JP2004526969A5 - - Google Patents

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Publication number
JP2004526969A5
JP2004526969A5 JP2002579783A JP2002579783A JP2004526969A5 JP 2004526969 A5 JP2004526969 A5 JP 2004526969A5 JP 2002579783 A JP2002579783 A JP 2002579783A JP 2002579783 A JP2002579783 A JP 2002579783A JP 2004526969 A5 JP2004526969 A5 JP 2004526969A5
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JP
Japan
Prior art keywords
sample
light source
recording
imaging device
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002579783A
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English (en)
Japanese (ja)
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JP3933581B2 (ja
JP2004526969A (ja
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Application filed filed Critical
Priority claimed from PCT/EP2002/003682 external-priority patent/WO2002082063A1/en
Publication of JP2004526969A publication Critical patent/JP2004526969A/ja
Publication of JP2004526969A5 publication Critical patent/JP2004526969A5/ja
Application granted granted Critical
Publication of JP3933581B2 publication Critical patent/JP3933581B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2002579783A 2001-04-06 2002-03-28 表面評価の方法および装置 Expired - Fee Related JP3933581B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP01201276 2001-04-06
PCT/EP2002/003682 WO2002082063A1 (en) 2001-04-06 2002-03-28 Method and device for surface evaluation

Publications (3)

Publication Number Publication Date
JP2004526969A JP2004526969A (ja) 2004-09-02
JP2004526969A5 true JP2004526969A5 (enrdf_load_stackoverflow) 2005-12-22
JP3933581B2 JP3933581B2 (ja) 2007-06-20

Family

ID=8180117

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002579783A Expired - Fee Related JP3933581B2 (ja) 2001-04-06 2002-03-28 表面評価の方法および装置

Country Status (9)

Country Link
EP (1) EP1373867A1 (enrdf_load_stackoverflow)
JP (1) JP3933581B2 (enrdf_load_stackoverflow)
KR (1) KR100875806B1 (enrdf_load_stackoverflow)
CN (1) CN100403011C (enrdf_load_stackoverflow)
AU (1) AU2002338353B2 (enrdf_load_stackoverflow)
BR (1) BR0208660A (enrdf_load_stackoverflow)
RU (1) RU2292037C2 (enrdf_load_stackoverflow)
WO (1) WO2002082063A1 (enrdf_load_stackoverflow)
ZA (1) ZA200307712B (enrdf_load_stackoverflow)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0625890D0 (en) * 2006-12-23 2007-02-07 Colormatrix Holdings Inc Polymeric materials
US9025153B2 (en) * 2011-11-16 2015-05-05 Axalta Coating Systems Ip Co., Llc Process for predicting degree of mottling in coating compositions by wet color measurement
JP5475057B2 (ja) 2012-04-20 2014-04-16 株式会社 オフィス・カラーサイエンス 変角分光イメージング測定方法およびその装置
EP2847556A4 (en) * 2012-05-09 2016-01-27 Seagate Technology Llc MAPPING SURFACE FEATURES
CN103674903A (zh) * 2013-12-31 2014-03-26 爱彼思（苏州）自动化科技有限公司 非接触式光泽度仪
US9880098B2 (en) * 2014-10-28 2018-01-30 Axalta Coatings Systems Ip Co., Llc Method and systems for quantifying differences between colored surfaces
US9678018B2 (en) 2015-03-30 2017-06-13 Gemological Institute Of America Inc. (Gia) Apparatus and method for assessing optical quality of gemstones
CN106908149A (zh) * 2017-04-11 2017-06-30 上海电机学院 一种机器人物体颜色识别系统及方法
KR102047206B1 (ko) * 2018-10-31 2019-11-20 한국과학기술원 체적함수비별 반사율 측정을 위한 함수특성곡선-초분광 캠 테스트 방법 및 장치
JP7341835B2 (ja) * 2019-10-09 2023-09-11 株式会社日立製作所 粉体混合システム及び粉体混合方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH552197A (de) * 1972-11-24 1974-07-31 Bbc Brown Boveri & Cie Einrichtung zum messen der rauhigkeit einer oberflaeche.
FR2515823B1 (fr) * 1980-11-24 1986-04-11 Cegedur Procede et dispositif de controle optique des etats de surface de produits metallurgiques
JP2588297B2 (ja) * 1990-06-20 1997-03-05 日産自動車株式会社 塗装表面の鮮映性評価方法
US5078496A (en) * 1990-08-14 1992-01-07 Autospect, Inc. Machine vision surface characterization system
GB9307279D0 (en) * 1993-04-07 1993-06-02 Feather James W Goniophotometer
US5640237A (en) * 1995-08-29 1997-06-17 Kla Instruments Corporation Method and apparatus for detecting non-uniformities in reflective surafaces
JP3312849B2 (ja) * 1996-06-25 2002-08-12 松下電工株式会社 物体表面の欠陥検出方法
US5909276A (en) * 1997-03-31 1999-06-01 Microtherm, Llc Optical inspection module and method for detecting particles and defects on substrates in integrated process tools
JPH11281584A (ja) * 1998-03-30 1999-10-15 Minolta Co Ltd 検査方法およびその装置

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