JP2006220903A5 - - Google Patents

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JP2006220903A5
JP2006220903A5 JP2005034108A JP2005034108A JP2006220903A5 JP 2006220903 A5 JP2006220903 A5 JP 2006220903A5 JP 2005034108 A JP2005034108 A JP 2005034108A JP 2005034108 A JP2005034108 A JP 2005034108A JP 2006220903 A5 JP2006220903 A5 JP 2006220903A5
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layer
optical
thickness
film
dielectric film
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JP2005034108A
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JP4785389B2 (en
JP2006220903A (en
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Claims (8)

基板上に、金属膜層と、1.351.55の屈折率を有する第1の誘電体膜と1.852.4の屈折率を有する第2の誘電体膜とを交互に前記金属膜層上に積層した誘電体膜層とから構成される9層以上の多層膜を有し、光を反射する反射ミラーであって、
前記金属膜層は、70nm以上の物理膜厚を有し、
前記誘電体膜層は、前記光の波長λに対して、前記基板側から順に、
(0.51)×λ/4の光学膜厚を有する第1の層と、
(23.5)×λ/4の光学膜厚を有する第2の層と、
(11.5)×λ/4の光学膜厚を有する第3の層と、
(11.8)×λ/4の光学膜厚を有する第4の層と、
(0.71.8)×λ/4の光学膜厚を有する第5の層と、
(1.31.5)×λ/4の光学膜厚を有する第6の層と、
(1.32)×λ/4の光学膜厚を有する第7の層と、
(0.91.5)×λ/4の光学膜厚を有する第8の層と、
(1.82.8)×λ/4の光学膜厚を有する第9の層と、
(0.10.5)×λ/4の光学膜厚を有する第10の層とを有することを特徴とする反射ミラー。
On the substrate, a metal film layer, a first dielectric film having a refractive index of 1.35 to 1.55 and a second dielectric film having a refractive index of 1.85 to 2.4 are alternately arranged. A reflection mirror having a multilayer film of nine or more layers composed of a dielectric film layer laminated on the metal film layer, and reflecting light;
The metal film layer has a physical film thickness of 70 nm or more,
The dielectric film layer is sequentially from the substrate side with respect to the wavelength λ of the light.
A first layer having a (0.5-1) optical film thickness of × λ / 4,
A second layer having an optical thickness of (2 to 3.5) × λ / 4;
A third layer having an optical thickness of (1 to 1.5) × λ / 4;
A fourth layer having an optical thickness of (1 to 1.8) × λ / 4;
A fifth layer having an optical thickness of (0.7 to 1.8) × λ / 4;
A sixth layer having an optical thickness of (1.3 to 1.5) × λ / 4;
A seventh layer having a (1.3-2) optical thickness of × λ / 4,
An eighth layer having an optical thickness of (0.9 to 1.5) × λ / 4;
A ninth layer having an optical thickness of (1.8 to 2.8) × λ / 4;
And a tenth layer having an optical film thickness of (0.1 to 0.5) × λ / 4.
基板上に、金属膜層と、1.351.55の屈折率を有する第1の誘電体膜と1.852.4の屈折率を有する第2の誘電体膜とを交互に前記金属膜層上に積層した誘電体膜層とから構成される9層以上の多層膜を有し、光を反射する反射ミラーであって、
前記金属膜層は、70nm以上の物理膜厚を有し、
前記誘電体膜層は、前記光の波長λに対して、前記基板側から順に、
(0.20.8)×λ/4の光学膜厚を有する第1の層と、
(2.43.0)×λ/4の光学膜厚を有する第2の層と、
(0.81.6)×λ/4の光学膜厚を有する第3の層と、
(11.8)×λ/4の光学膜厚を有する第4の層と、
(1.32)×λ/4の光学膜厚を有する第5の層と、
(0.71.3)×λ/4の光学膜厚を有する第6の層と、
(1.42.0)×λ/4の光学膜厚を有する第7の層と、
(1.11.7)×λ/4の光学膜厚を有する第8の層と、
(2.53.1)×λ/4の光学膜厚を有する第9の層とを有することを特徴とする反射ミラー。
On the substrate, a metal film layer, a first dielectric film having a refractive index of 1.35 to 1.55 and a second dielectric film having a refractive index of 1.85 to 2.4 are alternately arranged. A reflection mirror having a multilayer film of nine or more layers composed of a dielectric film layer laminated on the metal film layer, and reflecting light;
The metal film layer has a physical film thickness of 70 nm or more,
The dielectric film layer is sequentially from the substrate side with respect to the wavelength λ of the light.
A first layer having an optical film thickness of (0.2 to 0.8) × λ / 4;
A second layer having a (2.4 to 3.0) having an optical thickness of × λ / 4,
A third layer having an optical thickness of (0.8 to 1.6) × λ / 4;
A fourth layer having an optical thickness of (1 to 1.8) × λ / 4;
A fifth layer having a (1.3-2) optical thickness of × λ / 4,
A sixth layer having an optical thickness of (0.7 to 1.3) × λ / 4;
A seventh layer having an optical thickness of (1.4 to 2.0) × λ / 4;
An eighth layer having an optical film thickness of (1.1 to 1.7) × λ / 4;
And a ninth mirror having an optical film thickness of (2.5 to 3.1) × λ / 4.
基板上に、金属膜層と、1.351.55の屈折率を有する第1の誘電体膜と1.852.4の屈折率を有する第2の誘電体膜とを交互に前記金属膜層上に積層した誘電体膜層とから構成される9層以上の多層膜を有し、光を反射する反射ミラーであって、
前記金属膜層は、70nm以上の物理膜厚を有し、
前記誘電体膜層は、前記光の波長λに対して、前記基板側から順に、
(0.61)×λ/4の光学膜厚を有する第1の層と、
(0.61)×λ/4の光学膜厚を有する第2の層と、
(0.81.3)×λ/4の光学膜厚を有する第3の層と、
(0.81.3)×λ/4の光学膜厚を有する第4の層と、
(1.82.5)×λ/4の光学膜厚を有する第5の層と、
(23)×λ/4の光学膜厚を有する第6の層と、
(1.82.5)×λ/4の光学膜厚を有する第7の層と、
(0.71.3)×λ/4の光学膜厚を有する第8の層と、
(0.41)×λ/4の光学膜厚を有する第9の層と、
(0.10.5)×λ/4の光学膜厚を有する第10の層とを有することを特徴とする反射ミラー。
On the substrate, a metal film layer, a first dielectric film having a refractive index of 1.35 to 1.55 and a second dielectric film having a refractive index of 1.85 to 2.4 are alternately arranged. A reflection mirror having a multilayer film of nine or more layers composed of a dielectric film layer laminated on the metal film layer, and reflecting light;
The metal film layer has a physical film thickness of 70 nm or more,
The dielectric film layer is sequentially from the substrate side with respect to the wavelength λ of the light.
A first layer having a (0.6-1) optical film thickness of × λ / 4,
A second layer having a (0.6-1) optical film thickness of × λ / 4,
A third layer having an optical thickness of (0.8 to 1.3) × λ / 4;
A fourth layer having an optical thickness of (0.8 to 1.3) × λ / 4;
A fifth layer having a (1.8-2.5) optical thickness of × λ / 4,
A sixth layer having an optical thickness of (2 ~ 3) × λ / 4,
A seventh layer having an optical film thickness of (1.8 to 2.5) × λ / 4;
An eighth layer having an optical film thickness of (0.7 to 1.3) × λ / 4;
A ninth layer having (0.4-1) optical film thickness of × λ / 4,
And a tenth layer having an optical film thickness of (0.1 to 0.5) × λ / 4.
基板上に、金属膜層と、1.351.55の屈折率を有する第1の誘電体膜と1.852.4の屈折率を有する第2の誘電体膜とを交互に前記金属膜層上に積層した誘電体膜層とから構成される9層以上の多層膜を有し、光を反射する反射ミラーであって、
前記金属膜層は、70nm以上の物理膜厚を有し、
前記誘電体膜層は、前記光の波長λに対して、前記基板側から順に、
(0.61.3)×λ/4の光学膜厚を有する第1の層と、
(0.61.3)×λ/4の光学膜厚を有する第2の層と、
(0.20.8)×λ/4の光学膜厚を有する第3の層と、
(0.91.5)×λ/4の光学膜厚を有する第4の層と、
(1.82.4)×λ/4の光学膜厚を有する第5の層と、
(0.81.4)×λ/4の光学膜厚を有する第6の層と、
(0.20.8)×λ/4の光学膜厚を有する第7の層と、
(0.050.4)×λ/4の光学膜厚を有する第8の層とを有することを特徴とする反射ミラー。
On the substrate, a metal film layer, a first dielectric film having a refractive index of 1.35 to 1.55 and a second dielectric film having a refractive index of 1.85 to 2.4 are alternately arranged. A reflection mirror having a multilayer film of nine or more layers composed of a dielectric film layer laminated on the metal film layer, and reflecting light;
The metal film layer has a physical film thickness of 70 nm or more,
The dielectric film layer is sequentially from the substrate side with respect to the wavelength λ of the light.
A first layer having an optical film thickness of (0.6 to 1.3) × λ / 4;
A second layer having an optical film thickness of (0.6 to 1.3) × λ / 4;
A third layer having an optical thickness of (0.2 to 0.8) × λ / 4;
A fourth layer having an optical thickness of (0.9 to 1.5) × λ / 4;
A fifth layer having an optical film thickness of (1.8 to 2.4) × λ / 4;
A sixth layer having an optical thickness of (0.8 to 1.4) × λ / 4;
A seventh layer having an optical thickness of (0.2 to 0.8) × λ / 4;
And an eighth layer having an optical film thickness of (0.05 to 0.4) × λ / 4.
複数の光学素子を有し、
前記複数の光学素子のうち少なくとも一の光学素子は、請求項1〜4のうちいずれか一項記載の反射ミラーであることを特徴とする光学系。
Having a plurality of optical elements,
5. The optical system according to claim 1, wherein at least one of the plurality of optical elements is the reflecting mirror according to claim 1.
請求項1〜4のうちいずれか一項記載の反射ミラーを介して光を被処理体に照射して、当該被処理体を露光することを特徴とする露光装置。 An exposure apparatus that irradiates a target object with light through the reflecting mirror according to any one of claims 1 to 4 to expose the target object. レチクルのパターンを被処理体に露光する露光装置であって、
光源からの光で前記レチクルを照明する照明光学系と、
前記レチクルのパターンを前記被処理体に投影する投影光学系とを有し、
前記照明光学系及び前記投影光学系を構成する複数の光学素子のうち少なくとも一の光学素子は、請求項1〜4のうちいずれか一項記載の反射ミラーを有することを特徴とする露光装置。
An exposure apparatus that exposes a reticle pattern onto an object to be processed,
An illumination optical system that illuminates the reticle with light from a light source;
A projection optical system for projecting the reticle pattern onto the object to be processed;
The exposure apparatus according to claim 1, wherein at least one of the plurality of optical elements constituting the illumination optical system and the projection optical system includes the reflection mirror according to claim 1.
請求項又は記載の露光装置を用いて被処理体を露光するステップと、
露光された前記被処理体を現像するステップとを有することを特徴とするデバイス製造方法。
Exposing the object to be processed using the exposure apparatus according to claim 6 or 7 ,
And developing the exposed object to be processed.
JP2005034108A 2005-02-10 2005-02-10 Reflective mirror, exposure apparatus and device manufacturing method Expired - Fee Related JP4785389B2 (en)

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JP2006220903A JP2006220903A (en) 2006-08-24
JP2006220903A5 true JP2006220903A5 (en) 2008-03-27
JP4785389B2 JP4785389B2 (en) 2011-10-05

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JP5311757B2 (en) * 2007-03-29 2013-10-09 キヤノン株式会社 Reflective optical element, exposure apparatus, and device manufacturing method
JP2008257777A (en) * 2007-04-03 2008-10-23 Topcon Corp Optical component
US10067265B2 (en) 2010-10-12 2018-09-04 Toyota Motor Engineering & Manufacturing North America, Inc. Semi-transparent reflectors
JP2014086579A (en) * 2012-10-19 2014-05-12 Applied Materials Inc Reflective member for vacuum chamber
JP6236987B2 (en) 2013-08-23 2017-11-29 ミツミ電機株式会社 Optical scanning device and optical scanning unit

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JP2629693B2 (en) * 1987-02-26 1997-07-09 松下電器産業株式会社 Excimer laser mirror
JPH1031106A (en) * 1996-07-18 1998-02-03 Nikon Corp Laser mirror for multiwavelength
JP3976919B2 (en) * 1998-12-28 2007-09-19 日東光器株式会社 Reflection mirror
JP2001337462A (en) * 2000-05-26 2001-12-07 Nikon Corp Exposure device, method for manufacturing exposure device and method for manufacturing microdevice
JP2001338867A (en) * 2000-05-30 2001-12-07 Nikon Corp Lighting device, position-measuring device, and aligner and exposure method

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