JP2005308509A5 - - Google Patents

Download PDF

Info

Publication number
JP2005308509A5
JP2005308509A5 JP2004124966A JP2004124966A JP2005308509A5 JP 2005308509 A5 JP2005308509 A5 JP 2005308509A5 JP 2004124966 A JP2004124966 A JP 2004124966A JP 2004124966 A JP2004124966 A JP 2004124966A JP 2005308509 A5 JP2005308509 A5 JP 2005308509A5
Authority
JP
Japan
Prior art keywords
signal
phase
distributed
cross
generating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004124966A
Other languages
English (en)
Japanese (ja)
Other versions
JP4761724B2 (ja
JP2005308509A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2004124966A priority Critical patent/JP4761724B2/ja
Priority claimed from JP2004124966A external-priority patent/JP4761724B2/ja
Publication of JP2005308509A publication Critical patent/JP2005308509A/ja
Publication of JP2005308509A5 publication Critical patent/JP2005308509A5/ja
Application granted granted Critical
Publication of JP4761724B2 publication Critical patent/JP4761724B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

JP2004124966A 2004-04-21 2004-04-21 位相雑音を測定する方法および位相雑音測定装置 Expired - Lifetime JP4761724B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004124966A JP4761724B2 (ja) 2004-04-21 2004-04-21 位相雑音を測定する方法および位相雑音測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004124966A JP4761724B2 (ja) 2004-04-21 2004-04-21 位相雑音を測定する方法および位相雑音測定装置

Publications (3)

Publication Number Publication Date
JP2005308509A JP2005308509A (ja) 2005-11-04
JP2005308509A5 true JP2005308509A5 (enExample) 2007-05-31
JP4761724B2 JP4761724B2 (ja) 2011-08-31

Family

ID=35437460

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004124966A Expired - Lifetime JP4761724B2 (ja) 2004-04-21 2004-04-21 位相雑音を測定する方法および位相雑音測定装置

Country Status (1)

Country Link
JP (1) JP4761724B2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102667506B (zh) * 2009-09-23 2015-03-11 光电波公司 基于光延迟测量射频、微波或毫米波信号中的相位噪声
US8711992B2 (en) * 2012-05-31 2014-04-29 Agilent Technologies, Inc. Phase noise extraction apparatus and technique
GB2529200B (en) * 2014-08-13 2019-05-01 Fen Ep Ltd Improvement to Analysing Physiological Electrograms
CN110716092B (zh) * 2019-10-22 2021-09-07 上海交通大学 基于激光鉴频和互相关处理的相位噪声测量装置和测量方法
CN118244019B (zh) * 2024-03-05 2024-11-29 西安科技大学 一种相位噪声分析仪及相位噪声分析方法
CN118534397B (zh) * 2024-06-04 2025-08-12 徴格半导体(杭州)有限公司 一种基于频谱分析的相位噪声测量方法及系统、存储介质

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5956170A (ja) * 1982-09-24 1984-03-31 Advantest Corp 伝達関数測定器
JP3099979B2 (ja) * 1991-05-27 2000-10-16 日本電信電話株式会社 付加位相雑音測定方法および装置
US5412325A (en) * 1993-12-23 1995-05-02 Hughes Aircraft Company Phase noise measurement system and method
JP3381109B2 (ja) * 1994-12-28 2003-02-24 ソニー株式会社 伝達関数測定装置
US5608331A (en) * 1995-06-06 1997-03-04 Hughes Electronics Noise measurement test system
JP3921035B2 (ja) * 2000-06-14 2007-05-30 アンリツ株式会社 位相雑音伝達特性解析装置
JP2003232842A (ja) * 2002-02-12 2003-08-22 Mitsubishi Electric Corp 方位探知装置

Similar Documents

Publication Publication Date Title
JP2005308511A5 (enExample)
Zhang et al. Acoustic emission detection of rail defect based on wavelet transform and Shannon entropy
CN106596712B (zh) 一种基于缺陷深度的选频带脉冲涡流无损检测方法
CN102928514B (zh) 一种基于频率特征的木材应力波无损检测方法
US8854030B2 (en) Method and device for frequency response measurement
JP2010533040A5 (enExample)
WO2010144857A3 (en) Method of detecting system function by measuring frequency response
DE60106588D1 (de) Spatiale und spektrale wellenfrontanalyse und -messung
JP2005186929A5 (enExample)
CN108896274B (zh) 一种基于子集窗长度优化算法的分布式光纤应变解调方法
JP2008233063A5 (enExample)
JP2005024487A5 (enExample)
JP2005308509A5 (enExample)
EA200701744A1 (ru) Оценка шума на одной частоте посредством замера шума на других частотах
CN105241428A (zh) 一种利用高光谱进行水深反演的方法
Avanesians et al. Wave separation: Application for arrival time detection in ultrasonic signals
CN105572150B (zh) 基于扩频的双通道粮食水分测量方法和装置
FR2972811B1 (fr) Dispositif et procede de spectrometrie photonique, procede de calibrage du dispositif et utilisation du dispositif
CA2464251A1 (en) Method and apparatus for spectrom analysis
JP2008082735A (ja) 感圧塗料による非定常圧力場の画像計測方法
CN104049036A (zh) 基于时反聚焦峰值的结构损伤多峰值回归评估方法
JP2005308512A5 (enExample)
CN105877729A (zh) 生物讯号量测系统、方法及耳机
Wijnant et al. Development and application of a new method for the in-situ measurement of sound apsorption
CN118131128A (zh) 一种循环平稳声源快速定位方法及装置