-04 2020-08-10 INSTITUTO POLITéCNICO DE LEIRIA Transmissor sem fios para cancelamento de onda estacionária, recetor, sistema e respetivo método
US11029402B2 (en) * 2016-03-07 2021-06-08 The University Of Vermont And State Agricultural College Wideband ground penetrating radar system and method
US11442098B2 (en) * 2019-06-20 2022-09-13 Teradyne, Inc. Generating a waveform based on digital pulses
US10805015B1 (en) * 2020-02-21 2020-10-13 Rohde & Schwarz Gmbh & Co. Kg Method as well as test system for testing a device under test
JP2023156195A (ja) * 2022-04-12 2023-10-24 富士通株式会社 シミュレーションプログラム、シミュレーション方法、およびシミュレーション装置
US20250283754A1 (en) * 2024-03-11 2025-09-11 Teradyne, Inc. System for testing light sources

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0237731B2 (ja) * 1981-07-28 1990-08-27 Tokyo Shibaura Electric Co Shingoshorisochi
JPH0648284B2 (ja) * 1986-10-20 1994-06-22 アンリツ株式会社 伝達特性測定装置
US5059915A (en) * 1989-12-01 1991-10-22 Wiltron Company Vector network analyzer RF pulse profiling method and apparatus
JP3942790B2 (ja) * 2000-02-24 2007-07-11 アンリツ株式会社 信号分析装置

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