JP2004257971A - Ultrasonic signal processing system, method, program, and storage medium and ultrasonic flaw detection apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an ultrasonic signal processing system capable of easily and accurately detecting a flaw by using a TOFD(time of flight diffraction) method. <P>SOLUTION: In a system for processing an ultrasonic signal due to a defect 4 existing in a specimen 1 based on the TOFD method by receiving an ultrasonic wave transmitted from a transmission oblique probe 2 disposed in the specimen 1 by using a reception oblique probe 3, a signal processing program 7 is carried out, a circular pattern indicated on a B scope is automatically detected based on the ultrasonic signal, and the existence of the defect 4 is indicated and displayed based on the detected circular pattern. <P>COPYRIGHT: (C)2004,JPO&NCIPI

Description

【００３２】
また、円弧によるずれ量について図５を参照して説明する。
円弧によるずれ量は、特定の信号源（音源）に対する走査方向のずれに応じた路程方向のずれ量をいい、このずれ量は図５の例では、以下のようにして求めることができる。
【００３３】
【数２】

【００３４】
なお、異なるフィルタサイズの複数の円弧フィルタを用意し、円弧模様を複数の円弧フィルタの特徴量に基づきの識別することも可能である。
【００３５】
ステップＴ３は、円弧フィルタが適用されたＴＯＦＤデータに対し２値化処理を適用するものであり、後述の処理はこの２値化したデータに基づき行われる。なお、２値化に際しては例えば平均値＋２σの閾値を設定する。
【００３６】
ステップＴ４は、２値化したデータのうち路程方向のデータに膨張収縮処理を適用するものである。この処理により、路程方向に連続して表れる円弧模様を、一つのグループとして抽出することが可能となる。
【００３７】
ステップＴ５は、２値化したデータ又はその膨張収縮処理したデータの連結成分を得るためのラベリング処理である。
【００３８】
ステップＴ６は、特徴量計算処理であり、上述した円弧差分値特徴量と、円弧差分値Ｓ／Ｎ特徴量を計算する。
【００３９】
ステップＴ７は、上述した円弧差分値特徴量と、円弧差分値Ｓ／Ｎ特徴量、特徴量とに基づき円弧模様を識別するに際し、特徴量への重み付けやしきい値の決定のために線形判別分析（正準判別分析）を用いることにより、複数の特徴量の組合せがより適切になり識別率が向上する。
【００４０】
以上のステップを経てステップＴ８で識別結果が得られる。
【００４１】
次に、図３においてステップＴ９，Ｔ１０は、識別結果をさらに人手により補正するものであり、モニタ９に表示された識別結果を見ながら、図示しないキーボードやマウス等を操作して、識別結果をさらに人手により補正する。
【００４２】
ステップＴ１０は、識別結果をさらに人手により補正するものである。
【００４３】
ステップＴ１１は、識別結果について各領域から最も指示ピーク位置と思われる位置として、円弧Ｓ／Ｎ特徴量の最大位置を検索する。
【００４４】
ステップＴ１２は、識別結果について各領毎の指示情報を計測するものであり、ここで言う指示情報は、指示の走査位置、指示の深さ位置、深さ方向、長さ等を言う。また例えば図６に示すように、横方向エコー高さ平均値を用いて指示情報を求めることも可能である。
【００４５】
図７は、本実施形態の信号処理の変化を示しており、図７（ａ）は原データつまり円弧フィルタが適用される前のＴＯＦＤデータである。
【００４６】
図７（ｂ）は円弧フィルタが適用された後のデータである。
【００４７】
図７（ｃ）は２値化処理後のデータである。
【００４８】
図７（ｄ）は膨張収縮処理後のデータである。
【００４９】
以上述べた本実施形態によれば、次のような作用効果を得ることができる。すなわち、本実施形態においては、画像処理で円弧模様を自動検出し、その結果に基づいて指示情報を自動計測することから、人手作業の減少を図られ、コンピュータ処理による高速化が図れると共に人手に伴うケアレスミスが減少する効果が期待できる。
【００５０】
また、画像処理で円弧模様を自動検出するのに円弧フィルタを用い、該フィルタ画像を用いて２値化することから、指示模様である円弧模様領域のＳ／Ｎが向上し、より適切に指示領域を２値化できるようになる。
【００５１】
さらに、円弧フィルタ特徴量を用いて円弧模様を検出するようにしているので、円弧模様により敏感な特徴量を用いることにより、指示とノイズの識別率が向上する。
【００５２】
またフィルタサイズが異なる複数の円弧フィルタ特徴量を適宜用いることにより、指示領域以外であればフィルタサイズが異なるとばらつきが大きくなると考えられることから、指示とノイズとの識別率が一層向上するものとなる。
【００５３】
さらに識別のための特徴量への重み付けやしきい値の決定のために線形判別分析（正準判別分析）を用いることにより、複数の特徴量の組合せがより適切になり識別率が向上する。
【００５４】
また識別結果の人手による補正機能を設けていることにより、自動による識別結果を補正する手段を提供することで、より高い精度の結果を得ることができる。
【００５５】
さらに、指示情報の計測に横方向エコー高さ平均値を用いることにより、平均値を用いることで局所的なノイズの影響を低減し、安定した指示情報計測が可能となる。
【００５６】
本発明において、識別結果の表示は各種の形態を採用することができる。例えば、処理結果を原画像に重ね合わせる形とすることができる。
【００５７】
また、円弧フィルタの出力がしきい値を超え、かつ円弧模様として識別されたラベルと、円弧模様として認識された各ラベルの中で、円弧差分値Ｓ／Ｎ特徴量の値が最も大きい位置をマーキングしたものと（例えば正方形で示し、その大きさは特徴量値の大きさに比例させる）、円弧フィルタの出力がしきい値を越えて、かつ円弧模様では無いと識別されたラベルとを色別で表示することで、円弧模様の中心として識別された領域と、円弧模様として認識された各ラベルの中で、円弧差分値Ｓ／Ｎ特徴量の値が最も大きい位置と、円弧では無い、つまりノイズと識別された領域とを、明確に判別が行われるようにすることができる。
【００５８】
上述した実施形態において、コンピュータ６は、単一のコンピュータ等のハードウエアとして構成する他に、一又は複数のコンピュータ又はこれらコンピュータの一部の機能により構成することができる。また本発明が実施される方法を、コンピュータにより実行するプログラムとして構成とすることもでき、さらに該プログラムを記録した記憶媒体をコンピュータに適用し、該コンピュータにて前記プログラムを実行するようにしても良い。さらに、図１に示すシステムにおけるＴＯＦＤデータは、オンライン又はオフラインで本発明のシステム、方法等により処理するができる。
【００５９】
また図８は、探傷器及び信号処理のためのコンピュータ等により一の超音波探傷装置を構成した場合の例であり、被検体１に配置される送信探触子２と、被検体１に送信探触子２と距離を存して配置され送信探触子２から送信した超音波を受信する受信探触子３と、探傷装置本体１１と、モニタ１２と、プリンタ１３とから構成されている。
【００６０】
探傷装置本体１１は、送信探触子２を送信駆動する送信部１１Ａと、受信探触子３を受信駆動する受信部１１Ｂと、この受信部１１Ｂより得られる超音波受信信号をＢスコープ表示処理すると共に当該処理に基づき得られるＢスコープ上の円弧模様を自動検出する信号処理手段として信号処理プログラム１１Ｄがストアされ且つ実行可能な信号処理部１１Ｃと、データ記憶部（ＨＤＤ）１１Ｅと、システムコントローラ１１Ｆとからなり、リアルタイム又は非リアルタイムでＴＯＦＤデータを取得して、図１に示す構成と同様な処理を行うことができる。
【００６１】
【発明の効果】
以上のように本発明によれば、被検体に配置した送信探触子から送信した超音波を受信探触子により受信することにより前記被検体内に存在する欠陥に起因した超音波信号を処理するに際し、超音波信号に基づきＢスコープ上で表れる円弧模様を自動検出し、該検出した円弧模様に基づき前記欠陥の存在を指示表示するようにしたので、ＴＯＦＤ法による探傷を容易且つ高精度に行うことが可能な超音波信号処理システム、方法、プログラム及び記憶媒体並びに超音波探傷装置を提供できるものである。
【図面の簡単な説明】
【図１】本発明による超音波信号処理システムの一実施形態の構成を示す図。
【図２】同システムにおける超音波信号処理方法の一例の概略を示すフロー図。
【図３】同方法の詳細を示すフロー図。
【図４】本発明における円弧フィルタを説明する図。
【図５】本発明における円弧ずれ量を説明する図。
【図６】指示情報の計測手法の一例を示す図。
【図７】本発明による超音波信号処理による画像処理の変化を示す図。
【図８】本発明による超音波探傷装置の一例を示す図。
【図９】ＴＯＦＤ法による探傷法を説明する図。
【符号の説明】
１…被検体、２…送信斜角探触子、３…受信斜角探触子、４…欠陥、５…探傷器、６…コンピュータ、７…信号処理プログラム、８…データ記憶装置（ＨＤＤ）、９…モニタ、１０…プリンタ、１１…超音波探傷装置、１１Ａ…送信部、１１Ｂ…受信部、１１Ｃ…信号処理部、１１Ｄ…信号処理プログラム、１１Ｅ…データ記憶装置（ＨＤＤ）、１１Ｆ…システムコントローラ、１２…モニタ、１３…プリンタ。[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a system, a method, a program, a storage medium, and an ultrasonic inspection apparatus applied to processing of an arc pattern related to B-scope display by an ultrasonic inspection method called a TOFD (Time of Flight Diffraction) method.
[0002]
[Prior art]
The TOFD method, which is one of the ultrasonic flaw detection methods, uses a transmission oblique probe and a reception oblique probe that are arranged at a distance from a subject, and transmits ultrasonic waves from the transmission oblique probe into the subject. The ultrasonic signal transmitted near the surface of the object by the receiving angle beam probe, the ultrasonic signal reflected on the bottom surface of the object, and the defect caused by the defect existing in the object. And a scattered-wave signal having the same as a reflection source, and a propagation time difference between these signals is obtained, and a B-scope display is performed to obtain instruction information relating to a defect position and a defect instruction height.
[0003]
In the TOFD method, as shown in FIG. 9A, an ultrasonic wave transmitted from a transmission probe 2 arranged on a subject 1 is received by a reception probe 3 and signal processing is performed on the ultrasonic wave. As shown in FIG. 9B, regarding the defect 4 present in the specimen 1, instruction information indicating an arc pattern caused by the defect 4 on a B scope having a scanning direction in the horizontal direction and a path direction in the vertical direction. Is obtained.
[0004]
Further, as the ultrasonic flaw detection method, a method different from the TOFD method as disclosed in Patent Document 1 or Patent Document 2 is known.
[0005]
Patent Document 1 discloses a plate wave ultrasonic flaw detection method and apparatus which does not require discrimination between an image caused by a defect and an image related to noise as a configuration for removing an image related to noise from a two-dimensional image obtained from a flaw detection signal. Is disclosed.
[0006]
Patent Document 2 discloses an automatic shroud inspection apparatus suitable for flaw detection of a shroud of a nuclear power plant, and enables automatic detection of defects.
[0007]
[Patent Document 1]
Japanese Patent Application Laid-Open No. 9-015217
[Patent Document 2]
JP-A-11-326580
[Problems to be solved by the invention]
In such a conventional technique, when an object having many defects is inspected by the TOFD method, all the arc patterns are manually detected and detected, and the measurement and recording are performed. For this reason, a lot of trouble is required for flaw detection, and there is a possibility that a problem such as a missed arc pattern due to a careless mistake or erroneous measurement may occur due to manual detection of an instruction.
[0010]
An object of the present invention is to provide an ultrasonic signal processing system, a method, a program, a storage medium, and an ultrasonic flaw detection apparatus that can easily and highly accurately perform flaw detection by the TOFD method.
[0011]
[Means for Solving the Problems]
In order to solve the above-described problems, the present invention provides an ultrasonic signal caused by a defect present in the subject by receiving an ultrasonic wave transmitted from a transmission probe arranged on the subject by a receiving probe. In the ultrasonic signal processing system for processing,
Image processing means for automatically detecting an arc pattern appearing on a B scope based on the ultrasonic signal;
Display means for instructing and displaying the presence of the defect based on the arc pattern detected by the image processing means.
[0012]
In order to solve the above-described problems, the present invention provides an ultrasonic signal caused by a defect present in the subject by receiving an ultrasonic wave transmitted from a transmission probe arranged on the subject by a receiving probe. In the ultrasonic signal processing method for processing,
An image processing step of automatically detecting an arc pattern appearing on a B scope based on the ultrasonic signal;
A display step of instructing and displaying the presence of the defect based on the arc pattern detected in the image processing step.
[0013]
In order to solve the above problems, the present invention
On the computer,
An image processing step of automatically detecting an arc pattern appearing on a B scope based on an ultrasonic signal obtained by ultrasonically scanning a subject by the TOFD method;
A display step of instructing and displaying the presence of a defect in the subject based on the arc pattern detected in the image processing step.
[0014]
In order to solve the above problems, the present invention
On the computer,
An image processing step of automatically detecting an arc pattern appearing on a B scope based on an ultrasonic signal obtained by ultrasonically scanning a subject by the TOFD method;
And a display step of instructing and displaying the presence of a defect in the subject based on the arc pattern detected in the image processing step.
[0015]
According to the ultrasonic signal processing system, the method, the program, and the storage medium of the present invention, the ultrasonic wave transmitted from the transmission probe arranged on the subject is received by the reception probe and is present in the subject. When processing an ultrasonic signal caused by a defect, an arc pattern appearing on a B scope is automatically detected based on the ultrasonic signal, and the existence of the defect is indicated and displayed based on the detected arc pattern. Flaw detection can be performed easily and with high accuracy.
[0016]
To solve the above problems, the ultrasonic flaw detector according to the present invention,
A transmitting probe arranged on the subject,
A receiving probe that is arranged at a distance from the transmitting probe in the subject and receives ultrasonic waves transmitted from the transmitting probe,
Transmission means for driving the transmission probe to transmit,
Receiving means for receiving and driving the receiving probe;
A signal processing means for performing B-scope display processing of the ultrasonic reception signal obtained from the receiving unit and automatically detecting an arc pattern on the B-scope obtained based on the processing; and a signal processing means based on the arc pattern detected by the signal processing means. Display means for indicating and displaying the presence of a defect existing in the subject.
[0017]
According to the ultrasonic flaw detector of the present invention, an ultrasonic signal transmitted from a transmission probe arranged on a subject is received by a receiving probe, and an ultrasonic signal caused by a defect present in the subject is received. At the time of processing, an arc pattern appearing on the B scope is automatically detected based on the ultrasonic signal, and the presence of the defect is indicated and displayed based on the detected arc pattern, so that the flaw detection by the TOFD method is easy and highly accurate. It is possible to do it.
[0018]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, an embodiment of an ultrasonic signal processing system according to the present invention will be described with reference to the drawings.
[0019]
As shown in FIG. 1, the system according to the present embodiment includes a transmission oblique probe 2, a receiving oblique probe 3, which implements the TOFD method, and a computer 6, which acquires and processes data from the flaw detector 5. The ultrasonic signal processing method according to the present invention is performed by executing the signal processing program 7 stored in the computer 6.
[0020]
For example, a transmission bevel probe 2 is disposed as a transmission probe on one surface side of the subject 1, and a reception bevel probe is disposed as a reception probe at a distance from the transmission bevel probe 2. 3 are arranged.
[0021]
The transmission oblique probe 2 is driven by a transmission unit provided in the flaw detector 5 to transmit ultrasonic waves to the subject 1. The reception oblique probe 3 is caused by an ultrasonic signal transmitted near the surface of the subject 1, an ultrasonic signal reflected on the bottom surface of the subject 1, and a defect 4 existing in the subject 1. A scattered wave signal using the defect as a reflection source is received at the same time, and the flaw detector 5 obtains a propagation time difference between these signals, thereby obtaining data (TOFD data) related to the B-scope display. The TOFD data indicates instruction information relating to the defect position and the defect instruction height, and an arc pattern corresponding to the defect 4 appears. In addition, the defect 4 referred to here refers to a thing which can be a sound source as viewed from a receiving probe by reflecting an ultrasonic wave. Specifically, the defect 4 is a discontinuous state such as a crack, poor fusion, inclusion inclusion, a pore, and a shape of welding. Is a typical example.
[0022]
The TOFD data is held in a data storage device (HDD) 8 via a computer 6 and is automatically recognized using image processing for automatic detection of an arc pattern by executing a signal processing program 7 stored in the computer 6 in advance. Processing and generation of information for indicating and displaying the presence of a defect based on the arc pattern detected by the image processing are performed and output to the monitor 9 and / or the printer 10.
[0023]
In the present invention, as shown in FIG. 2, TOFD data collection is performed in step S1, an arc pattern automatic recognition process is executed in step S2, a manual correction process is executed in step S3, and the monitor 9 and the monitor 9 are executed in step S4. And / or outputting the result to the printer 10.
[0024]
Next, the details of the ultrasonic signal processing according to the present invention will be described with reference to FIG. In step T1 corresponding to step S1 in FIG. 2, TOFD data is collected by the transmission bevel probe 2, the reception bevel probe 3, and the flaw detector 5, and the TOFD data is stored in the data storage device via the computer 6. (HDD) 8. Here, the TOFD data is two-dimensional data in which an arc pattern caused by the defect 4 appears on a B scope in which the scanning direction is the horizontal direction and the path direction is the vertical direction.
[0025]
Step S2 in FIG. 2 includes steps T2 to T8 in FIG. Step T2 applies, for example, an arc filter having a filter size of 60 pixels in the scanning direction and a path direction of 12 pixels to the TOFD data. The filter size is defined by the operation direction and the path direction, and the circular arc filter in the filter size is used. An arc pattern is automatically detected using an arc filter for distinguishing a region from another region. Here, the arc filter will be described with reference to FIG.
[0026]
In FIG. 4, the B scope of the TOFD data is considered as a two-dimensional image in which the horizontal direction corresponds to the scanning direction and the vertical direction corresponds to the path direction, and the echo height 1 (i, j) at the scanning position i and the path position j is defined as a pixel ( i, j).
[0027]
In order to extract an arc pattern, consider an arc-shaped region as shown with respect to a processing symmetric position (position of interest). This area is considered as a two-dimensional area indicated by a coordinate system (m, w) having a shift due to an arc inside the processing symmetric position as an origin. Here, m is the horizontal direction (scanning direction), and W is the vertical direction (road direction). The shift amount due to the arc will be described later.
[0028]
In the arc pattern, it is considered that the vertical standard deviation is larger than the horizontal standard deviation in this region. Therefore, the ratio of the standard deviation in the vertical and horizontal directions is used as the output of the arc S / N filter. In the arc pattern, since the peak in the path direction continues in an arc shape, a clear peak is also found in the average value of the horizontal echo height in the arc region. It appears to appear, which effectively acts to distinguish between the arc pattern and other patterns.
[0029]
In such identification, two feature values are defined using a difference value between the peak and the echo heights before and after the peak. These are the arc difference value feature amount and the arc difference value S / N feature amount.
[0030]
The definition formula is shown below. When the arc region in FIG. 4 protrudes from the original image, the output value of the processing target pixel is set to 0.
[0031]
(Equation 1)

[0032]
Further, the shift amount due to the arc will be described with reference to FIG.
The displacement due to the arc refers to the displacement in the path direction in accordance with the displacement in the scanning direction with respect to a specific signal source (sound source). In the example of FIG. 5, the displacement can be obtained as follows.
[0033]
(Equation 2)

[0034]
In addition, it is also possible to prepare a plurality of circular filters having different filter sizes and to identify the circular pattern based on the characteristic amounts of the plural circular filters.
[0035]
In step T3, the binarization processing is applied to the TOFD data to which the arc filter has been applied, and the processing described later is performed based on the binarized data. In binarization, for example, a threshold value of an average value + 2σ is set.
[0036]
Step T4 is to apply the expansion / contraction processing to the data in the path direction among the binarized data. By this processing, it becomes possible to extract an arc pattern continuously appearing in the path direction as one group.
[0037]
Step T5 is a labeling process for obtaining a connected component of the binarized data or the data subjected to the expansion / contraction processing.
[0038]
Step T6 is a feature value calculation process in which the above-described arc difference value feature value and the arc difference value S / N feature value are calculated.
[0039]
In step T7, when discriminating an arc pattern based on the above-described arc difference value feature amount, the arc difference value S / N feature amount, and the feature amount, linear discrimination is performed for weighting the feature amount and determining a threshold value. By using the analysis (canonical discriminant analysis), the combination of a plurality of feature amounts becomes more appropriate, and the identification rate is improved.
[0040]
Through the above steps, an identification result is obtained in step T8.
[0041]
Next, steps T9 and T10 in FIG. 3 are for manually correcting the identification result, and by operating a keyboard and a mouse (not shown) while viewing the identification result displayed on the monitor 9, the identification result is obtained. Further, correction is performed manually.
[0042]
Step T10 is to further manually correct the identification result.
[0043]
In step T11, a search is made for the maximum position of the arc S / N feature amount as a position considered to be the most instructed peak position from each area in the identification result.
[0044]
Step T12 is to measure the instruction information for each area with respect to the identification result, and the instruction information referred to here indicates an instruction scanning position, an instruction depth position, a depth direction, a length, and the like. For example, as shown in FIG. 6, it is also possible to obtain the instruction information by using the average value of the horizontal echo height.
[0045]
FIG. 7 shows a change in signal processing according to the present embodiment. FIG. 7A shows original data, that is, TOFD data before an arc filter is applied.
[0046]
FIG. 7B shows data after the arc filter is applied.
[0047]
FIG. 7C shows data after the binarization processing.
[0048]
FIG. 7D shows data after the expansion / contraction processing.
[0049]
According to the embodiment described above, the following operation and effect can be obtained. That is, in the present embodiment, since the arc pattern is automatically detected by the image processing and the instruction information is automatically measured based on the result, the number of manual operations can be reduced, the speed can be increased by computer processing, and the manual operation can be performed. An effect of reducing accompanying careless mistakes can be expected.
[0050]
Further, since an arc filter is used for automatically detecting the arc pattern in the image processing and binarization is performed using the filter image, the S / N of the arc pattern area as the instruction pattern is improved, and the instruction is more appropriately performed. The region can be binarized.
[0051]
Further, since the circular arc pattern is detected using the circular arc filter characteristic amount, the discrimination rate between the instruction and the noise is improved by using the characteristic amount that is more sensitive to the circular arc pattern.
[0052]
In addition, by appropriately using a plurality of arc filter feature amounts having different filter sizes, it is considered that if the filter size is different from those other than the designated region, the variation becomes larger, so that the discrimination rate between the designated and the noise is further improved. Become.
[0053]
Furthermore, by using linear discriminant analysis (canonical discriminant analysis) for weighting the feature amounts for identification and determining the threshold value, the combination of a plurality of feature amounts becomes more appropriate and the identification rate is improved.
[0054]
In addition, by providing a function of manually correcting the identification result, a means for automatically correcting the identification result is provided, so that a result with higher accuracy can be obtained.
[0055]
Furthermore, by using the average value of the horizontal echo heights for measurement of the instruction information, the influence of local noise is reduced by using the average value, and stable measurement of the instruction information can be performed.
[0056]
In the present invention, the identification result can be displayed in various forms. For example, the processing result may be superimposed on the original image.
[0057]
In addition, a position where the output of the arc filter exceeds the threshold value and the label identified as the arc pattern and the position where the value of the arc difference value S / N feature amount is the largest among the labels recognized as the arc pattern are determined. The marked one (for example, indicated by a square and the size is proportional to the magnitude of the feature value) and the label whose output from the circular filter exceeds the threshold value and is identified as not a circular pattern are colored. By displaying them separately, the area identified as the center of the circular arc pattern, the position where the value of the circular arc difference value S / N feature amount is largest among the labels recognized as the circular arc pattern, and the position other than the circular arc, That is, it is possible to clearly determine a region identified as noise.
[0058]
In the above-described embodiment, the computer 6 can be configured as one or more computers or a part of functions of these computers, in addition to being configured as hardware such as a single computer. Further, the method in which the present invention is implemented may be configured as a program to be executed by a computer, and a storage medium storing the program may be applied to the computer, and the program may be executed by the computer. good. Further, the TOFD data in the system shown in FIG. 1 can be processed online or offline by the system, method, etc. of the present invention.
[0059]
FIG. 8 shows an example in which one ultrasonic flaw detector is constituted by a flaw detector and a computer for signal processing, etc., and a transmission probe 2 arranged on the subject 1 and a transmission probe transmitted to the subject 1. The receiving probe 3 is disposed at a distance from the probe 2 and receives the ultrasonic wave transmitted from the transmitting probe 2, a flaw detector main body 11, a monitor 12, and a printer 13. .
[0060]
The flaw detector main body 11 includes a transmitting unit 11A that drives the transmitting probe 2 to transmit, a receiving unit 11B that drives the receiving probe 3 to receive, and a B scope display process of the ultrasonic reception signal obtained from the receiving unit 11B. A signal processing unit 11C in which a signal processing program 11D is stored and executable as signal processing means for automatically detecting an arc pattern on a B scope obtained based on the processing, a data storage unit (HDD) 11E, a system controller 11F, it is possible to acquire TOFD data in real time or non-real time and perform the same processing as the configuration shown in FIG.
[0061]
【The invention's effect】
As described above, according to the present invention, an ultrasonic signal transmitted from a transmission probe disposed on a subject is received by a reception probe to process an ultrasonic signal caused by a defect existing in the subject. In doing so, the arc pattern appearing on the B scope is automatically detected based on the ultrasonic signal, and the presence of the defect is indicated and displayed based on the detected arc pattern, so that the flaw detection by the TOFD method can be performed easily and with high accuracy. It is possible to provide an ultrasonic signal processing system, a method, a program, a storage medium, and an ultrasonic inspection device that can be performed.
[Brief description of the drawings]
FIG. 1 is a diagram showing a configuration of an embodiment of an ultrasonic signal processing system according to the present invention.
FIG. 2 is a flowchart schematically showing an example of an ultrasonic signal processing method in the system.
FIG. 3 is a flowchart showing details of the method.
FIG. 4 is a diagram illustrating an arc filter according to the present invention.
FIG. 5 is a diagram illustrating an arc deviation amount according to the present invention.
FIG. 6 is a diagram showing an example of a method for measuring instruction information.
FIG. 7 is a diagram showing a change in image processing by ultrasonic signal processing according to the present invention.
FIG. 8 is a diagram showing an example of an ultrasonic flaw detector according to the present invention.
FIG. 9 is a diagram illustrating a flaw detection method by the TOFD method.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 ... Subject, 2 ... transmission angle probe, 3 ... reception angle probe, 4 ... defect, 5 ... flaw detector, 6 ... computer, 7 ... signal processing program, 8 ... data storage device (HDD) , 9 monitor, 10 printer, 11 ultrasonic flaw detector, 11A transmitter, 11B receiver, 11C signal processor, 11D signal processing program, 11E data storage device (HDD), 11F system Controller, 12 monitor, 13 printer.

Claims (12)

In an ultrasonic signal processing system that processes an ultrasonic signal caused by a defect present in the object by receiving an ultrasonic wave transmitted from a transmission probe arranged on the object by a reception probe,
Image processing means for automatically detecting an arc pattern appearing on a B scope based on the ultrasonic signal;
Display means for instructing and displaying the presence of the defect based on the arc pattern detected by the image processing means. An ultrasonic signal processing method for processing an ultrasonic signal caused by a defect present in the object by receiving an ultrasonic wave transmitted from a transmission probe arranged on the object by a reception probe,
An image processing step of automatically detecting an arc pattern appearing on a B scope based on the ultrasonic signal;
A display step of instructing and displaying the presence of the defect based on the arc pattern detected in the image processing step. The image processing step includes a step of automatically detecting the arc pattern using an arc filter in which a filter size is defined by an operation direction and a path direction, and an arc area and another area in the filter size are identified. The ultrasonic signal processing method according to claim 2, wherein: 4. The ultrasonic signal processing method according to claim 3, wherein the arc filter identifies the arc region and the other region based on a predetermined feature amount. 5. The ultrasonic wave according to claim 4, wherein the image processing step prepares a plurality of circular filters having different filter sizes, and identifies the circular pattern based on a characteristic amount of the plural circular filters. Signal processing method. The ultrasonic signal processing method according to any one of claims 1 to 5, wherein a linear discriminant method is used to identify the arc pattern based on a characteristic amount of the arc filter. 7. The ultrasonic signal processing method according to claim 1, wherein after the arc pattern is identified based on a characteristic amount of the arc filter, the identification result is further manually corrected. The ultrasonic signal processing method according to any one of claims 1 to 7, wherein the displaying step indicates and displays the presence of the defect using an average value of horizontal echo heights. On the computer,
An image processing step of automatically detecting an arc pattern appearing on a B scope based on an ultrasonic signal obtained by ultrasonically scanning a subject by the TOFD method;
A display step of instructing and displaying the presence of a defect in the subject based on the arc pattern detected in the image processing step. On the computer,
An image processing step of automatically detecting an arc pattern appearing on a B scope based on an ultrasonic signal obtained by ultrasonically scanning a subject by the TOFD method;
A display step of instructing and displaying the presence of a defect in the subject based on the arc pattern detected in the image processing step. A transmitting probe arranged on the subject,
A receiving probe that is arranged at a distance from the transmitting probe in the subject and receives ultrasonic waves transmitted from the transmitting probe,
Transmission means for driving the transmission probe to transmit,
Receiving means for receiving and driving the receiving probe;
Signal processing means for performing B-scope display processing on the ultrasonic reception signal obtained from the receiving unit and automatically detecting an arc pattern on the B-scope obtained based on the processing;
Display means for indicating and displaying the presence of a defect present in the subject based on the arc pattern detected by the signal processing means. The ultrasonic processing apparatus according to claim 11, wherein the signal processing unit includes a storage unit that stores the ultrasonic reception signal, and retrieves the ultrasonic reception signal from the storage unit when the arc pattern is automatically detected. Sonic flaw detector.

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