JP2005517364A5 - - Google Patents

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Publication number
JP2005517364A5
JP2005517364A5 JP2003567101A JP2003567101A JP2005517364A5 JP 2005517364 A5 JP2005517364 A5 JP 2005517364A5 JP 2003567101 A JP2003567101 A JP 2003567101A JP 2003567101 A JP2003567101 A JP 2003567101A JP 2005517364 A5 JP2005517364 A5 JP 2005517364A5
Authority
JP
Japan
Prior art keywords
scanning microscope
computer system
data
frame burst
burst ratio
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003567101A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005517364A (ja
Filing date
Publication date
Priority claimed from DE10204369A external-priority patent/DE10204369A1/de
Application filed filed Critical
Publication of JP2005517364A publication Critical patent/JP2005517364A/ja
Publication of JP2005517364A5 publication Critical patent/JP2005517364A5/ja
Pending legal-status Critical Current

Links

JP2003567101A 2002-02-02 2003-01-25 高速スキャナを有する走査顕微鏡でデータ処理するための方法および高速スキャナを有する走査顕微鏡 Pending JP2005517364A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10204369A DE10204369A1 (de) 2002-02-02 2002-02-02 Verfahren zur Datenverarbeitung in einem Scanmikroskop mit schnellem Scanner und Scanmikroskop mit schnellem Scanner
PCT/EP2003/000768 WO2003067891A1 (de) 2002-02-02 2003-01-25 Verfahren zur datenverarbeitung in einem scanmikroskop mit schnellem scanner und scanmikroskop mit schnellem scanner

Publications (2)

Publication Number Publication Date
JP2005517364A JP2005517364A (ja) 2005-06-09
JP2005517364A5 true JP2005517364A5 (enExample) 2007-07-12

Family

ID=27588313

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003567101A Pending JP2005517364A (ja) 2002-02-02 2003-01-25 高速スキャナを有する走査顕微鏡でデータ処理するための方法および高速スキャナを有する走査顕微鏡

Country Status (5)

Country Link
US (1) US7802027B2 (enExample)
EP (1) EP1470720A1 (enExample)
JP (1) JP2005517364A (enExample)
DE (1) DE10204369A1 (enExample)
WO (1) WO2003067891A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006025445A1 (de) * 2006-05-31 2007-12-06 Carl Zeiss Microimaging Gmbh Laser-Scanning-Mikroskop mit Hochgeschwindigkeitsdatenverarbeitung
DE102009022394A1 (de) * 2009-05-22 2010-11-25 Leica Microsystems Cms Gmbh System und Verfahren zum computergestützten Durchführen mindestens eines Tests bei einem Scanmikroskop
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4318137A (en) * 1978-04-28 1982-03-02 The United States Of America As Represented By The Secretary Of The Air Force Real time digital recording system for thermovision data
US5469398A (en) * 1991-09-10 1995-11-21 Silicon Systems, Inc. Selectable width, brustable FIFO
EP1120675B1 (en) 1999-12-10 2005-01-05 Leica Microsystems Heidelberg GmbH Apparatus and method for analyzing acquired scan data
JP2004534849A (ja) * 2001-07-13 2004-11-18 トラスティーズ オブ ボストン カレッジ 光学的記録に有用なフタリド化合物
DE10134328B4 (de) 2001-07-14 2012-10-04 Leica Microsystems Cms Gmbh Verfahren und System zur Einstellung der Bilderfassung eines Mikroskops

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