JP2005534040A - アダプティブ電圧監視 - Google Patents
アダプティブ電圧監視 Download PDFInfo
- Publication number
- JP2005534040A JP2005534040A JP2004528423A JP2004528423A JP2005534040A JP 2005534040 A JP2005534040 A JP 2005534040A JP 2004528423 A JP2004528423 A JP 2004528423A JP 2004528423 A JP2004528423 A JP 2004528423A JP 2005534040 A JP2005534040 A JP 2005534040A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- signal
- predetermined
- monitoring
- comparator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/1659—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16504—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed
- G01R19/16519—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed using FET's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16528—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values using digital techniques or performing arithmetic operations
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
Description
L 確定回路、ラッチ回路
1 監視ロジック
M 転送回路、マルチプレクサ
V、VDDP 監視電圧
A 評価ユニット
D 確定回路の入力
Claims (5)
- 所定数の電圧領域に対応する数の比較ユニット(CMP;CMP1〜CMP6)であって、入力電圧(VDDP)が該所定の電圧領域の内にある場合に、該入力電圧(VDDP)の値と基準電圧(Vref)とを比較し、所定の信号(S;S1L、S1H〜S3L、S3H)を出力する比較ユニットと、
該入力電圧が確定信号の供給の際にどの電圧領域にあるかを、該確定信号の供給によって確定する確定回路(L、L1〜L6)と、
該入力電圧が該確定信号の供給の際に該所定の電圧領域の外にある場合に、所定の信号(a;ah、al)を出力する監視ユニット(1、M;1、M1、M2)と、
を備える、電圧監視構成物。 - 各電圧領域のための前記比較ユニット内において、それぞれ、コンパレータ(CMP;CMP1〜CMP6)は、電圧上限および電圧下限のための、監視する電圧から分圧された電圧と、前記基準電圧(Vref)とを比較する、請求項1に記載の電圧監視構成物。
- 前記監視ユニット内において、検出された電圧領域のためのコンパレータ(CMP;CMP1〜CMP6)の前記出力信号を評価回路(A)に出力する転送回路(M;M1、M2)を備える、請求項2に記載の電圧監視構成物。
- 前記評価回路(A)は、前記コンパレータの前記出力信号を所定の時点のみに評価する、請求項3に記載の電圧監視構成物。
- 前記評価回路(A)は、第1の時点まで前記コンパレータの前記出力信号を基準値として格納し、所定の時間領域において該コンパレータの該出力信号と該基準値とを比較する、請求項4の電圧監視構成物。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10234181A DE10234181B3 (de) | 2002-07-26 | 2002-07-26 | Adaptive Spannungsüberwachung |
PCT/DE2003/002468 WO2004017078A1 (de) | 2002-07-26 | 2003-07-22 | Adaptive spannungsüberwachung |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005534040A true JP2005534040A (ja) | 2005-11-10 |
JP4057011B2 JP4057011B2 (ja) | 2008-03-05 |
Family
ID=31724049
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004528423A Expired - Fee Related JP4057011B2 (ja) | 2002-07-26 | 2003-07-22 | アダプティブ電圧監視 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7005894B2 (ja) |
EP (1) | EP1525485B1 (ja) |
JP (1) | JP4057011B2 (ja) |
DE (2) | DE10234181B3 (ja) |
TW (1) | TWI229189B (ja) |
WO (1) | WO2004017078A1 (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7849332B1 (en) | 2002-11-14 | 2010-12-07 | Nvidia Corporation | Processor voltage adjustment system and method |
US7886164B1 (en) | 2002-11-14 | 2011-02-08 | Nvidia Corporation | Processor temperature adjustment system and method |
US7882369B1 (en) | 2002-11-14 | 2011-02-01 | Nvidia Corporation | Processor performance adjustment system and method |
JP4296811B2 (ja) * | 2003-03-25 | 2009-07-15 | 株式会社デンソー | 物理量センサ装置 |
US7348836B1 (en) * | 2005-08-15 | 2008-03-25 | Nvidia Corporation | Integrated circuit core power supply event monitor |
US9134782B2 (en) | 2007-05-07 | 2015-09-15 | Nvidia Corporation | Maintaining optimum voltage supply to match performance of an integrated circuit |
US8370663B2 (en) | 2008-02-11 | 2013-02-05 | Nvidia Corporation | Power management with dynamic frequency adjustments |
US9256265B2 (en) | 2009-12-30 | 2016-02-09 | Nvidia Corporation | Method and system for artificially and dynamically limiting the framerate of a graphics processing unit |
US9830889B2 (en) | 2009-12-31 | 2017-11-28 | Nvidia Corporation | Methods and system for artifically and dynamically limiting the display resolution of an application |
US8839006B2 (en) | 2010-05-28 | 2014-09-16 | Nvidia Corporation | Power consumption reduction systems and methods |
FR3086763B1 (fr) | 2018-09-27 | 2021-04-23 | St Microelectronics Rousset | Surveillance de la valeur d'une tension continue par rapport a plusieurs niveaux de tension |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58118967A (ja) * | 1982-01-09 | 1983-07-15 | Mitsubishi Electric Corp | 電気量の状態変化検出装置 |
JPS60211370A (ja) * | 1984-04-05 | 1985-10-23 | Toshiba Corp | 電圧検出回路 |
US5598161A (en) * | 1992-12-18 | 1997-01-28 | Sony Corporation | Analog-to-digital converter having reduced circuit area |
FR2746987A1 (fr) * | 1996-03-29 | 1997-10-03 | Philips Electronics Nv | Convertisseur analogique/numerique a frequence d'echantillonnage elevee |
FR2749939B1 (fr) * | 1996-06-13 | 1998-07-31 | Sgs Thomson Microelectronics | Detecteur de gamme de tension d'alimentation dans un circuit integre |
US5998985A (en) * | 1998-02-20 | 1999-12-07 | Fluke Corporation | Voltage indicator using serial comparison voltage measurement |
DE19814696C1 (de) * | 1998-04-01 | 1999-07-08 | Siemens Ag | Spannungs-Überwachungseinrichtung für zwei unterschiedliche Versorgungsspannungen eines elektronischen Geräts |
US6329942B1 (en) * | 2000-01-31 | 2001-12-11 | Texas Instruments Incorporated | Parallel latch for high speed comparator using two modes of operation |
US6535424B2 (en) * | 2001-07-25 | 2003-03-18 | Advanced Micro Devices, Inc. | Voltage boost circuit using supply voltage detection to compensate for supply voltage variations in read mode voltage |
-
2002
- 2002-07-26 DE DE10234181A patent/DE10234181B3/de not_active Expired - Fee Related
-
2003
- 2003-07-02 TW TW092118135A patent/TWI229189B/zh not_active IP Right Cessation
- 2003-07-22 WO PCT/DE2003/002468 patent/WO2004017078A1/de active IP Right Grant
- 2003-07-22 JP JP2004528423A patent/JP4057011B2/ja not_active Expired - Fee Related
- 2003-07-22 EP EP03787717A patent/EP1525485B1/de not_active Expired - Fee Related
- 2003-07-22 DE DE50308503T patent/DE50308503D1/de not_active Expired - Lifetime
-
2005
- 2005-01-26 US US11/045,000 patent/US7005894B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
TW200402537A (en) | 2004-02-16 |
WO2004017078A1 (de) | 2004-02-26 |
EP1525485B1 (de) | 2007-10-31 |
DE10234181B3 (de) | 2004-04-08 |
US20050174249A1 (en) | 2005-08-11 |
US7005894B2 (en) | 2006-02-28 |
EP1525485A1 (de) | 2005-04-27 |
TWI229189B (en) | 2005-03-11 |
JP4057011B2 (ja) | 2008-03-05 |
DE50308503D1 (de) | 2007-12-13 |
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