JP2005127842A - Pin block - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a pin block which exchangeably implants each probe to a pin board in a simple attachment structure and can contribute to reducing an inspection cost. <P>SOLUTION: The pin block 11 which makes up a substrate inspection apparatus, has a large number of probes 22 being arranged in the pin board 12 so as to freely come into contact individually with a large number of inspection points being set in an object substrate to be inspected. Each of the probes 22 is made up of a holding tubular section 23 which is loosely inserted into a through hole 15 being formed by drilling the pin board 12 from a one side face 13 to the other side face 14; and a contact pin section 26 which is held by the holding tubular section 23 so that it can freely advance and retract. The other side face 14 of the pin board 12 has a support plate 32 which freely contacts with a basis end face 24 of the holding tubular section 23 of the probe 22; and a lead wire 35 which can be electrically connected through its open end section 35a to the basis end face 24 of the holding tubular section 23 when contacting therewith. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  In the present invention, for example, a large number of individual contacts can be freely planted to a large number of inspection points set with a certain rule, for example, set in a lattice pattern at a constant pitch on a substrate to be inspected. This is a technique related to a pin block having a probe and constituting a substrate inspection apparatus.

  A substrate inspection apparatus such as an in-circuit tester includes a pin block as a test head that is formed so as to freely make electrical contact with each inspection point of a substrate to be inspected via an individual probe.

  FIG. 6 is a main part explanatory view showing an example of a conventional pin block with a part thereof omitted, and FIG. 7 is an explanatory view showing an enlarged circular encircled part in FIG. According to these figures, the pin block 1 includes a pin board 2 into which sockets 3 into which a large number of probes 4 are individually inserted are press-fitted, and a substrate to be inspected that is not shown with each probe 4 inserted into the socket 3. The guide board 7 which is provided on the pin board 2 with the guide hole 8 which suppresses the deflection to the individual inspection points and guides the probe stroke by regulating the reference height is constituted as a whole. ing.

  In this case, as shown in FIG. 8, the probe 4 protrudes through a projection 3 a provided on the inner surface of the socket 3, a holding cylinder portion 5 that is brought into contact with and connected to the socket 3, and a conductive coil spring (not shown). And the contact pin portion 6 held by the holding cylinder portion 5.

  For this reason, since each probe 4 can be planted by inserting the holding cylinder portion 5 into each socket 3 that has been press-fitted into the pin board 2 in advance, it differs only by replacing the desired probe 4. It can also correspond to the inspection point of the board inspection apparatus of the model.

On the other hand, some conventional pin blocks are provided with versatility that can be handled by the same pin block even for inspection target substrates of different types.
Japanese Patent Laid-Open No. 9-127155

  However, in the case of the pin block 1 shown in FIG. 5, it is necessary to insert a large number of probes 4 into the corresponding sockets 3 prepared in advance, which increases the number of parts and increases the cost. There was an inconvenience. Further, in the case of the pin block disclosed in Patent Document 1, as a result of requiring a combination of a test pin board and a contact pin selection board, there is a problem that the number of components increases and the cost increases. .

  In view of the above-mentioned problems found in the conventional example, the present invention effectively contributes to reducing the inspection cost by implanting each probe to the pin board in a replaceable manner with a simple mounting structure. An object of the present invention is to provide a pin block that can be used.

  The present invention has been made in order to achieve the above object, and includes a substrate having a large number of probes arranged on a pin board so as to freely make individual contact with a large number of inspection points set on a substrate to be inspected. In the pin block constituting the inspection device, each of the probes includes a holding cylinder portion that is loosely inserted through each through hole that is drilled from one side surface of the pin board toward the other side surface, It is formed with a contact pin portion that is held forward and backward by the holding cylinder portion, and a support plate that can freely come into contact with the base end surface of each holding cylinder portion of the probe is brought into contact with the other side surface of the pin board. It is characterized in that lead wires that can freely make electrical contact through the respective base end surfaces of the holding cylinder portion and the open end portions thereof are arranged separately.

  In this case, the contact pin portion in each probe includes a small-diameter pin end portion that comes into contact with the inspection point, and a large-diameter support portion that is connected to the small-diameter pin end portion and is held by the holding cylinder portion so as to freely advance and retract. It can also be formed.

  Further, the one side surface of the pin board is in contact with the open end face of each holding cylinder part or the open end face of the contact pin part on the large diameter support part side, and the corresponding part on the contact pin part side is inserted. It is preferable to dispose a guide board having permissible guide holes.

  Further, each of the probes is disposed under an arrangement relationship in which the open end surface of the large-diameter support portion in the contact pin portion urged in the protruding direction is pushed back in close contact with the guide plate side, You may make it the said base end surface of each holding | maintenance cylinder part press-contact to the said support plate side with the reaction force produced | generated in that case. Furthermore, at least one or more conductors are arranged in the length direction of the through hole between the base end surface of the holding cylinder portion of the required probe and the open end portion of each lead wire included in the support plate. By interposing and arranging along, it can also be made to be able to contact each of the said probe and the said lead wire in a corresponding relationship more reliably electrically.

  According to the present invention, since each probe can be arranged under a loosely inserted state that can be replaced via a socket-less through hole provided in the pin board, high-precision drilling is required. In addition, since the number of parts can be reduced by eliminating the need for a socket, it is possible to effectively contribute as an aid in reducing the inspection cost.

  In addition, each probe has a base end surface thereof as a result of reaction force acting on the side of the holding cylinder portion when the contact pin portion corresponding to each inspection point of the substrate to be inspected contacts and is pushed back. The lead wire on the side can be brought into pressure contact with the open end portion and can be reliably conducted.

  Furthermore, in the case where a guide board provided with a guide hole that allows insertion of the contact pin portion side on the one side surface of the pin board is disposed, the swing to the individual inspection points of the substrate to be inspected is suppressed, In addition, the reference height of the probe stroke can be regulated to guide the contact pin part side of the probe.

  Furthermore, when a conductor is interposed between the base end surface of the holding cylinder portion of the probe and the open end portion of each lead wire included in the support plate, the probe and the lead in a corresponding relationship Each of the wires can be more reliably brought into electrical contact.

  FIG. 1 is a main part explanatory view showing an example of a pin block according to the present invention with a part thereof omitted, and FIG. 2 is an explanatory view showing an enlarged circular encircling region in FIG. According to the figure, the pin block 11 is provided with a large number of probes 22 arranged on the pin board 12 so as to be able to freely contact a large number of inspection points set on a substrate to be inspected (not shown). It is formed as a part of (not shown).

  That is, each probe 22 passes through each through hole 15 formed between one side surface (upper surface in the illustrated example) 13 and the other side surface (lower surface in the illustrated example) 14 made of an appropriate insulating material. A holding cylinder portion 23 of approximately the same height that is loosely inserted, and a contact pin portion 26 that is urged by the holding cylinder portion 23 through a coil spring (not shown) in a protruding direction and is freely held back and forth. Is formed.

  Further, on the other side surface 14 of the pin board 12, a support plate 32 made of an appropriate insulating material that can freely come into contact with the base end surface 24 of each holding cylinder portion 23 of the probe 22 is installed. The arrangement is such that the pin board 12 is placed thereon. In addition, when the base end surface 24 of each holding cylinder portion 23 of the probe 22 comes into contact with the support plate 32, a lead wire made of a magnet wire or the like that can freely make electrical contact via the open end portion 35a. 35 is wired separately.

  Further, one side surface 13 of the pin board 12 is in contact with the open end surface 25 of each holding cylinder portion 23 in order to suppress the deflection of the probe 22 or restrict the reference height of the stroke of the probe 22. A guide board 42 made of an appropriate insulating material is provided in which a guide hole 43 that prevents intrusion and allows the insertion of the contact pin portion 26 side is formed separately.

  FIG. 3 is an explanatory view of the main part showing another example of the pin block according to the present invention corresponding to FIG. 1, and the positional relationship among the pin board 22, the support plate 32, and the guide plate 42 is the example shown in FIG. However, the length of the through hole 15 is one or more conductors 18 between the base end surface 24 of the holding cylinder portion 23 of the probe 22 and the open end portion 35a of each lead wire 35 provided in the support plate 32. It is different in that it is disposed along the direction. In this case, the conductor 18 having a spherical shape in which the maximum outer diameter is slightly smaller than the inner diameter of the through hole 15 can be suitably used. In this case, the conductor 18 can be formed as a conductive metal sphere, and is formed by covering the outer surface of the elastic resin sphere with a conductive layer, or by imparting conductivity to the elastic resin sphere itself. You can also. Note that the conductor 18 may have a suitable three-dimensional shape other than a sphere.

  In addition, the shape of the base end surface 24 in the holding cylinder portion 23 of the probe 22 may be an appropriate one as desired, such as a flat surface, a concave shape, or a curved shape as shown in FIGS. Can be adopted. Further, as shown in FIGS. 4A and 4B, the conductor 18 disposed between the base end face 24 and the open end portion 35a of each lead wire 35 included in the support plate 32 is 1 as shown in FIGS. In addition to being able to be divided into two pieces as shown in FIG. 4 (c), it is possible to further increase the number and interpose them as necessary.

On the other hand, FIG. 5A is an explanatory view showing another example of the probe 22 constituting the present invention. In this case, the contact pin portion 26 in the probe 22 is a small-diameter pin end that contacts the inspection point of the inspection target substrate. It is formed of a portion 27 and a large-diameter support portion 28 that is connected to the small-diameter pin end portion 27 and is held by the holding cylinder portion 23 so as to be able to advance and retreat. Therefore, large径支rod portions 28 at normal times (when not used), from the holding cylinder portion 23 side via the coil spring (not shown) by the length extruded condition of L _1.

In the probe 22 in such a state, as shown in FIG. 5B, after the holding cylinder portion 23 is loosely inserted into the through hole 15 of the pin board 12, the small diameter pin end portion 27 is inserted into the guide hole 43. By placing the guide board 42 on the pin board 12, the large-diameter support portion 28 having the length L ₁ is pushed back to the length L ₂ . As a result, a reaction force is generated in the holding cylinder portion 23 in the direction in which the base end surface 24 is in pressure contact with the open end portion 35a of the lead wire 35 provided in the support plate 32. be able to.

  Next, the operation and effect of the present invention having the above configuration will be described based on the example shown in FIG. 1. First, the pin board 12 has individual through holes 15 and individual lead wires on the support plate 32 side. It is placed on the support plate 32 under a positional relationship that individually faces the open end 35a of the 35, and the positional relationship is fixed. After the position fixing between the pin board 12 and the support plate 32 is finished, the holding cylinder portion of each probe 22 from the one side surface 13 side to the other side surface 14 with respect to a predetermined through hole 15 of the pin board 12. 23 are inserted separately. In this case, since each through-hole 15 is formed with an inner diameter having a clearance with respect to the outer diameter of the holding cylinder portion 23, the holding cylinder portion 23 can be loosely inserted without being press-fitted. The probe 22 itself can be easily replaced and removed.

  After the probes 22 are individually arranged in all the necessary through holes 15, the contact pin portions 26 of the probes 22 protruding from the one side surface 13 of the pin board 12 are inserted through the corresponding guide holes 43. After the guide board 42 is placed on the pin board 12, the positional relationship is fixed. Accordingly, the probes 22 at this time are in an arrangement relationship in which the open end surface 24 of the holding cylinder portion 23 is in contact with the guide board 42 side, so that the removal is surely prevented.

  After the pin block 11 is configured in this way, the contact pin portion 26 of the probe 22 corresponding to each inspection point of the inspection target substrate is brought into contact. At this time, the contact pin portion 26 is pushed back to the holding cylinder portion 23 side with a predetermined stroke against the urging force, and the holding end portion 25 of the holding cylinder portion 23 is also caused by the reaction force generated at that time. The lead wire 35 is brought into pressure contact with the open end portion 35a, and the two are surely conducted. Therefore, the inspection with respect to each inspection point of the inspection target substrate can be performed smoothly and accurately.

  Further, in the case of the other example shown in FIG. 3, after the pin board 12 is placed on the support plate 32 in the same manner as in FIG. 1 and the positional relationship is fixed, as shown in FIGS. One or more conductors 15 are accommodated in the necessary through holes 15 in advance, and the holding cylinder portions 23 of the individual probes 22 are inserted into the predetermined through holes 15 separately.

  For this reason, even if the axial length of the holding cylinder portion 23 of the probe 22 is shorter than the depth length of the through hole 15, the length is finely adjusted via the conductor 15 to open the end portion of the lead wire 35. Contact with 35a can be ensured. In particular, if the conductor 15 has a spherical shape, the dimension after fine adjustment can be known immediately by multiplying the diameter dimension by an integer, so that the fine adjustment of the length can be easily performed accordingly. .

  In addition, when the conductor 15 is formed by covering the outer surface of the elastic resin sphere with a conductive layer, or formed by imparting conductivity to the elastic resin sphere itself, the function as a cushioning material is exhibited. Therefore, even if there is a slight dimensional error, it can be absorbed and the contact with the open end portion 35a of the lead wire 35 can be ensured more reliably. Moreover, when using the conductor 15 made of a conductive metal sphere, particularly preferably the conductor 15 having the outer surface of the elastic resin sphere covered with a conductive layer or the conductor 15 imparted with conductivity to the elastic resin sphere itself. The open end of the lead wire 35 is flexibly accommodated even if the base end face 24 of the holding cylinder portion 23 of each probe 22 exhibits various shape patterns as shown in FIGS. Contact with the end 35a can be ensured.

On the other hand, the probe 22 shown in FIG. 5A is connected to the small-diameter pin end portion 27 where the contact pin portion 26 comes into contact with the inspection point of the substrate to be inspected and the small-diameter pin end portion 27 so as to advance and retract. It is formed with a large-diameter support portion 28 that is freely held. Therefore, the large径支rod section 28 of the normal time (when not in use) is pushed out from the holding tubular portion 23 side via the coil spring (not shown) equivalent to the length by L _1.

In the probe 22 in this state, after the holding cylinder portion 23 is loosely inserted into the through hole 15 of the pin board 12, the guide board 42 is placed on the pin board 12 while the small diameter pin end portion 27 is inserted into the guide hole 43. by also large径支rod portion 28 as shown in FIG. 5 (b) what was the length of L ₁ is pushed back to a length of L _2. As a result, a reaction force is generated on the proximal end surface 24 of the holding cylinder portion 23 in the direction in which it is pressed against the open end portion 35a of the lead wire 35 included in the support plate 32, and therefore the open end portion 35a of the lead wire 35 and Contact can be made more reliably.

  That is, according to the present invention, even if the accuracy of the inner diameter of the through hole 15 formed in the pin board 12 is of a level that allows the holding cylinder portion 23 of the probe 22 to be loosely inserted, even the inner diameter of the guide hole 43 of the guide board 42 is sufficient. If it is formed with high accuracy, it is possible to suppress the vibration on the contact pin portion 27 side of the probe 22 at the time of inspection. Therefore, the socket 3 as shown in FIG. 8 which is necessary in the prior art can be made unnecessary, and the drilling of the through hole 15 can be performed with relatively low accuracy.

  Further, in the past, it has been necessary to directly connect the lead wire to the base end face side of the socket 3 shown in FIG. 8, but according to the present invention, the base end face of the holding cylinder portion 23 of the probe 22. 24 can be arranged so as to be freely contactable without being directly connected to the open end 35a of the lead wire 35 made of a magnet wire or the like. As a result, it can help reduce the inspection cost including the product cost. It is possible to contribute effectively.

  The embodiment of the present invention has been described with reference to the illustrated example, and the specific embodiment is not limited to this. For example, the pin block 11 according to the present invention can be configured without using the guide board 42 if necessary. Also in this case, since the probe 22 is held by the holding cylinder portion 23 with the contact pin portion 26 being urged in the protruding direction, the probe 22 abuts the contact pin portion 26 on the inspection point of the substrate to be inspected. At this time, the contact pin portion 26 is pushed back, and at this time, the base end surface 24 of the holding cylinder portion 23 can be brought into pressure contact with the open end portion 35 a of the lead wire 35.

  In addition, when the inspection target substrate is placed with its surface direction oriented in the vertical direction, the pin block 11 can also be arranged so as to correspond to this. Further, the pin block 11 may be arranged toward the inspection target substrate located below.

The principal part explanatory drawing which abbreviate | omits one part and shows an example of the pin block which concerns on this invention. Explanatory drawing which expands and shows the circular go part of FIG. The principal part explanatory drawing which abbreviate | omits one part and shows the other example of the pin block which concerns on this invention. The principal part enlarged view which divides the base end surface shape in the holding | maintenance cylinder part of a probe into patterns according to a relationship with a conductor, and shows it as a pattern. Explanatory drawing which shows the other example of the probe of this invention as (a), respectively, and the arrangement | positioning state as (b). The principal part explanatory drawing which abbreviate | omits one part and shows the prior art example of a pin block. Explanatory drawing which expands and shows the circular go part of FIG. Explanatory drawing which decomposes | disassembles and shows the structural example of the conventional probe.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Pin block 2 Pin board 3 Socket 3a Protrusion 4 Probe 5 Holding cylinder part 6 Contact pin part 7 Guide board 8 Guide hole 11 Pin block 12 Pin board 13 One side 14 Other side 15 Through-hole 18 Conductor 22 Probe 23 Holding cylinder part 24 Base end surface 25 Open end portion 26 Contact pin portion 27 Small diameter pin end portion 28 Large diameter support portion 29 Open end surface 32 Support plate 35 Lead wire 35a Open end portion 42 Guide board 43 Guide hole

Claims (5)

In the pin block that comprises a plurality of probes arranged on the pin board so that individual contact with a large number of inspection points set on the inspection target substrate is configured,
Each of the probes includes a holding cylinder portion that is loosely inserted through each through-hole that is drilled from one side surface to the other side surface of the pin board, and a contact that is held by the holding cylinder portion so as to freely advance and retract. Formed with the pin part,
On the other side surface of the pin board, a support plate that can freely come into contact with the base end surface of each holding cylinder portion of the probe is interposed via each base end surface of the holding cylinder portion and its open end portion at the time of contact. A pin block characterized by the installation of lead wires that allow free electrical contact.   The contact pin portion in each probe is formed by a small-diameter pin end portion that comes into contact with the inspection point, and a large-diameter support portion that is connected to the small-diameter pin end portion and is held by the holding cylinder portion. Pin block as described in.   The one side surface of the pin board is in contact with the open end surface of each holding cylinder portion or the open end surface of the contact pin portion on the large-diameter support portion side, and allows the corresponding portion on the contact pin portion side to be inserted. The pin block according to claim 1 or 2, wherein a guide board having a hole is provided.   Each of the probes is disposed under an arrangement relationship in which the open end surface of the large-diameter support portion of the contact pin portion urged in the protruding direction is pushed back toward the guide board side. The pin block according to claim 3, wherein the base end surface of each holding cylinder portion is pressed against the support plate side by a reaction force generated on the support plate. At least one or more conductors are arranged along the length direction of the through hole between the base end surface of the holding cylinder portion in the required probe and the open end portion of each lead wire included in the support plate. The pin block according to any one of claims 1 to 4, wherein the pin block is interposed.

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