JP2005512127A - ディジタル・ホログラフィック・イメージングの装置及び方法 - Google Patents
ディジタル・ホログラフィック・イメージングの装置及び方法 Download PDFInfo
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Abstract
Description
b)試料の誘電特性。放射の強度に影響する吸収率と放射の位相を修正する屈折率。吸収率と屈折率とは複素屈折率という概念で結合されることが多い。
c)試料を組み込む媒体の誘電特性。電磁相互作用が試料の特性のみに依存するのは、真空中または近似的には空気中だけである。一般的には、試料の誘電特性は試料を組み込む媒体の誘電特性に対して相対的に定義しなければならない。例えば、検討しなければならないのは試料(ns)の絶対屈折率ではなく、nmが試料を組み込む媒体の屈折率である場合の差(ns−nm)である。
また、複数の画像が提供される場合、処理制御ユニットを使用してそれらを互いに比較し、例えば信号変化の空間分布を明らかにしてもよい。
φは、度数または勾配で表される物体波7の位相である。φは定量的位相差画像17と呼ばれる画像としてDHIが提供する。
OPL=φλ/2π、但しλは放射の波長。OPLは光路長と呼ばれる。φが度数で測定される場合、OPL=φλ/360である。
nsは試料1の屈折率である。
dは試料1の厚さである。
hは試料1の高さであり、試料のトポグラフィーを記述する。
数式(1)が明らかに示すところによれば、測定信号は試料の構造特性(厚さd)と、試料の誘電特性と試料を組み込む媒体の誘電特性との間の差(屈折率の差ns−nm)とに依存する。
数式(1)及び(2)は標本形状及び誘電特性の関数としてOPLの挙動を記述する数式の例を示したものに過ぎない。本発明を適用し、電磁放射と標本との相互作用を記述するより複雑でより一般的なモデルに基づいて標本形状と標本の誘電特性とを決定してもよい。特に、こうしたモデルは、マクスウェル方程式の枠組、及び/または電磁相互作用のベクトルまたはテンソル理論の枠組、及び/または散乱ポテンシャル方程式の枠組、及び/または標本による電磁放射の回折を記述する理論モデルの枠組で獲得すればよい。また、明らかなように、こうしたモデルは屈折率以外の誘電特性、特に吸収率、及び/または複素屈折率を含んでもよい。特に、こうしたモデルは小さい試料の場合、及び/または試料の誘電特性と媒体の誘電特性とが大きく異なる場合、さらに正確な結果を示すことがある。
これによってnmの高速で大幅な変調が可能になる。
OPL1=(ns−nm1)d (3)
OPL2=(ns−nm2)d (4)
d=(OPL1−OPL2)/(nm2−nm1) (5)
ns=(OPL2nm1−OPL1nm2)/(OPL2−OPL1) (6)
ここで、2つの画像取得で十分であっても、例えば測定の精度を向上させるため、異なる値のnm、または同じ値のnmについてさらに多くの取得を行ってもよい。
[特許]
米国特許6,262,218号 クーシュ(Cuche)他
WO 00/20929号 クーシュ(Cuche)他
ジェイ・ダブリュ・グッドマン(J.W. Goodmann)及びアール・ダブリュ・ローレン(R.W. Lawrence)、「電子的に検出されたホログラムからのディジタル画像形成(“Digital image formation from electronically detected holograms”」、応用物理通信(Appl. Phys. Lett.)、第11巻、1967年、77−79頁
アイ・ヤマグチ(I. Yamaguchi)他、「位相シフト・ディジタル・ホログラフィーにおける画像形成と顕微鏡法への応用(“Image formation in phase-shifting digital holography and application to microscopy”)」、応用光学(Applied Optics)、第40巻、第34号、2001年、6177−6186頁
ユー・シュナース(U. Schnars)及びダブリュ・ユプトナー(W. Juptner)、「CCDターゲットによるホログラムの直接記録と数値的復元(“Direct recording of holograms by a CCD target and numerical reconstruction”)」、応用光学(Applied Optics)、第33巻、1994年、179−181頁
イー・クーシュ(Cuche)他、「定量的位相差イメージングのためのディジタル・ホログラフィー(“Digital holography for quantitative phase-contrast imaging”)」、光学通信(Optics Letters)、第24巻、1999年、291−293頁
イー・クーシュ(Cuche)他、「ディジタル・オフアクシス・ホログラフィーにおけるゼロ次及び二重像消去のための空間フィルタリング(“Spatial Filtering for Zero-Order and Twin-Image Elimination in Digital Off-Axis Holography”)」、応用光学(Applied Optics)、第38巻、第34号、1999年
ティー・コロンブ(T. Colomb)他、「ディジタル・ホログラフィーの使用による偏光イメージング(“Polarization Imaging by Use of Digital Holography”)」、応用光学(Applied Optics)、第38巻、第34号、1999年
アール・ベラー(R. Barer)、「生細胞の屈折率測定法及び干渉法(“Refractometry and interferometry of living cells”)」、米国光学学会雑誌(Journal of the Optical Society of America)、第47巻、1957年、545−556頁
エーシー・スヴォボダ(AC. Svoboda)他、「光トラッピング干渉法によるキネシン・ステッピングの直接観察(“Direct observation of kinesin stepping by optical trapping interferometry”)、ネイチャー(Nature),第365巻、1993年
ジー・エー・ダン(G.A. Dunn)及びディー・ジチャ(D. Zicha)、「線維芽細胞拡散の動態(“Dynamics of fibroblast spreading”)」、細胞科学雑誌(Journal of Cell Science)、第108巻、1995年、1239−1249頁
Claims (12)
- 試料のディジタル・ホログラフィック・イメージング(DHI)を実行する装置であって、該装置が、
ホログラフィック生成ユニットと、
ホログラフィック復元ユニットと、
処理ユニットと、
試料ユニットとを備え、該試料ユニットは、試料が収容された媒体を収容することに適合した容器を含むことを特徴とする装置。 - 請求項1に記載の装置において、前記容器が液体を収容することに適合したことを特徴とする装置。
- 請求項1または2に記載の装置において、さらに、前記試料ユニットに接続された媒体制御ユニットを備え、該媒体制御ユニットは、媒体の部分的または完全な媒体交換を含め、媒体特性を修正することに適合した媒体制御ユニットを備えることを特徴とする装置。
- 請求項1〜3のいずれか1項に記載の装置において、さらに、前記試料ユニットの少なくとも一部を機械的に振動させる振動手段を備えることを特徴とする装置。
- 請求項4に記載の装置において、前記振動手段が前記媒体制御ユニットに組み込まれたことを特徴とする装置。
- 請求項1〜5のいずれか1項に記載の装置に適合する試料を含む媒体であって、該媒体は、
前記試料に直接影響を及ぼす、すなわち、前記試料の形状及び/またはその誘電特性を修正する条件、および、
得られたホログラフィック・イメージングのコントラスト修正を誘発する条件の少なくとも1つを満足することを特徴とする媒体。 - 請求項1〜5のいずれか1項に記載の装置に使用する方法であって、媒体を使用し、該媒体が実時間観察の間に修正されることを特徴とする方法。
- 請求項7に記載の方法において、前記媒体が分散性媒体であり、該媒体の誘電特性が前記試料を照明する放射の波長を変化させることによって変化することを特徴とする方法。
- 請求項7または8に記載の方法において、前記媒体の誘電特性が修正され、得られた前記対応するホログラフィック情報が前記試料の形状及び/または前記媒体の誘電特性を規定するために使用されることを特徴とする方法。
- 請求項7〜9のいずれか1項に記載の方法において、前記試料の方向が複数のホログラムの獲得の間に変化され、該複数のホログラム情報内容が前記試料のコンピュータ処理された三次元断層写真を構築するために使用されることを特徴とする方法。
- 請求項7〜9のいずれか1項に記載の方法において、前記試料を照明する放射の波長が複数のホログラムの獲得の間に変化され、該複数のホログラムの情報内容が前記試料のコンピュータ処理された三次元断層写真を構築するために使用されることを特徴とする方法。
- 請求項7〜9のいずれか1項に記載の方法において、前記試料を照明する放射の波長および該試料の方向が複数のホログラムの獲得の間に変化され、該複数のホログラムの情報内容が前記試料のコンピュータ処理された三次元断層写真を構築するために使用されることを特徴とする方法。
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EP3252538A1 (en) | 2017-12-06 |
EP3252538B1 (en) | 2019-02-06 |
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