JP2005243627A - マススペクトロメータ - Google Patents

マススペクトロメータ Download PDF

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Publication number
JP2005243627A
JP2005243627A JP2005029479A JP2005029479A JP2005243627A JP 2005243627 A JP2005243627 A JP 2005243627A JP 2005029479 A JP2005029479 A JP 2005029479A JP 2005029479 A JP2005029479 A JP 2005029479A JP 2005243627 A JP2005243627 A JP 2005243627A
Authority
JP
Japan
Prior art keywords
ion source
gas
vapor
ion
bar
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2005029479A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005243627A5 (de
Inventor
Stevan Bajic
ベイジック、ステヴァン
Robert Harold Bateman
ベイトマン、ロバート、ハロルド
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micromass UK Ltd
Original Assignee
Micromass UK Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB0402634A external-priority patent/GB0402634D0/en
Application filed by Micromass UK Ltd filed Critical Micromass UK Ltd
Publication of JP2005243627A publication Critical patent/JP2005243627A/ja
Publication of JP2005243627A5 publication Critical patent/JP2005243627A5/ja
Withdrawn legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Dispersion Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2005029479A 2004-02-06 2005-02-04 マススペクトロメータ Withdrawn JP2005243627A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0402634A GB0402634D0 (en) 2004-02-06 2004-02-06 Mass spectrometer
GB0403551A GB0403551D0 (en) 2004-02-06 2004-02-18 Mass spectrometer

Publications (2)

Publication Number Publication Date
JP2005243627A true JP2005243627A (ja) 2005-09-08
JP2005243627A5 JP2005243627A5 (de) 2008-03-13

Family

ID=34379506

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2005029478A Withdrawn JP2005221506A (ja) 2004-02-06 2005-02-04 質量分析計
JP2005029479A Withdrawn JP2005243627A (ja) 2004-02-06 2005-02-04 マススペクトロメータ

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2005029478A Withdrawn JP2005221506A (ja) 2004-02-06 2005-02-04 質量分析計

Country Status (4)

Country Link
JP (2) JP2005221506A (de)
CA (2) CA2496099C (de)
DE (3) DE102005004801B4 (de)
GB (2) GB2410830B (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI625524B (zh) * 2016-04-14 2018-06-01 國立中山大學 使用多游離源作爲連接介面及游離技術的層析質譜裝置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006050136B4 (de) * 2006-10-25 2016-12-15 Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V. Verfahren und Vorrichtung zur Erzeugung von positiv und/oder negativ ionisierten Gasanalyten für die Gasanalyse
EP2988316B1 (de) * 2013-04-19 2020-10-14 Shimadzu Corporation Massenspektrometer

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3967931A (en) * 1974-09-25 1976-07-06 Research Corporation Flame aerosol detector for liquid chromatography
US5285064A (en) * 1987-03-06 1994-02-08 Extrel Corporation Method and apparatus for introduction of liquid effluent into mass spectrometer and other gas-phase or particle detectors
AU1708188A (en) * 1987-03-06 1988-09-26 Geochemical Services Inc. Direct injection rf torch
GB2203241B (en) * 1987-03-06 1991-12-04 Extrel Corp Introduction of effluent into mass spectrometers and other gas-phase or particle detectors
US4977785A (en) * 1988-02-19 1990-12-18 Extrel Corporation Method and apparatus for introduction of fluid streams into mass spectrometers and other gas phase detectors
US4926021A (en) * 1988-09-09 1990-05-15 Amax Inc. Reactive gas sample introduction system for an inductively coupled plasma mass spectrometer
JP2598566B2 (ja) * 1990-10-26 1997-04-09 株式会社日立製作所 質量分析計
US5597467A (en) * 1995-02-21 1997-01-28 Cetac Technologies Inc. System for interfacing capillary zone electrophoresis and inductively coupled plasma-mass spectrometer sample analysis systems, and method of use
CA2276018C (en) * 1997-01-03 2004-11-23 Mds Inc. Spray chamber with dryer
US6002129A (en) * 1998-05-14 1999-12-14 Seiko Instruments Inc. Inductively coupled plasma mass spectrometric and spectrochemical analyzer
CA2366625C (en) * 1999-03-22 2008-01-22 Analytica Of Branford, Inc. Direct flow injection analysis nebulization electrospray and apci mass spectrometry
EP1402762B1 (de) * 2001-07-03 2013-09-25 Agilent Technologies Australia (M) Pty Ltd Plasmabrenner

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI625524B (zh) * 2016-04-14 2018-06-01 國立中山大學 使用多游離源作爲連接介面及游離技術的層析質譜裝置

Also Published As

Publication number Publication date
DE102005004804A1 (de) 2005-10-20
GB2410831A (en) 2005-08-10
DE202005001632U1 (de) 2005-06-02
GB0502363D0 (en) 2005-03-16
DE102005004804B4 (de) 2010-06-10
GB2410830A (en) 2005-08-10
CA2496099C (en) 2013-09-24
GB2410830B (en) 2008-06-04
GB2410831B (en) 2008-05-21
JP2005221506A (ja) 2005-08-18
GB0502362D0 (en) 2005-03-16
DE102005004801B4 (de) 2010-06-17
CA2496099A1 (en) 2005-08-06
CA2496013C (en) 2013-09-24
DE102005004801A1 (de) 2005-08-25
CA2496013A1 (en) 2005-08-06

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