JP2006005086A5 - - Google Patents

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Publication number
JP2006005086A5
JP2006005086A5 JP2004178471A JP2004178471A JP2006005086A5 JP 2006005086 A5 JP2006005086 A5 JP 2006005086A5 JP 2004178471 A JP2004178471 A JP 2004178471A JP 2004178471 A JP2004178471 A JP 2004178471A JP 2006005086 A5 JP2006005086 A5 JP 2006005086A5
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Japan
Prior art keywords
substrate
chamber
substrate processing
transfer
processed
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JP2004178471A
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Japanese (ja)
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JP4722416B2 (en
JP2006005086A (en
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Publication of JP2006005086A5 publication Critical patent/JP2006005086A5/ja
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Claims (1)

大気搬送室と、前記大気搬送室の一側に並列接続される真空気密可能な基板処理モジュールであって前記大気搬送室の一側に連通する前室及び該前室と連通する基板処理室から構成される複数の基板処理モジュールと、前記大気搬送室に備えられ大気搬送室を介して前記基板処理モジュール又は前記基板収納部に対して基板の搬送を行う1台の第1の基板搬送装置と、前記複数の基板処理モジュールを構成する複数の前室にそれぞれ備えられ、前室と基板処理室との間で基板を搬送する第2の基板搬送装置と、前記第1の基板搬送装置、第2の基板搬送装置、及び前記前室の圧力を制御する制御手段とを備えた半導体製造装置において、
前記制御手段は、
複数の基板処理モジュールの中で、基板処理室での処理が済んだ基板処理モジュールの該基板処理室から前記前室に処理済みの基板を搬送するよう前記第2の基板搬送装置を制御し、
前記処理済みの基板が前記前室に搬送されたことを検知すると、前記処理済みの基板が搬送された前室を真空圧から大気圧に復帰させるよう前記前室の圧力を制御するとともに、前記処理済み基板の搬送された前記基板処理モジュールに対して前記基板収納部から次の未処理基板の搬送を開始させるよう前記第1の基板搬送装置を制御するものであることを特徴とする半導体製造装置。
An atmospheric transfer chamber, a vacuum-tight substrate processing module connected in parallel to one side of the atmospheric transfer chamber, a front chamber communicating with one side of the atmospheric transfer chamber, and a substrate processing chamber communicating with the front chamber A plurality of substrate processing modules configured, and one first substrate transfer device provided in the atmospheric transfer chamber and configured to transfer a substrate to the substrate processing module or the substrate storage unit via the atmospheric transfer chamber; A second substrate transfer device that is provided in each of a plurality of front chambers that constitute the plurality of substrate processing modules, and that transfers a substrate between the front chamber and the substrate processing chamber; the first substrate transfer device; In a semiconductor manufacturing apparatus comprising: the substrate transfer device of 2; and a control means for controlling the pressure of the front chamber.
The control means includes
Controlling the second substrate transport device to transport the processed substrate from the substrate processing chamber of the substrate processing module processed in the substrate processing chamber to the front chamber among the plurality of substrate processing modules;
When detecting that the said processed substrate is transported to the front chamber, when the processed substrate to control the pressure in the front chamber so as to restore the pre-chamber which is conveyed to the atmospheric pressure from the vacuum pressure together, the The semiconductor manufacturing method is characterized in that the first substrate transfer device is controlled so that the substrate processing module to which the processed substrate is transferred starts transfer of the next unprocessed substrate from the substrate storage unit. apparatus.
JP2004178471A 2004-06-16 2004-06-16 Semiconductor manufacturing apparatus, substrate transfer method, and semiconductor device manufacturing method Active JP4722416B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004178471A JP4722416B2 (en) 2004-06-16 2004-06-16 Semiconductor manufacturing apparatus, substrate transfer method, and semiconductor device manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004178471A JP4722416B2 (en) 2004-06-16 2004-06-16 Semiconductor manufacturing apparatus, substrate transfer method, and semiconductor device manufacturing method

Publications (3)

Publication Number Publication Date
JP2006005086A JP2006005086A (en) 2006-01-05
JP2006005086A5 true JP2006005086A5 (en) 2007-07-26
JP4722416B2 JP4722416B2 (en) 2011-07-13

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JP2004178471A Active JP4722416B2 (en) 2004-06-16 2004-06-16 Semiconductor manufacturing apparatus, substrate transfer method, and semiconductor device manufacturing method

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JP (1) JP4722416B2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5369233B2 (en) * 2010-03-19 2013-12-18 パナソニック株式会社 Plasma processing apparatus and plasma processing method
JP5550600B2 (en) * 2011-04-13 2014-07-16 パナソニック株式会社 Plasma processing apparatus and plasma processing method
CN105742201B (en) * 2011-08-16 2018-07-27 应用材料公司 Method and apparatus for sensing substrate in chamber
US9478452B2 (en) 2013-02-20 2016-10-25 National Institute Of Advanced Industrial Science And Technology Small production device and production system using the same

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2641922B2 (en) * 1988-10-26 1997-08-20 東京エレクトロン株式会社 Processing equipment
JPH0427140A (en) * 1990-05-22 1992-01-30 Tokyo Electron Ltd Detector for processed body
JPH05294405A (en) * 1992-04-20 1993-11-09 Tel Varian Ltd Substrate detector
JPH1145929A (en) * 1997-05-30 1999-02-16 Sharp Corp Plasma processing device
JP3468056B2 (en) * 1997-09-23 2003-11-17 東京エレクトロン株式会社 Substrate detection device
JPH11195695A (en) * 1997-12-26 1999-07-21 Advanced Display Inc Electronic device manufacturing apparatus
JP4256551B2 (en) * 1998-12-25 2009-04-22 東京エレクトロン株式会社 Vacuum processing system
JP2002237507A (en) * 2000-12-08 2002-08-23 Tokyo Electron Ltd Processing system, and method for conveying element to be processed of the processing system

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