JP2005242211A5 - - Google Patents
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- Publication number
- JP2005242211A5 JP2005242211A5 JP2004054863A JP2004054863A JP2005242211A5 JP 2005242211 A5 JP2005242211 A5 JP 2005242211A5 JP 2004054863 A JP2004054863 A JP 2004054863A JP 2004054863 A JP2004054863 A JP 2004054863A JP 2005242211 A5 JP2005242211 A5 JP 2005242211A5
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- JP
- Japan
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Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004054863A JP4587678B2 (ja) | 2004-02-27 | 2004-02-27 | アレイ基板の検査方法及び検査装置 |
TW094102899A TW200600803A (en) | 2004-02-27 | 2005-01-31 | Method and device for testing array substrate |
US11/063,748 US7508229B2 (en) | 2004-02-27 | 2005-02-24 | Method and device for testing array substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004054863A JP4587678B2 (ja) | 2004-02-27 | 2004-02-27 | アレイ基板の検査方法及び検査装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010178524A Division JP5328733B2 (ja) | 2010-08-09 | 2010-08-09 | アレイ基板の検査方法及び検査装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2005242211A JP2005242211A (ja) | 2005-09-08 |
JP2005242211A5 true JP2005242211A5 (ja) | 2007-03-22 |
JP4587678B2 JP4587678B2 (ja) | 2010-11-24 |
Family
ID=34917904
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004054863A Expired - Lifetime JP4587678B2 (ja) | 2004-02-27 | 2004-02-27 | アレイ基板の検査方法及び検査装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7508229B2 (ja) |
JP (1) | JP4587678B2 (ja) |
TW (1) | TW200600803A (ja) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4428255B2 (ja) * | 2005-02-28 | 2010-03-10 | エプソンイメージングデバイス株式会社 | 電気光学装置、駆動方法および電子機器 |
JP5357399B2 (ja) * | 2007-03-09 | 2013-12-04 | 株式会社ジャパンディスプレイ | 表示装置 |
TWI408382B (zh) * | 2009-11-13 | 2013-09-11 | 成像裝置的檢測方法及系統 | |
JP5013554B2 (ja) * | 2010-03-31 | 2012-08-29 | 株式会社ジャパンディスプレイセントラル | 液晶表示装置 |
CN104375294B (zh) * | 2014-11-24 | 2017-03-15 | 深圳市华星光电技术有限公司 | 一种显示面板的检测电路及其检测方法 |
US9601070B2 (en) | 2014-11-24 | 2017-03-21 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Method for performing detection on display panel |
CA2889870A1 (en) * | 2015-05-04 | 2016-11-04 | Ignis Innovation Inc. | Optical feedback system |
CN109637405B (zh) * | 2018-12-05 | 2021-04-06 | 惠科股份有限公司 | 阵列基板的测试方法、装置及存储介质 |
CN116129780B (zh) * | 2023-04-04 | 2023-06-23 | 惠科股份有限公司 | 故障检测电路、显示面板和故障检测方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4968931A (en) * | 1989-11-03 | 1990-11-06 | Motorola, Inc. | Apparatus and method for burning in integrated circuit wafers |
US5546013A (en) * | 1993-03-05 | 1996-08-13 | International Business Machines Corporation | Array tester for determining contact quality and line integrity in a TFT/LCD |
KR0182184B1 (en) * | 1996-04-24 | 1999-04-15 | Samsung Electronics Co Ltd | Disconnection/short test apparatus and its method of signal line using metrix |
JPH10177357A (ja) * | 1996-12-18 | 1998-06-30 | Toshiba Corp | 平面表示装置の製造方法 |
JP3131585B2 (ja) | 1997-09-30 | 2001-02-05 | 株式会社東芝 | 半導体検査回路および半導体回路の検査方法 |
JP2001265248A (ja) * | 2000-03-14 | 2001-09-28 | Internatl Business Mach Corp <Ibm> | アクティブ・マトリックス表示装置、及び、その検査方法 |
TW589455B (en) * | 2000-11-24 | 2004-06-01 | Hannstar Display Corp | Testing method for LCD panel |
JP4112300B2 (ja) * | 2002-07-26 | 2008-07-02 | 株式会社半導体エネルギー研究所 | 電気的検査方法及び半導体表示装置の作製方法 |
-
2004
- 2004-02-27 JP JP2004054863A patent/JP4587678B2/ja not_active Expired - Lifetime
-
2005
- 2005-01-31 TW TW094102899A patent/TW200600803A/zh unknown
- 2005-02-24 US US11/063,748 patent/US7508229B2/en active Active