JP2005242211A5 - - Google Patents

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Publication number
JP2005242211A5
JP2005242211A5 JP2004054863A JP2004054863A JP2005242211A5 JP 2005242211 A5 JP2005242211 A5 JP 2005242211A5 JP 2004054863 A JP2004054863 A JP 2004054863A JP 2004054863 A JP2004054863 A JP 2004054863A JP 2005242211 A5 JP2005242211 A5 JP 2005242211A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2004054863A
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JP4587678B2 (ja
JP2005242211A (ja
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Priority to JP2004054863A priority Critical patent/JP4587678B2/ja
Priority claimed from JP2004054863A external-priority patent/JP4587678B2/ja
Priority to TW094102899A priority patent/TW200600803A/zh
Priority to US11/063,748 priority patent/US7508229B2/en
Publication of JP2005242211A publication Critical patent/JP2005242211A/ja
Publication of JP2005242211A5 publication Critical patent/JP2005242211A5/ja
Application granted granted Critical
Publication of JP4587678B2 publication Critical patent/JP4587678B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2004054863A 2004-02-27 2004-02-27 アレイ基板の検査方法及び検査装置 Expired - Lifetime JP4587678B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2004054863A JP4587678B2 (ja) 2004-02-27 2004-02-27 アレイ基板の検査方法及び検査装置
TW094102899A TW200600803A (en) 2004-02-27 2005-01-31 Method and device for testing array substrate
US11/063,748 US7508229B2 (en) 2004-02-27 2005-02-24 Method and device for testing array substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004054863A JP4587678B2 (ja) 2004-02-27 2004-02-27 アレイ基板の検査方法及び検査装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2010178524A Division JP5328733B2 (ja) 2010-08-09 2010-08-09 アレイ基板の検査方法及び検査装置

Publications (3)

Publication Number Publication Date
JP2005242211A JP2005242211A (ja) 2005-09-08
JP2005242211A5 true JP2005242211A5 (ja) 2007-03-22
JP4587678B2 JP4587678B2 (ja) 2010-11-24

Family

ID=34917904

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004054863A Expired - Lifetime JP4587678B2 (ja) 2004-02-27 2004-02-27 アレイ基板の検査方法及び検査装置

Country Status (3)

Country Link
US (1) US7508229B2 (ja)
JP (1) JP4587678B2 (ja)
TW (1) TW200600803A (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4428255B2 (ja) * 2005-02-28 2010-03-10 エプソンイメージングデバイス株式会社 電気光学装置、駆動方法および電子機器
JP5357399B2 (ja) * 2007-03-09 2013-12-04 株式会社ジャパンディスプレイ 表示装置
TWI408382B (zh) * 2009-11-13 2013-09-11 成像裝置的檢測方法及系統
JP5013554B2 (ja) * 2010-03-31 2012-08-29 株式会社ジャパンディスプレイセントラル 液晶表示装置
CN104375294B (zh) * 2014-11-24 2017-03-15 深圳市华星光电技术有限公司 一种显示面板的检测电路及其检测方法
US9601070B2 (en) 2014-11-24 2017-03-21 Shenzhen China Star Optoelectronics Technology Co., Ltd. Method for performing detection on display panel
CA2889870A1 (en) * 2015-05-04 2016-11-04 Ignis Innovation Inc. Optical feedback system
CN109637405B (zh) * 2018-12-05 2021-04-06 惠科股份有限公司 阵列基板的测试方法、装置及存储介质
CN116129780B (zh) * 2023-04-04 2023-06-23 惠科股份有限公司 故障检测电路、显示面板和故障检测方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4968931A (en) * 1989-11-03 1990-11-06 Motorola, Inc. Apparatus and method for burning in integrated circuit wafers
US5546013A (en) * 1993-03-05 1996-08-13 International Business Machines Corporation Array tester for determining contact quality and line integrity in a TFT/LCD
KR0182184B1 (en) * 1996-04-24 1999-04-15 Samsung Electronics Co Ltd Disconnection/short test apparatus and its method of signal line using metrix
JPH10177357A (ja) * 1996-12-18 1998-06-30 Toshiba Corp 平面表示装置の製造方法
JP3131585B2 (ja) 1997-09-30 2001-02-05 株式会社東芝 半導体検査回路および半導体回路の検査方法
JP2001265248A (ja) * 2000-03-14 2001-09-28 Internatl Business Mach Corp <Ibm> アクティブ・マトリックス表示装置、及び、その検査方法
TW589455B (en) * 2000-11-24 2004-06-01 Hannstar Display Corp Testing method for LCD panel
JP4112300B2 (ja) * 2002-07-26 2008-07-02 株式会社半導体エネルギー研究所 電気的検査方法及び半導体表示装置の作製方法

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