JP2004170109A - Apparatus and method for inspecting irregular color - Google Patents

Apparatus and method for inspecting irregular color Download PDF

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Publication number
JP2004170109A
JP2004170109A JP2002333385A JP2002333385A JP2004170109A JP 2004170109 A JP2004170109 A JP 2004170109A JP 2002333385 A JP2002333385 A JP 2002333385A JP 2002333385 A JP2002333385 A JP 2002333385A JP 2004170109 A JP2004170109 A JP 2004170109A
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Japan
Prior art keywords
color
combined
pixels
side length
ratio
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JP2002333385A
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Japanese (ja)
Inventor
Kotaro Kobayashi
弘太郎 小林
Seiji Hamano
誠司 濱野
Koichi Wakitani
康一 脇谷
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Panasonic Holdings Corp
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Matsushita Electric Industrial Co Ltd
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Priority to JP2002333385A priority Critical patent/JP2004170109A/en
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Abstract

<P>PROBLEM TO BE SOLVED: To solve the problem that it is difficult to carry out a color irregularity inspection close to the inspection by humen becaus even an irregular color of which area of the irregular color is small to the extent that it is not recognized by human vision or to the extent that it does not affect the human vision in the conventional method is judged to be non-conforming even if it may not be judged as non-conforming by humen. <P>SOLUTION: An irregular color pixel is detected from an image, which is the image of an inspection target 1, and combined and a judgment is made according to the area of the combined irregular color section, thus achieving a judgment close to that of a human for preventing a non-conforming article when the area of the irregular color is small. Additionally, a circumscribing rectangle being circumscribed to the combined irregular color section is provided, and the irregular color is distinguished from defects by considering the shape and area of the irregular color by at least one evaluation value of the number of pixels in the subscribing rectangle, the longer side length, the shorter side length, the ratio of the longer side length to the shorter side length, the total of each combined pixel value, the ratio of the total of each combined pixel value to the number of combined pixels, and the ratio of the number of combined pixels to the number of pixels of the subscribing rectangle. <P>COPYRIGHT: (C)2004,JPO

Description

【0001】
【発明の属する技術分野】
本発明は、PDP、液晶パネル、CRT、有機EL、無機ELなどのカラーディスプレイデバイスにおける色むらを検査する色むら検査装置および検査方法に関するものである。
【0002】
【従来の技術】
従来のカラーディスプレイデバイスの色むら検査方法について、図4に示すフローチャートを用いて説明する。
【0003】
まず、カラーディスプレイデバイスの画面の発光状態を各画素毎にカメラで撮像し、画像処理装置に入力する(S1)。
【0004】
次に、撮像系であるカメラには、レンズの屈折むら、色フィルタの膜厚のむら、カラー固体撮像装置を構成する受光素子間の感度のばらつき等、カメラ自体に感度のばらつきがあり、均一な単色画面を撮像しても、カメラの感度に起因して、色むら、感度むらに相当するばらつきが発生するため、画像入力(S1)にて入力したデータについて、撮像系の各画素毎に生じる受光量の差を補正する(S2)。
【0005】
次に、受光量補正処理(S2)において補正したR、G、Bの光量値を、表色系に変換する色度変換を行う(S3)。
【0006】
次に、画質評価をおこなうための評価値を算出する(S4)。具体的には、カラーディスプレイデバイスの画面中央と画面上の任意の点との色度差、明度差を算出し、総和を評価値として算出する。または、カラーディスプレイデバイスの撮像面を検査領域に分割し、各検査領域内の全画素どうしについて色度差、明度差を算出し、差の大きさが最大となる色度差、明度差の大きさを、各検査領域内での評価値として算出する。
【0007】
次に、評価値算出処理(S4)において算出された評価値に基づいて、カラーディスプレイデバイスの最終判定を行う(S5)。最終判定(S5)は、一つの評価値で行うことも可能であるが、判定精度を向上させるため、複数の評価値を組み合わせて行うことが望ましい(例えば、特許文献1参照。)。
【0008】
【特許文献1】
特開平10−260109号公報
【0009】
【発明が解決しようとする課題】
上記に示したような従来の方法では、カラーディスプレイデバイス上のセルが点灯しないような欠陥が存在する場合に、欠陥部分の色度あるいは色相が通常部分と比較して大きく異るため、欠陥が色むらとして検出されていた。
【0010】
さらに、色むらの面積が人の視覚で認識されない程度または人の視覚に影響を及ぼさない程度に小さい場合には、良品として採用する場合があるが、従来の方法では、不良品として判定してしまい、人に近い判定が困難であった。
【0011】
したがって、カラーディスプレイデバイスの良品率が低下し、生産性が低下してしまっていた。
【0012】
【課題を解決するための手段】
上記課題を解決するために本発明は、検査対象物を撮像し、前記撮像した画像から色むら画素を検出し、色むら判定を行う色むら検査方法において、前記検出した色むら画素を結合し、前記結合した色むら部分の面積により色むら判定を行うことにより、色むらの面積が人の視覚で認識されない程度または人の視覚に影響を及ぼさない程度に小さい場合には、不良品とせず良品とするような人に近い判定が可能となる。
【0013】
また、結合した色むら部分に外接する外接矩形を設け、前記外接矩形の画素数、長辺長、短辺長、長辺長と短辺長との比、結合された各画素値の総和、結合された各画素値の総和と結合された画素数との比、結合された画素数と前記外接矩形の画素数との比の少なくとも1つの評価値により色むらと欠陥の弁別を行うことにより、色むらの形状や面積を考慮した判定を行うことが可能となる。
【0014】
【発明の実施の形態】
本発明の一実施の形態について、図1から図3を用いて説明する。
【0015】
図1は本発明の一実施の形態における色むら検査装置の概略構成図である。1は検査対象物であり、検査対象物1はPDP、液晶パネル、CRT、有機EL、無機ELなどのカラーディスプレイデバイスである。2は検査対象物1を点灯させるための点灯装置であり、検査対象物1に点灯装置2を接続し検査対象物1を点灯状態にする。3は検査対象物1を撮像する撮像手段、4は検査対象物1と撮像手段3の間に位置するバンドパスフィルタ、5は撮像手段3に取り付けて色むら部分と正常部分の境界を明確にするための結合レンズ、6は撮像手段3により得られた画像データを処理する画像処理装置、7は画像処理装置6内に配置された記憶部、8は画像処理装置6により処理された検査結果を表示するための表示装置である。
【0016】
検査対象物1の面積に対し撮像手段3の撮像可能範囲が狭い場合は、検査対象物1または撮像手段3を移動させて撮像する必要がある。また、バンドパスフィルタ4は撮像手段3がR、G、Bに分光できない場合に必要であり、フィルタを交換して複数回撮像する必要がある。
【0017】
撮像手段3によって得られた画像データを画像処理装置6に転送し、画像処理装置6内の記憶部7にそれぞれR、G、Bの光量値をデジタルデータとして記憶させる。記憶させたデータを記憶部7にあらかじめ記憶されている画像処理プログラムによって処理し、色むらを検出する。画像処理プログラムについては後述する。画像処理プログラムにより処理した結果、色むらと判定された色むら部分の座標と結合された画素数、結合された色むら部分に外接する外接矩形の画素数、長辺長、短辺長、長辺長と短辺長との比、結合された各画素値の総和、結合された各画素値の総和と結合された画素数との比、結合された画素数と外接矩形の画素数との比という評価値の少なくとも1つを記憶部7に保存する。
【0018】
また、検査対象物1を複数回に分割して撮像する場合や検査対象物1または撮像手段3を移動させて撮像する場合は、各部分の撮像位置を記憶部7に保存する。記憶部7に保存された検査結果は、必要に応じて表示装置8に表示させる。
【0019】
次に、画像処理プログラムを図2に示すフローチャートを用いて説明する。
【0020】
まず、検査対象物1を撮像し、撮像した画像データを画像処理装置6に入力する(S11)。
【0021】
次に、画像処理装置6に入力された画像データについて、撮像系の特性、例えばレンズの色収差や撮像手段3の位置により生じるR、G、Bの受光量の差を補正する(S12)。これはR、G、Bの各色について検査対象物1上の同一点を撮像手段3の各部分で撮像し、撮像手段3の中央を1とした場合の比をあらかじめ求め、求めた比を補正係数として各画素の光量値に乗算することにより求めることができる。ここで、隣接する複数画素を1ブロックとして大きさを決定し、簡易的に補正を行ってもよい。
【0022】
次に、受光量補正処理(S12)により補正されたR、G、Bの光量値を演算し、演算結果より色の評価値を算出する(S13)。例えば、色を表すものとして、CIEの規定する(X,Y,Z)、(x,y,Y)、(L*,u*,v*)の表色系がよく知られている。ここでは厳密にこれらの表色系に適合させる必要はなく、簡易かつ色むらの検出に有効な演算により色相、色度に相当するものを検出すればよく、例えば、ある基準軸を設定し、Rの光量を基準軸上、Gの光量を基準軸に対し+120degの方向、Bの光量を−120degの方向で光量に比例した長さのベクトルを持たせ、全てのベクトルを総和したベクトルの基準軸に対する角度を色相データとすればよい。このときR、G、Bの単位ベクトル長は色毎に異なっていてもよい。これは、撮像手段3の分光特性や検査対象物1の求められる色むらの表示品質により異なるためであり、実際には各色についての色むらに対して限度見本パネルを用いて決定するのが望ましい。
【0023】
色評価値算出処理(S13)によって算出された各画素の色評価値と、基準とする色評価値との差を算出する(S14)。基準となる色評価値とは、設計値あるいは良品パネルを用いて測定した色評価値を固定値として用いる方法がある。また、パネルにより全体の色評価値が偏っていても局部的な色むらがなければよいという場合には、色評価値算出処理(S13)によって算出された各画素の色評価値の平均値あるいは中間値あるいは最頻値を用いればよい。ここで、色評価値として色相を用いた場合の色相の差とは、その角度の差であり、色度を用いた場合であれば2次元情報であるため、2次元データ間の距離をその差とする。
【0024】
色評価値差算出処理(S14)によって算出された色評価値差が、第一のしきい値以上の画素を色むら候補として検出する(S15)。第一のしきい値を決定する際には、良品パネルの許容範囲、限度見本パネルでの色評価値の差を考慮して決定することが望ましい。
【0025】
色むら候補検出処理(S15)によって検出された色むら候補の画素がある一定距離以内にある場合に同一の色むらとして結合する(S16)。
【0026】
色むら候補結合処理(S16)によって結合された画素数が、第二のしきい値以上の場合に色むらと粗判定する(S17)。例えば、図3において、第二のしきい値を5とすると、図3(a)は色むらと判定されず、図3(b)から図3(d)は色むらとして判定される。ここで、第二のしきい値を便宜上5としたが、第二のしきい値を決定する際には、良品パネルの許容範囲を考慮して決定することが望ましく、この値に限るものではない。
【0027】
色むら粗判定処理(S17)によって色むらと粗判定された部分に外接する外接矩形を設け、外接矩形の画素数、長辺長、短辺長、長辺長と短辺長との比、結合された各画素値の総和、結合された各画素値の総和と結合された画素数との比、結合された画素数と外接矩形の画素数との比という評価値を算出する(S18)。例えば、色むら粗判定処理(S17)によって図3(b)から図3(d)の色むらと判定された部分に外接する外接矩形10b、10c、10dを設けると、図3(b)における長辺長と短辺長との比は4/4、結合された画素数と外接矩形の画素数との比は16/16、図3(c)における長辺長と短辺長との比は6/1、結合された画素数と外接矩形の画素数との比は6/6、図3(d)における長辺長と短辺長との比は6/4、結合された画素数と外接矩形の画素数との比は9/24となる。ここで、各比の計算を長辺長/短辺長、結合された画素数/外接矩形の画素数としたが、この計算方法に限るものではない。
【0028】
評価値算出処理(S18)によって算出された評価値の少なくとも1つにより色むらと欠陥の弁別を行い最終判定を行う(S19)。例えば、色むらと欠陥を弁別する判定基準を、長辺長と短辺長との比が0.5以上でかつ1.5以下、結合された画素数と外接矩形の画素数との比が0.5以上でかつ1.5以下とすると、図3(b)は長辺長と短辺長との比は1であり、結合された画素数と外接矩形の画素数との比も1であるため色むらと判定される。図3(c)は長辺長と短辺長との比が6であるため欠陥と判定され、図3(d)は長辺長と短辺長との比は1.5であるが、結合された画素数と外接矩形の画素数との比が0.375であるため欠陥と判定される。ここで、判定基準を0.5以上でかつ1.5以下としたが、判定基準を決定する際には、良品パネルの許容範囲を考慮して決定することが望ましく、この値に限るものではない。
【0029】
また、ここでは、評価値を長辺長と短辺長との比と結合された画素数と外接矩形の画素数との比として最終判定を行っているが、評価値を外接矩形の画素数とし外接矩形の画素数がある一定値以下であれば欠陥とする判定としたり、評価値を長辺長や短辺長とし長辺長や短辺長がある一定値以下であれば欠陥とする判定としたり、評価値を結合された各画素値の総和とし結合された各画素値の総和がある一定範囲のものを色むらとし範囲外のものを欠陥とする判定としたり、評価値を結合された各画素値の総和と結合された画素数との比とし結合された各画素値の総和と結合された画素数との比がある一定範囲のものを色むらとし範囲外のものを欠陥とする判定としたりしてもよい。
【0030】
以上の処理を行うことにより、検査対象物1の表示画面における色むらの検査を行う。
【0031】
以上のように本発明の一実施の形態によれば、検査対象物1の色むらを結合し、色むら部分として検査するため、色むらの面積が人の視覚で認識されない程度または人の視覚に影響を及ぼさない程度に小さい場合には、不良品とせず良品とすることが可能となり、人に近い判定が可能となる。
【0032】
さらに、色むらの形状や面積を考慮して色むらと欠陥の弁別を行うことが可能となる。
【0033】
【発明の効果】
以上のように本発明によれば、カラーディスプレイデバイスの色むらを、色相、色度に代表される色評価値を考慮して検出し、検出された色むらを結合し、色むら部分として検査するため、色むらの面積が人の視覚で認識されない程度または人の視覚に影響を及ぼさない程度に小さい場合には、不良品とせず良品とすることが可能となり、人に近い判定が可能となる。
【0034】
また、色むら部分の形状や面積を求めることにより、色むらと欠陥の弁別が可能となり、求められた位置や評価値から検査員による再判定が容易となり、さらに、前工程で発生した不良原因を推定し、生産効率を向上させることが可能となる。
【図面の簡単な説明】
【図1】本発明の実施の形態における色むら検査装置の概略構成図
【図2】本発明の実施の形態における画像処理プログラムのフローチャート
【図3】色むらパターンの概略図
【図4】従来の画像処理プログラムのフローチャート
【符号の説明】
1 検査対象物
2 点灯装置
3 撮像手段
4 バンドパスフィルタ
5 結合レンズ
6 画像処理装置
7 記憶部
8 表示装置
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a color non-uniformity inspection apparatus and method for inspecting color non-uniformity in a color display device such as a PDP, a liquid crystal panel, a CRT, an organic EL, and an inorganic EL.
[0002]
[Prior art]
A conventional color unevenness inspection method for a color display device will be described with reference to a flowchart shown in FIG.
[0003]
First, the light emission state of the screen of the color display device is imaged by a camera for each pixel and input to the image processing device (S1).
[0004]
Next, the camera which is an imaging system has variations in sensitivity of the camera itself, such as uneven refraction of a lens, unevenness of the thickness of a color filter, and variation in sensitivity between light receiving elements constituting a color solid-state imaging device. Even if a single-color screen is imaged, variations corresponding to color unevenness and sensitivity unevenness occur due to the sensitivity of the camera. Therefore, data input in the image input (S1) occurs for each pixel of the image capturing system. The difference in the amount of received light is corrected (S2).
[0005]
Next, chromaticity conversion for converting the R, G, and B light amount values corrected in the received light amount correction process (S2) into a color system is performed (S3).
[0006]
Next, an evaluation value for performing image quality evaluation is calculated (S4). Specifically, a chromaticity difference and a lightness difference between the center of the screen of the color display device and an arbitrary point on the screen are calculated, and the sum is calculated as an evaluation value. Alternatively, the imaging surface of the color display device is divided into inspection areas, and the chromaticity difference and lightness difference are calculated for all pixels in each inspection area, and the chromaticity difference and the magnitude of the lightness difference with the largest difference are calculated. Is calculated as an evaluation value in each inspection area.
[0007]
Next, based on the evaluation value calculated in the evaluation value calculation process (S4), the final determination of the color display device is performed (S5). The final judgment (S5) can be made with one evaluation value, but it is desirable to make a combination of a plurality of evaluation values in order to improve the judgment accuracy (for example, see Patent Document 1).
[0008]
[Patent Document 1]
JP-A-10-260109
[Problems to be solved by the invention]
In the conventional method as described above, when there is a defect that does not turn on the cell on the color display device, the chromaticity or hue of the defective portion is significantly different from that of the normal portion, so that the defect is It was detected as uneven color.
[0010]
Furthermore, when the area of the color unevenness is small enough not to be perceived by human vision or small enough not to affect human vision, it may be adopted as a non-defective product. As a result, it was difficult to make a judgment close to a person.
[0011]
Therefore, the non-defective rate of the color display device has decreased, and the productivity has decreased.
[0012]
[Means for Solving the Problems]
In order to solve the above problems, the present invention captures an inspection object, detects color unevenness pixels from the captured image, and in a color unevenness inspection method of performing color unevenness determination, combining the detected color unevenness pixels. By performing the color nonuniformity determination based on the area of the combined color non-uniformity portion, if the color non-uniformity area is small enough not to be recognized by human vision or not to affect human vision, it is not regarded as defective. It is possible to make a determination close to a person who is considered a good product.
[0013]
Further, a circumscribed rectangle circumscribing the combined color shading portion is provided, the number of pixels of the circumscribed rectangle, a long side length, a short side length, a ratio of the long side length to the short side length, a sum of the combined pixel values, By discriminating color unevenness and defects by at least one evaluation value of the ratio of the sum of the combined pixel values to the number of pixels combined and the ratio of the number of pixels combined to the number of pixels of the circumscribed rectangle. It is possible to make a determination in consideration of the shape and area of the color unevenness.
[0014]
BEST MODE FOR CARRYING OUT THE INVENTION
An embodiment of the present invention will be described with reference to FIGS.
[0015]
FIG. 1 is a schematic configuration diagram of a color shading inspection apparatus according to an embodiment of the present invention. Reference numeral 1 denotes an inspection target, and the inspection target 1 is a color display device such as a PDP, a liquid crystal panel, a CRT, an organic EL, and an inorganic EL. Reference numeral 2 denotes a lighting device for lighting the inspection object 1, and connects the lighting device 2 to the inspection object 1 to turn the inspection object 1 on. Reference numeral 3 denotes an imaging unit for imaging the inspection target 1, 4 denotes a band-pass filter located between the inspection target 1 and the imaging unit 3, and 5 denotes an image pickup unit 3 attached to the imaging unit 3 to clearly define a boundary between the uneven color portion and the normal portion. 6 is an image processing device for processing image data obtained by the imaging means 3, 7 is a storage unit disposed in the image processing device 6, and 8 is an inspection result processed by the image processing device 6. Is a display device for displaying.
[0016]
When the imaging range of the imaging unit 3 is narrower than the area of the inspection target 1, it is necessary to move the inspection target 1 or the imaging unit 3 to perform imaging. The bandpass filter 4 is necessary when the imaging unit 3 cannot separate the light into R, G, and B light.
[0017]
The image data obtained by the imaging means 3 is transferred to the image processing device 6, and the storage units 7 in the image processing device 6 store the R, G, and B light intensity values as digital data. The stored data is processed by an image processing program stored in the storage unit 7 in advance, and color unevenness is detected. The image processing program will be described later. As a result of processing by the image processing program, the number of pixels combined with the coordinates of the color shading portion determined to be color shading, the number of pixels of a circumscribed rectangle circumscribing the combined color shading portion, the long side length, the short side length, and the length The ratio of the side length to the short side length, the sum of the combined pixel values, the ratio of the sum of the combined pixel values to the number of combined pixels, and the ratio of the number of combined pixels to the number of pixels of the circumscribed rectangle At least one of the evaluation values of the ratio is stored in the storage unit 7.
[0018]
In the case where the inspection target 1 is imaged in a plurality of times or when the inspection target 1 or the imaging unit 3 is moved and imaged, the imaging position of each part is stored in the storage unit 7. The inspection results stored in the storage unit 7 are displayed on the display device 8 as necessary.
[0019]
Next, the image processing program will be described with reference to the flowchart shown in FIG.
[0020]
First, the inspection object 1 is imaged, and the imaged image data is input to the image processing device 6 (S11).
[0021]
Next, with respect to the image data input to the image processing device 6, the difference of the light receiving amounts of R, G, and B caused by the characteristics of the imaging system, for example, the chromatic aberration of the lens and the position of the imaging unit 3, is corrected (S12). This means that the same point on the inspection object 1 for each of the colors R, G, and B is imaged by each part of the imaging means 3, and the ratio when the center of the imaging means 3 is set to 1 is obtained in advance, and the obtained ratio is corrected. It can be obtained by multiplying the light amount value of each pixel as a coefficient. Here, the size may be determined by using a plurality of adjacent pixels as one block, and the correction may be simply performed.
[0022]
Next, the R, G, and B light amount values corrected by the received light amount correction process (S12) are calculated, and a color evaluation value is calculated from the calculation result (S13). For example, color systems of (X, Y, Z), (x, y, Y), and (L *, u *, v *) specified by the CIE are well known as representing colors. Here, it is not necessary to strictly conform to these color systems, and it is sufficient to detect hue and chromaticity equivalents by simple and effective calculation for detecting color unevenness, for example, by setting a certain reference axis, The light amount of R is on the reference axis, the light amount of G is in the direction of +120 deg with respect to the reference axis, and the light amount of B is in the direction of -120 deg with a vector proportional to the light amount. The angle with respect to the axis may be used as the hue data. At this time, the unit vector lengths of R, G, and B may be different for each color. This is because it differs depending on the spectral characteristics of the imaging means 3 and the display quality of the required color unevenness of the inspection object 1. In practice, it is desirable to determine the color unevenness of each color using the limit sample panel. .
[0023]
The difference between the color evaluation value of each pixel calculated by the color evaluation value calculation process (S13) and the reference color evaluation value is calculated (S14). As a reference color evaluation value, there is a method of using a design value or a color evaluation value measured using a non-defective panel as a fixed value. If it is sufficient that there is no local color unevenness even if the entire color evaluation value is biased depending on the panel, the average value of the color evaluation values of the pixels calculated by the color evaluation value calculation processing (S13) or An intermediate value or a mode value may be used. Here, the hue difference when the hue is used as the color evaluation value is a difference between the angles, and when the chromaticity is used, the hue difference is two-dimensional information. The difference.
[0024]
Pixels whose color evaluation value difference calculated by the color evaluation value difference calculation process (S14) is equal to or greater than a first threshold are detected as color unevenness candidates (S15). When determining the first threshold value, it is desirable to determine the first threshold value in consideration of the difference between the allowable range of the non-defective panel and the color evaluation value of the limit sample panel.
[0025]
When the pixels of the color shading candidate detected by the color shading candidate detection process (S15) are within a certain distance, they are combined as the same color shading (S16).
[0026]
If the number of pixels combined by the color unevenness candidate combining process (S16) is equal to or larger than the second threshold value, it is roughly determined that the color is uneven (S17). For example, assuming that the second threshold value is 5 in FIG. 3, FIG. 3A is not determined to be color unevenness, and FIGS. 3B to 3D are determined to be color unevenness. Here, the second threshold value is set to 5 for the sake of convenience. However, when determining the second threshold value, it is desirable to determine the second threshold value in consideration of the allowable range of the non-defective panel. Absent.
[0027]
A circumscribed rectangle circumscribing a portion that has been roughly determined to be color unevenness by the color unevenness rough determination process (S17) is provided, and the number of pixels of the circumscribed rectangle, a long side length, a short side length, a ratio of the long side length to the short side length, An evaluation value is calculated as the sum of the combined pixel values, the ratio of the sum of the combined pixel values to the number of pixels combined, and the ratio of the number of combined pixels to the number of pixels of the circumscribed rectangle (S18). . For example, if the circumscribed rectangles 10b, 10c, and 10d circumscribing the portions determined to have the color unevenness in FIGS. 3B to 3D by the color unevenness rough determination process (S17), as shown in FIG. The ratio of the long side length to the short side length is 4/4, the ratio of the number of combined pixels to the number of pixels of the circumscribed rectangle is 16/16, and the ratio of the long side length to the short side length in FIG. Is 6/1, the ratio of the number of combined pixels to the number of pixels of the circumscribed rectangle is 6/6, the ratio of the long side length to the short side length in FIG. 3D is 6/4, and the number of combined pixels Is 9/24. Here, the calculation of each ratio is defined as the long side length / short side length, the number of combined pixels / the number of pixels of the circumscribed rectangle, but the present invention is not limited to this calculation method.
[0028]
Color unevenness and defects are discriminated by at least one of the evaluation values calculated by the evaluation value calculation process (S18), and a final determination is made (S19). For example, a criterion for discriminating between color unevenness and a defect is that the ratio between the long side length and the short side length is 0.5 or more and 1.5 or less, and the ratio between the number of combined pixels and the number of pixels of the circumscribed rectangle is determined. 3B, the ratio between the long side length and the short side length is 1, and the ratio between the number of pixels combined and the number of pixels of the circumscribed rectangle is also 1 in FIG. Therefore, it is determined that the color is uneven. In FIG. 3C, the ratio between the long side length and the short side length is 6, and the defect is determined. In FIG. 3D, the ratio between the long side length and the short side length is 1.5. Since the ratio between the number of pixels combined and the number of pixels of the circumscribed rectangle is 0.375, it is determined to be a defect. Here, the criterion is 0.5 or more and 1.5 or less. However, when determining the criterion, it is preferable that the criterion be determined in consideration of the allowable range of the non-defective panel. Absent.
[0029]
In this case, the evaluation value is determined as the ratio of the number of pixels combined with the ratio of the long side length to the short side length and the number of pixels of the circumscribed rectangle. If the number of pixels of the circumscribed rectangle is equal to or less than a certain value, it is determined to be a defect. If the evaluation value is a long side length or a short side length, and the long side length or the short side length is equal to or less than a certain value, it is determined to be a defect. Judgment, the evaluation value is the sum of the combined pixel values, and the sum of the combined pixel values is determined to be color unevenness in a certain range and defective in the out of range. The ratio of the sum of the combined pixel values to the number of pixels combined is the ratio of the sum of the combined pixel values to the number of combined pixels. May be determined.
[0030]
By performing the above processing, the color unevenness on the display screen of the inspection object 1 is inspected.
[0031]
As described above, according to the embodiment of the present invention, since the color unevenness of the inspection object 1 is combined and inspected as the color unevenness part, the area of the color unevenness is not recognized by the human eye or the human visual perception. If the size is small enough not to affect the quality, it is possible to determine a good product without a defective product, and it is possible to make a determination close to a person.
[0032]
Furthermore, it is possible to discriminate between color unevenness and defects in consideration of the shape and area of the color unevenness.
[0033]
【The invention's effect】
As described above, according to the present invention, color unevenness of a color display device is detected in consideration of a color evaluation value represented by hue and chromaticity, and the detected color unevenness is combined and inspected as a color unevenness portion. Therefore, if the area of the color unevenness is small enough not to be perceived by human vision or not to affect human vision, it is possible to make it a good product without a defective product, and it is possible to make a judgment close to a human Become.
[0034]
In addition, by obtaining the shape and area of the color unevenness portion, it is possible to distinguish the color unevenness from the defect, it is easy for the inspector to re-determine from the obtained position and evaluation value, and furthermore, the cause of the defect that occurred in the previous process Can be estimated and the production efficiency can be improved.
[Brief description of the drawings]
FIG. 1 is a schematic configuration diagram of an uneven color inspection apparatus according to an embodiment of the present invention; FIG. 2 is a flowchart of an image processing program according to an embodiment of the present invention; FIG. 3 is a schematic diagram of an uneven color pattern; Flowchart of image processing program
REFERENCE SIGNS LIST 1 inspection object 2 lighting device 3 imaging means 4 bandpass filter 5 coupling lens 6 image processing device 7 storage unit 8 display device

Claims (4)

検査対象物を撮像する撮像手段と、前記撮像手段で撮像した画像を処理する画像処理手段と、前記画像処理手段で処理した検査結果を表示する表示手段とを備えた色むら検査装置において、前記画像処理手段が、前記撮像した画像から色むら画素を検出し、前記検出した色むら画素を結合し、前記結合した色むら部分の面積により色むら判定を行う手段を備えたことを特徴とする色むら検査装置。An unevenness inspection apparatus, comprising: an imaging unit that captures an image of an inspection target; an image processing unit that processes an image captured by the imaging unit; and a display unit that displays an inspection result processed by the image processing unit. Image processing means for detecting color unevenness pixels from the captured image, combining the detected color unevenness pixels, and performing color unevenness determination based on the area of the combined color unevenness portion. Color unevenness inspection device. 画像処理手段が、結合した色むら部分に外接する外接矩形を設け、前記外接矩形の画素数、長辺長、短辺長、長辺長と短辺長との比、結合された各画素値の総和、結合された各画素値の総和と結合された画素数との比、結合された画素数と前記外接矩形の画素数との比の少なくとも1つの評価値により色むらと欠陥の弁別を行う手段を備えたことを特徴とする請求項1記載の色むら検査装置。The image processing means provides a circumscribed rectangle circumscribing the combined color unevenness portion, the number of pixels of the circumscribed rectangle, a long side length, a short side length, a ratio between the long side length and the short side length, and a combined pixel value. And the ratio of the sum of the combined pixel values to the number of pixels combined and the ratio of the number of combined pixels to the number of pixels of the circumscribed rectangle determine at least one evaluation value of color unevenness and defects. 2. The color non-uniformity inspection apparatus according to claim 1, further comprising means for performing the color unevenness inspection. 検査対象物を撮像し、前記撮像した画像から色むら画素を検出し、色むら判定を行う色むら検査方法において、前記検出した色むら画素を結合し、前記結合した色むら部分の面積により色むら判定を行うことを特徴とする色むら検査方法。In the color shading inspection method of imaging an inspection object, detecting color shading pixels from the captured image, and performing color shading determination, the detected color shading pixels are combined, and the color is determined by the area of the combined color shading portion. An uneven color inspection method characterized by performing unevenness determination. 色むら判定において、結合した色むら部分に外接する外接矩形の画素数、長辺長、短辺長、長辺長と短辺長との比、結合された各画素値の総和、結合された各画素値の総和と結合された画素数との比、結合された画素数と前記外接矩形の画素数との比の少なくとも1つの評価値により色むらと欠陥の弁別することを特徴とする請求項3記載の色むら検査方法。In the color unevenness determination, the number of pixels of the circumscribed rectangle circumscribing the combined color unevenness portion, the long side length, the short side length, the ratio of the long side length to the short side length, the sum of the combined pixel values, the combined The color unevenness and the defect are discriminated by at least one evaluation value of a ratio of the sum of the pixel values to the number of combined pixels and a ratio of the number of combined pixels to the number of pixels of the circumscribed rectangle. Item 3. The color unevenness inspection method according to Item 3.
JP2002333385A 2002-11-18 2002-11-18 Apparatus and method for inspecting irregular color Pending JP2004170109A (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006049166A (en) * 2004-08-06 2006-02-16 Matsushita Electric Ind Co Ltd Lighting screen inspection method for plasma display panel
JP2006105926A (en) * 2004-10-08 2006-04-20 Nikon Corp Inspection apparatus
JP2007206550A (en) * 2006-02-03 2007-08-16 Toshiba Corp Defective pixel correcting device for liquid crystal panel
CN102279189A (en) * 2010-03-17 2011-12-14 夏普株式会社 Defect detecting device, defect restoring device and defect detecting method
TWI407248B (en) * 2006-12-05 2013-09-01 Hoya Corp Photomask inspecting apparatus, photomask inspecting method, method of producing a photomask for use in manufacturing a liquid crystal device and pattern transferring method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006049166A (en) * 2004-08-06 2006-02-16 Matsushita Electric Ind Co Ltd Lighting screen inspection method for plasma display panel
JP4525231B2 (en) * 2004-08-06 2010-08-18 パナソニック株式会社 Plasma display panel lighting screen inspection method
JP2006105926A (en) * 2004-10-08 2006-04-20 Nikon Corp Inspection apparatus
JP2007206550A (en) * 2006-02-03 2007-08-16 Toshiba Corp Defective pixel correcting device for liquid crystal panel
TWI407248B (en) * 2006-12-05 2013-09-01 Hoya Corp Photomask inspecting apparatus, photomask inspecting method, method of producing a photomask for use in manufacturing a liquid crystal device and pattern transferring method
CN102279189A (en) * 2010-03-17 2011-12-14 夏普株式会社 Defect detecting device, defect restoring device and defect detecting method

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