JP2004144556A - Test system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a test system which prevents such a state that untested sections are left in a strip because of setting a test width smaller than an actual width of the strip. <P>SOLUTION: The test system is provided with a width detecting means which measures width values of the strip being carried in a constant direction, and a width comparing means that compares the detection width, which has the width values of the strip detected by the width detecting means, with a product width which has the actual width value of the strip. Therefore, the system can effectively prevent such a state that the strip having the untested sections left therein because of setting the test width smaller than the actual width of the strip is shipped as a product. <P>COPYRIGHT: (C)2004,JPO

Description

【０１２３】
なお、前記欠陥のうち、Ｓ、Ｔ、Ｐ、Ｑ、Ｒ、Ｖ、Ｌについては、前記図１１および表１には示されていないが、検出感度として、不良品として排除すべきＮＧレベルの欠陥のみが検出される感度ｓ１と、不良品として排除するほどではないＯＫレベルの欠陥も検出されるｓ２との２段階の感度の一方を選択できる、検出感度として感度ｓ２を設定することにより、得られたデータから欠陥の発生傾向を管理する傾向管理を行うことができる。
【０１２４】
前記「Ｊ」キー乃至「Ｌ」キーの下方には、前記「傾向管理」画面と同様に、「Ｆ１：傾向管理」乃至「Ｆ１２：終了」の１２個のファンクションキーが表示されている。これは、以下に説明する画面についても同様である。
【０１２５】
前記１２個のファンクションキーのうち、「Ｆ３：Ａ面傾向」キーをクリックすると、図１０に示す「傾向管理画面」における「Ｂ面傾向」ゾーンの内容が拡大されて「Ｂ面傾向管理画面」として表示される。
【０１２６】
図１２に示すように、「Ｂ面傾向管理」画面には、Ａ面における帯域Ｌ１〜Ｌ１５のそれぞれについて平版印刷版Ｐの搬送距離と欠陥の発生個数との関係を示すグラフが表示される。前記グラフについては、前記「Ａ面傾向管理」画面のところで説明した通りである。
【０１２７】
グラフの下方には、「ｊ」キー、「ｋ」キー、「ｍ」キー、「ｎ」キー、「全選択」キー、および「解除」キーが表示されている。「ｊ」キー、「ｋ」キー、「ｍ」キー、「ｎ」キーは、何れも表示しようとする欠陥の種類を指定するキーであり、ｊ、ｋ、ｍ、ｎは、表２に示すように、Ｂ面における以下の欠陥に対応する。
【０１２８】
【表２】

【０１２９】
前記１２個のファンクションキーのうち、「Ｆ７：Ａ面周期」キーをクリックすると、図１０に示す「傾向管理画面」における「Ａ面周期」ゾーンの内容が拡大されてＡ面周期判定結果として表示される。
【０１３０】
「Ａ面周期判定結果」画面は、帳簿形式の画面であり、図１３に示すように、左側から、年月日、時刻、品種、ロット番号、アルミニウム幅、欠陥検出位置を示す検出幅、欠陥の発生周期を示す周期、欠陥を検出した帯域を示す検出レーン、前記欠陥の検出位置におけるロール径である該当ロール径、および該当ロール番号の１０個の欄が設けられている。
【０１３１】
「Ｆ８：Ｂ面周期」キーをクリックすると、図１０に示す「傾向管理」画面における「Ｂ面周期」ゾーンの内容が拡大されてＢ面周期判定結果として表示される。
【０１３２】
図１４に示すように、「Ｂ面周期判定結果」画面も、「Ａ面周期判定結果」画面と同様の帳簿形式の画面であり、同様の欄が設けられている。
【０１３３】
「Ｆ１１：ジャンボ出側」キーをクリックすると、不良品として排除すべき著しい欠陥であるジャンボ押傷についての設定画面である「ジャンボ押傷設定」画面が表示される。
【０１３４】
ジャンボ押し傷設定画面は、図１５に示すように、欠陥Ａ、Ｂ、Ｃ、Ｄ、Ｅ、Ｆ、Ｇ、およびＨの何れを、ジャンボ押傷に指定するかを入力する「Ａ」キー〜「Ｇ」キーと、前記「Ａ」キー〜「Ｇ」キーの下方に位置し、欠陥Ａ〜Ｇを全てジャンボ押傷として指定する「全選択」キーと、「Ａ」キー〜「Ｇ」キーおよび「全選択」キーからの入力内容を取り消す「全解除」キーとが設けられている。
【０１３５】
ここで、欠陥Ａ、Ｂ、Ｃ、Ｄ、Ｅ、Ｆ、Ｇ、およびＨは何れも光沢傷であり、意味内容は表３の通りである。
【０１３６】
【表３】

【０１３７】
「全選択」キーおよび「全解除」キーの下方には、後述する「出側停止印字設定」画面に移行する「出側設定」キーと、前記「出側停止印字設定」画面から「ジャンボ押し傷設定」画面に戻る「ジャンボ設定」キーとが設けられている。
【０１３８】
「ジャンボ押傷設定」画面において、「Ａ」キー〜「Ｇ」キーの少なくとも１つ、または「全選択」キーをクリックすると、中央処理装置７０Ａにおいては、前記キーに対応する欠陥をジャンボ押傷として指定する。
【０１３９】
次に、ジャンボ押し傷が設定されると、欠陥信号処理装置５０は、Ａ面レーザ光走査型検出装置２またはＢ面レーザ光走査型検出装置４において検出された光沢傷が前記ジャンボ押傷に指定された欠陥か否かを判定する。そして、前記判定がＹｅｓの場合には、警報出力を制御コンピュータ５２に入力する。
【０１４０】
制御コンピュータ５２は、欠陥信号処理装置５０から警報出力が入力されると外部接点出力部５８を通して警報ランプや警報ブザーなどを作動させる。
【０１４１】
前記「ジャンボ押し傷設定」画面において「出側停止」キーをクリックすると、「出側停止印字設定」画面が表示される。
【０１４２】
図１６に示すように、「出側停止印字設定」画面には、Ａ面レーザ光走査型検出装置２で検出される欠陥Ａ、Ｂ、Ｃ、Ｄ、Ｅ、Ｆ、Ｇ、およびＨの何れを、平版印刷版Ｐの搬送ラインを停止すべき欠陥である出側停止欠陥に指定するかを設定する「Ａ」キー〜「Ｈ」キーと、色筋検出装置１２、擦り傷検出装置１４、光沢検出装置１６、および色検出装置１８で検出される欠陥Ｓ、Ｔ、Ｐ、Ｑ、Ｒ、Ｖ、およびＬの何れを前記出側停止欠陥に指定するかを設定する「Ｓ」キー〜「Ｌ」キーと、Ｂ面レーザ光走査型検出装置４で検出される欠陥ａ、ｂ、ｃ、ｄ、ｅ、ｆ、ｇ、およびｈの何れを前記出側停止欠陥に指定するかを設定する「ａ」キー〜「ｈ」キーとが表示されている。
【０１４３】
ここで、欠陥ａ、ｂ、ｃ、ｄ、ｅ、ｆ、ｇ、およびｈは、以下の表４に示す種類の欠陥である。
【０１４４】
【表４】

【０１４５】
なお、「Ａ」キーの左側には、欠陥Ａ〜Ｈの全てを前記出側停止欠陥に指定する「ＳＬＡ面全選択」キーが表示され、「Ｓ」キーの左側には、欠陥Ｓ、Ｔ、Ｐ、Ｑ、Ｒ、Ｖ、およびＬの全てを前記出側停止欠陥に指定する「ＭＩＴ全選択」キーが表示されている。そして、「ａ」キーの左側には、欠陥ａ〜ｈの全てを前記出側停止欠陥に指定する「ＳＬＢ面全選択」キーが表示されている。
【０１４６】
「ａ」キー〜「ｈ」キーの下方には、欠陥Ａ〜Ｈ、欠陥Ｓ、Ｔ、Ｐ、Ｑ、Ｒ、Ｖ、Ｌ、および欠陥ａ〜ｈの全てを前記出側停止欠陥に指定する「全選択」キーと、「全選択」キーに隣接して設けられ、前記指定を解除する「全解除」キーとが表示されている。
【０１４７】
「全選択」キーと「全解除」キーとの下方には、「出側停止」キーと「ジャンボ設定」キーとが表示されている。
【０１４８】
出側停止印字設定画面において、「Ａ」キー〜「Ｈ」キーまたは「ａ」キー〜「ｈ」キーをクリックすると、中央処理装置７０Ａは、前記キーによって入力された欠陥を、出側停止欠陥に指定する。
【０１４９】
中央処理装置７０Ａにおいて前記出側欠陥が入力されると、欠陥信号処理装置５０および６０は、Ａ面レーザ光走査型検出装置２、Ｂ面レーザ光走査型検出装置４、色筋検出装置１２、擦り傷検出装置１４、光沢検出装置１６、色検出装置１８が検出した欠陥が出側停止欠陥に包含されるか否かを判定する。そして、前記判定がＹｅｓであったときは、制御コンピュータ５２または６２は、停止信号を平版印刷版Ｐの搬送ラインに入力し、前記搬送ラインを停止させる。同時に、中央処理装置７０Ａからの指示により、プリンタ７４において出側停止印字が行なわれる。
【０１５０】
「Ｆ４：ＳＬ幅データ」キーをクリックすると、中央処理装置７０Ａは、制御コンピュータ５２から入力された検出幅Ｗ_１の価と、生産管理コンピュータ６２から入力された日付、時刻、品種名、ロット番号、製品幅とをディスプレー７２に入力して図１７に示す「ＳＬ７０００幅検出データ」画面に表示させる。ここで、「Ｆ４：ＳＬ幅データ」画面における「ＡＬ幅」は、前記製品幅を示す。
【０１５１】
Ａ面レーザ光走査型検出装置２およびＢ面レーザ光走査型検出装置４において、たとえば黒筋を検出すると、図９において（Ｃ）に示すように、レーザ光受光部２Ｂ（４Ｂ）において出力される光電流Ｉも殆ど０まで急降下することがある。ここで、制御コンピュータ５２は、前述のように、光電流Ｉの立ち上がりおよび立ち下がりを検出することによって前記立上り位置および前記立下り位置を検出している。したがって、制御コンピュータ５２は、前記黒筋を検出した位置を前記立下り位置と判断する可能性がある。前記判断に基いて検査幅Ｗ_１を求めると、前記検査幅Ｗ_１は、図９において（Ｄ）に示すように、実際の製品幅Ｗよりも遥かに小さくなる。
【０１５２】
そこで、中央処理装置７０Ａにおいては、制御コンピュータ５２において求めた検査幅Ｗ_１を、生産管理コンピュータ７から入力された製品幅Ｗと比較し、検査幅Ｗ_１と製品幅Ｗとの差ΔＷが一定範囲内、たとえば、４ｍｍ以内であれば、検査幅Ｗ_１は正常であると判断し、前記差ΔＷが前記範囲を越えたときは、検査幅Ｗ_１は異常であると判断して、前記判断結果も、前記「Ｆ４：ＳＬ幅データ」画面の「比較結果」における「判定」の欄に表示する。
【０１５３】
オペレータは、前記画面を見ることにより、検出幅Ｗ_１が正常範囲内にあるか否かを判断でき、検出幅Ｗ_１が正常範囲内に無い場合には、ディスプレー７２または制御コンピュータ５２において検出幅Ｗ_１を再設定することができる。
【０１５４】
前記１２個のファンクションキーのうち、「Ｆ５：ＳＬ状態」キーをクリックすると、「ＳＬ７０００状態表示」画面が表示される。
【０１５５】
「ＳＬ７０００状態表示」画面は、図１８に示すように、日付、時刻、品種名、ロット番号、およびアルミニウム幅などのロット情報と、Ａ面レーザ光走査型検出装置２およびＢ面レーザ光走査型検出装置４における印加電圧ｖの価とを表示する帳簿形式の画面である。なお、印加電圧ｖの価は、「ＰＭＴＥ印加電圧」の欄に表示される。
【０１５６】
オペレータは、前記ＳＬ７０００状態表示画面を見ることにより、レーザ光受光部２Ｂ（４Ｂ）に適正な範囲の電圧が印加されているかいないか、および受光素子毎の印加電圧の差が余り大きくはないか否かを知ることができる。
【０１５７】
最後に、「Ｆ６：ＭＩＴ−４状態」キーをクリックすると、「ＭＩＴ−４状態表示」画面が表示される。
【０１５８】
「ＭＩＴ−４状態表示」画面は、図１９に示すように、色筋検出装置１２、擦り傷検出装置１４と光沢検出装置１６、および色検出装置１８におけるＣＣＤカメラへの印加電圧即ちカメラ電圧の価と、光源設定値とを表示する帳簿形式の画面である。
【０１５９】
オペレータは、前記ＭＩＴ−４状態表示画面を見ることにより、ＣＣＤカメラ２２、２６、３４、および３８が正常に作動しているか否か、および光源２０、２４、３２、および３６の設定電圧が適性であるか否かを知ることができる。
【０１６０】
実施形態１に係るオンライン表面検査システムにおいては、オペレータは、Ａ面レーザ光走査型検出装置２およびＢ面レーザ光走査型検出装置４において検査幅の設定が適切であるか否かを実時間で知ることができるから、未検査部の残存する帯状体が生じた場合には、製品として出荷される前に、検査幅の再設定などの適切な処置をとることができる。
【０１６１】
また、Ａ面レーザ光走査型検出装置２、Ｂ面レーザ光走査型検出装置４、色筋検出装置１２、擦り傷検出装置１４、光沢検出装置１６、および色検出装置１８で検出された欠陥の種類、発生位置、および発生周期などの欠陥情報を、平版印刷版Ｐのロット情報と関連させて表示するから、オペレータは、どのロットの平版印刷版にどのような種類の欠陥がどの程度の頻度で発生したか、および前記ロットにおける不良品の発生量はどの程度かを容易に把握できる。
【０１６２】
したがって、オペレータは、前記ロットの平版印刷版を生産するのに必要なアルミニウムウェブロールの再引当を行うなどの生産計画の修正を実時間で行えるから、たとえ、不良品が大量に発生して製品として出荷できる平版印刷版の得率が減少しても、アルミニウムウェブに不足が生じる前に、不足分のアルミニウムウェブロールを発注できる。故に、前記場合においても、アルミニウムウェブに不足が生じて生産に支障が生じることが防止される。
【０１６３】
更に、不良品として排除する必要のない微小な欠陥についても、発生した帯域、発生頻度、発生位置をグラフ化して表示するから、オペレータは、前記欠陥の発生傾向を容易に把握できる。したがって、前記欠陥が出側停止欠陥のような重大な欠陥に到る前に対策を講じることができるから、平版印刷版Ｐの損失を大幅に減らすことができる。
【０１６４】
加えて、Ａ面レーザ光走査型検出装置２、Ｂ面レーザ光走査型検出装置２、色筋検出装置１２、擦り傷検出装置１４、光沢検出装置１６、および色検出装置１８の運転状況もディスプレー７２に表示されるから、オペレータは、欠陥の検出が異常に多い場合、平版印刷版Ｐ側の異常によるものなのか、Ａ面レーザ光走査型検出装置２などの欠陥検出手段の側の異常によるものなのかを容易に判断できる。
【０１６５】
前記欠陥情報およびロット情報は、互いに関連付けられた状態で統括コンピュータ７０における記憶装置７０Ｂに格納されるから、製造条件と欠陥の発生傾向との関係を整理・検討することが容易に行える。
【０１６６】
【発明の効果】
以上説明したように、本発明によれば、帯状体における実際の幅よりも狭い検査幅が設定されて未検査部の残存する帯状体が製品として出荷されることを効果的に防止できる検査システムが提供される。
【図面の簡単な説明】
【図１】図１は、本発明に係る検査システムの一例であり、一定の速度で搬送される平版印刷版を検査するオンライン表面検査システムの構成を示すブロック図である。
【図２】図２は、図１に示すオンライン表面検査システムが備えるＡ面レーザ光走査型検出装置、Ｂ面レーザ光走査型検出装置、色筋検出装置、擦り傷検出装置、光沢検出装置、および色検出装置の配置を示す概略図である。
【図３】図３は、Ａ面レーザ光走査型検出装置およびＢ面レーザ光走査型検出装置におけるレーザ光照射部およびレーザ光受光部の相対的な位置関係を示す斜視図である。
【図４】図４は、色筋検出装置について、ＣＣＤカメラおよび光源と検査ローラおよび平版印刷版との相対的な位置関係を示す斜視図である。
【図５】図５は、図３に示すＡ面レーザ光走査型検出装置およびＢ面レーザ光走査型検出装置において、平版印刷版に照射されたレーザ光をレーザ光受光部において受光した状態を示す概略平面図である。
【図６】図６は、Ａ面レーザ光走査型検出装置およびＢ面レーザ光走査型検出装置からのデータを処理する欠陥信号処理装置の構成およびデータの流れを示すブロック図である。
【図７】図７は、色筋検査装置、擦り傷検出装置、光沢検出装置、および色検出装置からのデータを処理する欠陥信号処理装置の構成およびデータの流れを示すブロック図である。
【図８】図８は、統括コンピュータ６０の構成および情報の流れを示すブロック図である。
【図９】図９は、図１に示すオンライン表面検査システムにおいて、欠陥信号処理装置から入力された光電流および位置データに基き、Ａ面レーザ光走査型検出装置およびＢ面レーザ光走査型検出装置における検査幅を求める手順を示すグラフである。
【図１０】図１０は、図１に示すオンライン表面検査システムの備えるディスプレーに傾向管理画面が表示されたところを示す平面図である。
【図１１】図１１は、前記ディスプレーにＡ面傾向管理画面が表示されたところを示す平面図である。
【図１２】図１２は、前記ディスプレーにＢ面傾向管理画面が表示されたところを示す平面図である。
【図１３】図１３は、前記ディスプレーにＡ面周期判定結果が表示されたところを示す平面図である。
【図１４】図１４は、前記ディスプレーにＢ面周期判定結果が表示されたところを示す平面図である。
【図１５】図１５は、不良品として排除すべき著しい欠陥であるジャンボ押傷についての設定画面であるジャンボ押傷設定画面が前記ディスプレーに表示されたところを示す平面図である。
【図１６】図１６は、平版印刷版の搬送を停止する必要がある程の著しい欠陥である出側停止欠陥について設定を行う出側停止印字設定画面が前記ディスプレーに表示されたところを示す平面図である。
【図１７】図１７は、Ａ面レーザ光走査型検出装置およびＢ面レーザ光走査型検出装置における検査幅と平版印刷版Ｐの実際の幅であるアルミ幅との関係を表示するＳＬ７０００検出幅データ画面を示す平面図である。
【図１８】図１８は、Ａ面レーザ光走査型検出装置およびＢ面レーザ光走査型検出装置の運転状況を表示するＳＬ７０００状態表示画面を示す平面図である。
【図１９】図１９は、図２に示す色筋検出装置、擦り傷検出装置、光沢検出装置、および色検出装置の運転状態を表示するＭＩＴ−４状態表示画面を示す平面図である。
【符号の説明】
２　　　　Ａ面レーザ光走査型検出装置
４　　　　Ｂ面レーザ光走査型検出装置
６　　　　光沢傷データ管理部
７　　　　生産管理コンピュータ
８　　　　感光面欠陥データ管理部
９　　　　信号中継装置
１０　　　　総括制御部
１２　　　　色筋検出装置
１４　　　　擦り傷検出装置
１６　　　　光沢検出装置
１８　　　　色検出装置
５０　　　　欠陥信号処理装置
５２　　　　制御コンピュータ
６０　　　　欠陥信号処理装置
６２　　　　制御コンピュータ
７０　　　　統括コンピュータ
７０Ａ　　　中央処理装置
７０Ｂ　　　記憶装置[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an inspection system, and more particularly, to an inspection system that can effectively prevent a strip-like body having an uninspected portion that has not been inspected for surface defects from being shipped as a product.
[0002]
[Prior art]
In general, a lithographic printing plate is a photosensitive layer forming liquid on the grained surface of a support obtained by sequentially performing surface treatment such as graining, anodizing, silicate treatment on an aluminum web which is a continuous strip-like aluminum sheet. It is manufactured through a cutting process in which a photosensitive layer is formed by coating and drying, and then cutting into a desired size.
[0003]
The lithographic printing plate is inspected by an on-line surface inspection device for the presence or absence of a defective portion of the photosensitive layer (metal gloss scratch, color streak, scratch, coating unevenness, adhesion of foreign matter, etc.) before proceeding to the cutting step.
[0004]
Then, when the online surface inspection apparatus detects the defective portion, an identification label is affixed to a side edge portion of the planographic printing plate so that the start point and the end point of the section where the defective portion exists can be determined, and the cutting is performed. Sometimes the lithographic printing plate is cut at the start and end points, and the section is excluded as a defective product.
[0005]
In the on-line surface inspection apparatus, a laser beam is scanned along the width direction of the strip, and the reflected light reflected by the laser beam hitting the surface of the strip is received to detect defects on the surface of the photosensitive layer. A laser scanning type inspection apparatus for detecting the presence or absence of this has generally been used.
[0006]
[Patent Document 1]
JP-A-10-325809
[0007]
[Problems to be solved by the invention]
However, in the laser scanning inspection apparatus, the inspection width is often automatically set based on the magnitude of the rise that is a rapid rise and the sharp fall of the received light waveform.
[0008]
Therefore, when the black stripes, which are dark vertical stripes formed by applying the photosensitive layer forming solution excessively, are detected at the center of the planographic printing plate, the light reception waveform shows a large fall. When the fall exceeds a predetermined size, the laser scanning inspection apparatus determines that the entire width of the planographic printing plate is inspected when the black stripe is detected, and inspects the planographic printing plate. It is conceivable that the inspection width, which is the width, is set narrower than the actual width of the lithographic printing plate.
[0009]
Further, the inspection width may be set narrow due to an abnormality of the laser scanning inspection apparatus itself.
[0010]
The present invention provides a strip inspection system for automatically setting an inspection width by preventing the inspection width from being set narrower than an actual width of a strip such as a lithographic printing plate. Another object of the present invention is to provide an inspection system that can effectively prevent the occurrence of an uninspected portion that is not inspected for the presence or absence of surface defects.
[0011]
[Means for Solving the Problems]
According to the first aspect of the present invention, a width detection unit that measures the width of a band-shaped body that is conveyed in a certain direction, and a detection width that is a width of the band-shaped body that is detected by the width detection unit, The present invention relates to an inspection system comprising width comparison means for comparing with a product width which is a width.
[0012]
The inspection system can be used in an on-line surface inspection apparatus to determine whether the inspection width setting in the laser scanning inspection apparatus is correct.
[0013]
Further, in the transport line for transporting the strip-shaped body in which two types of strip-shaped bodies having different widths are connected in the longitudinal direction and cutting and removing the connection portion of the strip-shaped body, the detection width and the By continuously comparing the product width, the timing for cutting the strip can be controlled with high accuracy.
[0014]
According to the second aspect of the present invention, there is provided a defect detection means for detecting a defect on the surface of the belt-like body by scanning a belt-like body conveyed in a certain direction in the width direction, and the type and occurrence of the defect detected by the defect detection means. Defect information management means for collecting and managing defect information related to position and generation cycle, central information processing means for reading out the defect information from the defect information management means, and defect information read out by the central information processing means Display means for displaying, the width detecting means detects an inspection width for scanning the strip in the defect detecting means as the detection width, and the central information processing means includes the width comparing means. The width comparison means compares the inspection width with the product width, and determines that the inspection width is normal when the difference between the inspection width and the product width is within a certain range. The above When but which exceeds the range, the inspection width relates to an inspection system for determining as abnormal.
[0015]
The inspection system is provided with an on-line inspection device or the like for inspecting the surface of the belt-like body according to the inspection system according to claim 1.
In the inspection system, when the inspection width is set narrower than the actual band width in the defect detection means, the central information processing means determines that the inspection width is abnormal. It is possible to effectively prevent a large amount of band-like bodies remaining in the uninspected portion from being generated without the operator noticing the abnormality in the inspection width.
[0016]
The determination result may be displayed on the display means, or may be displayed on any other means.
[0017]
The inspection width may be set automatically by the defect detection means or may be set by the central information processing means.
[0018]
The product width may be, for example, a numerical value stored in advance as the width of the band in the lot information management unit described later, or a value obtained by actually measuring the width of the band by an appropriate unit. There may be.
[0019]
Examples of the defect detection means include optical defect detection means to be described later. In addition, an electrical defect detection that detects a surface defect based on a change in electrical characteristics of the strip, such as electrical resistance and capacitance. Means can also be used.
[0020]
A normal computer is used as the defect information management means and the central information processing means.
[0021]
Examples of the display means include a CRT display, a liquid crystal display, and a printer.
[0022]
Examples of the belt-like body include a lithographic printing plate and a support thereof. In addition, a silver salt photosensitive layer is formed on the surface of the belt-like film such as a magnetic tape such as a recording tape or a video tape, a photographic film or a movie film. Examples thereof include a silver salt photosensitive material, a strip-shaped steel plate, a strip-shaped metal plate such as a strip-shaped stainless steel plate and a strip-shaped aluminum plate, various plastic films, paper, and cloth.
[0023]
Defects detected by the defect detection means, such as gloss scratches in lithographic printing plates, large scratches that expose the base material of the strip, unevenness of the surface of the strip, fine scratches formed on the surface, Examples include foreign substances adhering to the surface. In addition, in lithographic printing plates and magnetic tapes having a coating layer on the surface, there are excess of uncoated parts and coating layer forming liquid that are not coated with the coating layer forming liquid that forms the coating layer. An excessively applied portion such as black streaks applied to the surface.
[0024]
The invention according to claim 3 comprises lot information management means in which lot information relating to the lot of the strip is stored, and the central information processing means reads the lot information from the lot information management means, The read lot information, the defect information read from the defect information management means, and the determination result for the inspection width are associated with each other to form a management format, and the display means is configured in the central information processing means. The present invention relates to an inspection system that displays a management format.
[0025]
In the inspection system, the determination result about the inspection width is displayed as a management format together with other defect information and the lot information, so that it is particularly easy for an operator to grasp whether there is an abnormality in the inspection width. is there.
[0026]
The invention according to claim 4 is that the lot information stored in the lot information management means is a roll provision quantity, which is a product type, a lot number, a width, a thickness, and a roll quantity of the base material of the belt. Information about the inspection system.
[0027]
In the inspection system, the production name of the band can be managed more finely by displaying the type and lot number of the band and the defect information in association with each other.
[0028]
Further, by displaying the production plan quantity and the defect information in association with each other, the operator increases the roll provision quantity for a lot with many defects, and rolls the base material roll based on the new roll provision quantity. It is possible to easily modify the production plan such as placing an additional order.
[0029]
The invention described in claim 5 relates to an inspection system having a plurality of the defect detection means.
[0030]
In the inspection system, two or more types of defects of the belt-like body are detected by at least one of the plurality of defect detection means. Then, defect information is output for each of the defects, and is displayed in a specific format in association with the lot information regarding the strip.
[0031]
Therefore, the operator can easily grasp the type of defect, the position of occurrence, and the frequency of occurrence for each lot of a plurality of types of defects that may occur in the belt-like body.
[0032]
In addition, since the production conditions of the strip can be easily determined from the lot information of the strip, measures necessary for eliminating the defect can be easily and quickly established.
[0033]
The invention according to claim 6 is an optical defect in which the defect detecting means includes a light source that irradiates light on the surface of the strip and a light receiving unit that receives reflected light from the surface of the strip. The present invention relates to an inspection system that is detection means.
[0034]
In the inspection system, defects on the surface of the belt can be continuously detected without contact.
[0035]
Examples of the optical defect detection means include the laser scanning type inspection apparatus described in the section of “Prior Art”. In addition, a rod-shaped light source that irradiates strip-shaped light over the entire width of the strip-shaped body; An optical inspection device including a CCD array or a CCD camera that receives the reflected light reflected by the band-like light from the light source. In the optical inspection apparatus, a polarizing filter or the like may be disposed between the light source and the strip as necessary.
[0036]
The invention according to claim 7 relates to an inspection system in which the central information processing means obtains the inspection width based on rising and falling of a received light waveform in a light receiving section provided in the optical defect detecting means.
[0037]
When the above-described laser scanning inspection apparatus is used as the defect detection means, the laser beam emitted from the laser scanning inspection apparatus is reflected by the strip when it strikes the strip, and therefore rises in a light receiving waveform. Occurs. Then, when the laser light passes through the surface of the band-like body, the reflected light from the band-like body also disappears, so that the received light waveform falls.
[0038]
Therefore, the defect detection means can automatically set the inspection width by setting the section between the rising edge and the falling edge as the inspection width.
[0039]
DETAILED DESCRIPTION OF THE INVENTION
1. Embodiment 1
The configuration of an on-line surface inspection system that is an example of an inspection system according to the present invention and inspects the presence / absence, position, and cycle of defects present on the surface of a lithographic printing plate conveyed at a constant speed is shown in FIGS. 2 will be described.
[0040]
As shown in FIGS. 1 and 2, the on-line surface inspection system 100 according to the first embodiment has gloss defects on the surface A, which is the surface on the side where the photosensitive layer of the planographic printing plate P is formed, as defect detection means. A-side laser beam scanning type detection device 2 for detecting the surface of the lithographic printing plate P, and a B-side laser beam scanning type detection device 4 for detecting the presence or absence of a gloss flaw on the B surface, which is the surface opposite to the A surface of the planographic printing plate P, A color streak detecting device 12, a scratch detecting device 14, a gloss detecting device 16, and a color detecting device 18 for detecting a photosensitive surface defect which is a defect on the surface of the photosensitive layer formed on the A surface, and an A surface laser beam scanning type. A gloss flaw data management unit 6 that reads data from the detection device 2 and the B-surface laser beam scanning type detection device 4 to collect and manage defect information about gloss flaws on the A surface and the B surface, a color streak detection device 12, and an abrasion Detection device 14, gloss detection device 6, a photosensitive surface defect data management unit 8 that reads data from the color detection device 18 and collects and manages defect information about photosensitive surface defects, and a production management computer 7 that stores lot information about the planographic printing plate P , Gloss flaw data management unit 6, photosensitive surface defect data management unit 8, and overall control unit 10 that controls the production management computer 7, gloss flaw data management unit 6, photosensitive surface defect data management unit 8, production management computer 7 And a signal relay device 9 for relaying signals between the overall control unit 10.
[0041]
Here, the gloss flaw is a defect generated on the surface A on the side where the photosensitive layer of the flat printing plate is formed, or on the surface B opposite to the surface A, It is a flaw-like defect deep enough to expose the aluminum layer. A glossy flaw usually has a strong metallic luster, so it can be referred to as a gloss defect.
[0042]
Examples of the photosensitive surface defect include a color streak that is a streak-like defect whose color is darker or lighter than the surroundings.
[0043]
As described in the section of “Prior Art”, the photosensitive layer is a photosensitive solution while continuously conveying a support produced by subjecting an aluminum web to surface roughening and anodizing treatment in the longitudinal direction. Therefore, a portion where the thickness is excessive and a portion where the thickness is too small in the photosensitive layer of the planographic printing plate P appear as streaks along the longitudinal direction of the planographic printing plate P. . Since the photosensitive layer is usually colored dark green or indigo, an excessive portion of the thickness of the photosensitive layer appears as dark stripes darker than the surroundings, and the thickness of the photosensitive layer is too small. These parts appear as light streaks that are lighter in color than the surroundings. The dark and light color stripes are called color stripes.
[0044]
Other photosensitive surface defects include scratches generated on the surface of the photosensitive layer, dotted light and darkness and scratches, color unevenness, and foreign matter.
[0045]
The A surface laser beam scanning detection device 2, the B surface laser beam scanning detection device 4, the color streak detection device 12, the scratch detection device 14, the gloss detection device 16, and the color detection device 18 are defects in the inspection system of the present invention. It corresponds to a detection means, and in particular corresponds to an optical defect detection means of the defect detection means. The gloss flaw data management unit 6 and the photosensitive surface defect data management unit 8 correspond to defect information management means in the inspection system. The overall control unit 10 corresponds to central information processing means in the inspection system, and the production management computer 7 corresponds to lot information management means and width detection means in the inspection system.
[0046]
The online surface inspection system 100 further includes a marking device 80 for attaching marks indicating the start point and end point of a section where a defect has occurred to the side edge of the planographic printing plate P in the transport line of the planographic printing plate P. Yes.
[0047]
1-1 Configuration of defect detection means
A surface laser beam scanning detection device 2, B surface laser beam scanning detection device 4, color streak detection device 12, scratch detection device 14, gloss detection device 16, which corresponds to a defect detection means in the inspection system according to the present invention, and As shown in FIG. 2, the color detection device 18 includes a color streak detection device 12, a scratch detection device 14, a gloss detection device 16, and color detection from the upstream side to the downstream side along the transport direction a of the planographic printing plate P. The device 18, the A-surface laser beam scanning detection device 2, and the B-surface laser beam scanning detection device 4 are arranged in this order.
[0048]
An inspection roller 40 is provided below each of the color streak detection device 12, the scratch detection device 14, the gloss detection device 16, and the color detection device 18. Is provided with a tension roller 42 around which the lithographic printing plate P is wound to take tension.
[0049]
Inspection rollers 44 and 46 are disposed in the vicinity of the A-surface laser beam scanning detection device 2 and the B-surface laser beam scanning detection device 4, respectively.
[0050]
As shown in FIGS. 2 and 3, the A-surface laser beam scanning detection device 2 and the B-surface laser beam scanning detection device 4 convert laser light from a laser light source (not shown) into an arrow b in FIG. As shown in FIG. 2, a laser beam irradiation unit 2A (4A) that scans the entire width of the planographic printing plate P along the width direction of the planographic printing plate P that is wound around the inspection roller 44 or 46 and conveyed, and the planographic plate A laser beam receiving unit 2B (4B) that includes a light receiving element array in which light receiving elements are arranged along the width direction of the printing plate P, receives reflected light from the A surface or the B surface, and outputs a photocurrent according to the intensity. ).
[0051]
In the laser beam irradiation unit 2A (4A), the laser beam can be scanned in one direction by a polygon mirror (not shown) that rotates at a constant speed. Further, the laser light receiving unit 2B (4B) extends over the entire width of the planographic printing plate P.
[0052]
As shown in FIG. 5, the laser beam scanned in the width direction of the planographic printing plate P in the laser beam irradiation unit 2A (4A) is reflected by the surface of the planographic printing plate P and passes through the laser beam receiving unit 2B (4B). Among the light-receiving elements that constitute the light-receiving element, the light-receiving element located at a position corresponding to the glossy scratch S is received and generates a photocurrent I. Accordingly, the laser light receiving unit 2B (4B) receives light data including position data L indicating the position of the light receiving element that has received the reflected light and photocurrent I corresponding to the intensity of the reflected light received by the light receiving element. Is output.
[0053]
The inspection roller 44 (46) is connected to a tachometer 2C (4C) that detects the transport distance of the planographic printing plate P, and the tachometer 2C (4C) is also connected to the glossy scratch data management unit 6.
[0054]
The photocurrent I, the inspection width, and the transport distance of the planographic printing plate P are all input to the gloss flaw data management unit 6.
[0055]
As shown in FIG. 2, the color streak detection device 12 includes a pair of light sources 20 that irradiate strip-like light over the entire width of the A surface and a CCD arranged in the width direction of the planographic printing plate P. A CCD array 22A for receiving the reflected light from the A surface and a CCD camera 22 having a condenser lens 22B for condensing the reflected light reflected from the A surface by the light from the light source 20 on the CCD array 22A are provided. In addition, the light source 20 is arrange | positioned so that irradiation light may concentrate on the same straight line over the full width of the lithographic printing plate P on A surface. The color streak detection device 12 has a function of detecting a color streak among the photosensitive surface defects.
[0056]
In the color streak detecting device 12, as shown in FIG. 4, the light reception voltage from the CCD camera 22 is output to the photosensitive layer defect data management unit 8, and the photosensitive layer defect data management unit 8 generates a light source based on the light reception voltage. A light amount control signal is output to 20, and the light source 20 adjusts the amount of light applied to the planographic printing plate P based on the light amount control signal. The same applies to the scratch detection device 14, the gloss detection device 16, and the color detection device 18.
[0057]
The scratch detection device 14 also includes a light source 24 for irradiating a band-like light over the entire width of the A surface and a CCD camera 26 having the same configuration as the CCD camera 22. However, unlike the color streak detection device 12, since it mainly has a function of detecting scratches, the number of the light sources 24 is one, and the light from the light sources 24 is reflected by the A surface in front of the CCD camera 26. A polarizing filter 28 is provided that cuts the longitudinal wave in the reflected light and passes only the transverse wave.
[0058]
The gloss detecting device 16 has a function of detecting spot-like light and darkness, scratches, and foreign matter, and includes a light source 32 composed of a fluorescent lamp that irradiates the A surface with light, and light from the light source 32 is converted to the A surface. And a CCD camera 34 for detecting the reflected light reflected at. The CCD camera 34 includes a CCD array 34A in which CCDs are arranged in a square shape, and a condensing lens 34B for condensing the reflected light from the A surface on the CCD array 34A.
[0059]
The color detection device 18 has a function of detecting dot-like color unevenness and foreign matter, and similarly to the gloss detection device 16, the light source 36 composed of a fluorescent lamp that irradiates the surface A with light and the CCD camera 34. And a CCD camera 38 that detects the reflected light reflected from the A-plane by the light from the light source 36. However, unlike the gloss detecting device 16, a pair of light sources 36 are provided, and the irradiation light is arranged so as to be concentrated on the same straight line over the entire width of the planographic printing plate P.
[0060]
In the color streak detection device 12, the scratch detection device 14, the gloss detection device 16, and the color detection device 18, the CCD camera 22 (26, 34, 36) is arranged in the width direction of the transport surface that is the transport path of the planographic printing plate P. A plurality of units can be provided over the range. FIG. 4 shows the relative positional relationship between the CCD camera 22 and the light source 20, the inspection roller 40 and the planographic printing plate P with respect to the color streak detection device 12.
[0061]
As shown in FIG. 4, the light source 20 is formed of a rod-like transparent member extending in the width direction with respect to the transport path of the planographic printing plate P, and metal halide is formed by an optical fiber (not shown) connected to one end. Light from an appropriate light source such as a light source (not shown) is introduced. The light introduced into the light source 20 is irradiated toward the A surface of the planographic printing plate P.
[0062]
The plurality of CCD cameras 22 that receive the reflected light from the A surface are arranged at regular intervals in the width direction with respect to the transport path of the planographic printing plate P.
[0063]
The digital image signal output from the CCD camera 22 is input to the photosensitive surface defect data management unit 8.
[0064]
1-2 Configuration of gloss flaw data management unit, photosensitive surface defect data management unit, and overall control unit
As shown in FIG. 1, the gloss flaw data management unit 6 includes a defect signal processing device 50, a control computer 52, a defect period determination computer 54, and a gloss flaw information display monitor 56. The control computer 52 is connected to the overall control unit 10 via the signal relay device 9 and further connected to an external contact output unit 58 for operating various external alarm devices (not shown) such as alarm lamps and alarm buzzers. Has been.
[0065]
The defect signal processing device 50 detects gloss scratches based on the intensity of the photocurrent output from the laser light receiving unit 2B (4B) of the A-surface laser light scanning detection device 2 and the B-surface laser light scanning detection device 4. The type is determined, and the generation position is specified based on the light receiving position in the laser light receiving unit 2B (4B) and the transport distance of the planographic printing plate P detected in the tachometer 2C (4C). Then, the data on the type and occurrence position of the gloss flaw is output to the control computer 52, and in the laser light irradiation unit 2A (4A) and the laser light receiving unit 2B (4B) based on a command from the control computer 52. The irradiation intensity of the laser beam and the magnitude of the voltage applied to the laser beam receiving unit 2B (4B) are controlled.
[0066]
Details of the configuration of the defect signal processing apparatus 50 are shown in FIG.
[0067]
As described above, the received light data including the photocurrent I and the position data L is input from the laser light receiving unit 2B (4B) to the glossy flaw data management unit 6, but as shown in FIG. The processing device 50 includes an A / D converter 50A for A / D converting the photocurrent I input to the defect signal processing device 50 from the laser light receiving unit 2B (4B), and an A / D converter 50A for A / D conversion. Differentiating circuit 50B for differentiating the value of the converted photocurrent I to obtain differential signal I ′, and comparing circuit 50C for analyzing differential signal I ′ generated by differentiating circuit 50B and determining the presence or absence of glossy scratch S. . Further, when the position data L is input, the defect signal processing apparatus 50 receives the lane 1 (L1), the lane 2 (L2), and the lane 3 (L3) in which the position data L is a widthwise band of the planographic printing plate P. )... Defect position data L indicating which of the 15 bands of lane 15 (L15) corresponds to. _df , The photocurrent I analysis result in the comparison circuit 50C, and the defect position data L from the light receiving position signal processing unit 50D. _df And the transport distance d of the planographic printing plate P input from the tachometer 2C (4C) _cv And a defect determination unit 50E for specifying the presence / absence, type, and occurrence position of the glossy scratch S.
[0068]
The defect determination unit 50E is connected to the control computer 52, the defect period determination computer 54, and the glossy scratch information display monitor 56.
[0069]
The defect cycle determination computer 54 has a function of obtaining a generation cycle for the glossy scratch and outputting the result to the control computer 52 when a specific result regarding the glossy scratch is input from the defect determination unit 50E.
[0070]
The control computer 52 reads the specific result about the glossy scratch from the defect signal processing device 50 and combines it with the generation cycle of the glossy scratch read from the defect cycle determination computer 54, and the type, the generation position, and the generation cycle of the glossy scratch. It has a function of configuring defect information regarding. The configured defect information is output toward the overall control unit 10 via the signal relay device 9. In addition, the control computer 52 uses the A-surface laser beam scanning detection device 2 and the B-surface laser beam scanning detection device 4 based on the rising and falling data of the photocurrent I input from the defect signal processing device 50. It also has a function of obtaining the scanning width of the laser beam, in other words, the inspection width.
[0071]
The control computer 52 further has a function of outputting a control command to the defect signal processing device 50 and the defect cycle determination computer 54 and a function of controlling the marking device 80.
[0072]
As shown in FIG. 1, the photosensitive surface defect data management unit 8 processes various defect data sent from the color streak detection device 12, the scratch detection device 14, the gloss detection device 16, and the color detection device 18 to process the A side. Defects that determine the type, occurrence position, and generation period of defects on the top and that control the color streak detection device 12, the scratch detection device 14, the gloss detection device 16, and the color detection device 18 based on the input setting information A signal processing device 60, a control computer 62 that controls the defect signal processing device 60, and a photosensitive surface defect display monitor 64 that displays the position and type of defects determined by the defect signal processing device 60 are provided.
[0073]
Details of the configuration of the defect signal processing apparatus 60 are shown in FIG.
[0074]
As shown in FIG. 7, the defect signal processing device 60 uses the light reception voltage V input from the CCD camera 22 included in the color streak detection device 12, the scratch detection device 14, the gloss detection device 16, and the color detection device 18 as A / A / D converter 60A that performs D conversion, a storage device 60B that stores the received light voltage V that has been A / D converted in time series, and a light reduction voltage that is read from the received light voltage V stored in the storage device 60B. A signal processing circuit 60C that performs the noise reduction processing by the signal processing circuit 60C and a preset upper limit voltage V _max And lower limit voltage V _min And a comparator 60D for determining the position and type of the defect.
[0075]
In the defect signal processing device 60, a comparator 60D is connected to the control computer 62.
[0076]
Based on the determination result output from the comparator 60D, the control computer 62 configures defect information related to the type, generation position, and generation period of the photosensitive surface defect, and the color streak detection device 12, the scratch detection device 14, and the gloss detection. It has a function of obtaining the inspection width in the device 16 and the color detection device 18, that is, the width covered by the CCD.
[0077]
The control computer 62 also has a function of displaying the defect information on the defect display display 64 and inputting the defect information to the overall control unit 10 via the signal relay device 9.
[0078]
The control computer 62 further has a function of exchanging data and control commands with the defect signal processing device 60, and also has a function of controlling the marking device 80.
[0079]
Details of the configuration of the overall control unit 10 are shown in FIG.
[0080]
As shown in FIG. 8, the overall control unit 10 associates the defect information and inspection width registered from the control computer 52 and the control computer 62 with the lot information regarding the planographic printing plate input from the production management computer 7. A central computer 70 that configures the management format, a display 72 that displays the management format configured in the central computer 70, and a printer 74 that prints the management format displayed on the display 72.
[0081]
The lot information stored in the production management computer 7 includes the type of the planographic printing plate P, the lot number, the width, the thickness, the roll allocation quantity, and the like.
[0082]
The overall computer 70 has a storage device 70B for temporarily storing data such as the defect information, inspection width, and lot information, and the data is written to or read from the storage device 70B, and the management format is based on the read data. And a central processing unit 70A.
[0083]
The central processing unit 70A compares the width of the planographic printing plate read from the production management computer 7, that is, the product width with the inspection width input from the control computer 52, and determines whether the inspection width is within the normal range. It also has a function of determining whether or not to display in the management format.
[0084]
The central computer 70 also controls the A surface laser beam scanning detection device 2, the B surface laser beam scanning detection device 4, the color streak detection device 12, the scratch detection device 14, and the gloss detection device 16 via the control computers 52 and 62. And a function of controlling the color detection device 18.
[0085]
1-3 Action of online inspection system
Hereinafter, the operation of the online surface inspection system 100 will be described.
[0086]
Data from the A-surface laser beam scanning detection device 2 and the B-surface laser beam scanning detection device 4 is processed in the gloss flaw data management unit 6 according to the following procedure.
[0087]
When a light reception signal is input to the defect signal processing device 50 from the laser light receiving unit 2B (4B) included in the A-surface laser light scanning detection device 2 and the B-surface laser light scanning detection device 4, the defect signal processing device 50 The A / D converter 50A performs A / D conversion on the photocurrent I of the received light signal, and then differentiates it in the differentiating circuit 50B to obtain a differentiated signal I ′.
[0088]
Since the wound surface of the glossy scratch S usually has a strong metallic luster as described above, the reflected light from which the laser beam from the laser beam irradiation unit 2A (4A) is reflected by the glossy scratch S is shown in FIG. Is strong. Therefore, when the laser light from the laser light irradiation unit 2A (4A) hits the glossy scratch S, the reflected light is received by the laser light receiving unit 2B (4B), and the photocurrent I increases abruptly. When passing through the glossy scratch S, the photocurrent I rapidly decreases.
[0089]
Therefore, also in the differential signal I ′ generated by the differentiating circuit 50B, the steep positive spike peak S1 corresponding to the rapid increase in the photocurrent I and the steep negative corresponding to the subsequent rapid decrease in the photocurrent. A spike-like peak S2 appears.
[0090]
Therefore, the differential signal I ′ generated by the differentiation circuit 50B is input to the comparison circuit 50C, and in the comparison circuit 50C, the presence or absence of spike-like peaks S1 and S2 and the height of the spike-like peak S1 are preset reference values i. When spike peaks S1 and S2 appear and the height of spike peaks S1 exceeds the reference value i, it is determined that there are gloss flaws S. As the data indicating the size of the glossy scratch S, the photocurrent I which is the peak value of the photocurrent I corresponding to the section from the spike-like peaks S1 to S2. _df Is output.
[0091]
When the spike-like peaks S1 and S2 are detected by the differentiating circuit 50B, and the comparison circuit 50C determines that there is a glossy scratch S, the light receiving position signal processing unit 50D detects the position when the spike-like peaks S1 and S2 are detected. Gloss defect position data L indicating the occurrence position of the gloss scratch S _df Output as.
[0092]
Photocurrent I output from comparison circuit 50C _df And gloss defect position data L input from the light receiving position signal processing unit 50D _df Is input to the defect determination unit 50E. The transport distance d of the planographic printing plate P input from the tachometer 2C (4C) _cv Are also appropriately A / D converted and input to the defect determination unit 50E.
[0093]
In the defect determination unit 50E, the photocurrent I _df And transport distance d _cv From the data, the depth, width and length of the glossy scratch S and the occurrence position along the transport direction a are obtained. Based on the relational expression set in advance with respect to the depth, width and length of the gloss flaw and the type of the gloss flaw (defects A to H (A surface) and defects a to h (B surface)), It is determined which of defects A to H and defects a to h correspond. Then, the determination result for the glossy scratch S and the gloss defect position data L _df Are input to the control computer 52 and the defect period determination computer 54 and displayed on the glossy flaw information display monitor 56.
[0094]
In the defect cycle determination computer 54, for example, the generation cycle of how many intervals the glossy scratch S determined to be the defect A by the defect determination unit 50E occurs along the transport direction a is obtained, and the generation The period is input to the control computer 52.
[0095]
The control computer 52 determines the determination result relating to the gloss flaw S and the gloss defect position data L input from the defect signal processing device 50. _df Then, defect information related to the glossy scratch S is formed from the generation period input from the defect period determination computer 54 and output to the overall control unit 10 via the signal relay device 9.
[0096]
The control computer 52 also determines the inspection width W in the A-surface laser light scanning detection device 2 and the B-surface laser light scanning detection device 4 based on the photocurrent I and the position data L input from the defect signal processing device 50. ₁ Ask for. Inspection width W ₁ FIG. 9 shows a procedure for obtaining.
[0097]
As shown in FIG. 9A, when the lithographic printing plate P is scanned along the width direction by the laser light from the laser light irradiation unit 2A (4A), until the laser light hits the lithographic printing plate P, Since the laser light travels straight without being reflected by anything, the amount of light received by the laser light receiving unit 2B (4B) is zero. Therefore, the photocurrent I input to the defect signal processing device 50 from the laser light receiving unit 2B (4B) is also zero.
[0098]
The laser beam starts to strike the lithographic printing plate P at position 1 and passes through the lithographic printing plate P at position 2.
[0099]
Therefore, when the laser beam passes through the position 1, the laser beam is reflected by the planographic printing plate P toward the laser beam receiving unit 2B (4B), and therefore in the laser beam receiving unit 2B (4B). The photocurrent I rises from 0 to a certain current value X. On the other hand, when the laser beam passes through the position 2, the laser beam reflected on the planographic printing plate P is not reflected until the laser beam is received by the laser beam receiving unit 2B (4B). From 0 to 0.
[0100]
Therefore, position 1 is the rising position of photocurrent I, and position 2 is the falling position of photocurrent I. The control computer 52 detects the rising position and the falling position by detecting the rising and falling of the photocurrent I. Then, as shown in FIG. 9B, position data L corresponding to the rising position. _rise And position data L corresponding to the falling position _drop From the rising position to the falling position, that is, the scanning width of the laser beam, in other words, the inspection width W ₁ Ask for.
[0101]
Inspection width W obtained in this way ₁ Is also input to the overall control unit 10 via the signal relay device 9.
[0102]
The defect signal processing device 50 further inputs the value of the applied voltage v applied to the laser light receiving unit 2B (4B) to the control computer 52 as data indicating the operating state of the laser light receiving unit 2B (4B). The control computer 52 inputs the value of the applied voltage v to the overall control unit 10.
[0103]
On the other hand, data from the color streak detection device 12, the scratch detection device 14, the gloss detection device 16, and the color detection device 18 is processed in the photosensitive surface defect data management unit 8 according to the following procedure.
[0104]
Hereinafter, the procedure will be described using the color streak detection device 12 as an example.
[0105]
When the received light voltage V in the CCD array 22A is input in time series from the CCD camera 22 included in the color streak detecting device 12 to the defect signal processing device 60, the received light voltage V is converted from an analog amount to a digital amount by the A / D converter 60A. Is converted to The received light voltage converted into the digital quantity is temporarily stored in the storage device 60B in association with the CCD position data L. Then, noise reduction processing is performed by the signal processing circuit 60C.
[0106]
The received light voltage V subjected to noise reduction processing by the signal processing circuit 60C is input to the comparator 60D.
[0107]
Therefore, when the lithographic printing plate on which the color streaks appear is photographed by the CCD camera 22, a light receiving voltage lower (in the case of dark colored streaks) or a higher light receiving voltage (in the case of light colored streaks) than that in the surroundings in the color streaks. Is output.
[0108]
Therefore, in the comparator 60D, the inputted light reception voltage V is converted into the upper limit voltage V inputted in advance to the comparator 60D. _max And lower limit voltage V _min In comparison with _max And lower limit voltage V _min If it is lower than that, it is determined that there is a color streak among the photosensitive surface defects, and the magnitude of the light reception voltage V is output as data indicating the degree of the color streak. Then, as the data indicating the position of the color stripe, the position data L of the CCD that receives the reflected light from the color stripe is output.
[0109]
The comparator 60D inputs the presence / absence of a color streak, the light reception voltage V in the color streak, and the position data L of the CCD that detects the color streak as defect information regarding the color streak.
[0110]
The control computer 62 determines from the position data L in which of the bands L1 to L15 of the planographic printing plate the color streak exists. Further, it is determined from the received light voltage V whether the color stripe corresponds to an excessive thickness portion where the thickness of the photosensitive layer is excessive or an excessive thickness portion where the thickness is excessively small, and the degree of the color stripe is further determined.
[0111]
The defect signal processing device 60 processes the received light voltage and the CCD position data from the scratch detection device 14, the gloss detection device 16, and the color detection device 18 according to the same procedure, and inputs them to the control computer 62. Based on the received light voltage and the CCD position data, the control computer 62 determines the presence or absence, size, and lithographic printing plate P of the photosensitive surface defects, such as scratches, spot-like light and darkness and scratches, and spot-like color unevenness and foreign matter. Determine the top position.
[0112]
In the control computer 62, based on the received light voltage V and the position data L in the color streak inspection device 12, the scratch detection device 14, the gloss detection device 16, and the color detection device 18, the inspection width in each inspection device. Inspection width W ₂ , W ₃ , W ₄ , And W ₅ It may have a function for obtaining.
[0113]
The control computer 62 displays the defect information and the inspection width information on the defect display display 64 and inputs the defect information and the inspection width to the overall control unit 10 via the signal relay device 9.
[0114]
As shown in FIG. 8, defect information about glossy scratches is input from the control computer 52 and defect information about photosensitive surface defects is input from the control computer 62 to the central computer 70 provided in the central control unit 10. When the lot information such as the lot number, width (product width), thickness, aluminum web manufacturer, product name, and roll allocation quantity is input from the production management computer 7 to the planographic printing plate P, the central processing unit 70A These pieces of information are stored in a predetermined area of the storage device 70B.
[0115]
The central processing unit 70 </ b> A also reads the defect information and lot information from the storage device 70 </ b> B according to various instructions input from the display 72, configures a predetermined format, and outputs it to the display 72. The display 72 displays various trend management screens in a graph and book format based on the format.
[0116]
For example, as shown in FIG. 10, the “trend management screen” displayed on the display 72 is located at the upper left part of the screen, and shows the occurrence of defects in the bands L1 to L15 on the A side of the planographic printing plate in a graph. “A-side tendency” zone, located in the upper right part of the screen, “B-side tendency” zone displaying the occurrence of defects in the bands L1 to L15 on the B side of the planographic printing plate, located in the lower left part of the screen , A detection lane that is a band in which a defect is detected in the A plane, an “A plane period” zone that indicates a detection position and a generation cycle of the defect in the detection lane, and a lower right portion of the screen, It comprises a detection lane and a “B-plane period” zone indicating the detection position and generation period of defects in the detection lane.
[0117]
Below the “A-plane cycle” zone and the “B-plane cycle” zone on the A-plane trend management screen, there are twelve function keys “F1: Trend management”, “F2: A” for switching display and the like. "Surface tendency", "F3: B surface tendency", "F4: SL width data", "F5: SL state", "F6: MIT-4 state", "F7: A surface period", "F8: B surface period""F9:Print","F10:Maintenance","F11: Outgoing jumbo", and "F12: End" are displayed. The trend management screen shown in FIG. 10 is displayed by clicking the “F1: Trend management” key.
[0118]
The type name of the planographic printing plate P in the lot information input from the production management computer 7 is displayed at the upper left corner of the trend management screen.
[0119]
When the “F2: A-side trend” key is clicked among the 12 function keys, the contents of the “A-side trend” zone on the “trend management” screen shown in FIG. Is displayed.
[0120]
As shown in FIG. 11, the “A-side tendency management” screen displays a graph showing the relationship between the transport distance of the planographic printing plate P and the number of occurrences of defects for each of the bands L1 to L15 on the A-side. In the graph, the vertical axis represents the transport distance, and the horizontal axis represents the number of defects generated. A black circle is displayed when there are no defects, and a red circle is displayed when there are two or more defects.
[0121]
Below the graph, “J” key, “K” key, “M” key, “N” key, “S” key, “T” key, “P” for designating the type of defect to be displayed. Key, “Q” key, “R” key, “V” key, “L” key, “Select all” key for displaying all the defects, and “Release key” for canceling the designation of the defects are displayed. Yes. Here, as shown in Table 1, J, K, M, N, S, T, P, Q, R, V, and L correspond to the following defects on the A plane.
[0122]
[Table 1]

[0123]
Of the defects, S, T, P, Q, R, V, and L are not shown in FIG. 11 and Table 1, but the detection sensitivity is NG level that should be excluded as a defective product. By setting the sensitivity s2 as the detection sensitivity, one of two sensitivities, that is, the sensitivity s1 at which only the defect is detected and the s2 at which an OK level defect that is not excluded as a defective product is detected can be selected. It is possible to perform trend management for managing the tendency of occurrence of defects from the obtained data.
[0124]
Below the “J” key to “L” key, 12 function keys “F1: Trend management” to “F12: End” are displayed as in the “Trend management” screen. The same applies to the screen described below.
[0125]
When the “F3: A-side tendency” key is clicked among the 12 function keys, the contents of the “B-side tendency” zone in the “trend management screen” shown in FIG. Is displayed.
[0126]
As shown in FIG. 12, on the “B-side tendency management” screen, a graph showing the relationship between the transport distance of the planographic printing plate P and the number of occurrences of defects is displayed for each of the bands L1 to L15 on the A-side. The graph is as described in the “A-side tendency management” screen.
[0127]
Below the graph, a “j” key, “k” key, “m” key, “n” key, “select all” key, and “cancel” key are displayed. “J” key, “k” key, “m” key, and “n” key are all keys for designating the type of defect to be displayed, and j, k, m, and n are shown in Table 2. Thus, it corresponds to the following defects on the B surface.
[0128]
[Table 2]

[0129]
When the “F7: A plane cycle” key is clicked among the 12 function keys, the content of the “A plane cycle” zone in the “trend management screen” shown in FIG. 10 is expanded and displayed as the A plane cycle determination result. Is done.
[0130]
The “A-plane cycle determination result” screen is a book-format screen. As shown in FIG. 13, from the left side, date, time, product type, lot number, aluminum width, detection width indicating defect detection position, defect There are provided 10 columns of a period indicating the generation period, a detection lane indicating a band in which a defect is detected, a corresponding roll diameter which is a roll diameter at a position where the defect is detected, and a corresponding roll number.
[0131]
When the “F8: B-side cycle” key is clicked, the content of the “B-side cycle” zone on the “trend management” screen shown in FIG. 10 is enlarged and displayed as the B-side cycle determination result.
[0132]
As shown in FIG. 14, the “B-plane cycle determination result” screen is also a book-format screen similar to the “A-plane cycle determination result” screen, and has the same columns.
[0133]
When the “F11: jumbo exit side” key is clicked, a “jumbo scratch setting” screen, which is a setting screen for jumbo scratches that are significant defects to be excluded as defective products, is displayed.
[0134]
As shown in FIG. 15, the jumbo scratch setting screen has an “A” key for inputting which of defects A, B, C, D, E, F, G, and H are designated as jumbo scratches. A “G” key, a “select all” key that is located below the “A” key to the “G” key and designates all defects A to G as jumbo scratches, and an “A” key to a “G” key And an “all cancel” key for canceling the input contents from the “select all” key.
[0135]
Here, the defects A, B, C, D, E, F, G, and H are all gloss scratches, and the meanings are as shown in Table 3.
[0136]
[Table 3]

[0137]
Below the “Select All” key and the “Release All” key, there will be an “Exit Side Setting” key that shifts to the “Exit Side Stop Print Setting” screen, which will be described later, and “Jumbo Press” A “jumbo setting” key for returning to the “scratch setting” screen is provided.
[0138]
When at least one of the “A” key to “G” key or the “select all” key is clicked on the “jumbo scratch setting” screen, the central processing unit 70A identifies the defect corresponding to the key as a jumbo scratch. Specify as.
[0139]
Next, when the jumbo dent is set, the defect signal processing device 50 causes the glossy flaw detected by the A-surface laser beam scanning detector 2 or the B-surface laser beam scanning detector 4 to be the jumbo dent. It is determined whether or not it is a designated defect. If the determination is Yes, an alarm output is input to the control computer 52.
[0140]
When an alarm output is input from the defect signal processing device 50, the control computer 52 activates an alarm lamp, an alarm buzzer, or the like through the external contact output unit 58.
[0141]
When the “exit side stop” key is clicked on the “jumbo press setting” screen, an “exit side stop print setting” screen is displayed.
[0142]
As shown in FIG. 16, any one of defects A, B, C, D, E, F, G, and H detected by the A-surface laser beam scanning detection device 2 is displayed on the “outside stop print setting” screen. “A” key to “H” key for setting whether to designate the transport stop line of the planographic printing plate P as the defect to be stopped, the color streak detection device 12, the scuff detection device 14, and the gloss “S” key to “L” for setting which of defects S, T, P, Q, R, V, and L detected by the detection device 16 and the color detection device 18 is designated as the outgoing stop defect ”Key and the defect a, b, c, d, e, f, g, and h detected by the B-surface laser beam scanning type detection device 4 are set as the exit stop defect. “a” key to “h” key are displayed.
[0143]
Here, the defects a, b, c, d, e, f, g, and h are the types of defects shown in Table 4 below.
[0144]
[Table 4]

[0145]
On the left side of the “A” key, an “SLA surface all selection” key for designating all the defects A to H as the outgoing stop defect is displayed. On the left side of the “S” key, the defects S, T , “P”, “Q”, “R”, “V”, and “L” are all displayed with the “Select all MIT” key for designating the outgoing stop defect. On the left side of the “a” key, a “SLB surface all selection” key for designating all of the defects a to h as the outgoing stop defect is displayed.
[0146]
Below the “a” key to “h” key, all of the defects A to H, defects S, T, P, Q, R, V, L, and defects a to h are designated as the exit stop defects. An “all select” key and an “all cancel” key provided adjacent to the “select all” key and canceling the designation are displayed.
[0147]
Below the “select all” key and the “cancel all” key, a “stop on exit” key and a “jumbo setting” key are displayed.
[0148]
When the “A” key to “H” key or the “a” key to “h” key is clicked on the output stop printing setting screen, the central processing unit 70A determines the defect input by the key as the output stop defect. Is specified.
[0149]
When the outgoing defect is input to the central processing unit 70A, the defect signal processing devices 50 and 60 are connected to the A-surface laser beam scanning detection device 2, the B-surface laser beam scanning detection device 4, the color streak detection device 12, and the like. It is determined whether or not the defect detected by the scratch detection device 14, the gloss detection device 16, and the color detection device 18 is included in the exit stop defect. When the determination is Yes, the control computer 52 or 62 inputs a stop signal to the transport line of the planographic printing plate P, and stops the transport line. At the same time, in response to an instruction from the central processing unit 70A, output stop printing is performed in the printer 74.
[0150]
When the “F4: SL width data” key is clicked, the central processing unit 70A detects the detection width W input from the control computer 52. ₁ The date, time, product name, lot number, and product width input from the production management computer 62 are input to the display 72 and displayed on the “SL7000 width detection data” screen shown in FIG. Here, “AL width” on the “F4: SL width data” screen indicates the product width.
[0151]
When, for example, black stripes are detected in the A-surface laser beam scanning detection device 2 and the B-surface laser beam scanning detection device 4, as shown in FIG. 9C, they are output from the laser light receiving unit 2 B (4 B). In some cases, the photocurrent I that falls almost suddenly drops to zero. Here, as described above, the control computer 52 detects the rising position and the falling position by detecting the rising and falling of the photocurrent I. Therefore, the control computer 52 may determine the position where the black stripe is detected as the falling position. Inspection width W based on the above judgment ₁ , The inspection width W ₁ Is much smaller than the actual product width W, as shown in FIG.
[0152]
Therefore, in the central processing unit 70A, the inspection width W obtained by the control computer 52 is determined. ₁ Is compared with the product width W input from the production management computer 7, and the inspection width W ₁ And the product width W are within a certain range, for example, within 4 mm, the inspection width W ₁ Is determined to be normal, and when the difference ΔW exceeds the range, the inspection width W ₁ Is determined to be abnormal, and the determination result is also displayed in the “determination” column of “comparison result” on the “F4: SL width data” screen.
[0153]
The operator looks at the screen to detect the detection width W. ₁ Is within the normal range, and the detection width W ₁ Is not within the normal range, the display 72 or the control computer 52 detects the detection width W ₁ Can be reset.
[0154]
When the “F5: SL state” key is clicked among the 12 function keys, the “SL7000 state display” screen is displayed.
[0155]
As shown in FIG. 18, the “SL7000 status display” screen has lot information such as date, time, product name, lot number, and aluminum width, A surface laser beam scanning detection device 2 and B surface laser beam scanning type. It is a book-type screen that displays the value of the applied voltage v in the detection device 4. The value of the applied voltage v is displayed in the “PMTE applied voltage” column.
[0156]
The operator looks at the SL7000 status display screen, and confirms whether or not an appropriate range of voltage is applied to the laser light receiving unit 2B (4B) and whether the difference in applied voltage for each light receiving element is not too large. You can know whether or not.
[0157]
Finally, when the “F6: MIT-4 status” key is clicked, the “MIT-4 status display” screen is displayed.
[0158]
As shown in FIG. 19, the “MIT-4 status display” screen displays the value of the voltage applied to the CCD camera in the color streak detection device 12, the scratch detection device 14, the gloss detection device 16, and the color detection device 18, that is, the value of the camera voltage. And a book-type screen that displays the light source setting values.
[0159]
The operator looks at the MIT-4 status display screen to determine whether or not the CCD cameras 22, 26, 34, and 38 are operating normally, and the set voltages of the light sources 20, 24, 32, and 36 are appropriate. It is possible to know whether or not.
[0160]
In the online surface inspection system according to the first embodiment, the operator determines in real time whether or not the inspection width is appropriately set in the A-surface laser beam scanning detection device 2 and the B-surface laser beam scanning detection device 4. Since it can be known, when a strip-like body in which an uninspected portion remains is generated, an appropriate measure such as resetting the inspection width can be taken before shipment as a product.
[0161]
Also, the types of defects detected by the A-surface laser beam scanning detection device 2, the B-surface laser beam scanning detection device 4, the color streak detection device 12, the scratch detection device 14, the gloss detection device 16, and the color detection device 18. Since the defect information such as the occurrence position and the occurrence cycle is displayed in association with the lot information of the planographic printing plate P, the operator can determine which type of defect in which lot of the planographic printing plate and how often. It can be easily ascertained whether it has occurred and the amount of defective products in the lot.
[0162]
Therefore, the operator can correct the production plan such as reallocating the aluminum web roll necessary to produce the lithographic printing plate of the lot in real time. Even if the yield of lithographic printing plates that can be shipped as is reduced, before the shortage occurs in the aluminum web, the shortage of aluminum web roll can be ordered. Therefore, even in the above case, it is prevented that the aluminum web is deficient and production is hindered.
[0163]
Further, even for a minute defect that does not need to be excluded as a defective product, the generated band, the occurrence frequency, and the occurrence position are displayed in a graph, so that the operator can easily grasp the occurrence tendency of the defect. Therefore, since it is possible to take measures before the defect reaches a serious defect such as an exit stop defect, the loss of the planographic printing plate P can be greatly reduced.
[0164]
In addition, the operation status of the A-surface laser beam scanning detection device 2, the B-surface laser beam scanning detection device 2, the color streak detection device 12, the scratch detection device 14, the gloss detection device 16, and the color detection device 18 is also displayed on the display 72. Therefore, when the number of defects detected is abnormally high, the operator may be due to an abnormality on the planographic printing plate P side or an abnormality on the defect detection means side such as the A-surface laser beam scanning type detection device 2. Can be easily determined.
[0165]
Since the defect information and the lot information are stored in the storage device 70B in the overall computer 70 in a state of being associated with each other, the relationship between the manufacturing conditions and the tendency of occurrence of defects can be easily organized and examined.
[0166]
【The invention's effect】
As described above, according to the present invention, an inspection system that can effectively prevent a strip-like body having an uninspected portion remaining from being shipped as a product by setting an inspection width narrower than the actual width of the strip-like body. Is provided.
[Brief description of the drawings]
FIG. 1 is a block diagram showing the configuration of an on-line surface inspection system that is an example of an inspection system according to the present invention and inspects a lithographic printing plate conveyed at a constant speed.
2 is a side A laser light scanning detection device, a surface B laser light scanning detection device, a color streak detection device, a scratch detection device, a gloss detection device, and the like included in the online surface inspection system shown in FIG. It is the schematic which shows arrangement | positioning of a color detection apparatus.
FIG. 3 is a perspective view showing a relative positional relationship between a laser beam irradiation unit and a laser beam receiving unit in the A-plane laser beam scanning detection device and the B-plane laser beam scanning detection device.
FIG. 4 is a perspective view showing a relative positional relationship among a CCD camera, a light source, an inspection roller, and a lithographic printing plate in the color streak detection device.
5 shows a state in which laser light applied to a planographic printing plate is received by a laser light receiving unit in the A-surface laser light scanning detection device and the B-surface laser light scanning detection device shown in FIG. 3; It is a schematic plan view shown.
FIG. 6 is a block diagram showing a configuration and a data flow of a defect signal processing device that processes data from the A-surface laser beam scanning detection device and the B-surface laser beam scanning detection device.
FIG. 7 is a block diagram showing a configuration and a data flow of a defect signal processing device that processes data from a color streak inspection device, a scratch detection device, a gloss detection device, and a color detection device.
FIG. 8 is a block diagram showing the configuration of the central computer 60 and the flow of information.
9 is a diagram illustrating an A surface laser beam scanning type detection device and a B surface laser beam scanning type detection device based on the photocurrent and position data input from the defect signal processing device in the online surface inspection system shown in FIG. 1; It is a graph which shows the procedure which calculates | requires the test | inspection width in an apparatus.
FIG. 10 is a plan view showing a trend management screen displayed on the display included in the online surface inspection system shown in FIG. 1;
FIG. 11 is a plan view showing a state where an A-side tendency management screen is displayed on the display.
FIG. 12 is a plan view showing a B surface tendency management screen displayed on the display.
FIG. 13 is a plan view showing a position A period determination result displayed on the display.
FIG. 14 is a plan view showing a B surface period determination result displayed on the display.
FIG. 15 is a plan view showing a state where a jumbo scratch setting screen, which is a setting screen for a jumbo scratch that is a significant defect to be eliminated as a defective product, is displayed on the display;
FIG. 16 is a plan view showing a display of an exit stop print setting screen for setting an exit stop defect, which is a significant defect that requires stopping the transportation of a lithographic printing plate, on the display; FIG.
FIG. 17 is a SL7000 detection width that displays the relationship between the inspection width and the aluminum width that is the actual width of the lithographic printing plate P in the A-side laser beam scanning detection device and the B-side laser beam scanning detection device; It is a top view which shows a data screen.
FIG. 18 is a plan view showing an SL7000 status display screen that displays the operation status of the A-plane laser beam scanning detection device and the B-plane laser beam scanning detection device.
FIG. 19 is a plan view showing a MIT-4 status display screen that displays the operation statuses of the color streak detection device, the scratch detection device, the gloss detection device, and the color detection device shown in FIG. 2;
[Explanation of symbols]
2 A-surface laser beam scanning detection device
4 B surface laser beam scanning type detection device
6 Glossy Scratch Data Management Department
7 Production management computer
8 Photosensitive surface defect data management department
9 Signal repeater
10 General Control Department
12 Color streak detection device
14 Scratch detection device
16 Gloss detection device
18 color detector
50 Defect signal processing device
52 Control computer
60 Defect signal processing device
62 Control computer
70 General computer
70A Central processing unit
70B storage device

Claims (7)

Width detecting means for measuring the width of the belt-shaped body conveyed in a certain direction;
An inspection system comprising: a width comparison unit that compares a detection width, which is a width of the belt-like body detected by the width detection unit, with a product width, which is an actual width of the belt-like body. Defect detection means for detecting a defect on the surface of the band by scanning the band conveyed in a certain direction in the width direction;
Defect information management means for collecting and managing defect information related to the type of defect detected by the defect detection means, the occurrence position, and the generation period;
Central information processing means for reading out the defect information from the defect information management means,
Display means for displaying defect information read by the central information processing means,
The width detection unit detects an inspection width for scanning the strip in the defect detection unit as the detection width,
The central information processing means includes the width comparison means, and the width comparison means compares the inspection width with the product width, and the difference between the inspection width and the product width is within a certain range. The inspection system according to claim 1, wherein the inspection width is determined to be normal, and the inspection width is determined to be abnormal when the difference exceeds the range. Comprising lot information management means in which lot information relating to the lot of the strip is stored;
The central information processing means reads the lot information from the lot information management means and manages the read lot information, the defect information read from the defect information management means, and the determination result for the inspection width in association with each other. Configure the format for
The inspection system according to claim 1, wherein the display unit displays a management format configured in the central information processing unit. The lot information stored in the lot information management means is information relating to the type of the strip, the lot number, the width, the thickness, and the roll allocation quantity that is the roll quantity of the base material of the strip. The inspection system according to any one of the above. The inspection system according to claim 1, comprising a plurality of the defect detection means. The defect detection means is an optical defect detection means comprising a light source for irradiating light on the surface of the belt-like body and a light receiving part for receiving reflected light from the surface of the belt-like body. The inspection system according to any one of the above. The inspection system according to claim 6, wherein the central information processing unit obtains the inspection width based on rising and falling of a received light waveform in a light receiving unit included in the optical defect detecting unit.

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