JP2006135087A5 - - Google Patents
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- JP2006135087A5 JP2006135087A5 JP2004322575A JP2004322575A JP2006135087A5 JP 2006135087 A5 JP2006135087 A5 JP 2006135087A5 JP 2004322575 A JP2004322575 A JP 2004322575A JP 2004322575 A JP2004322575 A JP 2004322575A JP 2006135087 A5 JP2006135087 A5 JP 2006135087A5
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- JP
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- Prior art keywords
- mask
- space
- exposure apparatus
- space defining
- masks
- Prior art date
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Claims (11)
マスクの面を境界とする空間を定義する空間定義部材とともに当該マスクを移動させるマスクステージと、
前記空間の圧力を制御する圧力制御器と、
複数の空間定義部材のうち露光処理に使用すべきマスクに適合した空間定義部材を当該マスクに組み合わせるための操作機構と、
を備え、前記圧力制御器によって前記空間の圧力を制御しながら、前記マスクステージに搭載されたマスクのパターンを感光基板に転写することを特徴とする露光装置。 An exposure apparatus for transferring a pattern to a photosensitive substrate,
A mask stage for moving the mask with space definition member that defines a space for the surface of the mask and the boundary,
A pressure controller for controlling the pressure in the space;
An operation mechanism for combining a space definition member suitable for a mask to be used for exposure processing among the plurality of space definition members with the mask;
An exposure apparatus for transferring a mask pattern mounted on the mask stage onto a photosensitive substrate while controlling the pressure in the space by the pressure controller.
前記操作機構は、前記ストッカーから前記マスクステージにマスクを搬送する途中において、当該搬送に係るマスクに対して空間定義部材を組み合わせることを特徴とする請求項1に記載の露光装置。 It further includes a stocker that can accommodate a plurality of masks,
The operating mechanism, in the course of conveying the mask to the mask stage from the stocker, the exposure apparatus according to claim 1, wherein the combining space definition member with respect to the mask according to the transport.
前記操作機構は、露光処理の終了後に前記マスクステージに配置されている第1マスク及び第1空間定義部材を前記バッファに搬送し、その後、次に使用すべく所定位置に準備されている第2マスク及び第2空間定義部材を前記マスクステージに搬送することを特徴とする請求項1に記載の露光装置。 A buffer that temporarily holds the mask;
The operating mechanism, the first mask and the first space definition member disposed on the mask stage after completion of the exposure process is transported to the buffer, then a second, which is prepared in a predetermined position in order to use then The exposure apparatus according to claim 1 , wherein the mask and the second space defining member are transported to the mask stage.
前記操作機構は、露光処理の終了後に前記マスクステージに配置されている第1マスク及び第1空間定義部材を前記バッファに搬送した後に前記バッファによって保持されている前記第1空間定義部材を次に使用すべく前記所定位置に準備されている第2マスクに組み合わせ、次いで、前記所定位置に準備されている前記第2マスク及びそれに組み合わせられている前記第1空間定義部材を前記マスクステージに搬送することを特徴とする請求項1に記載の露光装置。 A buffer that temporarily holds the mask and the space defining member;
The operating mechanism, then the first space definition member held by said buffer after the first mask and the first space definition member disposed on the mask stage after completion of the exposure process has been transported to the buffer Combined with the second mask prepared at the predetermined position for use, and then transports the second mask prepared at the predetermined position and the first space defining member combined therewith to the mask stage. The exposure apparatus according to claim 1 , wherein:
次に使用すべきマスクを前記ストッカーから取り出して前記所定位置に配置する第2操作機構とを更に備えることを特徴とする請求項4又は請求項5に記載の露光装置。 A stocker capable of accommodating a plurality of masks and space defining members;
An apparatus according to claim 4 or claim 5, characterized in that next further comprising a mask to be used is taken out from the stocker and a second operating mechanism disposed in the predetermined position.
マスクの面を境界とする空間を定義する空間定義部材とともに当該マスクを移動させるマスクステージと、
前記空間の圧力を制御する圧力制御器と、
複数のマスクを収容する第1収容部及び複数の空間定義部材を収容する第2収容部を含むストッカーと、
前記第1収容部から任意のマスクを取り出して、前記第2収容部に収容されている複数の空間定義部材のうちの1つと組み合わせ、その後、組み合わせに係る一対のマスク及び空間定義部材を前記マスクステージに搬送する操作機構と、
を備え、前記圧力制御器によって前記空間の圧力を制御しながら、前記マスクステージに搭載されたマスクのパターンを感光基板に転写することを特徴とする露光装置。 An exposure apparatus for transferring a pattern to a photosensitive substrate,
A mask stage for moving the mask with space definition member that defines a space for the surface of the mask and the boundary,
A pressure controller for controlling the pressure in the space;
A stocker including a first accommodating portion for accommodating a plurality of masks and a second accommodating portion for accommodating a plurality of space defining members;
An arbitrary mask is taken out from the first housing portion and combined with one of a plurality of space defining members housed in the second housing portion, and then a pair of masks and space defining members related to the combination are combined with the mask. An operating mechanism for conveying to the stage;
An exposure apparatus for transferring a mask pattern mounted on the mask stage onto a photosensitive substrate while controlling the pressure in the space by the pressure controller.
請求項1乃至請求項10のいずれか1項に記載の露光装置を使用して感光基板にマスクのパターンを転写する工程と、
パターンが転写された感光基板を現像処理する工程と、
を含むことを特徴とするデバイス製造方法。 A device manufacturing method comprising:
Transferring the mask pattern to the photosensitive substrate using the exposure apparatus according to claim 1;
Developing the photosensitive substrate to which the pattern has been transferred;
A device manufacturing method comprising:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004322575A JP5006513B2 (en) | 2004-11-05 | 2004-11-05 | Exposure apparatus and device manufacturing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004322575A JP5006513B2 (en) | 2004-11-05 | 2004-11-05 | Exposure apparatus and device manufacturing method |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011024428A Division JP5295283B2 (en) | 2011-02-07 | 2011-02-07 | Exposure apparatus and device manufacturing method |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2006135087A JP2006135087A (en) | 2006-05-25 |
JP2006135087A5 true JP2006135087A5 (en) | 2007-12-13 |
JP5006513B2 JP5006513B2 (en) | 2012-08-22 |
Family
ID=36728363
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004322575A Expired - Fee Related JP5006513B2 (en) | 2004-11-05 | 2004-11-05 | Exposure apparatus and device manufacturing method |
Country Status (1)
Country | Link |
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JP (1) | JP5006513B2 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4794471B2 (en) * | 2007-02-05 | 2011-10-19 | 株式会社日立ハイテクノロジーズ | Exposure apparatus and method for exchanging top plate of negative pressure chamber of exposure apparatus |
JP5252893B2 (en) * | 2007-11-21 | 2013-07-31 | キヤノン株式会社 | Inspection apparatus, exposure apparatus, and device manufacturing method |
JP5247375B2 (en) * | 2008-11-25 | 2013-07-24 | キヤノン株式会社 | Exposure apparatus and device manufacturing method |
JP2011060799A (en) * | 2009-09-07 | 2011-03-24 | Canon Inc | Exposure apparatus, exposure method and device manufacturing method |
JP5506555B2 (en) * | 2010-06-11 | 2014-05-28 | キヤノン株式会社 | Foreign matter inspection apparatus, exposure apparatus using the same, and device manufacturing method |
NL2014864B1 (en) | 2015-05-27 | 2017-01-31 | Suss Microtec Lithography Gmbh | Device for treating a disc-shaped substrate and support adapter. |
CN117238812B (en) * | 2023-11-10 | 2024-04-05 | 四川省农业机械科学研究院 | Substrate warp measuring device and measuring method |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02108329A (en) * | 1988-10-17 | 1990-04-20 | Matsushita Electric Ind Co Ltd | Acoustic equipment |
JP2787082B2 (en) * | 1988-11-24 | 1998-08-13 | 株式会社ニコン | Projection exposure apparatus, projection exposure method, and element manufacturing method |
JPH02176752A (en) * | 1988-12-28 | 1990-07-09 | Toppan Printing Co Ltd | Mask for exposure and its deflection preventive jig |
JPH0318011A (en) * | 1989-06-14 | 1991-01-25 | Matsushita Electron Corp | Reducing-projection exposure apparatus |
JPH0729791A (en) * | 1993-07-08 | 1995-01-31 | Toshiba Corp | Exposure system |
JPH0882919A (en) * | 1994-09-12 | 1996-03-26 | Hitachi Ltd | Photomask and exposure device using the same |
JP2002033258A (en) * | 2000-07-17 | 2002-01-31 | Nikon Corp | Aligner, mask apparatus, pattern protective apparatus, and method of manufacturing device |
JP2002158153A (en) * | 2000-11-16 | 2002-05-31 | Canon Inc | Aligner and method of replacing gas in pellicle space |
JP2002372777A (en) * | 2001-06-18 | 2002-12-26 | Canon Inc | Gas replacement method and exposure device |
JP4340046B2 (en) * | 2002-07-25 | 2009-10-07 | 株式会社日立ハイテクノロジーズ | Mask plate fixing method of exposure apparatus and mask plate support device |
-
2004
- 2004-11-05 JP JP2004322575A patent/JP5006513B2/en not_active Expired - Fee Related
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