JP5437868B2 - トリガをかける方法及びrf試験測定装置 - Google Patents
トリガをかける方法及びrf試験測定装置 Download PDFInfo
- Publication number
- JP5437868B2 JP5437868B2 JP2010058274A JP2010058274A JP5437868B2 JP 5437868 B2 JP5437868 B2 JP 5437868B2 JP 2010058274 A JP2010058274 A JP 2010058274A JP 2010058274 A JP2010058274 A JP 2010058274A JP 5437868 B2 JP5437868 B2 JP 5437868B2
- Authority
- JP
- Japan
- Prior art keywords
- frequency domain
- bitmap
- time
- signal
- region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims description 53
- 238000012360 testing method Methods 0.000 title claims description 32
- 238000005259 measurement Methods 0.000 title claims description 22
- 238000001228 spectrum Methods 0.000 claims description 82
- 230000004044 response Effects 0.000 claims description 17
- 238000005070 sampling Methods 0.000 claims description 14
- 230000008569 process Effects 0.000 claims description 9
- 238000001514 detection method Methods 0.000 claims description 8
- 230000006870 function Effects 0.000 claims description 7
- 238000013500 data storage Methods 0.000 claims description 6
- 238000012545 processing Methods 0.000 description 21
- 206010047571 Visual impairment Diseases 0.000 description 19
- 238000006243 chemical reaction Methods 0.000 description 16
- 238000004458 analytical method Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 8
- 238000009825 accumulation Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 5
- 230000008901 benefit Effects 0.000 description 4
- 230000000875 corresponding effect Effects 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 230000002688 persistence Effects 0.000 description 3
- 230000002829 reductive effect Effects 0.000 description 3
- 230000000717 retained effect Effects 0.000 description 3
- 230000002596 correlated effect Effects 0.000 description 2
- 230000001186 cumulative effect Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 238000000844 transformation Methods 0.000 description 2
- 230000001052 transient effect Effects 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013481 data capture Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004445 quantitative analysis Methods 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 238000012106 screening analysis Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 230000003313 weakening effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
- G01R13/0218—Circuits therefor
- G01R13/0254—Circuits therefor for triggering, synchronisation
- G01R13/0263—Circuits therefor for triggering, synchronisation for non-recurrent functions, e.g. transients
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
- Radar Systems Or Details Thereof (AREA)
Description
この例では、赤、橙などのような暖色系であるほど、発生数がより多いことを示すように用いられている。しかし、これは一例であり、他の種々の輝度勾配(intensity-grading)手法を用いることができる。
22 フロント・エンド
24 時間変動信号
26 付加要素
28 ノード
30 リアルタイム・エンジン処理ブロック
31 周波数領域ビットマップ
32 メモリ・サブシステム
34 表示サブシステム
36 処理サブシステム
38 記憶場所
Claims (3)
- 時間変動信号を繰り返しサンプリングすること、
上記時間変動信号のサンプリングに基いて時間とともに複数のデジタル周波数領域スペクトラムを生成すること、
周波数領域ビットマップを含むデータ記憶装置に上記デジタル周波数領域スペクトラムを順次適用することによって、上記時間変動信号についての上記周波数領域ビットマップを繰り返し更新すること、
上記周波数領域ビットマップ上に関心領域を特定することと、
上記周波数領域ビットマップ上の上記関心領域における予め定めた特性の生成の検出に応答して上記時間変動信号の捕捉をトリガすること
を具えるRF試験測定装置において信号イベントに応じてトリガをかける方法。 - 時間変動信号を受けるフロント・エンド部分と、
上記フロント・エンド部分と動作可能に結合されるとともに、上記フロント・エンド部分が上記時間変動信号を受けて処理するときに、上記時間変動信号に基いてデジタル周波数領域スペクトラムを生成するように構成されるリアルタイム・エンジンと、
上記デジタル周波数領域スペクトラムの連続して受けて蓄積することによって更新される周波数領域ビットマップを含むメモリ・サブシステムとを具え、
上記リアルタイム・エンジンが、ある信号特性の発生について上記周波数領域ビットマップをモニタし、上記信号特性の発生の検出に応答して、上記時間変動信号を捕捉してRF試験測定装置の記録場所に入れるよう更に構成されていることを特徴とするRF試験測定装置。
- 周波数の関数としてデジタル化したパワー・データを記録するよう構成された周波数領域ビットマップ上に関心領域を規定することと、
予め定めた特性の観点から上記関心領域についてトリガ基準を特定することと、
時間変動信号を繰り返しサンプリングすることと、
上記時間変動信号の上記サンプリングに基いて複数のデジタル周波数領域スペクトラムを時間とともに生成することと、
周波数領域ビットマップを含むデータ記憶装置に上記デジタル周波数領域スペクトラムを連続して適用することによって、上記周波数領域ビットマップを繰り返し更新することと、
上記周波数領域ビットマップの上記関心領域中の予め定めた上記特性の検出に応答して上記時間変動信号の捕捉をトリガすることと
を具えるRF試験測定装置において信号イベントに応じてトリガをかける方法。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16020909P | 2009-03-13 | 2009-03-13 | |
US61/160,209 | 2009-03-13 | ||
US12/568,141 US8489350B2 (en) | 2009-03-13 | 2009-09-28 | Frequency domain bitmap triggering using color, density and correlation based triggers |
US12/568,141 | 2009-09-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010217180A JP2010217180A (ja) | 2010-09-30 |
JP5437868B2 true JP5437868B2 (ja) | 2014-03-12 |
Family
ID=42244495
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010058274A Active JP5437868B2 (ja) | 2009-03-13 | 2010-03-15 | トリガをかける方法及びrf試験測定装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US8489350B2 (ja) |
EP (1) | EP2228660B1 (ja) |
JP (1) | JP5437868B2 (ja) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8489350B2 (en) * | 2009-03-13 | 2013-07-16 | Tektronix, Inc. | Frequency domain bitmap triggering using color, density and correlation based triggers |
US8880369B2 (en) | 2009-03-13 | 2014-11-04 | Tektronix, Inc. | Occupancy measurement and triggering in frequency domain bitmaps |
US8452571B2 (en) * | 2010-03-16 | 2013-05-28 | Tektronix, Inc | Trigger figure-of-merit indicator |
EP2520941B1 (en) * | 2011-04-27 | 2015-03-04 | Tektronix, Inc. | Trigger figure-of-merit indicator |
JP2012233851A (ja) * | 2011-05-09 | 2012-11-29 | Tektronix Inc | 実時間トリガ性能指数指示装置及び試験測定機器 |
US20120306886A1 (en) * | 2011-06-02 | 2012-12-06 | Tektronix, Inc | Continuous rf signal visualization with high resolution |
US8675781B2 (en) | 2011-09-08 | 2014-03-18 | Thinkrf Corporation | Radio frequency receiver system for wideband signal processing |
US8675078B1 (en) * | 2011-09-30 | 2014-03-18 | Thomson Licensing | Test technique for set-top boxes |
CN102780534B (zh) * | 2012-07-04 | 2014-12-03 | 中国电子科技集团公司第四十一研究所 | 一种通用的电磁信号自动搜索方法 |
DE102013200941A1 (de) * | 2012-11-12 | 2014-05-15 | Rohde & Schwarz Gmbh & Co. Kg | Verfahren und Vorrichtung zur Bestimmung einer Triggerbedingung für ein seltenes Signalereignis |
US9846184B2 (en) * | 2012-11-20 | 2017-12-19 | Tektronix, Inc. | Combinatorial mask triggering in time or frequency domain |
KR101383689B1 (ko) * | 2012-11-30 | 2014-04-09 | 한국전자통신연구원 | 신호 탐지 장치 및 방법 |
KR101597649B1 (ko) * | 2014-07-01 | 2016-02-25 | 국방과학연구소 | 주파수 도약신호의 검출을 위한 주파수 스펙트럼 표시 시스템 및 표시 방법 |
EP3187884B1 (en) * | 2015-12-28 | 2020-03-04 | Rohde&Schwarz GmbH&Co. KG | A method and apparatus for processing measurement tuples |
CN112136054B (zh) * | 2018-05-25 | 2023-06-13 | 株式会社东阳特克尼卡 | 频谱分析方法、其装置以及记录介质 |
US11874308B2 (en) | 2021-10-29 | 2024-01-16 | Keysight Technologies, Inc. | ASIC implementing real-time spectrum analysis |
CN115001605B (zh) * | 2022-05-30 | 2023-01-24 | 电子科技大学 | 一种面向卫星通信信号实时检测的荧光频谱分析方法 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3034048A (en) * | 1959-12-01 | 1962-05-08 | Lab For Electronics Inc | Signal analyzing circuits |
US5103402A (en) * | 1988-07-05 | 1992-04-07 | Tektronix, Inc. | Method and apparatus for identifying, saving, and analyzing continuous frequency domain data in a spectrum analyzer |
US6151010A (en) * | 1996-05-24 | 2000-11-21 | Lecroy, S.A. | Digital oscilloscope display and method therefor |
US6570592B1 (en) * | 1999-10-29 | 2003-05-27 | Agilent Technologies, Inc. | System and method for specifying trigger conditions of a signal measurement system using graphical elements on a graphical user interface |
US6615369B1 (en) | 2000-01-31 | 2003-09-02 | Agilent Technologies, Inc. | Logic analyzer with trigger specification defined by waveform exemplar |
JP3757787B2 (ja) * | 2000-11-21 | 2006-03-22 | 岩崎通信機株式会社 | ディジタルオシロスコープ |
JP4813774B2 (ja) * | 2004-05-18 | 2011-11-09 | テクトロニクス・インターナショナル・セールス・ゲーエムベーハー | 周波数分析装置の表示方法 |
US7251577B2 (en) * | 2004-07-19 | 2007-07-31 | Tektronix, Inc. | Realtime power mask trigger |
US20070061629A1 (en) | 2005-08-15 | 2007-03-15 | Thums Eric E | Drop and drag logic analyzer trigger |
US7970565B2 (en) * | 2006-02-27 | 2011-06-28 | Advantest Corporation | Measuring device, test device, electronic device, program, and recording medium |
US20070282542A1 (en) * | 2006-05-31 | 2007-12-06 | Duff Christopher P | Composite trigger for a digital sampling oscilloscope |
DE102006056154A1 (de) * | 2006-11-28 | 2008-05-29 | Rohde & Schwarz Gmbh & Co. Kg | Verfahren und Vorrichtung zur Ermittlung einer statistischen Messkenngröße |
DE102006056151A1 (de) * | 2006-11-28 | 2008-05-29 | Rohde & Schwarz Gmbh & Co. Kg | Verfahren und Vorrichtung zur Triggerung einer Aufzeichnung eines Mess-Signals |
GB2455052A (en) * | 2007-09-21 | 2009-06-03 | Agilent Technologies Inc | Trigger event detection apparatus and method therefore |
US7983332B2 (en) | 2007-11-12 | 2011-07-19 | Tektronix, Inc. | Eye violation and excess jitter trigger |
CN102037478A (zh) | 2008-05-22 | 2011-04-27 | 特克特朗尼克公司 | 三维位图中的信号搜索 |
US8255179B2 (en) * | 2009-02-11 | 2012-08-28 | Tektronix, Inc. | Time qualified frequency mask trigger |
US8880369B2 (en) * | 2009-03-13 | 2014-11-04 | Tektronix, Inc. | Occupancy measurement and triggering in frequency domain bitmaps |
US8489350B2 (en) * | 2009-03-13 | 2013-07-16 | Tektronix, Inc. | Frequency domain bitmap triggering using color, density and correlation based triggers |
US8706435B2 (en) * | 2010-05-06 | 2014-04-22 | Tektronix, Inc. | Signal detection and triggering using a difference bitmap |
US8452559B2 (en) * | 2010-05-12 | 2013-05-28 | Tektronix, Inc. | Density trace measurement |
-
2009
- 2009-09-28 US US12/568,141 patent/US8489350B2/en active Active
-
2010
- 2010-03-12 EP EP10156407.8A patent/EP2228660B1/en active Active
- 2010-03-15 JP JP2010058274A patent/JP5437868B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
EP2228660A3 (en) | 2013-10-02 |
EP2228660A2 (en) | 2010-09-15 |
US8489350B2 (en) | 2013-07-16 |
EP2228660B1 (en) | 2018-08-08 |
US20100231398A1 (en) | 2010-09-16 |
JP2010217180A (ja) | 2010-09-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5437868B2 (ja) | トリガをかける方法及びrf試験測定装置 | |
JP6126771B2 (ja) | トリガをかける方法及び周波数領域試験測定装置 | |
US9784765B2 (en) | Graphic actuation of test and measurement triggers | |
US8502822B2 (en) | Method and apparatus for visualizing and interactively manipulating profile data | |
JP5443233B2 (ja) | 波形特徴化方法 | |
US20030107573A1 (en) | Measurement icons for digital oscilloscopes | |
EP2385379B1 (en) | Signal detection and triggering using a difference bitmap | |
EP2386869B1 (en) | Density trace measurement and triggering in frequency domain bitmaps | |
US7505039B2 (en) | Track of statistics | |
WO2008021485A2 (en) | Method and apparatus for evaluating data | |
CN102170315B (zh) | 频域位图触发 | |
CN116430117A (zh) | 测试和测量仪器中频谱和谱图属性的自动确定 | |
CN116430116A (zh) | 具有带有光标时间相关性的谱图的测试和测量仪器 | |
JP6168763B2 (ja) | 試験測定装置及び試験測定装置における方法 | |
EP2743709A1 (en) | Real time spectrum analyzer with zoom display | |
EP3081946A1 (en) | Intensity information display | |
CN116528137A (zh) | 一种用于车辆声道的测试方法、装置、介质和电子设备 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A625 | Written request for application examination (by other person) |
Free format text: JAPANESE INTERMEDIATE CODE: A625 Effective date: 20111214 |
|
RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20120126 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20130510 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130521 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20130821 |
|
A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20130826 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20130920 |
|
A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20130926 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20131021 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20131105 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20131212 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5437868 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |