JP2005189085A5 - - Google Patents

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Publication number
JP2005189085A5
JP2005189085A5 JP2003430392A JP2003430392A JP2005189085A5 JP 2005189085 A5 JP2005189085 A5 JP 2005189085A5 JP 2003430392 A JP2003430392 A JP 2003430392A JP 2003430392 A JP2003430392 A JP 2003430392A JP 2005189085 A5 JP2005189085 A5 JP 2005189085A5
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JP
Japan
Prior art keywords
optical probe
light
probe according
loss
scattering element
Prior art date
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Granted
Application number
JP2003430392A
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English (en)
Japanese (ja)
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JP2005189085A (ja
JP4216179B2 (ja
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Application filed filed Critical
Priority to JP2003430392A priority Critical patent/JP4216179B2/ja
Priority claimed from JP2003430392A external-priority patent/JP4216179B2/ja
Publication of JP2005189085A publication Critical patent/JP2005189085A/ja
Publication of JP2005189085A5 publication Critical patent/JP2005189085A5/ja
Application granted granted Critical
Publication of JP4216179B2 publication Critical patent/JP4216179B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003430392A 2003-12-25 2003-12-25 光学プローブ Expired - Fee Related JP4216179B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003430392A JP4216179B2 (ja) 2003-12-25 2003-12-25 光学プローブ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003430392A JP4216179B2 (ja) 2003-12-25 2003-12-25 光学プローブ

Publications (3)

Publication Number Publication Date
JP2005189085A JP2005189085A (ja) 2005-07-14
JP2005189085A5 true JP2005189085A5 (https=) 2007-02-15
JP4216179B2 JP4216179B2 (ja) 2009-01-28

Family

ID=34788785

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003430392A Expired - Fee Related JP4216179B2 (ja) 2003-12-25 2003-12-25 光学プローブ

Country Status (1)

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JP (1) JP4216179B2 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5450993B2 (ja) * 2008-07-14 2014-03-26 富士フイルム株式会社 検出方法、検出用試料セルおよび検出用キット
JP5190945B2 (ja) * 2008-07-14 2013-04-24 富士フイルム株式会社 検出方法、検出装置、検出用試料セルおよび検出用キット
JP2010043934A (ja) * 2008-08-12 2010-02-25 Fujifilm Corp 検出方法、検出用試料セル、検出用キット及び検出装置
JP2010071682A (ja) * 2008-09-16 2010-04-02 Fujifilm Corp センシング装置、物質検出方法、検査チップ、及び検査キット
JP5563789B2 (ja) * 2009-06-11 2014-07-30 富士フイルム株式会社 検出方法

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