JP2004191363A - 画像計測方法、およびその画像計測装置 - Google Patents

画像計測方法、およびその画像計測装置 Download PDF

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Publication number
JP2004191363A
JP2004191363A JP2003380915A JP2003380915A JP2004191363A JP 2004191363 A JP2004191363 A JP 2004191363A JP 2003380915 A JP2003380915 A JP 2003380915A JP 2003380915 A JP2003380915 A JP 2003380915A JP 2004191363 A JP2004191363 A JP 2004191363A
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Japan
Prior art keywords
image
measured
electromagnetic wave
hollow portion
measurement
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Pending
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JP2003380915A
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English (en)
Japanese (ja)
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JP2004191363A5 (https=
Inventor
Masao Nagamoto
正雄 長本
Motozo Sakoda
素三 佐古田
Takaharu Yanada
隆春 梁田
Toshiyuki Shimizu
敏行 清水
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Panasonic Holdings Corp
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Matsushita Electric Industrial Co Ltd
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Priority to JP2003380915A priority Critical patent/JP2004191363A/ja
Publication of JP2004191363A publication Critical patent/JP2004191363A/ja
Publication of JP2004191363A5 publication Critical patent/JP2004191363A5/ja
Pending legal-status Critical Current

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  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Projection Apparatus (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
JP2003380915A 2002-11-26 2003-11-11 画像計測方法、およびその画像計測装置 Pending JP2004191363A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003380915A JP2004191363A (ja) 2002-11-26 2003-11-11 画像計測方法、およびその画像計測装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002342018 2002-11-26
JP2003380915A JP2004191363A (ja) 2002-11-26 2003-11-11 画像計測方法、およびその画像計測装置

Publications (2)

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JP2004191363A true JP2004191363A (ja) 2004-07-08
JP2004191363A5 JP2004191363A5 (https=) 2008-11-27

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ID=32774771

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JP2003380915A Pending JP2004191363A (ja) 2002-11-26 2003-11-11 画像計測方法、およびその画像計測装置

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