JP2005512098A5 - - Google Patents

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Publication number
JP2005512098A5
JP2005512098A5 JP2003551643A JP2003551643A JP2005512098A5 JP 2005512098 A5 JP2005512098 A5 JP 2005512098A5 JP 2003551643 A JP2003551643 A JP 2003551643A JP 2003551643 A JP2003551643 A JP 2003551643A JP 2005512098 A5 JP2005512098 A5 JP 2005512098A5
Authority
JP
Japan
Prior art keywords
waveform
measurement results
icons
display
processing data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003551643A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005512098A (ja
Filing date
Publication date
Priority claimed from US10/013,563 external-priority patent/US6791545B2/en
Application filed filed Critical
Publication of JP2005512098A publication Critical patent/JP2005512098A/ja
Publication of JP2005512098A5 publication Critical patent/JP2005512098A5/ja
Pending legal-status Critical Current

Links

JP2003551643A 2001-12-11 2002-12-04 デジタル・オシロスコープの測定アイコン Pending JP2005512098A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/013,563 US6791545B2 (en) 2001-12-11 2001-12-11 Measurement icons for digital oscilloscopes
PCT/US2002/038534 WO2003050651A2 (en) 2001-12-11 2002-12-04 Measurement icons for digital oscilloscopes

Publications (2)

Publication Number Publication Date
JP2005512098A JP2005512098A (ja) 2005-04-28
JP2005512098A5 true JP2005512098A5 (enExample) 2006-01-19

Family

ID=21760587

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003551643A Pending JP2005512098A (ja) 2001-12-11 2002-12-04 デジタル・オシロスコープの測定アイコン

Country Status (6)

Country Link
US (1) US6791545B2 (enExample)
EP (1) EP1454300A4 (enExample)
JP (1) JP2005512098A (enExample)
CN (1) CN100375123C (enExample)
AU (1) AU2002357780A1 (enExample)
WO (1) WO2003050651A2 (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001311708A (ja) * 2000-04-28 2001-11-09 Seiko Instruments Inc 分析装置
WO2002097373A2 (en) * 2001-05-31 2002-12-05 Lecroy Corporation Surface mapping and 3-d parametric analysis
US7184906B2 (en) * 2003-06-26 2007-02-27 Agilent Technologies, Inc. Systems and methods for performing multi-source measurements
US20050102115A1 (en) * 2003-11-07 2005-05-12 Waldo Gary J. Digital oscilloscope with customizable display for selected function options
US10074057B2 (en) * 2004-05-21 2018-09-11 Pressco Technology Inc. Graphical re-inspection user setup interface
JP2006084453A (ja) * 2004-08-18 2006-03-30 Horiba Ltd 分析装置
ES2428639T3 (es) * 2005-03-29 2013-11-08 Martin Roche Sensor de detección de parámetros corporales y método para detectar parámetros corporales
JP4625978B2 (ja) * 2005-04-22 2011-02-02 テクトロニクス・インターナショナル・セールス・ゲーエムベーハー 信号発生装置及びパラメータ編集画面層表示方法
US7505039B2 (en) * 2005-07-21 2009-03-17 Lecroy Corporation Track of statistics
US7620509B2 (en) * 2005-11-03 2009-11-17 Tektronix, Inc. Detection of time-frequency codes using a spectrogram
US20080007555A1 (en) * 2006-07-10 2008-01-10 Vrba Joseph A Dynamic plot on plot displays
JP5024598B2 (ja) * 2006-10-30 2012-09-12 横河電機株式会社 マルチチャネルアナライザ
US8631358B2 (en) 2007-10-10 2014-01-14 Apple Inc. Variable device graphical user interface
US20090164923A1 (en) * 2007-12-21 2009-06-25 Nokia Corporation Method, apparatus and computer program product for providing an adaptive icon
DE102008008138A1 (de) * 2008-02-08 2009-08-13 Rhode & Schwarz Gmbh & Co. Kg Konfigurierbares Messgerät und entsprechendes Messverfahren
US8525837B2 (en) * 2008-04-29 2013-09-03 Teledyne Lecroy, Inc. Method and apparatus for data preview
CN102053188B (zh) * 2009-11-10 2013-09-25 北京普源精电科技有限公司 一种具有标签显示功能的数字示波器及其控制方法
US9157943B2 (en) * 2010-08-13 2015-10-13 Tektronix, Inc. Multi-channel frequency domain test and measurement instrument
DE102010048810A1 (de) 2010-10-20 2012-04-26 Hüttinger Elektronik Gmbh + Co. Kg System zur Bedienung mehrerer Plasma- und/oder Induktionserwärmungsprozesse
DE102010048809A1 (de) 2010-10-20 2012-04-26 Hüttinger Elektronik Gmbh + Co. Kg Leistungsversorgungssystem für eine Plasmaanwendung und/oder eine Induktionserwärmungsanwendung
US9496993B1 (en) 2012-01-13 2016-11-15 Teledyne Lecroy, Inc. Noise analysis to reveal jitter and crosstalk's effect on signal integrity
DE102012217726B4 (de) * 2012-09-28 2014-11-20 Rohde & Schwarz Gmbh & Co. Kg Messgerät und Messverfahren mit gekoppelter Darstellung
DE102013206711A1 (de) * 2013-04-15 2014-10-16 Rohde & Schwarz Gmbh & Co. Kg Messgerät und Messverfahren mit Mehrfachanzeige
CN105974171B (zh) * 2016-04-29 2018-09-07 深圳市鼎阳科技有限公司 一种快速实现线显示的示波器和方法
US11415602B2 (en) * 2018-12-03 2022-08-16 Rohde & Schwarz Gmbh & Co. Kg Method for operating an oscilloscope as well as oscilloscope
US10852323B2 (en) * 2018-12-28 2020-12-01 Rohde & Schwarz Gmbh & Co. Kg Measurement apparatus and method for analyzing a waveform of a signal
US10902670B1 (en) * 2019-11-12 2021-01-26 Facebook Technologies, Llc Systems and methods for graphics rendering based on machine learning
US11436793B1 (en) 2021-02-12 2022-09-06 Facebook Technologies, Llc Systems and methods for graphics rendering based on machine learning
EP4312037A1 (en) * 2022-07-26 2024-01-31 Rohde & Schwarz GmbH & Co. KG Measurement application device and method

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5081592A (en) * 1987-08-05 1992-01-14 Tektronix, Inc. Test system for acquiring, calculating and displaying representations of data sequences
US5226118A (en) * 1991-01-29 1993-07-06 Prometrix Corporation Data analysis system and method for industrial process control systems
US5485078A (en) * 1994-03-23 1996-01-16 Venturedyne, Ltd. Method for analyzing a circuit board waveform for faults
US5579462A (en) * 1994-11-03 1996-11-26 Bio-Rad Laboratories User interface for spectrometer
US5953009A (en) * 1997-05-27 1999-09-14 Hewlett-Packard Company Graphical system and method for invoking measurements in a signal measurement system
US6522345B1 (en) * 1998-01-12 2003-02-18 Agilent Technologies, Inc. System and method for simultaneously invoking automated measurements in a signal measurement system
US6320577B1 (en) * 1998-11-03 2001-11-20 Agilent Technologies, Inc. System and method for graphically annotating a waveform display in a signal-measurement system
US6571185B1 (en) * 1999-04-20 2003-05-27 Tektronix, Inc. Continually responsive and anticipating automatic setup function for a digital oscilloscope
JP2002162419A (ja) * 2000-10-11 2002-06-07 Agilent Technol Inc 信号測定システムで捕捉された信号の各パルス毎に、パルス特性のデータベースを生成するためのシステム及び方法

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