JP2006064850A5 - - Google Patents

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Publication number
JP2006064850A5
JP2006064850A5 JP2004245313A JP2004245313A JP2006064850A5 JP 2006064850 A5 JP2006064850 A5 JP 2006064850A5 JP 2004245313 A JP2004245313 A JP 2004245313A JP 2004245313 A JP2004245313 A JP 2004245313A JP 2006064850 A5 JP2006064850 A5 JP 2006064850A5
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JP
Japan
Prior art keywords
stage
specimen
microscope
microwell plate
holding
Prior art date
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Granted
Application number
JP2004245313A
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English (en)
Japanese (ja)
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JP2006064850A (ja
JP4694166B2 (ja
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Application filed filed Critical
Priority to JP2004245313A priority Critical patent/JP4694166B2/ja
Priority claimed from JP2004245313A external-priority patent/JP4694166B2/ja
Publication of JP2006064850A publication Critical patent/JP2006064850A/ja
Publication of JP2006064850A5 publication Critical patent/JP2006064850A5/ja
Application granted granted Critical
Publication of JP4694166B2 publication Critical patent/JP4694166B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004245313A 2004-08-25 2004-08-25 顕微鏡検査システムとマイクロウェルプレート移載装置 Expired - Fee Related JP4694166B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004245313A JP4694166B2 (ja) 2004-08-25 2004-08-25 顕微鏡検査システムとマイクロウェルプレート移載装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004245313A JP4694166B2 (ja) 2004-08-25 2004-08-25 顕微鏡検査システムとマイクロウェルプレート移載装置

Publications (3)

Publication Number Publication Date
JP2006064850A JP2006064850A (ja) 2006-03-09
JP2006064850A5 true JP2006064850A5 (enExample) 2007-10-11
JP4694166B2 JP4694166B2 (ja) 2011-06-08

Family

ID=36111423

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004245313A Expired - Fee Related JP4694166B2 (ja) 2004-08-25 2004-08-25 顕微鏡検査システムとマイクロウェルプレート移載装置

Country Status (1)

Country Link
JP (1) JP4694166B2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5416919B2 (ja) * 2008-06-04 2014-02-12 川崎重工業株式会社 自動細胞培養装置
KR101085099B1 (ko) 2009-02-12 2011-11-21 에이피텍 주식회사 투과전자현미경 분석시료의 회전장치
JP2010261915A (ja) * 2009-05-11 2010-11-18 Olympus Corp 基板検査装置
JP6663555B2 (ja) * 2015-07-23 2020-03-13 澁谷工業株式会社 細胞立体構造物製造装置
WO2019224921A1 (ja) 2018-05-22 2019-11-28 株式会社日立ハイテクノロジーズ 分析装置
CN110133309B (zh) * 2019-05-07 2024-09-27 易普森智慧健康科技（深圳）有限公司 全自动检测设备
WO2025032646A1 (ja) * 2023-08-04 2025-02-13 株式会社島津製作所 サンプルプレート自動交換装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5754838A (en) * 1980-09-18 1982-04-01 Omron Tateisi Electronics Co Automatic specimen feeder
JPS62158414U (enExample) * 1986-03-28 1987-10-08
JPH04307366A (ja) * 1991-04-03 1992-10-29 Hitachi Ltd スライドガラス格納機構
JP4213262B2 (ja) * 1998-09-01 2009-01-21 シスメックス株式会社 検査装置
JP2003248176A (ja) * 2001-12-19 2003-09-05 Olympus Optical Co Ltd 顕微鏡画像撮影装置

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