JP2005512098A - デジタル・オシロスコープの測定アイコン - Google Patents

デジタル・オシロスコープの測定アイコン Download PDF

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Publication number
JP2005512098A
JP2005512098A JP2003551643A JP2003551643A JP2005512098A JP 2005512098 A JP2005512098 A JP 2005512098A JP 2003551643 A JP2003551643 A JP 2003551643A JP 2003551643 A JP2003551643 A JP 2003551643A JP 2005512098 A JP2005512098 A JP 2005512098A
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JP
Japan
Prior art keywords
measurement results
waveform
display
measurement
measurement result
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Pending
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JP2003551643A
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English (en)
Japanese (ja)
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JP2005512098A5 (enExample
Inventor
トーマス ミラー，マーティン
ケイク，アンソニー
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レクロイ コーポレイション
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Application filed by レクロイ コーポレイション filed Critical レクロイ コーポレイション
Publication of JP2005512098A publication Critical patent/JP2005512098A/ja
Publication of JP2005512098A5 publication Critical patent/JP2005512098A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Controls And Circuits For Display Device (AREA)
  • Recording Measured Values (AREA)
  • User Interface Of Digital Computer (AREA)
JP2003551643A 2001-12-11 2002-12-04 デジタル・オシロスコープの測定アイコン Pending JP2005512098A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/013,563 US6791545B2 (en) 2001-12-11 2001-12-11 Measurement icons for digital oscilloscopes
PCT/US2002/038534 WO2003050651A2 (en) 2001-12-11 2002-12-04 Measurement icons for digital oscilloscopes

Publications (2)

Publication Number Publication Date
JP2005512098A true JP2005512098A (ja) 2005-04-28
JP2005512098A5 JP2005512098A5 (enExample) 2006-01-19

Family

ID=21760587

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003551643A Pending JP2005512098A (ja) 2001-12-11 2002-12-04 デジタル・オシロスコープの測定アイコン

Country Status (6)

Country Link
US (1) US6791545B2 (enExample)
EP (1) EP1454300A4 (enExample)
JP (1) JP2005512098A (enExample)
CN (1) CN100375123C (enExample)
AU (1) AU2002357780A1 (enExample)
WO (1) WO2003050651A2 (enExample)

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JP2001311708A (ja) * 2000-04-28 2001-11-09 Seiko Instruments Inc 分析装置
WO2002097373A2 (en) * 2001-05-31 2002-12-05 Lecroy Corporation Surface mapping and 3-d parametric analysis
US7184906B2 (en) * 2003-06-26 2007-02-27 Agilent Technologies, Inc. Systems and methods for performing multi-source measurements
US20050102115A1 (en) * 2003-11-07 2005-05-12 Waldo Gary J. Digital oscilloscope with customizable display for selected function options
CN104392292B (zh) * 2004-05-21 2019-07-26 派拉斯科技术公司 图形重新检验用户设置界面
JP2006084453A (ja) * 2004-08-18 2006-03-30 Horiba Ltd 分析装置
EP2510874A3 (en) * 2005-03-29 2012-11-28 Martin Roche Biometric sensor
JP4625978B2 (ja) * 2005-04-22 2011-02-02 テクトロニクス・インターナショナル・セールス・ゲーエムベーハー 信号発生装置及びパラメータ編集画面層表示方法
US7505039B2 (en) * 2005-07-21 2009-03-17 Lecroy Corporation Track of statistics
US7620509B2 (en) * 2005-11-03 2009-11-17 Tektronix, Inc. Detection of time-frequency codes using a spectrogram
US20080007555A1 (en) * 2006-07-10 2008-01-10 Vrba Joseph A Dynamic plot on plot displays
JP5024598B2 (ja) * 2006-10-30 2012-09-12 横河電機株式会社 マルチチャネルアナライザ
US8631358B2 (en) 2007-10-10 2014-01-14 Apple Inc. Variable device graphical user interface
US20090164923A1 (en) * 2007-12-21 2009-06-25 Nokia Corporation Method, apparatus and computer program product for providing an adaptive icon
DE102008008138A1 (de) 2008-02-08 2009-08-13 Rhode & Schwarz Gmbh & Co. Kg Konfigurierbares Messgerät und entsprechendes Messverfahren
US8525837B2 (en) * 2008-04-29 2013-09-03 Teledyne Lecroy, Inc. Method and apparatus for data preview
CN102053188B (zh) * 2009-11-10 2013-09-25 北京普源精电科技有限公司 一种具有标签显示功能的数字示波器及其控制方法
US9157943B2 (en) * 2010-08-13 2015-10-13 Tektronix, Inc. Multi-channel frequency domain test and measurement instrument
DE102010048809A1 (de) 2010-10-20 2012-04-26 Hüttinger Elektronik Gmbh + Co. Kg Leistungsversorgungssystem für eine Plasmaanwendung und/oder eine Induktionserwärmungsanwendung
DE102010048810A1 (de) 2010-10-20 2012-04-26 Hüttinger Elektronik Gmbh + Co. Kg System zur Bedienung mehrerer Plasma- und/oder Induktionserwärmungsprozesse
US9496993B1 (en) 2012-01-13 2016-11-15 Teledyne Lecroy, Inc. Noise analysis to reveal jitter and crosstalk's effect on signal integrity
DE102012217726B4 (de) * 2012-09-28 2014-11-20 Rohde & Schwarz Gmbh & Co. Kg Messgerät und Messverfahren mit gekoppelter Darstellung
DE102013206711A1 (de) * 2013-04-15 2014-10-16 Rohde & Schwarz Gmbh & Co. Kg Messgerät und Messverfahren mit Mehrfachanzeige
CN105974171B (zh) * 2016-04-29 2018-09-07 深圳市鼎阳科技有限公司 一种快速实现线显示的示波器和方法
US11415602B2 (en) * 2018-12-03 2022-08-16 Rohde & Schwarz Gmbh & Co. Kg Method for operating an oscilloscope as well as oscilloscope
US10852323B2 (en) * 2018-12-28 2020-12-01 Rohde & Schwarz Gmbh & Co. Kg Measurement apparatus and method for analyzing a waveform of a signal
US10902670B1 (en) * 2019-11-12 2021-01-26 Facebook Technologies, Llc Systems and methods for graphics rendering based on machine learning
US11436793B1 (en) 2021-02-12 2022-09-06 Facebook Technologies, Llc Systems and methods for graphics rendering based on machine learning
EP4312037A1 (en) * 2022-07-26 2024-01-31 Rohde & Schwarz GmbH & Co. KG Measurement application device and method

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5081592A (en) * 1987-08-05 1992-01-14 Tektronix, Inc. Test system for acquiring, calculating and displaying representations of data sequences
US5226118A (en) * 1991-01-29 1993-07-06 Prometrix Corporation Data analysis system and method for industrial process control systems
US5485078A (en) * 1994-03-23 1996-01-16 Venturedyne, Ltd. Method for analyzing a circuit board waveform for faults
US5579462A (en) * 1994-11-03 1996-11-26 Bio-Rad Laboratories User interface for spectrometer
US5953009A (en) * 1997-05-27 1999-09-14 Hewlett-Packard Company Graphical system and method for invoking measurements in a signal measurement system
US6522345B1 (en) * 1998-01-12 2003-02-18 Agilent Technologies, Inc. System and method for simultaneously invoking automated measurements in a signal measurement system
US6320577B1 (en) * 1998-11-03 2001-11-20 Agilent Technologies, Inc. System and method for graphically annotating a waveform display in a signal-measurement system
US6571185B1 (en) * 1999-04-20 2003-05-27 Tektronix, Inc. Continually responsive and anticipating automatic setup function for a digital oscilloscope
JP2002162419A (ja) * 2000-10-11 2002-06-07 Agilent Technol Inc 信号測定システムで捕捉された信号の各パルス毎に、パルス特性のデータベースを生成するためのシステム及び方法

Also Published As

Publication number Publication date
WO2003050651A2 (en) 2003-06-19
EP1454300A4 (en) 2005-11-30
WO2003050651A3 (en) 2003-10-16
CN100375123C (zh) 2008-03-12
US20030107573A1 (en) 2003-06-12
EP1454300A2 (en) 2004-09-08
US6791545B2 (en) 2004-09-14
AU2002357780A1 (en) 2003-06-23
CN1630885A (zh) 2005-06-22

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