JP2004108948A - Function inspection device for mounted printed board - Google Patents

Function inspection device for mounted printed board Download PDF

Info

Publication number
JP2004108948A
JP2004108948A JP2002272306A JP2002272306A JP2004108948A JP 2004108948 A JP2004108948 A JP 2004108948A JP 2002272306 A JP2002272306 A JP 2002272306A JP 2002272306 A JP2002272306 A JP 2002272306A JP 2004108948 A JP2004108948 A JP 2004108948A
Authority
JP
Japan
Prior art keywords
connector
inspected
printed circuit
circuit board
mounted printed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002272306A
Other languages
Japanese (ja)
Inventor
Yoshihiro Otobe
乙部 義弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP2002272306A priority Critical patent/JP2004108948A/en
Publication of JP2004108948A publication Critical patent/JP2004108948A/en
Pending legal-status Critical Current

Links

Images

Abstract

<P>PROBLEM TO BE SOLVED: To provide a function inspection device for a mounted printed board, preventing, when joining the connector of the function inspecting device to the connector of the mounted printed board, poor connections of both the connectors and causing no breakage of the connectors during inspecting function. <P>SOLUTION: The function inspection device for the mounted printed board for giving a testing input/output signal to the connector 8 to be inspected of the mounted printed board 1 with which the other connector 7 is put in contact and inspecting whether the input/output signal works normal or not, comprises a guide block 5 having a first recessed portion 5a and mounted on an upper cover 4 as a movable plate for guiding the other connector 7 put in contact with the connector 8 to be inspected. <P>COPYRIGHT: (C)2004,JPO

Description

【0001】
【発明の属する技術分野】
本発明は、プリント基板に部品を実装した実装プリント基板の機能検査装置に関し、とくにコネクタを実装プリント基板上の被検査(検査すべき)コネクタに接合してテスト用の入力信号を与えるように構成された実装プリント基板の機能検査装置に関するものである。
【0002】
【従来の技術】
実装後のプリント基板については、この基板が仕様通りに機能するか否かをチェックするための機能検査が行われる。これは別名ファンクションテストと呼ばれるもので、コンタクトプローブを実装プリント基板のコネクタのリードに接触させて入出力信号を与え、前記コネクタの入出力信号が正常か否かを調べるものである。
【0003】
図4は従来の実装プリント基板の機能検査装置を示す概略図である。図4において、まず、実装プリント基板11を、位置決めピン12を有する置き台13上にセットした後、上方に配置された上蓋14を駆動手段によって実装プリント基板11に向って下降させる。
【0004】
これによって上蓋14に保持されたコンタクトプローブを実装プリント基板11の実装部品であるコネクタ17のリード部に接合させる。このようにしてコネクタ17に束線を介して入力信号を与え、その出力を調べることによって実装プリント基板の機能検査が行われる。
【0005】
【発明が解決しようとする課題】
しかしながら、近年実装プリント基板の高速・集約・高密度化によりリードを設けないコネクタが用いられることが多くなり、コンタクトプローブでの接触が困難となってきた。図4に示すように、相手側コネクタ17を上蓋14に固定し、被検査コネクタ18の接合により上記機能検査を行っている。
【0006】
上記従来の技術によれば、前述した通り、相手側コネクタ17を上蓋14に固定し、上蓋14の下降によって接合させているため、コネクタ17のプリント基板11上の実装位置のずれまたはねじれ等によって、コネクタ17の接触不良が発生し、機能検査の信頼性が損なわれる。また上述の実装位置のずれによってコネクタ17に予期しないストレスがかかり、それによって破損するという問題もあった。
【0007】
本発明の目的は、機能検査装置のコネクタを実装プリント基板のコネクタに接合させるにあたって、両者の接触不良を防ぎかつ機能検査中にコネクタが破損することのない実装プリント基板の機能検査装置を提供することにある。
【0008】
本発明の他の目的は、実装工程のミスによってコネクタが左右または前後に逆向きの状態でプリント基板に実装されている場合、機能検査の過程においてこれを発見することのできる実装プリント基板の機能検査装置を提供することにある。
【0009】
【課題を解決するための手段】
前記の課題を解決するために、請求項1記載の発明では、実装プリント基板上の検査すべきコネクタに、相手側コネクタを接触させてテスト用の入出力信号を与え、入出力信号が正常か否かを調べる実装プリント基板の機能検査装置において、第1の凹部を有するガイドブロックが、前記検査すべきコネクタに接触させられる前記相手側コネクタを案内するために可動板である上蓋に取り付けられている実装プリント基板の機能検査装置を最も主要な特徴とする。
【0010】
請求項2記載の発明では、請求項1記載の実装プリント基板の機能検査装置において、前記ガイドブロックの前記第1の凹部の下方に前記検査すべきコネクタの外形に対応する形状を有する第2の凹部が設けてあることを主要な特徴とする。
【0011】
【発明の実施の形態】
以下、図面により本発明の実施の形態を詳細に説明する。図1は本発明の実装プリント基板の機能検査装置の実施の形態の一部分を示す部分縦断面図である。本実施の形態において、実装プリント基板1は位置決めピン2によって置き台3上の所定位置に保持されている。置き台3の上方には可動板である上蓋4が配置され、この上蓋4の下面にはガイドブロック5がボルト6によって上下左右に可動状態で取り付けられている。
【0012】
ガイドブロック5の図示上面には第1の凹部5aが形成され、その底部として被検査コネクタ(検査すべきコネクタ)8の相手側コネクタ7が一体的に設けられている。ガイドブロック5の下端面、すなわち、第1の凹部5aの底部下方に第2の凹部5bが設けられ、第2の凹部5bの周壁は検査すべきコネクタ8の外縁に沿った形状をなしている。
【0013】
図2は図1の本発明の実装プリント基板の機能検査装置の実施の形態の動作を説明する部分縦断面図である。実装プリント基板1の機能検査を開始するにあたって、上方に位置する上蓋4を駆動手段(図示せず)によって実装プリント基板1に向って下降させる。
【0014】
図3はガイドブロックの第2の凹部の周部の形状を示す断面図である。ガイドブロック5の第2の凹部5bの周壁は被検査コネクタ8の外縁に沿った形状をなしている。
【0015】
それによってガイドブロック5が被検査コネクタ8の外縁に向って下降する。ガイドブロック5の下端が実装プリント基板1の表面に近づくと、被検査コネクタ8はガイドブロック5の第2の凹部5b内に収容される。
【0016】
このとき、実装プリント基板1の実装工程におけるミスで実装プリント基板1に対する被検査コネクタ8の実装位置が左右または前後方向に逆であった場合、すなわち逆付けの場合には、被検査コネクタ8をガイドブロック5の第2の凹部5bに収容することが不可能であり、したがって上蓋4の下降運動が妨げられる。これによって被検査コネクタ8の実装ミスを容易に発見することができる。
【0017】
上述の実装ミスがない場合には、ガイドブロック5の第2の凹部5bに被検査コネクタ8がスムーズに収容され、上蓋4が引き続き下降して被検査コネクタ8と接合する。
【0018】
すなわち、相手側コネクタ7と被検査コネクタ8との間の相対的位置ずれは、相手側コネクタ7がそれぞれ被検査コネクタ8に接触する前にガイドブロック5によって補正されるため、相手側コネクタ7の接合不良が発生することはない。
【0019】
上述した通り、本実施の形態によれば、被検査コネクタ8に多少の位置ずれがある場合でも、相手側コネクタ7に対して確実に接合させることができるため、実装プリント基板1の機能検査をスムーズに行うことが可能であり、またその検査結果は信頼性の高いものとなる。
【0020】
【発明の効果】
以上説明したように、請求項1によれば、検査すべきコネクタに接触させられる相手側コネクタを案内するための第1の凹所を有するガイドブロックが、上蓋に可動状態で取り付けられているので、実装プリント基板の機能検査装置の相手側コネクタを、実装プリント基板の被検査コネクタに対して確実に接合させることができるため、検査結果の信頼性が向上する。
【0021】
また、請求項2によれば、ガイドブロックの第1の凹部の下方に検査すべきコネクタの外形に対応する形状を有する第2の凹部が設けてあるので、実装プリント基板の機能検査中にコネクタが変形または破損する恐れがなく、さらに、実装プリント基板の機能検査の過程において実装部品の実装ミスを発見できるという利点がある。
【図面の簡単な説明】
【図1】本発明の実装プリント基板の機能検査装置の実施の形態の一部分を示す部分縦断面図である。
【図2】図1の本発明の実装プリント基板の機能検査装置の実施の形態の動作を説明する部分縦断面図である。
【図3】ガイドブロックの第2の凹部の周部の形状を示す断面図である。
【図4】従来の実装プリント基板の機能検査装置を示す概略図である。
【符号の説明】
1 実装プリント基板
5 ガイドブロック
4 上蓋(可動板)
5a 第1の凹部
5b 第2の凹部
7 相手側コネクタ
8 被検査コネクタ(検査すべきコネクタ)
[0001]
TECHNICAL FIELD OF THE INVENTION
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for testing a function of a mounted printed circuit board in which components are mounted on a printed circuit board, and in particular, is configured to provide a test input signal by joining a connector to a connector to be inspected (to be inspected) on the mounted printed circuit board. The present invention relates to a function inspection device for a mounted printed circuit board.
[0002]
[Prior art]
The printed circuit board after mounting is subjected to a function test for checking whether the printed circuit board functions as specified. This is also called a function test, in which a contact probe is brought into contact with a lead of a connector on a mounting printed board to give an input / output signal, and it is checked whether or not the input / output signal of the connector is normal.
[0003]
FIG. 4 is a schematic diagram showing a conventional function inspection device for a mounted printed circuit board. In FIG. 4, first, the printed circuit board 11 is set on the table 13 having the positioning pins 12, and then the upper lid 14 disposed above is lowered toward the printed circuit board 11 by driving means.
[0004]
As a result, the contact probe held by the upper lid 14 is joined to the lead portion of the connector 17 which is a component mounted on the printed circuit board 11. In this way, the input signal is supplied to the connector 17 via the bundled wire, and the output of the connector 17 is checked to perform a function test of the mounted printed circuit board.
[0005]
[Problems to be solved by the invention]
However, in recent years, high-speed, integrated, and high-density mounting printed circuit boards have led to the use of connectors without leads, which has made it difficult to make contact with a contact probe. As shown in FIG. 4, the mating connector 17 is fixed to the upper lid 14, and the above-described function test is performed by joining the connector 18 to be tested.
[0006]
According to the above-described conventional technique, as described above, the mating connector 17 is fixed to the upper cover 14 and is joined by lowering the upper cover 14, so that the mounting position of the connector 17 on the printed circuit board 11 is shifted or twisted. In addition, contact failure of the connector 17 occurs, and the reliability of the function test is impaired. In addition, there is also a problem that unexpected stress is applied to the connector 17 due to the above-described displacement of the mounting position, and the connector 17 is thereby damaged.
[0007]
SUMMARY OF THE INVENTION It is an object of the present invention to provide a function inspection apparatus for a mounted printed circuit board which prevents a contact failure between the connectors of the function inspection apparatus and the connector of the function inspection apparatus and prevents the connector from being damaged during the function inspection. It is in.
[0008]
Another object of the present invention is to provide a function of a mounted printed circuit board that can detect this during a function inspection process when a connector is mounted on a printed circuit board in a state of being turned right and left or front and back due to a mistake in a mounting process. An object of the present invention is to provide an inspection device.
[0009]
[Means for Solving the Problems]
In order to solve the above-mentioned problem, according to the first aspect of the present invention, an input / output signal for a test is given by bringing a mating connector into contact with a connector to be inspected on a mounting printed circuit board, and whether the input / output signal is normal or not. In the device for inspecting the function of a mounted printed circuit board for checking whether or not there is, a guide block having a first concave portion is attached to an upper lid which is a movable plate for guiding the mating connector brought into contact with the connector to be inspected. The most important feature is a functional inspection device for mounted printed circuit boards.
[0010]
According to a second aspect of the present invention, in the functional inspection apparatus for a mounted printed circuit board according to the first aspect, a second portion having a shape corresponding to an outer shape of the connector to be inspected is provided below the first concave portion of the guide block. The main feature is that a concave portion is provided.
[0011]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. FIG. 1 is a partial longitudinal sectional view showing a part of an embodiment of a function inspection device for a mounted printed board according to the present invention. In this embodiment, the mounting printed circuit board 1 is held at a predetermined position on a table 3 by positioning pins 2. An upper cover 4 which is a movable plate is disposed above the placing table 3, and a guide block 5 is attached to a lower surface of the upper cover 4 by bolts 6 so as to be movable vertically and horizontally.
[0012]
A first concave portion 5a is formed on the upper surface of the guide block 5 in the drawing, and a mating connector 7 of a connector to be inspected (connector to be inspected) 8 is integrally provided as a bottom thereof. A second recess 5b is provided at the lower end surface of the guide block 5, that is, below the bottom of the first recess 5a, and the peripheral wall of the second recess 5b has a shape along the outer edge of the connector 8 to be inspected. .
[0013]
FIG. 2 is a partial longitudinal sectional view for explaining the operation of the embodiment of the function inspection apparatus for a mounted printed circuit board of the present invention shown in FIG. To start the function test of the mounted printed circuit board 1, the upper cover 4 positioned above is lowered toward the mounted printed circuit board 1 by a driving unit (not shown).
[0014]
FIG. 3 is a cross-sectional view showing the shape of the periphery of the second concave portion of the guide block. The peripheral wall of the second concave portion 5b of the guide block 5 has a shape along the outer edge of the connector 8 to be inspected.
[0015]
Thereby, the guide block 5 descends toward the outer edge of the connector 8 to be inspected. When the lower end of the guide block 5 approaches the surface of the printed circuit board 1, the connector 8 to be inspected is accommodated in the second recess 5b of the guide block 5.
[0016]
At this time, if the mounting position of the connector 8 to be inspected with respect to the mounting printed board 1 is reversed in the left-right or front-rear direction due to a mistake in the mounting process of the mounting printed board 1, the connector 8 to be inspected is It is impossible to accommodate the guide block 5 in the second concave portion 5b, so that the lowering movement of the upper lid 4 is prevented. As a result, a mounting error of the connector 8 to be inspected can be easily found.
[0017]
When there is no mounting error described above, the connector 8 to be inspected is smoothly accommodated in the second concave portion 5b of the guide block 5, and the upper lid 4 is continuously lowered to join the connector 8 to be inspected.
[0018]
That is, since the relative displacement between the mating connector 7 and the connector 8 to be inspected is corrected by the guide block 5 before the mating connector 7 comes into contact with the connector 8 to be inspected, respectively. No joint failure occurs.
[0019]
As described above, according to the present embodiment, even when the connector 8 to be inspected has a slight displacement, the connector 8 can be securely joined to the mating connector 7. The inspection can be performed smoothly, and the inspection result is highly reliable.
[0020]
【The invention's effect】
As described above, according to the first aspect, the guide block having the first recess for guiding the mating connector brought into contact with the connector to be inspected is movably attached to the upper lid. Since the mating connector of the function inspection device for the mounted printed circuit board can be securely joined to the connector to be inspected on the mounted printed circuit board, the reliability of the inspection result is improved.
[0021]
According to the second aspect, the second recess having a shape corresponding to the outer shape of the connector to be inspected is provided below the first recess of the guide block. There is an advantage that there is no risk of deformation or breakage, and that a mounting error of a mounted component can be found in the course of a function inspection of a mounted printed circuit board.
[Brief description of the drawings]
FIG. 1 is a partial longitudinal sectional view showing a part of an embodiment of a function inspection apparatus for a mounted printed circuit board according to the present invention.
FIG. 2 is a partial longitudinal sectional view for explaining the operation of the embodiment of the function inspection apparatus for a mounted printed circuit board of the present invention in FIG. 1;
FIG. 3 is a sectional view showing a shape of a peripheral portion of a second concave portion of the guide block.
FIG. 4 is a schematic view showing a conventional function inspection device for a mounted printed circuit board.
[Explanation of symbols]
1 mounting printed circuit board 5 guide block 4 top cover (movable plate)
5a first concave portion 5b second concave portion 7 mating connector 8 connector to be inspected (connector to be inspected)

Claims (2)

実装プリント基板上の検査すべきコネクタに、相手側コネクタを接触させてテスト用の入出力信号を与え、入出力信号が正常か否かを調べる実装プリント基板の機能検査装置において、第1の凹部を有するガイドブロックが、前記検査すべきコネクタに接触させられる前記相手側コネクタを案内するために可動板である上蓋に取り付けられていることを特徴とする実装プリント基板の機能検査装置。In a function inspection apparatus for a mounted printed circuit board, a test connector input / output signal is provided by bringing a mating connector into contact with a connector to be inspected on the mounted printed circuit board to check whether the input / output signal is normal. Wherein the guide block having: is attached to an upper lid which is a movable plate for guiding the mating connector brought into contact with the connector to be inspected. 前記ガイドブロックの前記第1の凹部の下方に前記検査すべきコネクタの外形に対応する形状を有する第2の凹部が設けてあることを特徴とする請求項1記載の実装プリント基板の機能検査装置。2. A function inspection apparatus for a mounted printed circuit board according to claim 1, wherein a second recess having a shape corresponding to the outer shape of the connector to be inspected is provided below the first recess of the guide block. .
JP2002272306A 2002-09-18 2002-09-18 Function inspection device for mounted printed board Pending JP2004108948A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002272306A JP2004108948A (en) 2002-09-18 2002-09-18 Function inspection device for mounted printed board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002272306A JP2004108948A (en) 2002-09-18 2002-09-18 Function inspection device for mounted printed board

Publications (1)

Publication Number Publication Date
JP2004108948A true JP2004108948A (en) 2004-04-08

Family

ID=32269356

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002272306A Pending JP2004108948A (en) 2002-09-18 2002-09-18 Function inspection device for mounted printed board

Country Status (1)

Country Link
JP (1) JP2004108948A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006105644A (en) * 2004-10-01 2006-04-20 Enplas Corp Socket for electric component
KR101529265B1 (en) * 2014-04-07 2015-06-17 (주) 루켄테크놀러지스 Inspecting apparatus for electronic device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006105644A (en) * 2004-10-01 2006-04-20 Enplas Corp Socket for electric component
JP4498874B2 (en) * 2004-10-01 2010-07-07 株式会社エンプラス Socket for electrical parts
KR101529265B1 (en) * 2014-04-07 2015-06-17 (주) 루켄테크놀러지스 Inspecting apparatus for electronic device

Similar Documents

Publication Publication Date Title
KR20060108426A (en) Probe unit for inspecting liquid crytal display panel
US7495464B2 (en) Inspection device of a semiconductor device
KR101186204B1 (en) Test apparatus for Flexible Printed Circuit Board
KR200488774Y1 (en) Apparatus for inspecting display panel
JP2004108948A (en) Function inspection device for mounted printed board
KR101000456B1 (en) Probe unit with easy maintenance
JP2002365310A (en) Vertical-type probe card
JP2001337050A (en) Method and apparatus for inspecting printed board
JPH05302938A (en) Inspection jig for printed wiring board
JP2805551B2 (en) Functional inspection equipment for mounted printed circuit boards
JP3693353B2 (en) Electrical inspection machine for printed wiring boards
JP3224519B2 (en) Wafer measuring jig, test head device and wafer measuring device
JPH07104383B2 (en) Printed wiring board pattern inspection method
KR200417528Y1 (en) PCB electrode plate
JP4282083B2 (en) Microcrack inspection method and apparatus
TWM641059U (en) Chip testing device
KR980010329A (en) Flow panel inspection device of vehicle
JPS6331391Y2 (en)
JPH05297019A (en) Inspection tool for printed wiring board
KR20220108653A (en) Manufacture method of surface mount typed connecter and manufacture apparatus of the surface mount typed connecter
CN114402207A (en) Inspection jig
JP2001133515A (en) Test jig for semiconductor device
JPH0729784U (en) Contact confirmation type socket
TW202326162A (en) Chip testing method
JPH07311242A (en) Test head part of in-circuit tester