JP2006059889A5 - - Google Patents

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Publication number
JP2006059889A5
JP2006059889A5 JP2004237899A JP2004237899A JP2006059889A5 JP 2006059889 A5 JP2006059889 A5 JP 2006059889A5 JP 2004237899 A JP2004237899 A JP 2004237899A JP 2004237899 A JP2004237899 A JP 2004237899A JP 2006059889 A5 JP2006059889 A5 JP 2006059889A5
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Japan
Prior art keywords
optical element
thin film
film
incident light
thickness
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JP2004237899A
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Japanese (ja)
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JP2006059889A (en
JP4498060B2 (en
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Priority to JP2004237899A priority Critical patent/JP4498060B2/en
Priority claimed from JP2004237899A external-priority patent/JP4498060B2/en
Publication of JP2006059889A publication Critical patent/JP2006059889A/en
Publication of JP2006059889A5 publication Critical patent/JP2006059889A5/ja
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Publication of JP4498060B2 publication Critical patent/JP4498060B2/en
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Claims (11)

入射光を反射する反射面に薄膜が成膜された光学素子であって、
前記反射面における前記入射光の入射角が大きくなるにしたがって前記薄膜の膜厚が小さくなるように成膜されていることを特徴とする光学素子。
An optical element in which a thin film is formed on a reflecting surface that reflects incident light,
Optical element characterized in that the thickness of the thin film is deposited on the small Kunar so as the incident angle of the incident light at the reflecting surface becomes larger.
入射光を反射する反射面に薄膜が成膜された光学素子であって、
前記光学素子の回転対称軸上の薄膜の膜厚が回転対称軸から離れた周辺部分薄膜の膜厚よりも大きいことを特徴とする光学素子。
An optical element in which a thin film is formed on a reflecting surface that reflects incident light,
Optical element film thickness of the thin film on the rotational symmetry axis of the optical element, being larger than the thickness of the thin film of the peripheral portion away from the axis of rotational symmetry.
前記膜厚の分布が、前記光学素子の回転対称軸を中心として回転対称であることを特徴とする請求項1又は請求項2に記載の光学素子。 The film thickness distributions, the optical element according to claim 1 or claim 2, wherein a rotational symmetric der Rukoto around the rotational symmetry axis of the optical element. 前記反射面に対する前記入射光の入射角が4°以上15°以下であることを特徴とする請求項1又は請求項2に記載の光学素子。   The optical element according to claim 1, wherein an incident angle of the incident light with respect to the reflecting surface is 4 ° or more and 15 ° or less. 前記薄膜が多層膜であることを特徴とする請求項1又は請求項2に記載の光学素子。   The optical element according to claim 1, wherein the thin film is a multilayer film. 前記多層膜が、シリコン層及びモリブデン層からなる2層を繰り返し積層して構成されていることを特徴とする請求項5に記載の光学素子。   6. The optical element according to claim 5, wherein the multilayer film is configured by repeatedly laminating two layers including a silicon layer and a molybdenum layer. 前記繰り返し数が40であることを特徴とする請求項6に記載の光学素子。   The optical element according to claim 6, wherein the number of repetitions is 40. 光源からの光でレチクルを照明する照明光学系と、
前記レチクルのパターンを基板上に投影する投影光学系とを備えた露光装置であって、
前記照明光学系又は前記投影光学系の少なくともいずれか一方が請求項1から請求項7のうちいずれか1項に記載の光学素子を有することを特徴とする露光装置。
An illumination optical system that illuminates the reticle with light from a light source;
An exposure apparatus comprising: a projection optical system that projects the reticle pattern onto a substrate;
An exposure apparatus, wherein at least one of the illumination optical system and the projection optical system includes the optical element according to any one of claims 1 to 7.
請求項8に記載の露光装置によって基板を露光する工程と、
露光された前記基板を現像する工程とを有するデバイスの製造方法。
Exposing the substrate with the exposure apparatus according to claim 8;
And developing the exposed substrate. A device manufacturing method.
入射光を反射する反射光学素子の反射面に薄膜を成膜する成膜方法であって、
前記反射面における前記入射光の入射角が大きくなるにしたがって前記薄膜の膜厚が小さくなるように成膜することを特徴とする成膜方法。
A film forming method for forming a thin film on a reflective surface of a reflective optical element that reflects incident light,
Deposition method characterized by depositing the film thickness is small Kunar so of the thin film according to the incident angle of the incident light at the reflecting surface becomes larger.
入射光を反射する反射光学素子の反射面に薄膜を成膜する成膜方法であって、
前記光学素子の回転対称軸上の薄膜の膜厚が回転対称軸から離れた周辺部分の薄膜の膜厚よりも大きくなるように成膜することを特徴とする成膜方法。
A film forming method for forming a thin film on a reflective surface of a reflective optical element that reflects incident light,
Film forming method thickness of the thin film on the rotational symmetry axis of the optical element, characterized in that deposited on the size Kunar so than the thickness of the thin film of the peripheral portion away from the axis of rotational symmetry.
JP2004237899A 2004-08-18 2004-08-18 Projection optical system, exposure apparatus, and optical element manufacturing method Expired - Fee Related JP4498060B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004237899A JP4498060B2 (en) 2004-08-18 2004-08-18 Projection optical system, exposure apparatus, and optical element manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004237899A JP4498060B2 (en) 2004-08-18 2004-08-18 Projection optical system, exposure apparatus, and optical element manufacturing method

Publications (3)

Publication Number Publication Date
JP2006059889A JP2006059889A (en) 2006-03-02
JP2006059889A5 true JP2006059889A5 (en) 2007-09-27
JP4498060B2 JP4498060B2 (en) 2010-07-07

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Family Applications (1)

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JP2004237899A Expired - Fee Related JP4498060B2 (en) 2004-08-18 2004-08-18 Projection optical system, exposure apparatus, and optical element manufacturing method

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Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1930771A1 (en) * 2006-12-04 2008-06-11 Carl Zeiss SMT AG Projection objectives having mirror elements with reflective coatings
KR101393999B1 (en) 2007-08-20 2014-05-14 칼 짜이스 에스엠티 게엠베하 Projection objective having mirror elements with reflective coatings
JP2010199503A (en) * 2009-02-27 2010-09-09 Nikon Corp Optical element, exposure apparatus, and device manufacturing method
DE102009047179B8 (en) 2009-11-26 2016-08-18 Carl Zeiss Smt Gmbh projection lens
WO2013146488A1 (en) * 2012-03-28 2013-10-03 Hoya株式会社 Method for manufacturing substrate provided with multilayer reflection film, method for manufacturing reflective mask blank, and method for manufacturing reflective mask
JP5746259B2 (en) * 2013-05-07 2015-07-08 カール・ツァイス・エスエムティー・ゲーエムベーハー Projection objective having a mirror element with a reflective coating

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2569447B2 (en) * 1988-11-28 1997-01-08 株式会社ニコン Manufacturing method of multilayer mirror
JP2002162566A (en) * 2000-11-27 2002-06-07 Nikon Corp Method for designing optical system, the optical system and projection aligner
EP1282011B1 (en) * 2001-08-01 2006-11-22 Carl Zeiss SMT AG Reflective projection lens for EUV photolithography
JP2003077805A (en) * 2001-09-03 2003-03-14 Nikon Corp Optical system manufacturing method and euv aligner

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