JP2006201173A - パルスドｒｆネットワーク測定を行うためのトリガ型狭帯域方法 - Google Patents

パルスドｒｆネットワーク測定を行うためのトリガ型狭帯域方法 Download PDF

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Publication number
JP2006201173A
JP2006201173A JP2006009901A JP2006009901A JP2006201173A JP 2006201173 A JP2006201173 A JP 2006201173A JP 2006009901 A JP2006009901 A JP 2006009901A JP 2006009901 A JP2006009901 A JP 2006009901A JP 2006201173 A JP2006201173 A JP 2006201173A
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Japan
Prior art keywords
pulse
data
receiver
dut
pulsed
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JP2006009901A
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Japanese (ja)
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JP2006201173A5 (enExample
Inventor
Michael S Marzalek
マイケル・エス・マーザレック
David J Ballo
デイヴィッド・ジェイ・バロ
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Agilent Technologies Inc
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Agilent Technologies Inc
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Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2006201173A publication Critical patent/JP2006201173A/ja
Publication of JP2006201173A5 publication Critical patent/JP2006201173A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2006009901A 2005-01-19 2006-01-18 パルスドｒｆネットワーク測定を行うためのトリガ型狭帯域方法 Pending JP2006201173A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/038,345 US7088088B1 (en) 2005-01-19 2005-01-19 Triggered narrow-band method for making pulsed-RF networking measurements

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JP2006201173A true JP2006201173A (ja) 2006-08-03
JP2006201173A5 JP2006201173A5 (enExample) 2009-03-05

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JP2006009901A Pending JP2006201173A (ja) 2005-01-19 2006-01-18 パルスドｒｆネットワーク測定を行うためのトリガ型狭帯域方法

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US (1) US7088088B1 (enExample)
JP (1) JP2006201173A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009031253A (ja) * 2008-02-01 2009-02-12 Advantest Corp 波形発生装置、波形生成装置、試験装置およびプログラム
US7885776B2 (en) 2007-07-24 2011-02-08 Advantest Corporation Waveform generator, waveform generating device, test apparatus, and machine readable medium storing a program thereof
US8060327B2 (en) 2007-07-24 2011-11-15 Advantest Corporation Waveform generator, waveform generating device, test apparatus, and machine readable medium storing a program thereof

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7623989B2 (en) * 2005-09-29 2009-11-24 Agilent Technologies, Inc. System and method for pulsed signal device characterization utilizing an adaptive matched filterbank
US7720137B2 (en) * 2006-10-18 2010-05-18 Tektronix, Inc. Characterization of a frequency response for a frequency translation device
US20090167323A1 (en) * 2007-12-31 2009-07-02 Shoulders Robert E Dynamic Range Recovery for Pulse-Modulated Measurements
US20100060507A1 (en) * 2008-09-09 2010-03-11 Lockheed Martin Corporation Electronic warfare receiver having digital antenna
JP2010282516A (ja) * 2009-06-05 2010-12-16 Fujitsu Ltd 電磁界シミュレーション装置、電磁界シミュレーションプログラムおよび近傍界測定装置
US9602225B2 (en) 2011-06-28 2017-03-21 Keysight Technologies, Inc. Impairment compensation
US9667358B2 (en) 2011-06-28 2017-05-30 Keysight Technologies, Inc. Impairment compensation
FR2994276B1 (fr) * 2012-08-06 2014-09-05 Commissariat Energie Atomique Procede de mesure de parametres s en mode pulse
US9395407B2 (en) * 2014-04-03 2016-07-19 X-Com Systems, Llc Enhanced dynamic range RF pulse measurement system
PT109137B (pt) * 2016-02-04 2020-08-10 INSTITUTO POLITéCNICO DE LEIRIA Transmissor sem fios para cancelamento de onda estacionária, recetor, sistema e respetivo método
US11029402B2 (en) * 2016-03-07 2021-06-08 The University Of Vermont And State Agricultural College Wideband ground penetrating radar system and method
US11442098B2 (en) * 2019-06-20 2022-09-13 Teradyne, Inc. Generating a waveform based on digital pulses
US10805015B1 (en) * 2020-02-21 2020-10-13 Rohde & Schwarz Gmbh & Co. Kg Method as well as test system for testing a device under test
JP2023156195A (ja) * 2022-04-12 2023-10-24 富士通株式会社 シミュレーションプログラム、シミュレーション方法、およびシミュレーション装置
US20250283754A1 (en) * 2024-03-11 2025-09-11 Teradyne, Inc. System for testing light sources

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5820037A (ja) * 1981-07-28 1983-02-05 Toshiba Corp 信号処理装置
JPS63101768A (ja) * 1986-10-20 1988-05-06 Anritsu Corp 伝達特性測定装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5059915A (en) * 1989-12-01 1991-10-22 Wiltron Company Vector network analyzer RF pulse profiling method and apparatus
JP3942790B2 (ja) * 2000-02-24 2007-07-11 アンリツ株式会社 信号分析装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5820037A (ja) * 1981-07-28 1983-02-05 Toshiba Corp 信号処理装置
JPS63101768A (ja) * 1986-10-20 1988-05-06 Anritsu Corp 伝達特性測定装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7885776B2 (en) 2007-07-24 2011-02-08 Advantest Corporation Waveform generator, waveform generating device, test apparatus, and machine readable medium storing a program thereof
US8060327B2 (en) 2007-07-24 2011-11-15 Advantest Corporation Waveform generator, waveform generating device, test apparatus, and machine readable medium storing a program thereof
JP2009031253A (ja) * 2008-02-01 2009-02-12 Advantest Corp 波形発生装置、波形生成装置、試験装置およびプログラム

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Publication number Publication date
US20060158174A1 (en) 2006-07-20
US7088088B1 (en) 2006-08-08

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