JP2005017299A - 波長モニタ及び制御システム - Google Patents

波長モニタ及び制御システム Download PDF

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Publication number
JP2005017299A
JP2005017299A JP2004187532A JP2004187532A JP2005017299A JP 2005017299 A JP2005017299 A JP 2005017299A JP 2004187532 A JP2004187532 A JP 2004187532A JP 2004187532 A JP2004187532 A JP 2004187532A JP 2005017299 A JP2005017299 A JP 2005017299A
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JP
Japan
Prior art keywords
wavelength
frequency
local oscillator
optical
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP2004187532A
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English (en)
Japanese (ja)
Other versions
JP2005017299A5 (https=
Inventor
Hongbin Zhang
ザン ホンビン
R Brian Jander
ジャンダー アール．ブリアン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SubCom LLC
Original Assignee
Tyco Telecommunication US Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tyco Telecommunication US Inc filed Critical Tyco Telecommunication US Inc
Publication of JP2005017299A publication Critical patent/JP2005017299A/ja
Publication of JP2005017299A5 publication Critical patent/JP2005017299A5/ja
Abandoned legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/04—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
    • H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
    • H04B10/0795—Performance monitoring; Measurement of transmission parameters
    • H04B10/07957—Monitoring or measuring wavelength

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Communication System (AREA)
  • Spectrometry And Color Measurement (AREA)
JP2004187532A 2003-06-25 2004-06-25 波長モニタ及び制御システム Abandoned JP2005017299A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US48257203P 2003-06-25 2003-06-25
US10/873,324 US20040264981A1 (en) 2003-06-25 2004-06-22 Wavelength monitoring and control system

Publications (2)

Publication Number Publication Date
JP2005017299A true JP2005017299A (ja) 2005-01-20
JP2005017299A5 JP2005017299A5 (https=) 2007-08-09

Family

ID=33539351

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004187532A Abandoned JP2005017299A (ja) 2003-06-25 2004-06-25 波長モニタ及び制御システム

Country Status (5)

Country Link
US (1) US20040264981A1 (https=)
EP (1) EP1492255B1 (https=)
JP (1) JP2005017299A (https=)
CA (1) CA2472408A1 (https=)
DE (1) DE602004006468T2 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009052941A (ja) * 2007-08-24 2009-03-12 Anritsu Corp 光スペクトルモニタ

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110135301A1 (en) * 2009-12-08 2011-06-09 Vello Systems, Inc. Wavelocker for Improving Laser Wavelength Accuracy in WDM Networks
US8805206B2 (en) * 2010-09-29 2014-08-12 Ciena Corporation Single pin coherent receiver
JP5699769B2 (ja) * 2011-04-13 2015-04-15 富士通株式会社 光チャンネルモニタおよび光伝送装置
US9291505B2 (en) * 2012-12-07 2016-03-22 Baker Hughes Incorporated Polarization scrambling in interferometer systems
CN105890779B (zh) * 2016-06-07 2019-02-26 哈尔滨工业大学 一种用于波长扫描系统的实时波长标定装置及标定方法
EP3879643A1 (en) 2020-03-09 2021-09-15 Thorlabs Quantum Electronics, Inc. Tunable laser assembly and method of control

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4856899A (en) * 1985-12-20 1989-08-15 Yokogawa Electric Corporation Optical frequency analyzer using a local oscillator heterodyne detection of incident light
US5838437A (en) * 1997-04-09 1998-11-17 Micron Optics, Inc. Reference system for optical devices including optical scanners and spectrum analyzers
KR100295810B1 (ko) * 1998-06-02 2001-10-26 서평원 파장분할다중방식광전송망채널감시시스템
US6256103B1 (en) * 2000-02-17 2001-07-03 Agilent Technologies, Inc. System and method for optical heterodyne detection of an optical signal
JP4270718B2 (ja) * 2000-04-27 2009-06-03 株式会社アドバンテスト 基準波長光発生装置
US6614955B1 (en) * 2000-08-22 2003-09-02 Agilent Technologies, Inc. Method and apparatus for an extended wavelength range coherent optical spectrum analyzer
US6671056B2 (en) * 2001-01-11 2003-12-30 Agilent Technologies, Inc Method and system for optical spectrum analysis with a depolarized local oscillator signal
US6985234B2 (en) * 2001-01-30 2006-01-10 Thorlabs, Inc. Swept wavelength meter
US6870629B1 (en) * 2001-10-29 2005-03-22 Precision Photonics Corporation Optical frequency sweep control and readout by using a phase lock

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009052941A (ja) * 2007-08-24 2009-03-12 Anritsu Corp 光スペクトルモニタ

Also Published As

Publication number Publication date
CA2472408A1 (en) 2004-12-25
DE602004006468T2 (de) 2008-01-17
DE602004006468D1 (de) 2007-06-28
EP1492255A3 (en) 2005-08-31
EP1492255A2 (en) 2004-12-29
US20040264981A1 (en) 2004-12-30
EP1492255B1 (en) 2007-05-16

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