JP2006135087A5 - - Google Patents

Download PDF

Info

Publication number
JP2006135087A5
JP2006135087A5 JP2004322575A JP2004322575A JP2006135087A5 JP 2006135087 A5 JP2006135087 A5 JP 2006135087A5 JP 2004322575 A JP2004322575 A JP 2004322575A JP 2004322575 A JP2004322575 A JP 2004322575A JP 2006135087 A5 JP2006135087 A5 JP 2006135087A5
Authority
JP
Japan
Prior art keywords
mask
space
exposure apparatus
space defining
masks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004322575A
Other languages
Japanese (ja)
Other versions
JP2006135087A (en
JP5006513B2 (en
Filing date
Publication date
Application filed filed Critical
Priority to JP2004322575A priority Critical patent/JP5006513B2/en
Priority claimed from JP2004322575A external-priority patent/JP5006513B2/en
Publication of JP2006135087A publication Critical patent/JP2006135087A/en
Publication of JP2006135087A5 publication Critical patent/JP2006135087A5/ja
Application granted granted Critical
Publication of JP5006513B2 publication Critical patent/JP5006513B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Claims (11)

パターンを感光基板に転写する露光装置であって、
マスク面を境界とする空間を定義する空間定義部材とともに当該マスクを移動させるマスクステージと、
前記空間の圧力を制御する圧力制御器と、
複数の空間定義部材のうち露光処理に使用すべきマスクに適合した空間定義部材を当該マスクに組み合わせるための操作機構と、
を備え、前記圧力制御器によって前記空間の圧力を制御しながら、前記マスクステージに搭載されたマスクのパターンを感光基板に転写することを特徴とする露光装置。
An exposure apparatus for transferring a pattern to a photosensitive substrate,
A mask stage for moving the mask with space definition member that defines a space for the surface of the mask and the boundary,
A pressure controller for controlling the pressure in the space;
An operation mechanism for combining a space definition member suitable for a mask to be used for exposure processing among the plurality of space definition members with the mask;
An exposure apparatus for transferring a mask pattern mounted on the mask stage onto a photosensitive substrate while controlling the pressure in the space by the pressure controller.
複数のマスクを収容可能なストッカーを更に備え、
前記操作機構は、前記ストッカーから前記マスクステージにマスクを搬送する途中において、当該搬送に係るマスクに対して空間定義部材を組み合わせることを特徴とする請求項1に記載の露光装置。
It further includes a stocker that can accommodate a plurality of masks,
The operating mechanism, in the course of conveying the mask to the mask stage from the stocker, the exposure apparatus according to claim 1, wherein the combining space definition member with respect to the mask according to the transport.
前記マスクステージに一対のマスク及び空間定義部材が搬送された後に、前記空間定義部材に設けられた第1流路と前記マスクステージに設けられた第2流路とが接続され、前記第1及び第2流路を通じて前記圧力制御器が前記空間の圧力を制御可能になることを特徴とする請求項1又は請求項2に記載の露光装置。   After the pair of masks and the space defining member are transferred to the mask stage, a first flow path provided in the space defining member and a second flow path provided in the mask stage are connected, and the first and The exposure apparatus according to claim 1, wherein the pressure controller can control the pressure of the space through the second flow path. マスクを一時的に保持するバッファを更に備え、
前記操作機構は、露光処理の終了後に前記マスクステージに配置されている第1マスク及び第1空間定義部材を前記バッファに搬送し、その後、次に使用すべく所定位置に準備されている第2マスク及び第2空間定義部材を前記マスクステージに搬送することを特徴とする請求項に記載の露光装置。
A buffer that temporarily holds the mask;
The operating mechanism, the first mask and the first space definition member disposed on the mask stage after completion of the exposure process is transported to the buffer, then a second, which is prepared in a predetermined position in order to use then The exposure apparatus according to claim 1 , wherein the mask and the second space defining member are transported to the mask stage.
マスク及び空間定義部材を一時的に保持するバッファを更に備え、
前記操作機構は、露光処理の終了後に前記マスクステージに配置されている第1マスク及び第1空間定義部材を前記バッファに搬送した後に前記バッファによって保持されている前記第1空間定義部材を次に使用すべく前記所定位置に準備されている第2マスクに組み合わせ、次いで、前記所定位置に準備されている前記第2マスク及びそれに組み合わせられている前記第1空間定義部材を前記マスクステージに搬送することを特徴とする請求項に記載の露光装置。
A buffer that temporarily holds the mask and the space defining member;
The operating mechanism, then the first space definition member held by said buffer after the first mask and the first space definition member disposed on the mask stage after completion of the exposure process has been transported to the buffer Combined with the second mask prepared at the predetermined position for use, and then transports the second mask prepared at the predetermined position and the first space defining member combined therewith to the mask stage. The exposure apparatus according to claim 1 , wherein:
複数のマスク及び空間定義部材を収容可能なストッカーと、
次に使用すべきマスクを前記ストッカーから取り出して前記所定位置に配置する第2操作機構を更に備えることを特徴とする請求項4又は請求項5に記載の露光装置。
A stocker capable of accommodating a plurality of masks and space defining members;
An apparatus according to claim 4 or claim 5, characterized in that next further comprising a mask to be used is taken out from the stocker and a second operating mechanism disposed in the predetermined position.
前記ストッカーは、複数のマスクを収容する第1収容部と、複数の空間定義部材を収容する第2収容部とを含み、前記第2操作機構は、前記第1収容部から任意のマスクを取り出して、前記第2収容部に収容されている複数の空間定義部材のうちの1つと組み合わせ、その後、組み合わせに係る一対のマスク及び空間定義部材を前記所定位置に搬送するように駆動されることを特徴とする請求項6に記載の露光装置。   The stocker includes a first accommodating portion that accommodates a plurality of masks and a second accommodating portion that accommodates a plurality of space defining members, and the second operation mechanism takes out an arbitrary mask from the first accommodating portion. Combined with one of the plurality of space defining members accommodated in the second accommodating portion, and then driven to convey the pair of masks and the space defining member according to the combination to the predetermined position. The exposure apparatus according to claim 6, characterized in that: 空間定義部材を清浄化するクリーナを更に備えることを特徴とする請求項1乃至請求項7のいずれか1項に記載の露光装置。   The exposure apparatus according to claim 1, further comprising a cleaner that cleans the space defining member. 前記クリーナは、空間定義部材に付着している異物を検知するセンサと、空間定義部材に付着している異物を除去する異物除去機構とを含むことを特徴とする請求項8に記載の露光装置。   9. The exposure apparatus according to claim 8, wherein the cleaner includes a sensor that detects foreign matter adhering to the space defining member and a foreign matter removing mechanism that removes foreign matter adhering to the space defining member. . パターンを感光基板に転写する露光装置であって、
マスク面を境界とする空間を定義する空間定義部材とともに当該マスクを移動させるマスクステージと、
前記空間の圧力を制御する圧力制御器と、
複数のマスクを収容する第1収容部及び複数の空間定義部材を収容する第2収容部を含むストッカーと、
前記第1収容部から任意のマスクを取り出して、前記第2収容部に収容されている複数の空間定義部材のうちの1つと組み合わせ、その後、組み合わせに係る一対のマスク及び空間定義部材を前記マスクステージに搬送する操作機構と、
を備え、前記圧力制御器によって前記空間の圧力を制御しながら、前記マスクステージに搭載されたマスクのパターンを感光基板に転写することを特徴とする露光装置。
An exposure apparatus for transferring a pattern to a photosensitive substrate,
A mask stage for moving the mask with space definition member that defines a space for the surface of the mask and the boundary,
A pressure controller for controlling the pressure in the space;
A stocker including a first accommodating portion for accommodating a plurality of masks and a second accommodating portion for accommodating a plurality of space defining members;
An arbitrary mask is taken out from the first housing portion and combined with one of a plurality of space defining members housed in the second housing portion, and then a pair of masks and space defining members related to the combination are combined with the mask. An operating mechanism for conveying to the stage;
An exposure apparatus for transferring a mask pattern mounted on the mask stage onto a photosensitive substrate while controlling the pressure in the space by the pressure controller.
デバイス製造方法であって、
請求項1乃至請求項10のいずれか1項に記載の露光装置を使用して感光基板にマスクのパターンを転写する工程と、
パターンが転写された感光基板を現像処理する工程と、
を含むことを特徴とするデバイス製造方法。
A device manufacturing method comprising:
Transferring the mask pattern to the photosensitive substrate using the exposure apparatus according to claim 1;
Developing the photosensitive substrate to which the pattern has been transferred;
A device manufacturing method comprising:
JP2004322575A 2004-11-05 2004-11-05 Exposure apparatus and device manufacturing method Expired - Fee Related JP5006513B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004322575A JP5006513B2 (en) 2004-11-05 2004-11-05 Exposure apparatus and device manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004322575A JP5006513B2 (en) 2004-11-05 2004-11-05 Exposure apparatus and device manufacturing method

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2011024428A Division JP5295283B2 (en) 2011-02-07 2011-02-07 Exposure apparatus and device manufacturing method

Publications (3)

Publication Number Publication Date
JP2006135087A JP2006135087A (en) 2006-05-25
JP2006135087A5 true JP2006135087A5 (en) 2007-12-13
JP5006513B2 JP5006513B2 (en) 2012-08-22

Family

ID=36728363

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004322575A Expired - Fee Related JP5006513B2 (en) 2004-11-05 2004-11-05 Exposure apparatus and device manufacturing method

Country Status (1)

Country Link
JP (1) JP5006513B2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4794471B2 (en) * 2007-02-05 2011-10-19 株式会社日立ハイテクノロジーズ Exposure apparatus and method for exchanging top plate of negative pressure chamber of exposure apparatus
JP5252893B2 (en) * 2007-11-21 2013-07-31 キヤノン株式会社 Inspection apparatus, exposure apparatus, and device manufacturing method
JP5247375B2 (en) * 2008-11-25 2013-07-24 キヤノン株式会社 Exposure apparatus and device manufacturing method
JP2011060799A (en) * 2009-09-07 2011-03-24 Canon Inc Exposure apparatus, exposure method and device manufacturing method
JP5506555B2 (en) * 2010-06-11 2014-05-28 キヤノン株式会社 Foreign matter inspection apparatus, exposure apparatus using the same, and device manufacturing method
NL2014864B1 (en) 2015-05-27 2017-01-31 Suss Microtec Lithography Gmbh Device for treating a disc-shaped substrate and support adapter.
CN117238812B (en) * 2023-11-10 2024-04-05 四川省农业机械科学研究院 Substrate warp measuring device and measuring method

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02108329A (en) * 1988-10-17 1990-04-20 Matsushita Electric Ind Co Ltd Acoustic equipment
JP2787082B2 (en) * 1988-11-24 1998-08-13 株式会社ニコン Projection exposure apparatus, projection exposure method, and element manufacturing method
JPH02176752A (en) * 1988-12-28 1990-07-09 Toppan Printing Co Ltd Mask for exposure and its deflection preventive jig
JPH0318011A (en) * 1989-06-14 1991-01-25 Matsushita Electron Corp Reducing-projection exposure apparatus
JPH0729791A (en) * 1993-07-08 1995-01-31 Toshiba Corp Exposure system
JPH0882919A (en) * 1994-09-12 1996-03-26 Hitachi Ltd Photomask and exposure device using the same
JP2002033258A (en) * 2000-07-17 2002-01-31 Nikon Corp Aligner, mask apparatus, pattern protective apparatus, and method of manufacturing device
JP2002158153A (en) * 2000-11-16 2002-05-31 Canon Inc Aligner and method of replacing gas in pellicle space
JP2002372777A (en) * 2001-06-18 2002-12-26 Canon Inc Gas replacement method and exposure device
JP4340046B2 (en) * 2002-07-25 2009-10-07 株式会社日立ハイテクノロジーズ Mask plate fixing method of exposure apparatus and mask plate support device

Similar Documents

Publication Publication Date Title
JP4410121B2 (en) Coating and developing apparatus and coating and developing method
JP4830523B2 (en) Coating, developing apparatus, coating, developing method and computer program for carrying out the method.
JP2008135582A (en) Coating film formation equipment for immersion exposure, and method of forming coating film
JP2008135583A (en) Coating film formation equipment, and coating film formation method
KR102119360B1 (en) Substrate processing apparatus, film forming unit, substrate processing method and film forming method
JP2008198879A (en) Substrate processing apparatus
JP4926678B2 (en) Immersion exposure cleaning apparatus and cleaning method, and computer program and storage medium
JP7232596B2 (en) SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
JP2006024684A (en) Substrate collection method and substrate processing apparatus
JP2006135087A5 (en)
JP2007046859A (en) Reduced-pressure drying device
JP4813333B2 (en) Film forming method, film forming apparatus, pattern forming method, and computer-readable storage medium
JP2008244072A (en) Substrate processing method, substrate processor, and computer readable storage medium
JP2008153422A (en) Applying and developing device, and pattern forming method
JP5371605B2 (en) Vacuum drying apparatus and vacuum drying method
JP2008288447A (en) Substrate treating apparatus
JP2008198878A (en) Substrate processing apparatus
JP2011128646A5 (en)
JP2008103611A (en) Liquid treating device
JP2007173365A (en) System and method for processing application drying
JP2010045207A (en) Applying and developing device, conveying arm cleaning method for applying and developing device, and storage medium
JP2006253515A (en) Method and device for treating substrate
JP4872448B2 (en) Coating, developing device, coating, developing method and storage medium.
JP2010140960A (en) Heat treatment apparatus
KR100993234B1 (en) A high index liquid circulating system in a pattern forming apparatus