JP2004273847A - Substrate carrying apparatus - Google Patents

Substrate carrying apparatus Download PDF

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Publication number
JP2004273847A
JP2004273847A JP2003063853A JP2003063853A JP2004273847A JP 2004273847 A JP2004273847 A JP 2004273847A JP 2003063853 A JP2003063853 A JP 2003063853A JP 2003063853 A JP2003063853 A JP 2003063853A JP 2004273847 A JP2004273847 A JP 2004273847A
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Prior art keywords
substrate
holding arm
placement
inclined surface
corner portion
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JP2003063853A
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JP4037777B2 (en
Inventor
Reiji Sato
礼史 佐藤
Shinji Kobayashi
真二 小林
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Tokyo Electron Ltd
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Tokyo Electron Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a substrate carrying apparatus that carries a square substrate placed on a support arm while being aligned with high accuracy. <P>SOLUTION: Four placing parts 41 to 44 for supporting each corner of the substrate G are provided to a support arm 31 whose inner edge is configured to be arcuate. One of the placing parts is configured to be a restriction placing part 5 for supporting a C face C1 of a first corner S1 of the substrate and restricting the corner S1 in press contact with end faces of two sides sandwiching the corner S1. The other placing parts are configured as tilt placing parts 6 each provided with a first tilt face 61 for guiding end edges of two sides sandwiching C faces C2 to C4 of the other corners of the substrate downward and tilted downward toward the inner side of the support arm 31. When the substrate is delivered to the support arm 31, the corners S2 to S4 placed on the tilt placing parts 6 are guided along the tilt face, and the corner S1 is pressed into contact with the restriction placing part 5. Thus, the substrate is placed on the support arm 31 in an aligned state. <P>COPYRIGHT: (C)2004,JPO&NCIPI

Description

【0001】
【発明の属する技術分野】
本発明は、角型の基板を搬送するための基板搬送装置に関する。
【0002】
【従来の技術】
半導体デバイスの製造プロセスにおいて、角型のマスク基板にレジスト液を塗布し、フォトマスクを用いてそのレジスト膜を露光し、更に現像することによって所望のパタ−ンマスクを作製することが行われている。上記のような処理を行う場合、例えば基板にレジスト液の塗布処理を行う塗布膜ユニットと、基板に現像液を供給して現像処理を行う現像ユニットと、塗布処理や現像処理の前後の処理を行う複数の処理ユニットとを、1つの装置内に設け、当該装置内において基板を搬送アームによりこれらのユニットに対して搬送して所定の処理が行われている。
【0003】
ところで前記マスク基板は角型であるが、処理ユニットとの間の基板の受け渡しの点から、図15(a)の平面図、図15(b)の側部断面図に示すように、搬送アーム1の内縁11は円弧状に形成されている。そして前記アーム1の内縁11の4箇所に基板10の角部を挟みこむように保持する保持部12を設け、この保持部12に基板10の4個の角部を保持させた状態で基板10を搬送していた。この際搬送アーム1の内縁11の円弧の中心位置と基板10の中心位置とが揃うように基板10を位置決めして搬送アーム1に載置することが好ましいが、基板10には例えば±0.5mmの誤差があるので、保持部12には基板精度の最大公差以上のクリアランスがとってある。このため保持部12にて基板10の角部を保持しても、搬送中に基板10が縦方向や横方向にずれやすく、基板10を確実に位置決めした状態で搬送することは困難であった。
【0004】
このため本発明者らは、基板を位置決めした状態で保持する搬送アームについて検討している。このような構成としては、基板を搬送アーム上にて機械的に押圧して位置決めをする手法が知られており、例えば角型基板を載置手段に載置し、角型基板の第1の角部の2側面を対角線方向に押圧すると共に、角型基板の第1の角部と対向する第2の角部の2側面を対角線方向に押圧する機構を搬送アーム上に設ける構成(例えば、特許文献1参照)が提案されている。
【0005】
【特許文献1】
特開平5−100198号公報(図1参照)
【0006】
【発明が解決しようとする課題】
ところで上述の構成では、基板の対向する2つの角部を押圧する機構を搬送アームに設けなくてはならず、構造的に複雑になる上、重量的にも問題である。マスク基板は基板自体が0.3kg程度と重いので、アームの軽量化を図りたいという背景もある。
【0007】
本発明はこのような事情の下になされたものであり、その目的は、角型の基板を搬送するにあたり、前記基板を精度良く位置決めした状態で保持させ、正確な搬送を行う技術を提供することにある。
【0008】
【課題を解決するための手段】
本発明の基板搬送装置は、角型の基板を載置する保持アームを備えた基板搬送装置において、
前記保持アームは、基板の4個の角部が載置される4個の載置部を備え、
前記載置部の一つは、基板の第1の角部の裏面側を保持すると共に、前記第1の角部を挟む2辺の端面と接触して、当該第1の角部を規制する規制載置部であり、
他の載置部のうちの少なくとも2個の載置部は、基板の裏面の角部を挟む2辺の端縁を下方側に案内するように保持アームの内側に向けて下方側に傾斜する第1の傾斜面を備えた傾斜載置部であり、
基板の角部を傾斜載置部に載置して傾斜面に沿って案内することにより、基板の第1の角部を前記規制載置部に当接させ、これにより基板を位置合わせした状態で保持アームに載置することを特徴とする。
【0009】
また4個の載置部の一つは、基板の第1の角部の裏面側を保持すると共に、前記第1の角部を挟む2辺の端面と接触して、当該第1の角部を規制する規制載置部とし、他の載置部のうちの前記規制載置部と基板の対角線上に対向する載置部は、基板の裏面の角部を挟む2辺の端縁を下方側に案内するように、かつ水平面に対して保持アームの内側に向けて下方側に傾斜する第1の傾斜面を備えた傾斜載置部としてもよい。
【0010】
このような基板搬送装置では、基板の角部を傾斜載置部に載置して、前記角部を挟む2辺の端縁を傾斜面に沿って案内することにより、基板の左右方向の位置を修正した状態で、基板の第1の角部を前記規制載置部に当接させることができ、これにより基板が精度良く位置合わせした状態で保持アームに載置される。また前記基板の2箇所の角部にて、角部を挟む2辺の端縁の位置が規制された状態で保持されるので、搬送中の基板Gの左右方向のずれが抑えられ、基板が正確に位置決めされた状態で確実に搬送を行うことができる。
【0011】
ここで前記傾斜載置部は、前記第1の傾斜面の上方側に、この第1の傾斜面よりも緩やかに傾斜する第2の傾斜面を備え、この第2の傾斜面に置かれた基板の角部が当該第2の傾斜面に沿って第1の傾斜面に案内されるようにしてもよい。また前記基板搬送装置の保持アームを進退自在、昇降自在、略鉛直軸まわりに回転自在に移動させる駆動機構と、保持アームの進退方向の前方側に設けられた前記規制載置部と、基板が保持アームに載置されたときに、保持アームを進退方向の後方側に、基板が慣性力で規制載置部側に移動するように第1の速度で僅かに移動させ、次いで保持アームを進退方向の後方側に第1の速度よりも小さい第2の速度で移動させるように前記駆動機構の駆動を制御する制御部と、を備えるようにしてもよい。
【0012】
さらに前記規制載置部以外の載置部に設けられ、基板の裏面側を押圧して持ち上げる押圧機構と、基板が保持アームに載置されたときに、押圧機構により基板の裏面側を持ち上げるように前記押圧機構の駆動を制御する制御部と、を備えるようにしてもよいし、前記規制載置部以外の載置部に、基板の裏面側と接触するようにボール機構を設けるようにしてもよい。また基板が前記保持アームに、当該保持アームの進退方向の軸に対して基板の互いに対向する一対の辺が斜めに位置した状態で載置されるように、前記載置部を保持アームに設けるようにしてもよい。さらに前記保持アームとしては、当該アームの内縁が円弧状に設けられているものを用いることができる。前記角型の基板としては、例えばパターンマスクの製造に用いられるマスク基板が用いられ、この場合前記規制載置部及び傾斜載置部にて保持される領域は、マスク基板の側面と底面との間に形成される傾斜面である。
【0013】
【発明の実施の形態】
以下に本発明の基板搬送手段を備えた塗布膜形成装置の一実施の形態について説明する。ここで、図1は塗布膜形成装置の一実施の形態に係る全体構成を示す平面図であって、図2はその概略斜視図である。図中B1は例えば5枚の基板例えばマスク基板Gが収納されたキャリアCを搬入出するためのキャリアブロックであり、このキャリアブロックB1は、前記キャリアCを載置するキャリア載置部21と受け渡し手段22とを備えている。
【0014】
前記受け渡し手段21はキャリアCから基板Gを取り出し、取り出した基板GをキャリアブロックB1の奥側に設けられている処理部B2へと受け渡すように、左右、前後に移動自在、昇降自在、鉛直軸回りに回転自在に構成されている。
【0015】
処理部B2の中央には基板搬送装置をなす基板搬送手段3が設けられており、これを取り囲むように例えばキャリアブロックB1から奥を見て例えば右側には塗布ユニット23及び現像ユニット24、左側には洗浄ユニット25、手前側、奥側には加熱・冷却系のユニット等を多段に積み重ねた棚ユニットU1,U2が夫々配置されている。塗布ユニット23は、基板にレジスト液を塗布する処理を行うユニット、現像ユニット24は、露光後の基板に現像液を液盛りして所定時間そのままの状態にして現像処理を行うユニット、洗浄ユニット25はレジスト液を塗布する前に基板を洗浄するためのユニットである。
【0016】
前記棚ユニットU1,U2は、複数のユニットが積み上げられて構成され、例えば図2に示すように、加熱ユニット26、冷却ユニット27のほか、基板Gの受け渡しユニット28等が上下に割り当てられている。前記基板搬送手段3は、昇降自在、進退自在及び鉛直軸まわりに回転自在に構成され、棚ユニットU1,U2及び塗布ユニット23、現像ユニット24並びに洗浄ユニット25の間で基板Gを搬送する役割を持っている。但し図2では便宜上受け渡し手段22及び基板搬送手段3は描いていない。
【0017】
前記処理部B2はインタ−フェイス部B3を介して露光装置B4と接続されている。インタ−フェイス部B3は受け渡し手段29を備えており、この受け渡し手段29は、例えば昇降自在、左右、前後に移動自在かつ鉛直軸まわりに回転自在に構成され、前記処理ブロックB2と露光装置B4との間で基板Gの受け渡しを行うようになっている。
【0018】
このような塗布膜形成装置における基板Gの流れについて述べておくと、先ず外部からキャリアCがキャリア載置部21に搬入され、受け渡し手段22によりこのキャリアC内から基板Gが取り出される。基板Gは、受け渡し手段22から棚ユニットU1の受け渡しユニット28を介して基板搬送手段3に受け渡され、所定のユニットに順次搬送される。例えば洗浄ユニット25にて所定の洗浄処理が行われ、加熱ユニット26の一つにて加熱乾燥が行われた後、冷却ユニット27にて所定の温度に調整され、塗布ユニット23にて塗布膜の成分が溶剤に溶解されたレジスト液の塗布処理が行われる。
【0019】
続いて基板Gは加熱ユニット26の一つにてプリベーク処理が行われた後、冷却ユニット27の一つにて所定の温度に調整される。次いで基板搬送手段3により棚ユニットU2の受け渡しユニット28を介してインターフェイス部B3の受け渡し手段29に受け渡され、この受け渡し手段29により露光装置B4に搬送されて、所定の露光処理が行われる。この後基板Gは、インターフェイス部B3を介して処理部B2に搬送され、加熱ユニット26の一つにてポストエクスポージャーベーク処理が行われる。次いで冷却ユニット27にて所定の温度まで冷却されて温度調整された後、現像ユニット24にて現像液が液盛りされ、所定の現像処理が行われる。こうして所定の回路パターンが形成された基板Gは基板搬送手段3、キャリアブロックB1の受け渡し手段22を介して、例えば元のキャリアC内に戻される。
【0020】
ここで前記マスク基板Gについて簡単に説明する。このマスク基板Gは例えばパターンマスクを形成するための基板であり、例えば一辺の長さが152±0.5mmの正方形であって、厚さが6.35mmの、一辺の長さが6インチサイズの角型のガラス基板が用いられる。マスク基板Gには平面的に見て角部が円弧状にカットされているR面タイプと、角部が直線的にカットされているタイプの基板Gがあるが、この実施の形態ではR面タイプの基板Gを例にして説明する。このR面タイプのマスク基板Gの角部Sは、例えば図3(a)に示すように、平面的に見て半径2mmの円の円弧の一部にカットされている。
【0021】
このようなマスク基板Gは基板搬送手段3により基板GのC面100が保持される。このC面100とは、図3(b)に示すように、マスク基板Gの角部の側面と底面との間に形成される傾斜面をいう。マスク基板Gでは、基板Gのどこかにパーティクルが付着すると、そのパーティクルの存在により、当該マスク基板Gをパターンマスクとして用いて露光するウエハが全て使用できなくなってしまうため、パーティクルの付着を抑えるために基板搬送手段3による保持領域がかなり小さく制限されている。
【0022】
続いて前記基板搬送手段3について図を参照して詳細に説明する。先ず基板搬送手段3の全体構成について図4に基づいて説明すると、前記基板搬送手段3は、基板Gを保持する保持アーム31と、この保持アーム31を進退自在に支持する基台32と、この基台32を昇降自在に支持する一対の案内レール33,34と、これら案内レール33,34の上端及び下端を夫々連結する連結部材35,36と、案内レール33,34及び連結部材35,36よりなる枠体を鉛直軸周りに回転自在に駆動するために案内レール下端の連結部材36に一体的に取り付けられた回転駆動部37と、案内レ−ル上端の連結部材35に設けられた回転軸部38と、を備えている。
【0023】
前記保持アーム31は、夫々基板Gを保持し得るように3段構成になっており、アーム31の基端部は基台32の長手方向に設けられた案内溝32aに沿ってスライド移動できるようになっている。そのスライド移動によるアーム31の進退移動や基台32の昇降移動は、夫々別個の図示しない駆動部により駆動される。従ってそれら図示しない2つの駆動部、案内溝32a、前記案内レール33,34及び前記回転駆動部37は、アーム31を略鉛直軸まわりに回転自在、かつ昇降自在、かつ進退自在に駆動する駆動機構を構成しており、この駆動機構は図示しない制御部により搬送プログラムに基づいて駆動制御される。
【0024】
続いて前記保持アーム31について説明すると、このアーム31の内縁30は例えば図5に示すように半径127mmの円の円弧の一部により構成され、このアーム31の内縁30の4箇所の位置には、基板Gの角部S1〜S4を保持するための第1の載置部41、第2の載置部42、第3の載置部43、第4の載置部44が夫々設けられている。この例では、保持アーム31の内縁の円弧の中心位置と基板Gの中心位置とが揃い、かつ図5に矢印で示すアーム31の進退方向の軸と基板Gの互いに対向する一対の辺の長さ方向とが略平行な状態で基板Gがアーム31上に載置されるような位置に前記4個の載置部4(41〜44)が設けられている。
【0025】
これら4個の載置部4A〜4Dのうちの1個、例えばアーム31の進退方向の前方側に設けられた第1の載置部41は、例えば図6に示すように規制載置部5として構成されている。この規制載置部5は、基板Gの第1の角部S1の裏面側例えば裏面側のC面C1(以下、C面とは角部の裏面側のC面をいうものとする)を載置するために前記C面C1の傾斜に合わせて略水平方向から保持アーム31の内側に向けて傾斜する載置面51と、基板Gの角部S1を挟む2辺の端面の一部と接触する略垂直な接触面52と、を備えており、前記基板Gの角部S1を挟む2辺の端面が前記接触面52に当接するように基板Gの角部S1のC面C1を載置面51に載置させることにより、基板Gを位置決めする役割を果たすものである。つまり第1の角部S1では、当該角部S1のC面C1と、前記角部S1を挟む2辺の端面とが規制載置部5に接触した状態で載置されるので、上下方向と左右方向のずれが規制される。
【0026】
また前記4個の載置部4のうちの残りの3個、例えば第1〜第3の載置部42〜44は、例えば図7,図8に示すように傾斜載置部6として構成されている。この傾斜載置部6は、基板Gの裏面の角部S3(S2,S4)を挟む2辺の端縁(この例ではC面C3(C2,C4)を挟む2辺の端縁)を下方側に案内するように、かつ水平面に対して保持アーム31の内側に向けて下方側に傾斜する第1の傾斜面61を備えると共に、この第1の傾斜面61の上方側には第1の傾斜面61よりも水平面に対しての傾斜が緩やかな第2の傾斜面62を備えている(図8(a)参照)。
【0027】
ここでマスク基板Gを保持するときには、第1の角部S1が規制載置部5にて基板Gを位置決めするように保持されたときに、角部S3(S2,S4)のC面C3(C2,C4)の裏面側の凸縁が第1の傾斜面61の角部の凹縁に重なる状態で、図8に示すように角部S3(S2,S4)のC面C3(C2,C4)が第1の傾斜面61に当接する状態で保持される。
【0028】
このため第1の傾斜面61の傾斜角度θ1(水平面とのなす角)は、マスク基板GのC面100の水平面とのなす角θ(図3参照)と略同じになるように設定されている。例えば前記保持アーム31は、C面100のなす角θが45度のマスク基板Gを保持するときには、第1の傾斜面61は、例えば幅W1が3mm、傾斜角度θ1が約67度、高さH1が7mm程度に設定され、第2の傾斜面62は、例えば幅W2が1.7mm、傾斜角度θ2が約60度、高さH2が3mm程度に夫々設定される。
【0029】
またこの実施の形態では、図8(b)に示すように、第2の傾斜面62の水平面に対しての傾斜を第1の傾斜面61よりも大きくなるように設定してもよく、この場合、第1の傾斜面61は、幅W1が3mm、傾斜角度θ1が約60度、高さH1が5mm程度に設定され、第2の傾斜面62は、幅W2が2mm、傾斜角度θ2が約70度、高さH2が5.5mm程度に夫々設定される。
【0030】
このような基板搬送手段3に基板Gを載置するときには、所定の処理ユニットの例えば昇降ピン等の受け渡し手段から基板Gを受け取る場合を例にして説明すると、複数の例えば4本の昇降ピンにて保持されている基板Gの下方側の所定位置に基板搬送手段3を位置させ、昇降ピンを下降させることにより、昇降ピンから基板搬送手段3に基板Gの角部S1〜S4が4つの載置部41〜44に夫々位置するように受け渡す。
【0031】
ここで通常では、基板Gの第1の角部S1以外の角部S2〜S4は、傾斜載置部6の第1の傾斜面61に基板裏面側の角部S2〜S4のC面C2〜C4が位置するように受け渡される。このように受け渡されると、基板Gは0.3kgと重いので、基板Gの裏面側の角部S2を挟む2辺の端縁、この例では前記C面C3(C2,C4)を挟む2辺の端縁が第1の傾斜面61に沿って自重により下方側に案内される(図9(a))。
【0032】
この際保持アーム31に基板Gが受け渡されたときには、角部S3(S2,S4)のC面C3(C2,C4)の裏面側の凸縁が第1の傾斜面61の角部の凹縁に重なる状態ではないが、基板Gの3方の角部S2〜S4が第1の傾斜面61に沿って保持アーム31の内側に向けて案内されていくので、左右方向のずれが修正されながら移動することとなる。このように基板Gが移動することにより、図9(b)に示すように、基板Gの第1の角部S1を挟む2辺の端面は規制載置部5の接触面52に当接し、この当接した位置で他の角部S2〜S4の移動が停止する。
【0033】
こうして第1の角部S1が規制載置部5により位置が規制されると、他の角部S2〜S4では、角部S3(S2,S4)のC面C3(C2,C4)の裏面側の凸縁が第1の傾斜面61の角部の凹縁に重なる状態で移動が停止することになり、その状態で固定される。つまり他の角部S3(S2,S4)では、当該角部のC面C3(C2,C4)と、このC面C3(C2,C4)を挟む2辺の端縁とが傾斜載置部6に接触した状態で載置されるので、上下方向と左右方向のずれが規制される。このようにして基板Gは基板搬送手段3にて水平面に対して僅かに傾斜した状態で位置決めされて保持され、次工程に搬送される。ここで前記基板Gの傾斜角度θ3は水平面に対して1.4度程度であり、基板Gの搬送や他の処理ユニットとの間の受け渡しには問題のない範囲である。
【0034】
このような基板搬送手段3では、4個の載置部41〜44の内、3個の載置部42〜44は第1の傾斜面61を備えた傾斜載置部6とし、基板Gの角部(この例ではC面)をガイドした状態で自重により移動させ、残りの1個の載置部41(規制載置部5)にて基板Gの第1の角部S1を位置決めした状態で規制するように保持しているので、内縁が円弧の一部により形成された保持アーム31に角型の基板Gを正確に位置決めした状態で保持させることができる。このように基板Gが上下方向及び左右方向に規制された状態で保持アーム3に保持されるので、搬送中においても基板Gが精度良く位置決めされた状態で保持され、正確な搬送を行うことができる。
【0035】
この際傾斜載置部6と規制載置部5という簡易な構成により、高い位置決め精度を確保できるので、機械的なガイド機構などの複雑な機構を設ける必要がない。このため基板搬送手段3の小型化や軽量化を図ることができ、スペース的、コスト的に有利である。
【0036】
また仮に基板搬送手段3への基板Gの受け渡し時に、基板Gの位置がずれて、前記他の角部S2〜S4が、傾斜載置部6の第1の傾斜面61に載らずに、第2の傾斜面62に位置するように受け渡されたときでも、前記角部S2〜S4は当該傾斜面62に沿って自重により下方側に移動し、第1の傾斜面61に案内されるので、結果として基板Gは正確に位置決めされた状態で保持される。
【0037】
続いて本発明の他の実施の形態について説明する。この例では、図10に示すように、保持アーム31の進退方向の前方側の載置部例えば第1の載置部41が規制載置部5として構成されており、例えば他の3つの載置部42〜44は傾斜載置部6として構成されている。
【0038】
そしてこの例では、基板Gを保持アーム31に載置したときに、保持アームの進退方向の後方側に第1の速度例えば300mm/s以上500mm/s以下の速度で僅かに例えば20mm程度移動させ(図11(a)、(b))、次いで第1の速度よりも遅い第2の速度例えば100mm/s以上300mm/s未満の速度で所定距離例えば450mm程度移動させるように(図11(c))、図示しない制御部により保持アーム31の進退方向の駆動を制御する。
【0039】
このように、基板Gを保持アーム31に載置した後、当該保持アーム31を第1の速度のような大きな速度で保持アームの進退方向の後方側に移動させると(図11(a))、基板Gが慣性力により保持アーム31の進退方向の前方側に向かい、この力と基板Gの自重による移動との組み合わせにより、基板Gの第1の角部S1が規制載置部5の所定位置まで瞬間的に移動し(図11(b))、より確実に前記角部S1を規制載置部5に当接させることができる。この際第1の速度が早過ぎたり、移動距離が長過ぎたりすると、前記基板Gに作用する慣性力が大きくなり過ぎ、基板Gが保持アーム31から落下しやすくなるので、第1の速度にて所定距離移動させた後、第1の速度よりも遅い第2の速度で所定距離移動させる。ここで第2の速度で第1の速度で移動させるときと同じ方向に移動させるのは、基板Gへの他の方向からの力が加わるのを抑えて、基板Gのずれを抑えるためである。
【0040】
続いて本発明のさらに他の実施の形態について説明する。この例では、例えば保持アーム31の1つの載置部4が規制載置部5として構成されており、他の3つの載置部4は傾斜載置部6として構成されている。そしてこの例では、傾斜載置部6の1つが押圧機構を備え、この押圧機構により傾斜載置部6を上昇させることにより基板の裏面側が持ち上がるようになっている。この押圧機構は、例えば図12に示すように、電磁石71,72と電源部73とにより構成され、基板Gが保持アーム31に受け渡されたときに、制御部7により電源部73をON状態として、電磁石71,72同士を反発させ、この反発力により傾斜載置部6を上昇させて基板Gを下方側から押圧するようになっている(図12(a),(b))。
【0041】
このように基板Gの一部が持ち上げられると(図12(b))、瞬間的に基板Gが傾斜するので基板Gの自重との組み合わせにより、基板Gの1の角部が規制載置部5の所定位置まで瞬間的に移動し(図12(c))、より確実に前記1の角部を規制載置部5に当接させることができる。この際傾斜載置部6の持ち上げ高さは大きすぎると基板Gが保持アーム31から落下しやすくなるので、1mm以上5mm以下程度が好ましい。または押圧機構としては、電磁石に変えて圧電素子を縦方向(高さ方向)に体積を変えられるように設けた構成であってもよい。
【0042】
続いて本発明のさらに他の実施の形態について説明する。この例では、例えば保持アーム31の1つの載置部4が規制載置部5として構成されており、他の3つの載置部は傾斜載置部6として構成されている。そしてこの例では、傾斜載置部6の1つがボール機構8を備え、このボール機構8により基板Gの裏面側が滑りやすくなっている。このボール機構8は、例えば第1の傾斜面61の基板Gが保持アーム31に受け渡されるときの載置位置と、基板Gが保持アーム31に位置合わせされたときの載置位置との間の位置に、例えばセラミックやPEEK樹脂などにより構成されたボール81が、当該ボール81の一部が基板Gの裏面側(裏面側のC面の裏面側)と接触するように設けられている。ここでボール81は例えば第1傾斜面61の2つの傾斜面に、夫々ボール81を取り付ける位置の高さが異なると共に、前記傾斜面の幅方向の位置が異なるように設けられる。
【0043】
このような構成では、基板Gが保持アーム31に受け渡されると(図13(a)、傾斜載置部6では基板Gが第1の傾斜面61に沿って移動する途中に、基板Gがボール機構8と接触し、ボール機構8の回転により基板Gが送り出されるように前記斜面61を滑るので(図13(b))、基板Gの自重との組み合わせにより、基板Gの1の角部S1が規制載置部5の所定位置まで速やかに移動し(図13(c))、より確実に前記1の角部を規制載置部5に当接させることができる。
【0044】
この際ボール81は方向指向性を持たないので、基板Gをより速やかに移動させることができて、有効である。また既述のように、ボール81を第1傾斜面61の2つの傾斜面に、夫々ボール81を取り付ける位置の高さが異なると共に、前記傾斜面の幅方向の位置が異なるように設けたので、基板Gの引っ掛かりが抑えられて基板Gがスムーズに滑り落ちることになる。またボール81は第1傾斜面61のいずれか一方の傾斜面に設けるようにしてもよいし、第1傾斜面61の2つの傾斜面のほぼ同じ位置に設けるようにしてもよい。
【0045】
以上において図11〜図13のような構成は、基板Gの角部の裏面側と傾斜載置部6の第1の傾斜面61との接触面の摩擦力が大きく、基板Gが第1の傾斜面61を滑りにくい場合に有効である。またこれらの構成では、確実に基板Gの1の角部を規制載置部5に当接できるので、基板Gが位置決めされた状態で基板Gに載置されたときに、基板Gが水平面に対して傾斜しないように予め規制載置部5と傾斜載置部6の形状を設定することができる。
【0046】
続いて本発明のさらに他の実施の形態について説明する。この実施の形態は、図14に示すように、基板Gが前記保持アーム31に、基板Gの中心位置と保持アームの中心位置とを揃えた状態で、かつ保持アーム31の進退方向の軸線に対して基板の互いに対向する一対の辺が斜めに位置した状態で載置されるように、4個の載置部を保持アーム31に設けたものである。このように載置すると、基板Gが第1の傾斜面61に沿って移動するときに、基板Gに作用する加速度のベクトルの対角線成分が大きくなり、確実に前記1の角部を規制載置部5に当接させることができる。
【0047】
以上において上述の実施の形態では、図10,図11の例を除いて、4個の載置部41〜44の内、いずれか1つを規制載置部5、残りの3個を傾斜載置部6とすればよい。また4個の載置部41〜44の内の、基板Gの対角線上に対向する2つ載置部が傾斜載置部6同士または一方が規制載置部5であって、他方が傾斜載置部6であれば、左右方向や上下方向のずれを抑えた状態で基板Gを保持することができるので、4個の載置部41〜44の内、1つを規制載置部5とし、他の載置部の内の2個の載置部を傾斜載置部6として、残りの1個の載置部は、例えばC面の傾斜に沿った傾斜面を有する構成としてもよい。
【0048】
さらに4個の載置部41〜44の内、1つを規制載置部5とし、他の載置部のうちの前記規制載置部5と基板Gの対角線上に対向する載置部を傾斜載置部6として、残りの2個の載置部は、例えばC面の傾斜に沿った傾斜面を有する構成としてもよい。これらの構成においても、傾斜載置部6の第1の傾斜面61の角部の凹縁と、基板Gの角部の裏面側(この例ではC面の裏面側)の凸縁とが重なるように基板Gを保持アーム31に載置することにより、基板Gの左右方向のずれが抑えられ、基板Gが位置決めされた状態で保持されるからである。
【0049】
また本発明の傾斜載置部6は第2の傾斜面62を備えない構成としてもよく、この場合第1の傾斜面61の傾斜角度θ1は65度、高さH1は8mm程度に設定される。
【0050】
さらに上述の実施の形態では、半導体マスク用の角型基板を例にとり説明したが、FPD(フラットパネルディスプレイ)用の角型基板等を搬送する基板搬送手段についても本発明は適用可能である。C面が形成されていない基板に対しては、規制載置部5に対しては、基板Gの第1の角部S1の裏面側の角部近傍領域が載置面51に載置され、前記角部S1の端面が接触面52に当接するように載置される。また傾斜載置部6に対しては、基板Gの他の角部の裏面側の凸縁が傾斜載置部6の第1の載置面61の凹縁と重なるように、前記他の角部を挟む2辺の端縁が第1の傾斜面61にて下方側に案内されるように載置されるので、同様の効果を得ることができる。
【0051】
【発明の効果】
本発明によれば、角型の基板を精度良く位置決めした状態で保持アームに載置して、正確な搬送を行うことができる。
【図面の簡単な説明】
【図1】本発明の基板搬送手段を備えた塗布膜形成装置の一実施の形態の全体構成を示す平面図である。
【図2】前記塗布膜形成装置の全体構成を示す概略斜視図である。
【図3】前記塗布膜形成装置にて処理されるマスク基板を説明するための平面図と側面図である。
【図4】前記基板搬送手段の全体構成を示す斜視図である。
【図5】前記基板搬送手段の保持アームを示す平面図である。
【図6】前記保持アームに設けられる規制載置部の一例を示す平面図と側面図である。
【図7】前記保持アームに設けられる傾斜載置部の一例を示す斜視図である。
【図8】前記傾斜載置部の一例を示す平面図と側面図である。
【図9】前記保持アームの作用を説明するための側面図である。
【図10】前記保持アームの他の例を説明するための平面図である。
【図11】前記保持アームの他の例を説明するための側面図である。
【図12】前記保持アームのさらに他の例を説明するための側面図である。
【図13】前記保持アームのさらに他の例を説明するための側面図である。
【図14】前記保持アームのさらに他の例を説明するための平面図である。
【図15】従来の搬送アームを示す平面図と断面図である。
【符号の説明】
G マスク基板
B1 キャリアブロック
B2 処理ブロック
3 基板搬送手段
31 保持アーム
41〜44 載置部
5 規制載置部
51 載置面
52 接触面
6 傾斜載置部
61 第1の傾斜面
62 第2の傾斜面
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a substrate transfer apparatus for transferring a square substrate.
[0002]
[Prior art]
In a semiconductor device manufacturing process, a resist pattern is applied to a rectangular mask substrate, the resist film is exposed using a photomask, and further developed to produce a desired pattern mask. . When performing the above processing, for example, a coating film unit for applying a resist solution to a substrate, a developing unit for supplying a developing solution to the substrate to perform development processing, and processing before and after the coating processing and development processing are performed. A plurality of processing units to be performed are provided in one apparatus, and a predetermined process is performed in the apparatus by transporting a substrate to these units by a transport arm.
[0003]
By the way, the mask substrate is rectangular, but from the point of delivery of the substrate to and from the processing unit, as shown in the plan view of FIG. 15A and the side sectional view of FIG. One inner edge 11 is formed in an arc shape. Then, holding parts 12 are provided to hold the corners of the substrate 10 so as to sandwich the corners of the substrate 10 at four locations on the inner edge 11 of the arm 1, and the substrate 10 is held in a state where the four corners of the substrate 10 are held by the holding parts 12. I was carrying it. At this time, the substrate 10 is preferably positioned and placed on the transfer arm 1 so that the center position of the arc of the inner edge 11 of the transfer arm 1 and the center position of the substrate 10 are aligned. Since there is an error of 5 mm, the holding portion 12 has a clearance exceeding the maximum tolerance of the substrate accuracy. For this reason, even if the corner portion of the substrate 10 is held by the holding unit 12, the substrate 10 is easily displaced in the vertical direction or the horizontal direction during the transfer, and it is difficult to transfer the substrate 10 in a state in which the substrate 10 is reliably positioned. .
[0004]
For this reason, the present inventors are examining a transfer arm that holds the substrate in a positioned state. As such a configuration, a technique is known in which a substrate is mechanically pressed and positioned on a transfer arm. For example, a square substrate is placed on a placement means, and the first of the square substrates is placed. A configuration in which a mechanism for pressing the two side surfaces of the corner portion in the diagonal direction and pressing the two side surfaces of the second corner portion facing the first corner portion of the square substrate in the diagonal direction is provided on the transfer arm (for example, Patent Document 1) has been proposed.
[0005]
[Patent Document 1]
Japanese Patent Laid-Open No. 5-100198 (see FIG. 1)
[0006]
[Problems to be solved by the invention]
By the way, in the above-described configuration, a mechanism for pressing two opposite corners of the substrate must be provided on the transfer arm, which is structurally complicated and also has a problem in weight. Since the mask substrate itself is as heavy as about 0.3 kg, there is a background that it is desired to reduce the weight of the arm.
[0007]
The present invention has been made under such circumstances, and an object of the present invention is to provide a technology for accurately transporting a square substrate by holding the substrate in a precisely positioned state. There is.
[0008]
[Means for Solving the Problems]
The substrate transfer apparatus of the present invention is a substrate transfer apparatus provided with a holding arm for placing a square substrate.
The holding arm includes four placement portions on which four corners of the substrate are placed,
One of the mounting portions holds the back side of the first corner portion of the substrate and contacts the end surfaces of the two sides sandwiching the first corner portion to regulate the first corner portion. It is a regulated placement part,
At least two of the other mounting portions are inclined downward toward the inside of the holding arm so as to guide the edges of the two sides sandwiching the corner portion of the back surface of the substrate downward. An inclined mounting portion having a first inclined surface;
A state where the corner portion of the substrate is placed on the inclined placement portion and guided along the inclined surface, thereby bringing the first corner portion of the substrate into contact with the restriction placement portion, thereby aligning the substrate. It is mounted on a holding arm.
[0009]
One of the four placement portions holds the back side of the first corner portion of the substrate and contacts with the end surfaces of the two sides sandwiching the first corner portion, thereby the first corner portion. Among the other placement units, the placement unit that is opposite to the regulation placement unit on the diagonal line of the substrate has two edges that sandwich the corner of the back surface of the substrate downward. It is good also as an inclination mounting part provided with the 1st inclined surface which inclines below toward the inner side of a holding | maintenance arm so that it may guide to the side.
[0010]
In such a substrate transport apparatus, the corner portion of the substrate is placed on the inclined placement portion, and the edges of the two sides sandwiching the corner portion are guided along the inclined surface, whereby the position of the substrate in the left-right direction is determined. The first corner of the substrate can be brought into contact with the restriction mounting portion in a state in which the substrate is corrected, so that the substrate is placed on the holding arm in a state where the substrate is accurately aligned. Further, since the positions of the edges of the two sides sandwiching the corner are held at the two corners of the substrate, the lateral displacement of the substrate G being transferred is suppressed, and the substrate is It is possible to reliably carry out the transfer while being accurately positioned.
[0011]
Here, the inclined mounting portion includes a second inclined surface which is inclined more gently than the first inclined surface above the first inclined surface, and is placed on the second inclined surface. You may make it the corner | angular part of a board | substrate guide to a 1st inclined surface along the said 2nd inclined surface. A driving mechanism for moving the holding arm of the substrate transfer device to be movable back and forth, freely moving up and down, and rotatable about a substantially vertical axis; the regulation placing portion provided on the front side of the holding arm in a moving direction; When placed on the holding arm, the holding arm is moved slightly at the first speed so that the substrate moves to the rear side in the advancing / retreating direction and the substrate is moved to the restricting placing portion side by inertial force, and then the holding arm is advanced / retreated. And a control unit that controls driving of the drive mechanism so as to move to the rear side in the direction at a second speed smaller than the first speed.
[0012]
Further, a pressing mechanism that is provided on a mounting portion other than the regulated mounting portion and presses and lifts the back side of the substrate, and when the substrate is placed on the holding arm, the back side of the substrate is lifted by the pressing mechanism. And a controller for controlling the driving of the pressing mechanism, or a mounting mechanism other than the restricting mounting section may be provided with a ball mechanism so as to contact the back side of the substrate. Also good. The mounting portion is provided on the holding arm so that the substrate is placed on the holding arm in a state where a pair of opposite sides of the substrate are obliquely positioned with respect to the axis of the holding arm in the advancing and retreating direction. You may do it. Further, as the holding arm, an arm whose inner edge is provided in an arc shape can be used. As the rectangular substrate, for example, a mask substrate used for manufacturing a pattern mask is used, and in this case, the regions held by the restriction mounting portion and the inclined mounting portion are the side surface and the bottom surface of the mask substrate. It is an inclined surface formed between them.
[0013]
DETAILED DESCRIPTION OF THE INVENTION
An embodiment of a coating film forming apparatus provided with a substrate transfer means of the present invention will be described below. Here, FIG. 1 is a plan view showing an overall configuration according to an embodiment of a coating film forming apparatus, and FIG. 2 is a schematic perspective view thereof. In the figure, B1 is a carrier block for carrying in / out a carrier C in which, for example, five substrates, for example, a mask substrate G are accommodated, and this carrier block B1 is transferred to and from the carrier placing portion 21 on which the carrier C is placed. And means 22.
[0014]
The delivery means 21 takes out the substrate G from the carrier C, and can move left and right, back and forth, move up and down, vertically so as to deliver the removed substrate G to the processing unit B2 provided on the back side of the carrier block B1. It is configured to be rotatable around its axis.
[0015]
In the center of the processing section B2, there is provided a substrate transfer means 3 that forms a substrate transfer device. For example, when viewed from the carrier block B1, the application unit 23 and the development unit 24 are provided on the right side, and the left side is provided on the left side. In the cleaning unit 25, shelf units U1 and U2 in which heating / cooling units and the like are stacked in multiple stages are arranged on the front side and the back side, respectively. The coating unit 23 is a unit that performs a process of coating a resist solution on a substrate, and the developing unit 24 is a unit that deposits a developer on an exposed substrate and performs the developing process for a predetermined time, and a cleaning unit 25. Is a unit for cleaning the substrate before applying the resist solution.
[0016]
The shelf units U1 and U2 are configured by stacking a plurality of units. For example, as shown in FIG. 2, in addition to the heating unit 26 and the cooling unit 27, the substrate G delivery unit 28 and the like are allocated vertically. . The substrate transport means 3 is configured to be movable up and down, reciprocated and rotatable about a vertical axis, and serves to transport the substrate G between the shelf units U1 and U2, the coating unit 23, the developing unit 24, and the cleaning unit 25. have. However, in FIG. 2, the delivery means 22 and the substrate transport means 3 are not drawn for convenience.
[0017]
The processing unit B2 is connected to an exposure apparatus B4 through an interface unit B3. The interface part B3 is provided with a delivery means 29. The delivery means 29 is, for example, configured to be movable up and down, movable left and right, back and forth, and rotatable about a vertical axis, and the processing block B2 and the exposure apparatus B4. The board | substrate G is delivered between.
[0018]
The flow of the substrate G in such a coating film forming apparatus will be described. First, the carrier C is carried into the carrier mounting portion 21 from the outside, and the substrate G is taken out from the carrier C by the transfer means 22. The board | substrate G is delivered to the board | substrate conveyance means 3 via the delivery unit 28 of the shelf unit U1 from the delivery means 22, and is sequentially conveyed to a predetermined unit. For example, a predetermined cleaning process is performed in the cleaning unit 25, heat drying is performed in one of the heating units 26, the temperature is adjusted to a predetermined temperature in the cooling unit 27, and a coating film is formed in the coating unit 23. A coating process of a resist solution in which components are dissolved in a solvent is performed.
[0019]
Subsequently, the substrate G is pre-baked by one of the heating units 26 and then adjusted to a predetermined temperature by one of the cooling units 27. Next, the substrate is transferred by the substrate transfer means 3 to the transfer means 29 of the interface unit B3 via the transfer unit 28 of the shelf unit U2, and is transferred to the exposure apparatus B4 by the transfer means 29 to perform a predetermined exposure process. Thereafter, the substrate G is transferred to the processing unit B2 via the interface unit B3, and post-exposure baking processing is performed in one of the heating units 26. Next, after cooling to a predetermined temperature by the cooling unit 27 and adjusting the temperature, the developer is accumulated in the developing unit 24 and a predetermined development process is performed. The substrate G on which the predetermined circuit pattern is thus formed is returned to, for example, the original carrier C through the substrate transfer means 3 and the delivery means 22 of the carrier block B1.
[0020]
Here, the mask substrate G will be briefly described. The mask substrate G is a substrate for forming a pattern mask, for example, and is, for example, a square with a side length of 152 ± 0.5 mm, a thickness of 6.35 mm, and a side length of 6 inches. The square glass substrate is used. The mask substrate G includes an R surface type in which corners are cut in an arc shape when viewed in plan, and a substrate G in which corner portions are linearly cut. In this embodiment, an R surface is used. A type substrate G will be described as an example. For example, as shown in FIG. 3A, the corner portion S of the R-plane type mask substrate G is cut into a part of a circular arc having a radius of 2 mm when viewed in plan.
[0021]
Such a mask substrate G holds the C surface 100 of the substrate G by the substrate transfer means 3. The C surface 100 is an inclined surface formed between the side surface and the bottom surface of the corner portion of the mask substrate G, as shown in FIG. In the mask substrate G, if particles adhere to somewhere on the substrate G, the presence of the particles makes it impossible to use all the wafers exposed using the mask substrate G as a pattern mask. In addition, the holding area by the substrate transfer means 3 is limited to be quite small.
[0022]
Next, the substrate transfer means 3 will be described in detail with reference to the drawings. First, the overall configuration of the substrate transport unit 3 will be described with reference to FIG. 4. The substrate transport unit 3 includes a holding arm 31 that holds the substrate G, a base 32 that supports the holding arm 31 so as to be movable forward and backward, A pair of guide rails 33, 34 that support the base 32 so as to be movable up and down, connecting members 35, 36 that connect the upper and lower ends of the guide rails 33, 34, guide rails 33, 34, and connecting members 35, 36, respectively. A rotation drive unit 37 integrally attached to the connecting member 36 at the lower end of the guide rail and a rotation provided at the connecting member 35 at the upper end of the guide rail to drive the frame body rotatably around the vertical axis. And a shaft portion 38.
[0023]
Each of the holding arms 31 has a three-stage configuration so as to hold the substrate G, and the base end of the arm 31 can slide along a guide groove 32 a provided in the longitudinal direction of the base 32. It has become. The forward / backward movement of the arm 31 and the upward / downward movement of the base 32 by the slide movement are driven by separate drive units (not shown). Therefore, the two drive parts (not shown), the guide groove 32a, the guide rails 33 and 34, and the rotation drive part 37 are a drive mechanism that drives the arm 31 so as to be rotatable about a substantially vertical axis, and to be movable up and down and back and forth. This drive mechanism is driven and controlled by a control unit (not shown) based on the conveyance program.
[0024]
Next, the holding arm 31 will be described. The inner edge 30 of the arm 31 is constituted by a part of a circular arc having a radius of 127 mm as shown in FIG. 5, for example, and there are four positions on the inner edge 30 of the arm 31. The first mounting portion 41, the second mounting portion 42, the third mounting portion 43, and the fourth mounting portion 44 for holding the corner portions S1 to S4 of the substrate G are provided. Yes. In this example, the center position of the arc of the inner edge of the holding arm 31 is aligned with the center position of the substrate G, and the length of a pair of sides of the arm 31 that are indicated by arrows in FIG. The four placement portions 4 (41 to 44) are provided at positions where the substrate G is placed on the arm 31 in a state substantially parallel to the vertical direction.
[0025]
One of the four placement portions 4A to 4D, for example, the first placement portion 41 provided on the front side in the forward / backward direction of the arm 31 is, for example, a restriction placement portion 5 as shown in FIG. It is configured as. The regulated placement portion 5 carries the back surface side of the first corner S1 of the substrate G, for example, the C surface C1 on the back surface side (hereinafter, the C surface refers to the C surface on the back surface side of the corner portion). In order to place, the mounting surface 51 that inclines from the substantially horizontal direction toward the inside of the holding arm 31 in accordance with the inclination of the C surface C1, and a part of the end surfaces of the two sides sandwiching the corner S1 of the substrate G are in contact with each other. A substantially vertical contact surface 52, and the C surface C1 of the corner S1 of the substrate G is placed so that the end surfaces of two sides sandwiching the corner S1 of the substrate G abut on the contact surface 52. The substrate G is positioned by being placed on the surface 51. That is, in the first corner portion S1, the C surface C1 of the corner portion S1 and the end surfaces of the two sides sandwiching the corner portion S1 are placed in contact with the restriction placement portion 5, so The shift in the left-right direction is restricted.
[0026]
Further, the remaining three of the four mounting portions 4, for example, the first to third mounting portions 42 to 44 are configured as inclined mounting portions 6 as shown in FIGS. 7 and 8, for example. ing. The inclined mounting portion 6 has two side edges (in this example, two side edges sandwiching the C plane C3 (C2, C4)) sandwiching the corner S3 (S2, S4) on the back surface of the substrate G downward. And a first inclined surface 61 that is inclined downward toward the inner side of the holding arm 31 with respect to the horizontal plane, and a first inclined surface 61 is provided above the first inclined surface 61. A second inclined surface 62 having a gentler inclination with respect to the horizontal plane than the inclined surface 61 is provided (see FIG. 8A).
[0027]
Here, when the mask substrate G is held, when the first corner portion S1 is held so as to position the substrate G by the restricting placement portion 5, the C surface C3 of the corner portion S3 (S2, S4) ( C2 C3 (C2, C4) of corner S3 (S2, S4) as shown in FIG. 8 with the convex edge on the back side of C2, C4) overlapping the concave edge of the corner of first inclined surface 61 Is held in contact with the first inclined surface 61.
[0028]
Therefore, the inclination angle θ1 (angle formed with the horizontal plane) of the first inclined plane 61 is set to be substantially the same as the angle θ (see FIG. 3) formed with the horizontal plane of the C plane 100 of the mask substrate G. Yes. For example, when the holding arm 31 holds the mask substrate G whose angle θ formed by the C surface 100 is 45 degrees, the first inclined surface 61 has, for example, a width W1 of 3 mm, an inclination angle θ1 of about 67 degrees, and a height. H1 is set to about 7 mm, and the second inclined surface 62 is set to have a width W2 of 1.7 mm, an inclination angle θ2 of about 60 degrees, and a height H2 of about 3 mm, for example.
[0029]
Further, in this embodiment, as shown in FIG. 8B, the inclination of the second inclined surface 62 with respect to the horizontal plane may be set to be larger than that of the first inclined surface 61. In this case, the first inclined surface 61 is set to have a width W1 of 3 mm, an inclination angle θ1 of about 60 degrees, and a height H1 of about 5 mm, and the second inclined surface 62 has a width W2 of 2 mm and an inclination angle θ2. About 70 degrees and the height H2 are set to about 5.5 mm, respectively.
[0030]
When the substrate G is placed on the substrate transport means 3, the case where the substrate G is received from a delivery means such as a lifting pin of a predetermined processing unit will be described as an example. A plurality of, for example, four lifting pins are provided. The substrate transfer means 3 is positioned at a predetermined position below the held substrate G, and the lifting pins are lowered, so that four corners S1 to S4 of the substrate G are placed on the substrate transfer means 3 from the lifting pins. It passes so that it may each be located in the mounting parts 41-44.
[0031]
Here, normally, corner portions S2 to S4 other than the first corner portion S1 of the substrate G are formed on the first inclined surface 61 of the inclined mounting portion 6 on the C surface C2 of the corner portions S2 to S4 on the substrate rear surface side. Passed so that C4 is located. When delivered in this way, the substrate G is as heavy as 0.3 kg. Therefore, two edges that sandwich the corner S2 on the back surface side of the substrate G, in this example, the C plane C3 (C2, C4) are sandwiched 2 The edge of the side is guided downward along the first inclined surface 61 by its own weight (FIG. 9A).
[0032]
At this time, when the substrate G is transferred to the holding arm 31, the convex edge on the back surface side of the C surface C 3 (C 2, C 4) of the corner portion S 3 (S 2, S 4) is recessed in the corner portion of the first inclined surface 61. Although not overlapping the edge, the three corners S2 to S4 of the substrate G are guided toward the inside of the holding arm 31 along the first inclined surface 61, so that the lateral shift is corrected. Will move. By moving the substrate G in this way, as shown in FIG. 9B, the end surfaces of the two sides sandwiching the first corner S1 of the substrate G come into contact with the contact surface 52 of the restriction mounting portion 5, The movement of the other corners S2 to S4 stops at the abutted position.
[0033]
When the position of the first corner portion S1 is thus restricted by the restriction mounting portion 5, the other corner portions S2 to S4 have the back side of the C surface C3 (C2, C4) of the corner portion S3 (S2, S4). The movement is stopped in a state where the convex edge overlaps with the concave edge at the corner of the first inclined surface 61, and is fixed in that state. In other words, in the other corner S3 (S2, S4), the C surface C3 (C2, C4) of the corner and the edges of the two sides sandwiching the C surface C3 (C2, C4) are inclined mounting portions 6. Since it is mounted in a state where it is in contact with the vertical axis, the vertical and horizontal shifts are restricted. In this way, the substrate G is positioned and held by the substrate transfer means 3 while being slightly inclined with respect to the horizontal plane, and is transferred to the next step. Here, the inclination angle θ3 of the substrate G is about 1.4 degrees with respect to the horizontal plane, and there is no problem in the transfer of the substrate G and the delivery to and from other processing units.
[0034]
In such a substrate transport means 3, among the four placement portions 41 to 44, the three placement portions 42 to 44 are the inclined placement portions 6 having the first inclined surfaces 61, and the substrate G The corner portion (C surface in this example) is moved by its own weight while being guided, and the first corner portion S1 of the substrate G is positioned by the remaining one placement portion 41 (regulation placement portion 5). Therefore, the square substrate G can be held in a state in which it is accurately positioned on the holding arm 31 whose inner edge is formed by a part of the arc. As described above, the substrate G is held by the holding arm 3 in a state in which the substrate G is regulated in the vertical direction and the left-right direction, so that the substrate G can be held in a state of being accurately positioned even during transfer and can be accurately transferred. it can.
[0035]
At this time, since a high positioning accuracy can be ensured by a simple configuration of the inclined placement portion 6 and the restriction placement portion 5, it is not necessary to provide a complicated mechanism such as a mechanical guide mechanism. For this reason, the board | substrate conveyance means 3 can be reduced in size and weight, and it is advantageous in space and cost.
[0036]
Further, if the substrate G is transferred to the substrate transport means 3, the position of the substrate G is shifted, and the other corners S <b> 2 to S <b> 4 are not placed on the first inclined surface 61 of the inclined mounting portion 6. Even when delivered so as to be positioned on the second inclined surface 62, the corners S <b> 2 to S <b> 4 move downward along the inclined surface 62 due to their own weight and are guided to the first inclined surface 61. As a result, the substrate G is held in an accurately positioned state.
[0037]
Next, another embodiment of the present invention will be described. In this example, as shown in FIG. 10, the mounting portion, for example, the first mounting portion 41 on the front side in the advancing / retreating direction of the holding arm 31 is configured as the restricting mounting portion 5, for example, the other three mounting portions. The placement portions 42 to 44 are configured as the inclined placement portion 6.
[0038]
In this example, when the substrate G is placed on the holding arm 31, the substrate G is moved slightly backward, for example, about 20 mm at a first speed, for example, 300 mm / s to 500 mm / s. (FIGS. 11 (a) and 11 (b)), and then a predetermined distance, for example, about 450 mm is moved at a second speed that is slower than the first speed, for example, 100 mm / s or more and less than 300 mm / s (FIG. 11 (c). )), The driving of the holding arm 31 in the forward / backward direction is controlled by a control unit (not shown).
[0039]
As described above, after the substrate G is placed on the holding arm 31, the holding arm 31 is moved to the rear side in the advancing / retreating direction of the holding arm at a high speed such as the first speed (FIG. 11A). The substrate G is moved forward by the inertial force in the advancing / retreating direction of the holding arm 31, and a combination of this force and the movement of the substrate G due to its own weight causes the first corner S <b> 1 of the substrate G to be a predetermined portion of the restriction mounting portion 5. It moves instantaneously to a position (FIG. 11 (b)), and the corner portion S1 can be brought into contact with the restricting placement portion 5 more reliably. At this time, if the first speed is too fast or the moving distance is too long, the inertial force acting on the substrate G becomes too large, and the substrate G easily falls from the holding arm 31. Then, the predetermined distance is moved at a second speed slower than the first speed. Here, the reason why the second speed is moved in the same direction as the first speed is that the force from the other direction on the substrate G is prevented from being applied and the displacement of the substrate G is suppressed. .
[0040]
Next, still another embodiment of the present invention will be described. In this example, for example, one placement portion 4 of the holding arm 31 is configured as a restriction placement portion 5, and the other three placement portions 4 are configured as inclined placement portions 6. In this example, one of the inclined mounting portions 6 includes a pressing mechanism, and the rear surface side of the substrate is lifted by raising the inclined mounting portion 6 by the pressing mechanism. For example, as shown in FIG. 12, the pressing mechanism includes electromagnets 71 and 72 and a power supply unit 73. When the substrate G is transferred to the holding arm 31, the control unit 7 turns on the power supply unit 73. As a result, the electromagnets 71 and 72 are repelled, and the inclined mounting portion 6 is raised by the repulsive force to press the substrate G from the lower side (FIGS. 12A and 12B).
[0041]
When a part of the substrate G is lifted in this way (FIG. 12B), the substrate G is instantaneously inclined, so that one corner portion of the substrate G is restricted by the restriction placement portion due to the combination with the own weight of the substrate G. 5 is instantaneously moved to a predetermined position 5 (FIG. 12C), and the corner portion 1 can be brought into contact with the restricting placement portion 5 more reliably. At this time, if the lifting height of the inclined mounting portion 6 is too large, the substrate G is likely to fall from the holding arm 31, and is preferably about 1 mm to 5 mm. Or as a press mechanism, the structure which provided the piezoelectric element so that the volume could be changed to the vertical direction (height direction) instead of an electromagnet may be sufficient.
[0042]
Next, still another embodiment of the present invention will be described. In this example, for example, one placement portion 4 of the holding arm 31 is configured as a restriction placement portion 5, and the other three placement portions are configured as inclined placement portions 6. In this example, one of the inclined mounting portions 6 includes a ball mechanism 8, and the ball mechanism 8 makes the back side of the substrate G slip easily. The ball mechanism 8 is, for example, between a placement position when the substrate G of the first inclined surface 61 is transferred to the holding arm 31 and a placement position when the substrate G is aligned with the holding arm 31. In this position, for example, a ball 81 made of ceramic, PEEK resin, or the like is provided such that a part of the ball 81 comes into contact with the back side of the substrate G (the back side of the C side on the back side). Here, for example, the balls 81 are provided on two inclined surfaces of the first inclined surface 61 such that the heights of the positions where the balls 81 are attached are different and the positions of the inclined surfaces in the width direction are different.
[0043]
In such a configuration, when the substrate G is delivered to the holding arm 31 (FIG. 13A), the substrate G is moved along the first inclined surface 61 in the inclined mounting portion 6. Since the inclined surface 61 slides so as to come into contact with the ball mechanism 8 and the substrate G is sent out by the rotation of the ball mechanism 8 (FIG. 13B), one corner of the substrate G is combined with the weight of the substrate G itself. S1 moves quickly to a predetermined position of the restriction placing portion 5 (FIG. 13C), and the one corner can be brought into contact with the restriction placement portion 5 more reliably.
[0044]
At this time, since the ball 81 does not have direction directivity, the substrate G can be moved more quickly, which is effective. As described above, the ball 81 is provided on the two inclined surfaces of the first inclined surface 61 such that the height of the position where the ball 81 is attached is different and the position of the inclined surface in the width direction is different. The catch of the substrate G is suppressed, and the substrate G slides down smoothly. The ball 81 may be provided on one of the inclined surfaces of the first inclined surface 61, or may be provided at substantially the same position on the two inclined surfaces of the first inclined surface 61.
[0045]
11 to 13, the frictional force of the contact surface between the back surface side of the corner portion of the substrate G and the first inclined surface 61 of the inclined mounting portion 6 is large, and the substrate G has the first structure. This is effective when the inclined surface 61 is difficult to slip. Moreover, in these structures, since one corner | angular part of the board | substrate G can contact | abut to the regulation mounting part 5 reliably, when the board | substrate G is mounted in the state in which it positioned, the board | substrate G will become a horizontal surface. On the other hand, the shapes of the restricting placement unit 5 and the inclined placement unit 6 can be set in advance so as not to be inclined.
[0046]
Next, still another embodiment of the present invention will be described. In this embodiment, as shown in FIG. 14, the substrate G is aligned with the holding arm 31 such that the center position of the substrate G and the center position of the holding arm are aligned, and the axis of the holding arm 31 is in the advancing / retreating direction. On the other hand, four mounting portions are provided on the holding arm 31 so that a pair of opposite sides of the substrate are positioned obliquely. When placed in this way, when the substrate G moves along the first inclined surface 61, the diagonal component of the acceleration vector acting on the substrate G becomes large, and the corner portion of the first is surely placed on the restriction. It can be brought into contact with the portion 5.
[0047]
In the above-described embodiment, except for the examples of FIGS. 10 and 11, any one of the four placement portions 41 to 44 is the restriction placement portion 5 and the remaining three are inclined placements. The placement unit 6 may be used. Of the four placement portions 41 to 44, two placement portions facing diagonally of the substrate G are the inclined placement portions 6 or one is the restriction placement portion 5, and the other is the inclined placement. If it is the mounting part 6, since the board | substrate G can be hold | maintained in the state which restrained the shift | offset | difference of the left-right direction or an up-down direction, one of the four mounting parts 41-44 is made into the restriction | limiting mounting part 5. Further, two of the other placement units may be set as the inclined placement unit 6, and the remaining one placement unit may have, for example, an inclined surface along the inclination of the C plane.
[0048]
Further, one of the four placement portions 41 to 44 is defined as a restriction placement portion 5, and the placement portion facing the restriction placement portion 5 and the diagonal line of the substrate G among the other placement portions. As the inclined mounting portion 6, the remaining two mounting portions may have an inclined surface along the inclination of the C surface, for example. Also in these configurations, the concave edge at the corner of the first inclined surface 61 of the inclined mounting portion 6 and the convex edge on the back surface side of the corner portion of the substrate G (in this example, the back surface side of the C surface) overlap. By placing the substrate G on the holding arm 31 as described above, the horizontal displacement of the substrate G is suppressed, and the substrate G is held in a positioned state.
[0049]
Further, the inclined mounting portion 6 of the present invention may be configured not to include the second inclined surface 62. In this case, the inclination angle θ1 of the first inclined surface 61 is set to 65 degrees and the height H1 is set to about 8 mm. .
[0050]
Furthermore, in the above-described embodiment, a rectangular substrate for a semiconductor mask has been described as an example. However, the present invention can also be applied to a substrate transfer unit that transfers a square substrate for an FPD (flat panel display) or the like. For the substrate on which the C-plane is not formed, the area near the corner on the back side of the first corner S1 of the substrate G is placed on the placement surface 51 with respect to the restricting placement unit 5, The end surface of the corner portion S1 is placed so as to contact the contact surface 52. Further, with respect to the inclined mounting portion 6, the other corners are arranged so that the convex edge on the back surface side of the other corner portion of the substrate G overlaps the concave edge of the first mounting surface 61 of the inclined mounting portion 6. Since the end edges of the two sides sandwiching the portion are placed so as to be guided downward by the first inclined surface 61, the same effect can be obtained.
[0051]
【The invention's effect】
According to the present invention, the square substrate can be placed on the holding arm in a state where the substrate is accurately positioned, and accurate conveyance can be performed.
[Brief description of the drawings]
FIG. 1 is a plan view showing the overall configuration of an embodiment of a coating film forming apparatus provided with a substrate transfer means of the present invention.
FIG. 2 is a schematic perspective view showing an overall configuration of the coating film forming apparatus.
FIGS. 3A and 3B are a plan view and a side view for explaining a mask substrate processed by the coating film forming apparatus. FIGS.
FIG. 4 is a perspective view showing an overall configuration of the substrate transfer means.
FIG. 5 is a plan view showing a holding arm of the substrate transfer means.
FIGS. 6A and 6B are a plan view and a side view showing an example of a restriction mounting portion provided on the holding arm. FIGS.
FIG. 7 is a perspective view showing an example of an inclined mounting portion provided on the holding arm.
FIG. 8 is a plan view and a side view showing an example of the inclined mounting portion.
FIG. 9 is a side view for explaining the operation of the holding arm.
FIG. 10 is a plan view for explaining another example of the holding arm.
FIG. 11 is a side view for explaining another example of the holding arm.
FIG. 12 is a side view for explaining still another example of the holding arm.
FIG. 13 is a side view for explaining still another example of the holding arm.
FIG. 14 is a plan view for explaining still another example of the holding arm.
15A and 15B are a plan view and a cross-sectional view showing a conventional transfer arm.
[Explanation of symbols]
G mask substrate
B1 carrier block
B2 processing block
3 Substrate transfer means
31 Holding arm
41-44 Placement section
5 regulation placement part
51 Placement surface
52 Contact surface
6 Inclined mounting part
61 First inclined surface
62 Second inclined surface

Claims (9)

角型の基板を載置する保持アームを備えた基板搬送装置において、
前記保持アームは、基板の4個の角部が載置される4個の載置部を備え、
前記載置部の一つは、基板の第1の角部の裏面側を保持すると共に、前記第1の角部を挟む2辺の端面と接触して、当該第1の角部を規制する規制載置部であり、
他の載置部のうちの少なくとも2個の載置部は、基板の裏面の角部を挟む2辺の端縁を下方側に案内するように保持アームの内側に向けて下方側に傾斜する第1の傾斜面を備えた傾斜載置部であり、
基板の角部を傾斜載置部に載置して傾斜面に沿って案内することにより、基板の第1の角部を前記規制載置部に当接させ、これにより基板を位置合わせした状態で保持アームに載置することを特徴とする基板搬送装置。
In a substrate transfer apparatus having a holding arm for placing a square substrate,
The holding arm includes four placement portions on which four corners of the substrate are placed,
One of the mounting portions holds the back side of the first corner portion of the substrate and contacts the end surfaces of the two sides sandwiching the first corner portion to regulate the first corner portion. It is a regulated placement part,
At least two of the other mounting portions are inclined downward toward the inside of the holding arm so as to guide the edges of the two sides sandwiching the corner portion of the back surface of the substrate downward. An inclined mounting portion having a first inclined surface;
A state where the corner portion of the substrate is placed on the inclined placement portion and guided along the inclined surface, thereby bringing the first corner portion of the substrate into contact with the restriction placement portion, thereby aligning the substrate. A substrate carrying device, wherein the substrate carrying device is placed on a holding arm.
角型の基板を載置する保持アームを備えた基板搬送装置において、
前記保持アームは、基板の4個の角部が載置される4個の載置部を備え、
前記載置部の一つは、基板の第1の角部の裏面側を保持すると共に、前記第1の角部を挟む2辺の端面と接触して、当該第1の角部を規制する規制載置部であり、
他の載置部のうちの前記規制載置部と基板の対角線上に対向する載置部は、基板の裏面の角部を挟む2辺の端縁を下方側に案内するように、かつ水平面に対して保持アームの内側に向けて下方側に傾斜する第1の傾斜面を備えた傾斜載置部であり、
基板の角部を傾斜載置部に載置して傾斜面に沿って案内することにより、基板の第1の角部を前記規制載置部に当接させ、これにより基板を位置合わせした状態で保持アームに載置することを特徴とする基板搬送装置。
In a substrate transfer apparatus having a holding arm for placing a square substrate,
The holding arm includes four placement portions on which four corners of the substrate are placed,
One of the mounting portions holds the back side of the first corner portion of the substrate and contacts the end surfaces of the two sides sandwiching the first corner portion to regulate the first corner portion. It is a regulated placement part,
Of the other placement units, the placement unit facing the regulation placement unit and the diagonal line of the substrate is such that the two edges sandwiching the corners on the back surface of the substrate are guided downward and a horizontal plane. An inclined mounting portion having a first inclined surface inclined downward toward the inside of the holding arm,
A state where the corner portion of the substrate is placed on the inclined placement portion and guided along the inclined surface, thereby bringing the first corner portion of the substrate into contact with the restriction placement portion, thereby aligning the substrate. A substrate carrying device, wherein the substrate carrying device is placed on a holding arm.
前記傾斜載置部は、前記第1の傾斜面の上方側に、この第1の傾斜面よりも緩やかに傾斜する第2の傾斜面を備え、この第2の傾斜面に置かれた基板の角部が当該第2の傾斜面に沿って第1の傾斜面に案内されることを特徴とする請求項1又は2記載の基板搬送装置。The inclined mounting portion includes a second inclined surface which is inclined more gently than the first inclined surface above the first inclined surface, and the substrate placed on the second inclined surface is provided. 3. The substrate transfer apparatus according to claim 1, wherein the corner portion is guided to the first inclined surface along the second inclined surface. 前記基板搬送装置の保持アームを進退自在、昇降自在、略鉛直軸まわりに回転自在に移動させる駆動機構と、
保持アームの進退方向の前方側に設けられた前記規制載置部と、
基板が保持アームに載置されたときに、保持アームを進退方向の後方側に、基板が慣性力で規制載置部側に移動するように第1の速度で僅かに移動させ、次いで保持アームを進退方向の後方側に第1の速度よりも小さい第2の速度で移動させるように前記駆動機構の駆動を制御する制御部と、を備えることを特徴とする請求項1ないし3のいずれかに記載の基板搬送装置。
A drive mechanism for moving the holding arm of the substrate transfer device so as to be movable back and forth, freely movable, and rotatable about a substantially vertical axis;
The restriction mounting portion provided on the front side in the advancing / retreating direction of the holding arm;
When the substrate is placed on the holding arm, the holding arm is moved slightly at the first speed so that the substrate moves to the rear side in the advancing / retreating direction, and the substrate is moved to the regulated placement portion side by inertial force, and then the holding arm 4. A control unit that controls the drive of the drive mechanism so as to move the drive mechanism rearward in the forward / backward direction at a second speed smaller than the first speed. 5. The board | substrate conveyance apparatus of description.
前記規制載置部以外の載置部に設けられ、基板の裏面側を押圧して持ち上げる押圧機構と、
基板が保持アームに載置されたときに、押圧機構により基板の裏面側を持ち上げるように前記押圧機構の駆動を制御する制御部と、を備えることを特徴とする請求項1ないし4のいずれかに記載の基板搬送装置。
A pressing mechanism that is provided in a mounting portion other than the regulated mounting portion and presses and lifts the back side of the substrate;
5. A control unit that controls driving of the pressing mechanism so as to lift the back side of the substrate by the pressing mechanism when the substrate is placed on the holding arm. The board | substrate conveyance apparatus of description.
前記規制載置部以外の載置部に、基板の裏面側と接触するようにボール機構を設けることを特徴とする請求項1ないし6のいずれかに記載の基板搬送装置。The substrate transport apparatus according to claim 1, wherein a ball mechanism is provided on a placement part other than the restriction placement part so as to be in contact with a back surface side of the substrate. 基板が前記保持アームに、当該保持アームの進退方向の軸に対して基板の互いに対向する一対の辺が斜めに位置した状態で載置されるように、前記載置部を保持アームに設けることを特徴とする請求項1ないし6のいずれかに記載の基板搬送装置。The mounting portion is provided on the holding arm so that the substrate is placed on the holding arm in a state where a pair of opposite sides of the substrate are obliquely positioned with respect to the axis of the holding arm in the advancing and retreating direction. The substrate transfer apparatus according to claim 1, wherein: 前記保持アームの内縁は、円弧状に設けられていることを特徴とする請求項1ないし7のいずれかに記載の基板搬送装置。The substrate transfer apparatus according to claim 1, wherein an inner edge of the holding arm is provided in an arc shape. 前記角型の基板はパターンマスクの製造に用いられるマスク基板であり、前記規制載置部及び傾斜載置部にて保持される領域は、マスク基板の側面と底面との間に形成される傾斜面であることを特徴とする請求項1ないし8のいずれかに記載の基板搬送装置。The square substrate is a mask substrate used for manufacturing a pattern mask, and the region held by the restriction mounting portion and the inclined mounting portion is an inclination formed between the side surface and the bottom surface of the mask substrate. The substrate transfer apparatus according to claim 1, wherein the substrate transfer apparatus is a surface.
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