JP2005190791A - Conductive contactor and inspection device equipped with this conductive contactor - Google Patents

Conductive contactor and inspection device equipped with this conductive contactor Download PDF

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JP2005190791A
JP2005190791A JP2003429755A JP2003429755A JP2005190791A JP 2005190791 A JP2005190791 A JP 2005190791A JP 2003429755 A JP2003429755 A JP 2003429755A JP 2003429755 A JP2003429755 A JP 2003429755A JP 2005190791 A JP2005190791 A JP 2005190791A
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contact
contacted
conductive
arm
spring member
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Katsumi Omote
克己 表
Hiroshi Oguri
拓 小栗
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Toshiba Corp
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Toshiba Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a conductive contactor maintaining a clean environment and securing a stable contact state, and an inspection device having this conductive contactor. <P>SOLUTION: The inspection device 10 has a contactor 1 for performing a conduction inspection by depressing and contacting a work 2. The contactor 1 has a shape in which a rectangular blade spring having conductivity is made annular shape and of which both ends are jointed, and when depressed and contacted to the work 2, is elastically deformed, thereby contact pressure is generated and its contact area is enlarged. Then, when a stress of lateral direction is generated, this stress is absorbed by the elastic deformation of the contactor 1, and horizontal slippage between the work 2 is not generated. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

この発明は、検査対象物の被接触部に接触する導電接触子、およびこの導電接触子を備えた検査装置に関する。   The present invention relates to a conductive contact that comes into contact with a contacted portion of an inspection object, and an inspection apparatus including the conductive contact.

従来、導電接触子として、回路基板検査装置のピンボードなどに嵌合保持されるスリーブと、このスリーブ内に摺動自在に保持されるピン本体と、このピン本体と上記スリーブとの間に介装された圧縮スプリングとを備えてなる導電接触ピンが知られている(例えば、特許文献1参照。)。この導電接触ピンは、ピン本体に環装された圧縮スプリングのバネ力を利用してピン本体をスリーブに沿って摺動させ、ピン本体の接点部を被接触部品に押圧接触させる。   Conventionally, as a conductive contact, a sleeve fitted and held on a pin board or the like of a circuit board inspection device, a pin main body slidably held in the sleeve, and an intermediate between the pin main body and the sleeve. 2. Description of the Related Art A conductive contact pin including a mounted compression spring is known (for example, see Patent Document 1). The conductive contact pin slides the pin body along the sleeve using the spring force of a compression spring that is mounted on the pin body, and presses the contact portion of the pin body against the contacted component.

しかし、この導電接触ピンによると、スリーブに対するピン本体の摺動によりゴミが発生する問題がある。発生したゴミは、被接触部品に付着して不具合を生じる。特に、導電接触ピンを被接触部品に対して上方から接触させる場合には、発生したゴミがそのまま被接触部品上に落下して付着してしまう。例えば、極めてクリーンな環境が要求されるフラットパネルディスプレイ等の製造工程においてこの種の摺動式の導電接触ピンを用いると、ピン本体の摺動により発生したゴミが被接触部に付着して不良発生率が高くなり製品歩留まりが悪くなる。   However, according to this conductive contact pin, there is a problem that dust is generated due to sliding of the pin body with respect to the sleeve. The generated dust adheres to the contacted parts and causes a problem. In particular, when the conductive contact pin is brought into contact with the contacted component from above, the generated dust falls and adheres to the contacted component as it is. For example, when this type of sliding conductive contact pin is used in the manufacturing process of a flat panel display or the like that requires a very clean environment, dust generated by sliding of the pin body adheres to the contacted part and becomes defective. Incidence is high and product yield is poor.

また、ピン本体を被接触部に押し当てる際に、ピン本体の押圧方向が被接触部に対して傾斜した方向から当接すると、ピン本体の接点部と被接触部との間でズレを生じ、被接触部を傷付けるとともにゴミの発生の原因となる。また、この場合、被接触部に対するピン本体の接触面積が小さくなり、安定した接触状態を得ることができなくなる。さらに、この種の導電接触ピンによると、圧縮スプリングとピン本体との間の摺動によってもゴミが発生する。   Further, when the pin body is pressed against the contacted part, if the pressing direction of the pin body comes into contact with the contacted part from the inclined direction, a deviation occurs between the contact part of the pin body and the contacted part. This will damage the contacted part and cause dust generation. In this case, the contact area of the pin main body with respect to the contacted portion is reduced, and a stable contact state cannot be obtained. Furthermore, according to this type of conductive contact pin, dust is also generated by sliding between the compression spring and the pin body.

また、この他の導電接触子として、導電性の板バネの先端を被接触部に接触させるタイプの接触子が知られている。この種の接触子は、板バネを弾性変形させてそのバネ力によって先端を被接触部に押圧接触させる。尚、板バネの先端は、被接触部を傷付けることのないようにラウンド加工されている。   As another conductive contact, a contact of the type in which the tip of a conductive leaf spring is brought into contact with a contacted part is known. In this type of contact, the leaf spring is elastically deformed, and the tip is pressed against the contacted portion by the spring force. The tip of the leaf spring is rounded so as not to damage the contacted part.

この種の板バネ状の接触子は、被接触部の上方に摺動機構を持たないため、部材同士の摺動によってゴミが発生する心配がない。しかし、この種の接触子では、適当な接触圧を確保するため板バネの弾性変形を利用するため、先端が被接触部に接触した後、板バネが弾性変形し、板バネの先端と被接触部との間にズレを生じてしまう。両者の間にズレを生じると、上述したように、被接触部を傷付けるとともにゴミの発生原因にもなる。
実開平2−129681号公報(請求項1、図)
Since this type of leaf spring-shaped contact does not have a sliding mechanism above the contacted portion, there is no concern that dust will be generated by sliding between members. However, in this type of contact, since the elastic deformation of the leaf spring is used to ensure an appropriate contact pressure, the leaf spring is elastically deformed after the tip comes into contact with the contacted portion, and the tip of the leaf spring and the covered portion are covered. Deviation occurs between the contact part. When a deviation occurs between the two, as described above, the contacted portion is damaged and dust is generated.
Japanese Utility Model Laid-Open No. 2-129681 (Claim 1, Figure)

この発明は、以上の点に鑑みなされたもので、その目的は、クリーンな環境を維持でき、安定した接触状態を得ることができる導電接触子、およびこの導電接触子を備えた検査装置を提供することにある。   The present invention has been made in view of the above points, and an object thereof is to provide a conductive contact capable of maintaining a clean environment and obtaining a stable contact state, and an inspection apparatus including the conductive contact. There is to do.

上記目的を達成するため、本発明の導電接触子は、導電性を有するバネ部材を環状にした弾性変形可能な接触部と、この接触部を弾性変形させつつ被接触部へ押圧する押圧機構に対して該接触部を取り付ける弾性変形可能な取り付け部と、を備えている。   In order to achieve the above object, the conductive contact of the present invention includes an elastically deformable contact portion in which a spring member having conductivity is formed into an annular shape, and a pressing mechanism that presses the contact portion against the contacted portion while elastically deforming the contact portion. And an elastically deformable attachment portion for attaching the contact portion.

また、本発明の導電接触子は、導電性を有する細長い板状のバネ部材を長手方向に沿って湾曲させて環状にした弾性変形可能な接触部と、上記バネ部材の長手方向両端を貼り合わせて形成され、上記接触部を弾性変形させつつ被接触部へ押圧する押圧機構に対して該接触部を取り付ける弾性変形可能な取り付け部と、を備えている。   The conductive contact according to the present invention is formed by bonding an elastically deformable contact portion obtained by bending an elongated plate-like spring member having conductivity into a ring shape along the longitudinal direction, and both longitudinal ends of the spring member. And an elastically deformable attachment portion that attaches the contact portion to a pressing mechanism that presses the contact portion against the contacted portion while elastically deforming the contact portion.

また、本発明の導電接触子は、導電性を有する細長い板状のバネ部材を長手方向に沿って湾曲させて接触部を形成し、該バネ部材の長手方向両端を接続して取り付け部を形成したことを特徴とする。   Further, the conductive contact of the present invention forms a contact portion by bending an elongated plate-like spring member having conductivity along the longitudinal direction, and forms attachment portions by connecting both longitudinal ends of the spring member. It is characterized by that.

上記発明の導電接触子は、弾性変形可能な取り付け部を介して環状の接触部を押圧機構に取り付け、押圧機構の動作により被接触部に押圧接触される。このとき、環状の接触部が弾性変形し、押圧力を生じるとともに、接触面積が大きくなる。また、このとき、取り付け部が弾性変形して押圧方向と異なる方向の応力を吸収する。   In the conductive contact according to the invention, the annular contact portion is attached to the pressing mechanism via the elastically deformable attachment portion, and is brought into press contact with the contacted portion by the operation of the pressing mechanism. At this time, the annular contact portion is elastically deformed to generate a pressing force and increase the contact area. At this time, the mounting portion elastically deforms and absorbs stress in a direction different from the pressing direction.

更に、本発明の検査装置は、上記導電接触子を上記取り付け部を介して先端部に取り付けたアームと、このアームの基端部近くに設けられ、上記接触部が上記被接触部に接触する接触面と略同じ面に位置決め配置された回転軸と、を有し、上記アームを上記回転軸を中心に回転させて上記接触部を上記被接触部に押圧接触させ、該接触部と被接触部を通電して検査することを特徴とする。   Furthermore, the inspection apparatus according to the present invention is provided with an arm in which the conductive contact is attached to the distal end portion via the attachment portion and a base end portion of the arm, and the contact portion contacts the contacted portion. A rotating shaft positioned and arranged on substantially the same surface as the contact surface, and the arm is rotated about the rotating shaft to press-contact the contact portion with the contacted portion. It is characterized by energizing and inspecting the part.

上記発明の検査装置によると、アームの先端部に導電接触子を取り付け、環状の接触部が被接触部に接触する接触面と略同じ面にアームの回転軸を位置決め配置した。これにより、接触部を被接触部に対して概ね直交する方向から押圧接触させることができ、接触部と被接触部との間のズレを防止できる。   According to the inspection apparatus of the above invention, the conductive contact is attached to the tip of the arm, and the rotary shaft of the arm is positioned and arranged on the substantially same surface as the contact surface where the annular contact portion contacts the contacted portion. Thereby, a contact part can be press-contacted from the direction substantially orthogonal to a to-be-contacted part, and the shift | offset | difference between a contact part and a to-be-contacted part can be prevented.

この発明の導電接触子、およびこの導電接触子を備えた検査装置は、上記のような構成および作用を有しているので、クリーンな環境を維持でき、接触子と被接触部との間で安定した接触状態を得ることができる。   Since the conductive contact according to the present invention and the inspection apparatus provided with the conductive contact have the above-described configuration and operation, a clean environment can be maintained, and the contact between the contact and the contacted part. A stable contact state can be obtained.

以下、図面を参照しながらこの発明の実施の形態について詳細に説明する。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

図1には、この発明の実施の形態に係る導電接触子1(以下、単に接触子1と称する)を備えた検査装置10の概略正面図を示してある。また、図2には、この検査装置10の平面図を示してある。さらに、図3には、接触子1の製造方法を説明するための斜視図を示してある。   FIG. 1 is a schematic front view of an inspection apparatus 10 provided with a conductive contact 1 (hereinafter simply referred to as contact 1) according to an embodiment of the present invention. FIG. 2 is a plan view of the inspection apparatus 10. Further, FIG. 3 is a perspective view for explaining a method for manufacturing the contact 1.

図3に示すように、接触子1は、導電性を有する細長い帯状の矩形の板バネ1a(バネ部材)(図3a)をその長手方向に沿って湾曲(図3b)させ、板バネ1aの長手方向両端を接着剤等により貼り合わせて(図3c、d)形成されている。本実施の形態では、ステンレス製の板厚0.02mm程度の板バネ1aを用意し、その両端を同一面で貼り合わせた。言い換えると、板バネ1aを湾曲させて略円環状の弾性変形可能な接触部1bを形成し、板バネ1aの両端を接続して弾性変形可能な取り付け部1cを形成した。この接触子1は、あらゆる方向に関して変形可能であることを特徴としている。   As shown in FIG. 3, the contact 1 is formed by bending a conductive strip-like rectangular leaf spring 1 a (spring member) (FIG. 3 a) along its longitudinal direction (FIG. 3 b). Both ends in the longitudinal direction are bonded to each other with an adhesive or the like (FIGS. 3c and d). In the present embodiment, a plate spring 1a made of stainless steel having a thickness of about 0.02 mm is prepared, and both ends thereof are bonded to the same surface. In other words, the leaf spring 1a is curved to form a substantially annular elastically deformable contact portion 1b, and both ends of the leaf spring 1a are connected to form an elastically deformable attachment portion 1c. The contact 1 is characterized by being deformable in all directions.

図1および図2に示すように、検査装置10は、上記構造の接触子1を押圧機構20に取り付けて構成されている。
検査装置10は、接触子1が接触する対象となる被接触部を有するワーク2を位置決めして載置する載置台4を有する。載置台4の一端には、ワーク2の端辺を当接させて位置決めするための位置決めブロック6が固設されている。載置台4の載置面4aは、略水平な面を形成し、ワーク2を水平な状態にして所定位置に位置決めして載置する。以下の説明では、載置台4の載置面4aに沿った図1中左右方向を横方向と称し、載置面4aと垂直な方向を高さ方向と称する。
As shown in FIGS. 1 and 2, the inspection apparatus 10 is configured by attaching the contact 1 having the above structure to a pressing mechanism 20.
The inspection apparatus 10 has a mounting table 4 for positioning and mounting a workpiece 2 having a contacted portion that is a target to which the contact 1 comes into contact. At one end of the mounting table 4, a positioning block 6 for fixing the workpiece 2 by contacting the end side of the workpiece 2 is fixed. The mounting surface 4a of the mounting table 4 forms a substantially horizontal surface, and the workpiece 2 is placed in a horizontal state and positioned at a predetermined position. In the following description, the horizontal direction in FIG. 1 along the mounting surface 4a of the mounting table 4 is referred to as a horizontal direction, and the direction perpendicular to the mounting surface 4a is referred to as a height direction.

押圧機構20は、第1腕22、第2腕24、およびシャフト26を組み合わせたアーム28を有する。接触子1は、その取り付け部1cを介して、第1腕22の先端に取り付けられている。具体的には、接触子1は、取り付け部1cを貫通した孔(図示せず)にネジ31を通して第1腕22の先端、すなわちアーム28の先端部にネジ止め固定されている。   The pressing mechanism 20 has an arm 28 in which a first arm 22, a second arm 24, and a shaft 26 are combined. The contact 1 is attached to the tip of the first arm 22 via the attachment portion 1c. Specifically, the contact 1 is screwed and fixed to the distal end of the first arm 22, that is, the distal end of the arm 28 through a screw 31 through a hole (not shown) penetrating the attachment portion 1 c.

第1腕22の後端は、第2腕24の先端近くでその上に重ねられてネジ32により固定されている。ネジ32による固定位置を調整することにより、第1腕22と第2腕24を接続した腕の長さを調整できるようになっている。つまり、ネジ32による固定位置を調整して接触子1の横方向の位置を調整できるようになっている。   The rear end of the first arm 22 is overlaid on the second arm 24 near the front end and fixed by a screw 32. By adjusting the fixing position by the screw 32, the length of the arm connecting the first arm 22 and the second arm 24 can be adjusted. That is, the lateral position of the contact 1 can be adjusted by adjusting the fixing position by the screw 32.

第2腕24の後端は、高さ方向に延びたシャフト26の途中にクランプ締結されている。具体的には、第2腕24の後端をシャフト26にクランプし、ネジ33によって締め付けている。第2腕24のシャフト26に沿ったクランプ位置を調整することにより、接触子1の取り付け高さを調整できる。   The rear end of the second arm 24 is clamped to the middle of the shaft 26 extending in the height direction. Specifically, the rear end of the second arm 24 is clamped to the shaft 26 and tightened with a screw 33. By adjusting the clamp position along the shaft 26 of the second arm 24, the mounting height of the contact 1 can be adjusted.

シャフト26の下端部、すなわちアーム28の後端部は、回転軸34に固設されたブロック35に固定されている。回転軸34の両端は、ベアリングホルダー36によって回転可能に保持されている。ベアリングホルダー36として、回転軸34に対する摩擦が少なく、回転軸34との間の摺接によるゴミの発生が殆ど無い玉軸受などが用いられる。   A lower end portion of the shaft 26, that is, a rear end portion of the arm 28 is fixed to a block 35 fixed to the rotating shaft 34. Both ends of the rotating shaft 34 are rotatably held by bearing holders 36. As the bearing holder 36, a ball bearing or the like that has little friction with the rotating shaft 34 and hardly generates dust due to sliding contact with the rotating shaft 34 is used.

ベアリングホルダー36は、絶縁性を有する支持部材37を介して、検査装置10のフレーム11に固設されている。そして、接触子1、第1腕22、第2腕24、シャフト26、ブロック35、および回転軸34を導電性を有する材料により形成し、回転軸34の一端から配線38を導出し、接触子1を介してワーク2に電圧を印加するようにした。   The bearing holder 36 is fixed to the frame 11 of the inspection apparatus 10 via an insulating support member 37. The contact 1, the first arm 22, the second arm 24, the shaft 26, the block 35, and the rotating shaft 34 are formed of a conductive material, and the wiring 38 is led out from one end of the rotating shaft 34. The voltage was applied to the work 2 through 1.

尚、接触子1を取り付けたアーム28は、回転軸34の中心が、接触部1bが接触するワーク2の接触面2aと略同じ面内に配置されるように、検査装置10のフレーム11に対して位置決めされて取り付けられている。これにより、アーム28を回転させて接触子1をワーク2に接触させる際、接触子1の接触位置における押圧方向がワーク2の接触面2aに対して略直交する方向となり、接触部1bと接触面2aとの間に横方向のズレを生じることを防止できる。   The arm 28 to which the contact 1 is attached is attached to the frame 11 of the inspection apparatus 10 so that the center of the rotating shaft 34 is arranged in substantially the same plane as the contact surface 2a of the work 2 with which the contact portion 1b contacts. It is positioned and attached to it. As a result, when the arm 28 is rotated to bring the contact 1 into contact with the work 2, the pressing direction at the contact position of the contact 1 is substantially perpendicular to the contact surface 2a of the work 2, and the contact 1b is brought into contact. It is possible to prevent a lateral shift from occurring between the surface 2a.

上記構造の検査装置10にワーク2をセットする場合、図4に示すように、押圧機構20のアーム28を図中矢印で示す時計回り方向に回転させ、接触子1を上方に退避させる。そして、ワーク2の端部を位置決めブロック6に当接せしめてワーク2を載置台4の載置面4a上に位置決め配置する。この後、図5に示すように、アーム28を反時計回り方向に回転させ、接触子1の接触部1bをワーク2の接触面2aに押圧接触させる。このとき、接触子1が弾性変形してその反力によって押圧力を生じワーク2の所定位置に確実に接触し、信頼性の高い検査が可能となる。   When the workpiece 2 is set in the inspection apparatus 10 having the above structure, as shown in FIG. 4, the arm 28 of the pressing mechanism 20 is rotated in the clockwise direction indicated by the arrow in the drawing, and the contact 1 is retracted upward. Then, the workpiece 2 is positioned on the mounting surface 4 a of the mounting table 4 by bringing the end of the workpiece 2 into contact with the positioning block 6. Thereafter, as shown in FIG. 5, the arm 28 is rotated in the counterclockwise direction so that the contact portion 1 b of the contact 1 is pressed against the contact surface 2 a of the work 2. At this time, the contact 1 is elastically deformed to generate a pressing force by the reaction force, thereby reliably contacting a predetermined position of the work 2 and enabling highly reliable inspection.

ここで、上述した本実施の形態の接触子1の作用について、図6乃至図8を参照して説明する。図6には、接触子1をワーク2の接触面2aに接触させた瞬間を示してあり、図7には、接触子1を接触面2aに所定圧力で押圧した状態を示してある。また、図8には、接触子1が傾斜した方向から接触面2aに接触した場合の挙動について説明するための図を示してあり、比較のため、従来の導電接触ピンの場合も並べて図示してある。   Here, the effect | action of the contact 1 of this Embodiment mentioned above is demonstrated with reference to FIG. 6 thru | or FIG. FIG. 6 shows the moment when the contact 1 is brought into contact with the contact surface 2a of the workpiece 2, and FIG. 7 shows a state where the contact 1 is pressed against the contact surface 2a with a predetermined pressure. Further, FIG. 8 shows a diagram for explaining the behavior when the contact 1 comes into contact with the contact surface 2a from the inclined direction. For comparison, the case of a conventional conductive contact pin is also shown side by side. It is.

図6に示すように、アーム28を回動させて接触子1の接触部1bをワーク2の接触面2aに接触させた状態では、接触子1は、接触部1bおよび取り付け部1c共に弾性変形していないため、接触部1bと接触面2aの間に押圧力は生じていない。   As shown in FIG. 6, when the arm 28 is rotated and the contact portion 1b of the contact 1 is brought into contact with the contact surface 2a of the workpiece 2, the contact 1 is elastically deformed in both the contact portion 1b and the attachment portion 1c. Therefore, no pressing force is generated between the contact portion 1b and the contact surface 2a.

この状態から、アーム28をさらに反時計回り方向に回転させると、接触子1の主に接触部1bが図7に示すように弾性変形し、その反力によって接触部1bが接触面2aに押圧される。これにより、両者の間に十分な接触圧を得ることができるとともに、接触部1bの弾性変形により両者の間の接触面積が大きくなり、より確実な接触状態を得ることができる。   When the arm 28 is further rotated counterclockwise from this state, the contact portion 1b of the contact 1 is mainly elastically deformed as shown in FIG. 7, and the contact portion 1b is pressed against the contact surface 2a by the reaction force. Is done. Thereby, while being able to obtain sufficient contact pressure between both, the contact area between both becomes large by elastic deformation of the contact part 1b, and a more reliable contact state can be obtained.

また、このとき、アーム28の回転軸34がワーク2の接触面2aと略同じ面に配置されているため、接触部1bが接触面2aを押圧する方向が接触面2aと略直交する方向となる。このため、接触部1bが正常な状態で接触面2aに押圧接触される場合、主に環状の接触部1bが弾性変形して、押圧方向に延びている取り付け部1cは殆ど弾性変形することはなく、接触部1bと接触面2aの間に横方向のズレを生じることは無い。   At this time, since the rotation shaft 34 of the arm 28 is disposed on substantially the same surface as the contact surface 2a of the workpiece 2, the direction in which the contact portion 1b presses the contact surface 2a is substantially perpendicular to the contact surface 2a. Become. For this reason, when the contact portion 1b is pressed against the contact surface 2a in a normal state, the annular contact portion 1b is mainly elastically deformed, and the attachment portion 1c extending in the pressing direction is almost elastically deformed. In other words, no lateral displacement occurs between the contact portion 1b and the contact surface 2a.

一方、何らかの原因により例えば図8(b)に示すように接触子1が接触面2aに対して角度θだけ傾斜した方向から接触した場合であっても、接触部1bの弾性変形に加えて取り付け部1cが比較的大きく弾性変形して横方向の応力を吸収し、接触部1bと接触面2aの間に横方向のズレを生じることを防止できる。   On the other hand, even if the contact 1 comes into contact with the contact surface 2a from the direction inclined by the angle θ as shown in FIG. It is possible to prevent the portion 1c from being elastically deformed comparatively and absorbing the stress in the lateral direction to cause a lateral displacement between the contact portion 1b and the contact surface 2a.

いずれにしても、上述した本実施の形態の接触子1を採用すると、接触面2aとの間で横方向のズレを生じることがなく、接触面2aを傷付けることもなく、ゴミが発生する心配も無い。   In any case, when the above-described contact 1 of the present embodiment is employed, there is no risk of lateral displacement with respect to the contact surface 2a, no damage to the contact surface 2a, and generation of dust. There is no.

これに対し、例えば、図8(d)に示すように、剛体からなる従来の導電接触ピン41が傾斜した方向から接触面2aに接触すると、直交する方向から接触した図8(c)の場合と比較して、接触面積が大幅に小さく(略点接触)なり、十分な接触状態を得ることができなくなる。その上、接触ピン41の先端と接触面2aとの間に横方向のズレを生じ、接触面2aを傷付けてしまうとともに、ゴミを発生する重大な問題を引き起こす。   On the other hand, for example, as shown in FIG. 8D, when the conventional conductive contact pin 41 made of a rigid body comes into contact with the contact surface 2a from the inclined direction, the case shown in FIG. As compared with the above, the contact area is significantly reduced (substantially point contact), and a sufficient contact state cannot be obtained. In addition, a lateral shift occurs between the tip of the contact pin 41 and the contact surface 2a, which damages the contact surface 2a and causes a serious problem of generating dust.

次に、本実施の形態の接触子1によって、接触子1とワーク2の間に生じる横方向のズレを吸収するメカニズムについて、図9および図10を参照してさらに詳細に説明する。
図9に示すように、接触子1を接触面2a(不図示)に押圧接触させるために図中実線で示す位置から図中2点鎖線で示す位置へ移動させたものと仮定し、アーム28の回転軸34の中心から接触子1がワーク2に接触する接触位置までの距離をL、接触子1をアーム28の先端に固定した位置から接触位置までの距離をM、そのときの接触子1の押し込み量をδ、接触子1の横方向へのズレ量をεと仮定すると、横ズレ量εは、
ε=L−√(L2−δ2
となる。
Next, a mechanism for absorbing the lateral displacement generated between the contact 1 and the workpiece 2 by the contact 1 of the present embodiment will be described in more detail with reference to FIGS. 9 and 10.
As shown in FIG. 9, it is assumed that the contact 1 is moved from the position indicated by the solid line in the drawing to the position indicated by the two-dot chain line in the drawing in order to press and contact the contact surface 2a (not shown). L is the distance from the center of the rotating shaft 34 to the contact position where the contact 1 comes into contact with the workpiece 2, and M is the distance from the position where the contact 1 is fixed to the tip of the arm 28 to the contact position. Assuming that the pushing amount of 1 is δ and the displacement amount of the contact 1 in the lateral direction is ε, the lateral displacement amount ε is
ε = L−√ (L 2 −δ 2 )
It becomes.

また、図10に示すように、そのときの接触子1の押圧力をP、接触子1が横方向にズレようとする力をP’、接触部1bと接触面2aとの間の摩擦力をF、弾性変形の無い状態における接触子1の半径をr、接触子1と接触面2aとの間の摩擦係数をμとすると、横ズレ力P’は、
P’=3εEI/M3
となり、押圧力Pは、
P=δEI/r3(π/4−2/π)
となり、摩擦力Fは、
F=μPとなる。
Also, as shown in FIG. 10, the pressing force of the contact 1 at that time is P, the force that the contact 1 tries to shift laterally is P ', and the frictional force between the contact portion 1b and the contact surface 2a Where F is the radius of the contact 1 in a state without elastic deformation, r is the radius of friction between the contact 1 and the contact surface 2a, and the lateral displacement force P ′ is
P ′ = 3εEI / M 3
And the pressing force P is
P = δEI / r 3 (π / 4-2 / π)
The frictional force F is
F = μP.

そして、接触子1を接触面2aに押圧接触せしめたときに両者の間に横ズレを生じない条件は、F>P’となる。言い換えると、F>P’を満たすように、上記各式の各値を設定することにより、接触子1とワーク2との間の横ズレを防止できることになる。   And, when the contact 1 is brought into press contact with the contact surface 2a, a condition that does not cause a lateral shift between them is F> P ′. In other words, by setting each value of the above equations so as to satisfy F> P ′, it is possible to prevent a lateral shift between the contact 1 and the work 2.

[実施例]
回転軸34の中心から接触位置までの距離Lを65[mm]に設定し、接触子1の押し込み量δを3[mm]に設定し、接触子1の取り付け位置から接触位置までの距離Mを30[mm]に設定し、弾性変形していない状態の接触子1(この場合、接触子1を円形とみなした)の半径rを7[mm]として、接触子1を押圧接触させたときの接触面2aに対する横ズレ量εを測定したところ、ε=0.069[mm]であった。また、このとき、接触子1の板バネ1aの厚さを0.05[mm]、幅を5[mm]に設定し、ステンレス製としたため、接触子1が横方向へズレようとする力P’は、8.2×10-5[N]となった。
[Example]
The distance L from the center of the rotating shaft 34 to the contact position is set to 65 [mm], the pushing amount δ of the contact 1 is set to 3 [mm], and the distance M from the attachment position of the contact 1 to the contact position is set. Is set to 30 [mm], and the radius of the contact 1 in a state where it is not elastically deformed (in this case, the contact 1 is regarded as a circle) is set to 7 [mm], and the contact 1 is pressed and contacted. When the lateral displacement amount ε with respect to the contact surface 2a was measured, ε was 0.069 [mm]. At this time, since the thickness of the leaf spring 1a of the contact 1 is set to 0.05 [mm] and the width is set to 5 [mm] and made of stainless steel, the force that the contact 1 tends to shift in the lateral direction. P ′ was 8.2 × 10 −5 [N].

これに対し、上述した条件を満たす場合の接触子1の接触面2aに対する押圧力Pは、近似計算で0.63[N]となった。また、このときの接触子1と接触面2aとの間の摩擦力Fは、摩擦係数μを0.5としたため、0.31[N]となった。   On the other hand, the pressing force P with respect to the contact surface 2a of the contact 1 when the above-described conditions are satisfied is 0.63 [N] in the approximate calculation. Further, the frictional force F between the contact 1 and the contact surface 2a at this time was 0.31 [N] because the friction coefficient μ was set to 0.5.

つまり、本実施例の設定値を採用した場合、接触子1が横方向にズレようとする力P’は、接触子1と接触面2aとの間の摩擦力Fよりはるかに小さくなり、接触子1を接触面2aに押圧せしめた際に両者の間で横ズレを生じることはない。   That is, when the set value of the present embodiment is adopted, the force P ′ that the contact 1 tries to shift in the lateral direction is much smaller than the frictional force F between the contact 1 and the contact surface 2a. When the child 1 is pressed against the contact surface 2a, no lateral displacement occurs between them.

以上のように、本実施の形態によると、板バネ1aを環状にして両端を接合しただけの簡単な構造の接触子1を採用することにより、部材間の摺接によってゴミが発生する心配がなく、クリーンな環境を維持でき、接触子1の弾性変形を利用して十分な押圧力を得ることができ且つ接触面積を拡大して安定した接触状態を得ることが可能となった。   As described above, according to the present embodiment, by adopting the contact 1 having a simple structure in which the leaf spring 1a is annular and both ends are joined, there is a concern that dust may be generated due to sliding contact between members. Therefore, a clean environment can be maintained, a sufficient pressing force can be obtained by utilizing the elastic deformation of the contact 1, and a stable contact state can be obtained by expanding the contact area.

なお、この発明は、上述した実施の形態そのままに限定されるものではなく、実施段階ではその要旨を逸脱しない範囲で構成要素を変形して具体化できる。また、上述した実施の形態に開示されている複数の構成要素の適宜な組み合わせにより種々の発明を形成できる。例えば、上述した実施の形態に示される全構成要素から幾つかの構成要素を削除しても良い。   Note that the present invention is not limited to the above-described embodiment as it is, and can be embodied by modifying the constituent elements without departing from the scope of the invention in the implementation stage. Various inventions can be formed by appropriately combining a plurality of constituent elements disclosed in the above-described embodiments. For example, you may delete some components from all the components shown by embodiment mentioned above.

例えば、上述した実施の形態では、矩形の板バネ1aを環状にして同一面を接合した構造の接触子1について説明したが、これに限らず、環状の接触部1bと取り付け部1cを別体とした接触子としても良い。   For example, in the above-described embodiment, the contact 1 having a structure in which the rectangular leaf spring 1a is annular and the same surface is joined is described. However, the present invention is not limited to this, and the annular contact 1b and the attachment 1c are separated. It may be a contact.

この発明の実施の形態に係る接触子を備えた検査装置の概略構成を示す正面図。The front view which shows schematic structure of the inspection apparatus provided with the contactor which concerns on embodiment of this invention. 図1の検査装置の平面図。The top view of the inspection apparatus of FIG. 図1の検査装置に組み込まれた接触子の製造工程を説明するための図。The figure for demonstrating the manufacturing process of the contactor integrated in the inspection apparatus of FIG. 図1の検査装置にワークをセットする方法を説明するための動作説明図。Operation | movement explanatory drawing for demonstrating the method to set a workpiece | work to the inspection apparatus of FIG. 図4でセットしたワークに接触子を接触させた状態を示す動作説明図。Operation | movement explanatory drawing which shows the state which made the contactor contact the workpiece | work set in FIG. 接触子をワークに接触させた瞬間を示す図。The figure which shows the moment when the contactor was made to contact a workpiece | work. 接触子をワークに押圧接触させて弾性変形させた状態を示す図。The figure which shows the state which made the contactor press-contact a workpiece | work and was elastically deformed. 接触子をワークの接触面に対して傾斜した方向から接触させた場合における接触子の挙動を従来の導電接触ピンと比較して示す図。The figure which shows the behavior of a contact child in the case of making a contact child contact from the direction inclined with respect to the contact surface of a workpiece | work compared with the conventional conductive contact pin. 接触子とワークとの間の横ズレを吸収するメカニズムを説明するための図。The figure for demonstrating the mechanism which absorbs the horizontal shift between a contactor and a workpiece | work. 接触子とワークとの間の横ズレを吸収するメカニズムを説明するための図。The figure for demonstrating the mechanism which absorbs the horizontal shift between a contactor and a workpiece | work.

符号の説明Explanation of symbols

1…接触子、1a…板バネ、1b…接触部、1c…取り付け部、2…ワーク、2a…接触面、4…載置台、6…位置決めブロック、10…検査装置、11…フレーム、20…押圧機構、28…アーム、34…回転軸。   DESCRIPTION OF SYMBOLS 1 ... Contact, 1a ... Leaf spring, 1b ... Contact part, 1c ... Mounting part, 2 ... Workpiece, 2a ... Contact surface, 4 ... Mounting stand, 6 ... Positioning block, 10 ... Inspection apparatus, 11 ... Frame, 20 ... Pressing mechanism, 28... Arm, 34.

Claims (7)

導電性を有するバネ部材を環状にした弾性変形可能な接触部と、
この接触部を弾性変形させつつ被接触部へ押圧する押圧機構に対して該接触部を取り付ける弾性変形可能な取り付け部と、
を備えていることを特徴とする導電接触子。
An elastically deformable contact portion in which a spring member having conductivity is formed into a ring;
An elastically deformable attachment portion for attaching the contact portion to a pressing mechanism that presses against the contacted portion while elastically deforming the contact portion;
A conductive contact comprising:
上記取り付け部は、上記接触部を被接触部へ押圧する方向に延びた導電性を有するバネ部材により形成されていることを特徴とする請求項1に記載の導電接触子。   2. The conductive contact according to claim 1, wherein the attachment portion is formed of a spring member having conductivity extending in a direction of pressing the contact portion against the contacted portion. 導電性を有する細長い板状のバネ部材を長手方向に沿って湾曲させて環状にした弾性変形可能な接触部と、
上記バネ部材の長手方向両端を貼り合わせて形成され、上記接触部を弾性変形させつつ被接触部へ押圧する押圧機構に対して該接触部を取り付ける弾性変形可能な取り付け部と、
を備えていることを特徴とする導電接触子。
An elastically deformable contact portion formed by bending an elongated plate-like spring member having conductivity into a ring shape along the longitudinal direction;
An elastically deformable mounting portion that is formed by bonding the longitudinal ends of the spring member and attaches the contact portion to a pressing mechanism that presses against the contacted portion while elastically deforming the contact portion;
A conductive contact comprising:
上記バネ部材は、細長い帯状の矩形の板バネであることを特徴とする請求項3に記載の導電接触子。   The conductive contact according to claim 3, wherein the spring member is an elongated strip-like rectangular leaf spring. 上記取り付け部は、上記板バネの同一面を両端で貼り合わせることにより形成されることを特徴とする請求項4に記載の導電接触子。   The conductive contact according to claim 4, wherein the attachment portion is formed by bonding the same surface of the leaf spring at both ends. 導電性を有する細長い板状のバネ部材を長手方向に沿って湾曲させて接触部を形成し、該バネ部材の長手方向両端を接続して取り付け部を形成したことを特徴とする導電接触子。   A conductive contact having a contact portion formed by bending an elongated plate-like spring member having conductivity along a longitudinal direction, and an attachment portion is formed by connecting both ends of the spring member in the longitudinal direction. 請求項1乃至5のいずれかに記載の導電接触子を上記取り付け部を介して先端部に取り付けたアームと、
このアームの基端部近くに設けられ、上記接触部が上記被接触部に接触する接触面と略同じ面に位置決め配置された回転軸と、を有し、
上記アームを上記回転軸を中心に回転させて上記接触部を上記被接触部に押圧接触させ、該接触部と被接触部を通電して検査することを特徴とする検査装置。
An arm having the conductive contact according to any one of claims 1 to 5 attached to a tip portion via the attachment portion;
A rotating shaft provided near the base end of the arm, and the contact portion positioned and arranged on substantially the same surface as the contact surface that contacts the contacted portion;
An inspection apparatus comprising: rotating the arm around the rotation shaft to bring the contact portion into press contact with the contacted portion; and energizing and inspecting the contact portion and the contacted portion.
JP2003429755A 2003-12-25 2003-12-25 Conductive contactor and inspection device equipped with this conductive contactor Pending JP2005190791A (en)

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Application Number Priority Date Filing Date Title
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Publication Number Publication Date
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Country Link
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014182041A (en) * 2013-03-21 2014-09-29 Totoku Electric Co Ltd Probe pin and contact probe

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014182041A (en) * 2013-03-21 2014-09-29 Totoku Electric Co Ltd Probe pin and contact probe

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