JP2005221368A5 - - Google Patents
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- Publication number
- JP2005221368A5 JP2005221368A5 JP2004029320A JP2004029320A JP2005221368A5 JP 2005221368 A5 JP2005221368 A5 JP 2005221368A5 JP 2004029320 A JP2004029320 A JP 2004029320A JP 2004029320 A JP2004029320 A JP 2004029320A JP 2005221368 A5 JP2005221368 A5 JP 2005221368A5
- Authority
- JP
- Japan
- Prior art keywords
- image data
- light
- sample
- confocal
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004029320A JP2005221368A (ja) | 2004-02-05 | 2004-02-05 | 観察装置及びその観察方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004029320A JP2005221368A (ja) | 2004-02-05 | 2004-02-05 | 観察装置及びその観察方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005221368A JP2005221368A (ja) | 2005-08-18 |
| JP2005221368A5 true JP2005221368A5 (enExample) | 2007-03-15 |
Family
ID=34997122
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004029320A Pending JP2005221368A (ja) | 2004-02-05 | 2004-02-05 | 観察装置及びその観察方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2005221368A (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007240744A (ja) | 2006-03-07 | 2007-09-20 | Tecdia Kk | 光スイッチ及び光アドドロップマルチプレクサ |
| KR101178055B1 (ko) * | 2009-08-14 | 2012-08-29 | 제주대학교 산학협력단 | 높이차 측정 장치 및 방법 |
| JP2012127682A (ja) | 2010-12-13 | 2012-07-05 | Hitachi High-Technologies Corp | 欠陥検査方法及びその装置 |
| CN103376259A (zh) * | 2012-04-11 | 2013-10-30 | 百励科技股份有限公司 | 元件内部缺陷的检测装置及方法 |
| JP6368623B2 (ja) * | 2014-11-06 | 2018-08-01 | 東レエンジニアリング株式会社 | 基板検査装置および方法 |
| EP3474003A1 (en) * | 2017-10-20 | 2019-04-24 | Essilor International | Method for evaluating cosmetic defects of an optical device |
| CN112198168B (zh) * | 2020-10-29 | 2025-07-11 | 深圳市华拓半导体技术有限公司 | 一种半导体检测装置及方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01221850A (ja) * | 1988-02-29 | 1989-09-05 | Shimadzu Corp | 赤外線散乱顕微鏡 |
| US5208648A (en) * | 1991-03-11 | 1993-05-04 | International Business Machines Corporation | Apparatus and a method for high numerical aperture microscopic examination of materials |
| JPH07294422A (ja) * | 1994-04-27 | 1995-11-10 | Mitsubishi Materials Corp | 表面近傍結晶欠陥の検出方法およびその装置 |
| JP4105809B2 (ja) * | 1998-09-08 | 2008-06-25 | 株式会社ルネサステクノロジ | 外観検査方法および外観検査装置 |
| JP2005049294A (ja) * | 2003-07-31 | 2005-02-24 | Olympus Corp | 対象物の観察方法及びその装置 |
-
2004
- 2004-02-05 JP JP2004029320A patent/JP2005221368A/ja active Pending
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