JP2005141035A - Fixture for dynamic operating inspection of liquid crystal panel, and method for dynamic operating inspection - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a fixture to relieve the load of work in correction work of a liquid crystal panel, after dynamic operating inspection. <P>SOLUTION: The fixture is provided with a base plate 11, on which the liquid crystal panel 8 equipped with a TFT substrate 8b, is placed and on which a hole H for making a light incident from a backlight 9 to the liquid crystal panel 8, a probe pin 15 arranged on the base plate 11 and supplying a turn on signal to transmit an input terminal 8c of the TFT substrate 8b of the liquid crystal panel 8, and a clamping unit 16 for holding the liquid crystal panel 8, in a state in which an end of the probe pin 15 is brought into contact with the input terminal of the liquid crystal panel, disposed so as to make the TFT substrate 8b face the upper side. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to a lighting inspection jig and a lighting inspection method for a liquid crystal panel, and more particularly to a jig and method used when performing a lighting inspection on a liquid crystal panel before mounting a driver for driving a circuit. It is.

A liquid crystal display device is configured by arranging a backlight on the back side of a liquid crystal panel. The liquid crystal panel sandwiches liquid crystal between two substrates on which electrodes are formed, and an electric signal is provided between the electrodes on both substrates. Is applied to change the transmittance of light incident on the liquid crystal panel from the backlight to display the image as an image.
The liquid crystal panel requires advanced thin film formation technology and microfabrication technology in its manufacturing process, and thus it has been difficult to completely suppress the occurrence of defects. Conventionally, in order to detect defects at an early stage, lighting inspection of a liquid crystal panel is performed at a stage before mounting a driver for driving the liquid crystal panel.

  In general, the lighting inspection is performed by inputting a lighting signal to a terminal of a liquid crystal panel using a lighting inspection jig, and an operator visually determines the presence or absence of a defect. When there is a lighting defect, it is determined whether the liquid crystal panel can be repaired by correction. In the correction process, the defect location is generally corrected by cutting and connecting the circuit pattern with a laser, but a series including confirmation of the defective pattern position, fine adjustment of the laser irradiation position, confirmation of the lighting state after the correction process, etc. In this operation, the liquid crystal panel is held in the lighting inspection jig.

Hereinafter, conventional visual inspection and laser correction in an active matrix liquid crystal panel having a thin film transistor as a switching element will be described with reference to FIGS.
As shown in FIG. 8, the liquid crystal panel 8 to be inspected for lighting has a liquid crystal sandwiched between a CF (color filter) substrate 8a and a TFT (thin film transistor) substrate 8b, and an input terminal 8c at a part of the periphery of the TFT substrate 8b. Are arranged in parallel on the surface facing the CF substrate 8.

  As shown in FIG. 7, the lighting inspection jig 1 includes a base plate 2 for holding the liquid crystal panel 8 and an upper lid 3 connected to the base plate 2 via a hinge portion 4. An incident light extraction hole 2a for allowing light from a separately provided backlight 9 to enter the liquid crystal panel 10 is provided, and a liquid crystal panel 8 is provided at a required position near the periphery of the incident light extraction hole 2a. Positioning protrusions 7 are provided for positioning.

  Further, the upper lid 3 is provided with a visual punch hole 3a for visually inspecting the display state when the liquid crystal panel 8 is turned on, and a probe pin such as a baking material or a resin is formed on the lower surface of the upper lid 3. A holding part 6 is provided, and the probe pin holding part 6 is provided with a spring probe 6 for supplying a test signal to the input terminal 8 c of the liquid crystal panel 8. The spring probes 6 are connected to an inspection signal supply means (not shown) by an inspection signal line W.

Hereinafter, a method of visual inspection using the lighting inspection jig 1 will be described.
As shown in FIG. 9, first, the liquid crystal panel 1 is placed on the base plate 2 of the lighting inspection jig 1, the panel periphery is brought into contact with the positioning projection 7, the liquid crystal panel 8 is aligned, and then the upper lid 3 is closed. Thus, the spring probe 6 is brought into contact with the input terminal 8 c of the liquid crystal panel 8. Then, an inspection signal is supplied to the spring probe 6 by an inspection signal supply means (not shown) and the backlight 9 is turned on, and the operator turns the lighting state of the liquid crystal panel 8 from the direction toward the CF substrate 8a through the visual hole 3a. Inspect by visual inspection M, and mark the defective part with a pen or the like.

  The liquid crystal panel 8 to be corrected is repaired by laser correction of the defective portion by the visual inspection, but the correction work is performed by directly irradiating the laser beam to cut and connect the wiring pattern of the TFT substrate 8b. It is necessary to direct the TFT substrate 8b side of the panel 8 to the laser irradiation apparatus L. Since the laser irradiation apparatus L which is normally used irradiates the laser from above the lighting inspection jig 1 in view of the apparatus configuration and safety, the operator performs the lighting inspection from the state at the time of the visual inspection shown in FIG. The liquid crystal panel 8 is turned upside down together with the jig 1 and the correction work is performed as shown in FIG. At the time of confirmation of the correction position, alignment of the laser correction position, and confirmation after correction, the lighting signal is confirmed in the lighting state inputted to the input terminal 8c through the spring probe 6 as in the visual inspection.

  In addition, the inspection jig disclosed in Japanese Patent Laid-Open No. 10-54967 is formed by folding a common pin corresponding to a probe into a substantially L shape without stroking it in the thickness direction of the jig. Although the thickness of the jig is reduced, the procedure for using the jig is substantially the same as that of the conventional example described above.

However, in recent years, the liquid crystal panel 8 has been increased in size while the liquid crystal panel from the 10-inch screen class to the 30-inch screen class is being lined up, and accordingly, the lighting inspection jig 1 has also been increased in size. When the correction work by the laser irradiation device L is performed after the visual inspection, the work for reversing the lighting inspection jig 1 occurs, and the work for reversing the lighting inspection jig 1 if the size is up to 16 type class. Although the load is not so large, if it exceeds 16 types, the lighting inspection jig 1 becomes large and heavy, and problems such as attachment / detachment of the liquid crystal panel 8 and reversing work become a heavy burden on the operator. . In such a situation, cracks, chips and the like due to the contact of the liquid crystal panel 8 during work occur, and the number of defective products is extremely increased.
JP-A-10-54967

  The present invention has been made in view of the above problems, and it is an object of the present invention to reduce the work load in the correction work of the liquid crystal panel after the lighting inspection and to reduce the quality deterioration during the work.

In order to solve the above problems, the present invention firstly, a base plate on which a liquid crystal panel provided with a TFT substrate is placed and a light incident hole for transmitting light from a backlight to the liquid crystal panel is provided;
A probe pin provided on the base plate for supplying a lighting signal to an input terminal of the TFT substrate of the liquid crystal panel;
A lighting test for a liquid crystal panel, comprising: holding means for holding the liquid crystal panel in a state where the tip of the probe pin is in contact with an input terminal of the liquid crystal panel arranged with the TFT substrate facing upward Jigs are provided.

  With the above configuration, the probe pin for supplying the lighting signal is arranged on the base plate side, and the TFT substrate input terminal is used as the probe pin by mounting the liquid crystal panel with the TFT substrate side facing the upper surface. Can be opposed. Therefore, if there is a lighting failure when a lighting signal is input to the probe pin and a lighting test is performed, the laser is irradiated directly from above without inverting the lighting test jig, and the wiring of the TFT substrate Correction work can be performed by disconnecting and connecting. In other words, handling work to reverse the lighting inspection jig holding the liquid crystal panel in the correction work after lighting inspection has been abolished, reducing the labor burden on the operator, and preventing damage to the liquid crystal panel or jig due to impact / stress during reversal It becomes possible to do.

The probe pin can be brought into and out of contact with the input terminal of the TFT substrate in a state where the liquid crystal panel is placed on the base plate and positioned and held by the holding means.
In a state where the liquid crystal panel is not held, it is preferable that the tip of the probe pin is stored in the base plate.

  With the above configuration, the probe pin will be hidden except when the holding means is used to position and hold the liquid crystal panel and inspect the lighting, so it is possible to avoid erroneous contact between the probe pin and the display portion of the liquid crystal panel, Damage to the liquid crystal panel can be prevented.

The present invention secondly places the liquid crystal panel on a lighting inspection jig with the TFT substrate surface facing upward,
A step of placing a backlight under the liquid crystal panel and inputting a lighting signal by bringing a probe pin of the lighting inspection jig into contact with an input terminal of a TFT substrate of the liquid crystal panel;
A step of visually inspecting the lighting state of the display part of the liquid crystal panel;
When a lighting failure occurs in the liquid crystal panel, the lighting inspection jig is not turned upside down, and laser irradiation is applied from above to the TFT substrate that is already on the upper surface side. There is provided a method for inspecting lighting of a liquid crystal panel, comprising a step of performing correction.

  According to the above method, since the liquid crystal panel is installed in the lighting inspection jig so that the TFT substrate is on the upper surface side, the lighting inspection is performed. When performing work to correct the wiring pattern on the board, handling work that reverses the liquid crystal panel can be eliminated, reducing the work burden and preventing damage to the liquid crystal panel or jig due to impact or stress during the reversing work. It becomes possible to do.

  As is clear from the above description, according to the present invention, when a lighting failure is caused by performing a lighting inspection using a lighting inspection jig, the liquid crystal panel is arranged so that the TFT substrate surface is already on the upper surface side. Since it is placed on the jig, it is possible to perform a work of correcting the wiring pattern of the TFT substrate by irradiating the laser from above in the same state. Therefore, it is possible to reduce the work load by eliminating the reversing work of the lighting inspection jig and to prevent the liquid crystal panel or the jig from being damaged.

Embodiments of the present invention will be described with reference to the drawings.
As shown in FIGS. 1 to 3, the lighting inspection jig 10 is provided with a probe pin 15 that supplies a lighting signal to a base plate 11 on which the liquid crystal panel 8 is placed, and a clamp unit that holds the liquid crystal panel 8 ( Holding means) 16. The liquid crystal panel 8 used has the same configuration as that described in the conventional example.

In the base plate 11, a light incident hole H for allowing light from the backlight 9 to pass through a rectangular plate-shaped main body plate 22 is formed in a tapered shape, and the periphery of the light incident hole H on the upper surface of the main body plate 22. A base frame portion 12 is provided at the position.
On the upper surface of two orthogonal sides of the base frame portion 12, a panel placement portion 21 is placed via a spring B4 embedded in a recess 12d on the base frame portion 12. Positioning projections 13 for standing and holding the liquid crystal panel 8 in contact with each other are provided upright at the required position.

  On the upper surfaces of the remaining two sides of the base frame portion 12, as shown in FIG. 4A, an elevating member 14 for placing the surface with the input terminal 8c of the liquid crystal panel 8 is interposed via springs B2 and B3. The probe pin 15 for conduction connected to the inspection signal supply means (not shown) is embedded in the groove portion 14a of the elevating member 14 via the spring B1.

  Specifically, the groove 12a recessed in the base frame 12 and the groove 14a of the elevating member 14 are installed so as to communicate with each other, and the probe pin 15 is embedded through the spring B1 in the communicated grooves 12a and 14a. Has been. Further, small groove portions 12b and 12c are respectively provided on both sides of the groove portion 12a, and lower end protruding portions 14b and 14c of the elevating member 14 are inserted into the small groove portions 12b and 12c via springs B2 and B3. Yes. In the open state where no external force is applied to the springs B1, B2, and B3 before the liquid crystal panel 8 is set, the upper end of the probe pin 15 is positioned below the upper surface of the elevating member 14, and the probe pin 15 The tip is hidden. In addition, at least the upper surface (liquid crystal panel contact surface) of the elevating member 14 is made of resin in order to reduce electrical shock and impact caused by collision.

  A clamp unit 16 for holding the liquid crystal panel 8 is provided on the outer edge side of the side of the base frame portion 12 where the elevating member 14 is disposed. The clamp unit 16 is provided with a clamp portion 16 via a rotating shaft 18 serving as a hinge on the upper side of a support portion 17 that is erected and fixed to the base frame portion 12. The inner surface of the clamp portion 20 is made of rubber or the like. Elastic material 20 is affixed.

Next, an inspection / correction procedure of the liquid crystal panel 8 using the lighting inspection jig 10 will be described.
First, the liquid crystal panel 8 is positioned on the lighting inspection jig 10 by bringing the panel periphery into contact with the positioning projection 13 with the TFT substrate 8b on the upper surface side and the CF substrate 8a on the lower surface side. In this state, the edge portion of the CF substrate 8 a of the liquid crystal panel 8 is placed on the panel placement portion 21 and the input terminal 8 c of the TFT substrate 8 b is placed on the upper surface of the elevating member 14.

  Next, as shown in FIG. 5, the clamp portion 19 is tilted inward with the rotating shaft 18 as a fulcrum, and the upper surface of the liquid crystal panel 8 is pressed and held via the elastic material 20. At this time, the liquid crystal panel 8 is pressed against the probe pin 15 by the pressing force of the clamp portion 19, so that the elevating member 14 sinks into the recesses 12 b and 12 c against the springs B 2 and B 3, and the tip of the probe pin 15 is moved. The input terminal 8c of the liquid crystal panel 8 is contacted. In addition, since the probe pin 15 is also urged by the spring B1, the contact pressure between the probe pin 15 and the input terminal 8c does not become excessive.

  Then, in a state where the backlight 9 is disposed below the light incident hole H of the lighting inspection jig 10, an inspection signal is output from the inspection signal supply means (not shown) to the probe pin 15, The screen of the liquid crystal panel 8 is turned on via the input terminal 8c, and the worker looks at the screen of the liquid crystal panel 8 from above to find a lighting defect.

  Next, when there is a liquid crystal panel 8 to be corrected by the visual inspection, the liquid crystal panel 8 is already in a state in which the TFT substrate 8b side faces upward. As shown in FIG. 6, the laser beam is irradiated by the laser irradiation device L disposed above, and the wiring pattern of the TFT substrate 8 b is cut and connected in the state where the jig 10 is not reversed. Correct the circuit.

  As described above, when the lighting inspection jig 10 of the present invention is used, the liquid crystal panel 8 is placed on the jig 10 so that the TFT substrate 8b is on the upper surface side. When shifting from the correction work to the liquid crystal panel 8 and the jig 10, it is not necessary to perform the reversing work, and the work of correcting the wiring pattern of the TFT substrate 8b can be performed by irradiating the laser from above in the same state. There is an advantage that workability and quality can be improved.

It is a perspective view of the lighting inspection jig of the embodiment of the present invention. It is a top view of the lighting inspection jig. It is sectional drawing of the jig | tool for lighting inspection. It is principal part sectional drawing before the liquid crystal panel holding | maintenance of the lighting inspection jig | tool. It is principal part sectional drawing after the liquid crystal panel holding | maintenance of the lighting inspection jig | tool. It is sectional drawing at the time of the correction work by a laser. It is a perspective view of the jig | tool for lighting inspection of a prior art example. (A) is a top view of a liquid crystal panel, (B) is a side view. It is sectional drawing at the time of lighting inspection of the jig | tool for lighting inspection of a prior art example. It is sectional drawing at the time of the correction operation | work of the lighting inspection jig | tool of a prior art example.

Explanation of symbols

8 Liquid crystal panel 8a CF substrate 8b TFT substrate 8c Input terminal 9 Backlight 10 Lighting inspection jig 11 Base plate 12 Base frame portion 12a Groove portion 13 Positioning protrusion 14 Lifting member 14a Groove portion 15 Probe pin 16 Clamp unit 17 Support portion 18 Rotating shaft 19 Clamp Part 20 Elastic material 21 Panel placement part B1-B4 Spring H Light incident hole L Laser irradiation apparatus

Claims (3)

A base plate on which a liquid crystal panel provided with a TFT substrate is placed and a light incident hole for transmitting light from the backlight to the liquid crystal panel is provided;
A probe pin provided on the base plate for supplying a lighting signal to an input terminal of the TFT substrate of the liquid crystal panel;
A lighting test for a liquid crystal panel, comprising: holding means for holding the liquid crystal panel in a state where the tip of the probe pin is in contact with an input terminal of the liquid crystal panel arranged with the TFT substrate facing upward Jig. The probe pin can be brought into and out of contact with the input terminal of the TFT substrate in a state where the liquid crystal panel is placed on the base plate and positioned and held by the holding means.
2. The lighting inspection jig for a liquid crystal panel according to claim 1, wherein the tip of the probe pin is housed in the base plate when the liquid crystal panel is not held. 3. Placing the liquid crystal panel on a lighting inspection jig with the TFT substrate surface facing upward;
A step of placing a backlight under the liquid crystal panel and inputting a lighting signal by bringing a probe pin of the lighting inspection jig into contact with an input terminal of a TFT substrate of the liquid crystal panel;
A step of visually inspecting the lighting state of the display part of the liquid crystal panel;
When a lighting failure occurs in the liquid crystal panel, the lighting inspection jig is not turned upside down, and laser irradiation is applied from above to the TFT substrate that is already on the upper surface side. A method for inspecting lighting of a liquid crystal panel, comprising the step of performing correction.

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