JP2004077238A - Characteristic measuring device of electronic component - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a characteristic measuring device capable of certainly cleaning dirt of a spherical measuring terminal contacting with an external electrode of a chip-type electronic component and measuring an electric characteristic of the chip-type electronic component always without error. <P>SOLUTION: The device contacts with the external electrode 66 of a chip-type capacitor 65 intermittently conveyed to a measuring position B and measures the electric characteristic. The device has a measuring unit 10 where the spherical measuring terminal 11 is rotatably held at the tip of a holder 15, and the holder 15 is vertically movably mounted to a supporting member 20. A through hole is disposed in an axial center of the holder 15, and gas such as compressed air is jetted to the measuring terminal 11 through the through hole to clean the surface of the measuring terminal 11. <P>COPYRIGHT: (C)2004,JPO

Description

[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a device for measuring the characteristics of chip-type electronic components, and more particularly to a device for automatically measuring the electrical characteristics of chip-type electronic components such as capacitors, coils, and high-frequency composite components.
[0002]
[Prior art and problems]
Generally, electronic components such as capacitors and chip coils are subjected to an inspection process before shipment. In the inspection step, for example, in the case of a capacitor, electrical characteristics such as capacitance and insulation resistance are measured, and only non-defective products are sorted and shipped based on the measurement result. This type of inspection process must be efficiently performed to handle a large number of electronic components.
[0003]
Conventionally, for example, in the inspection process of a chip-type capacitor, a characteristic measuring device shown in FIG. 4 has been used. This characteristic measuring device generally includes a turntable 50, a parts feeder 60, a capacitance measuring device 70 (hereinafter, referred to as a C measuring device), an insulation resistance measuring device 75 (hereinafter, referred to as an IR measuring device). , A take-out device (not shown), and a controller 80 for controlling the entire device.
[0004]
The turntable 50 is provided with holding portions 51 for holding chip capacitors one by one on the periphery thereof at equal intervals, and can be intermittently driven to rotate in the direction of arrow a. That is, the turntable 50 constitutes a circulating transport path that holds the capacitors one by one in the holding unit 51 and intermittently transports the capacitors in the direction of the arrow a. The parts feeder 60 supplies the capacitors to the holding unit 51 one by one at the supply position A. The C measuring device 70 measures the capacitance of the capacitor at the measurement position B. The IR measuring device 75 measures the insulation resistance of the capacitor at the measurement position C.
[0005]
Since the measurement of the insulation resistance requires time to perform each of charging, measuring, and discharging, for example, in the apparatus of FIG. 4, the measuring position C is set to an area where 27 capacitors can be measured at one time, The rotation of the table 50 is stopped, and the IR measurement is simultaneously performed on the 27 capacitors. Although the take-out device is not shown in the drawing, at the take-out position D, the measured capacitors are selectively taken out as non-defective products and defective products.
[0006]
In the characteristic measuring device having the above configuration, the capacitors are supplied one by one to the holding unit 51 at the supply position A and are intermittently conveyed. First, the capacitance is measured at the measurement position B, and the capacitance is measured at the measurement position C. Conveyed sequentially. When 27 capacitors are aligned at the measurement position C, the rotation of the turntable 50 is stopped, and the insulation resistance of 27 capacitors is measured at once.
[0007]
Next, while the turntable 50 is again intermittently rotated, the measured capacitors are selectively removed one by one at the removal position D. At this time, new capacitors are supplied one by one from the parts feeder 60, and are conveyed to the capacitance measurement position B and the insulation resistance measurement position C described above.
[0008]
As a measurement unit of the C measuring device 70 or the IR measuring device 75, for example, a test probe disclosed in Japanese Patent Application Laid-Open No. 8-338852 is known. In this test probe, a spherical measuring terminal is rotatably held at the tip of a shaft made of a cylindrical body, and a lubricant such as grease is filled from the rear end of the shaft so that the measuring terminal rotates smoothly. It was done.
[0009]
However, in the test probe, since the lubricant is used, foreign matter mixed in the lubricant adheres to the measurement terminal, and dust in the measurement chamber or dust adhered to the capacitor which is an object to be measured is applied to the measurement terminal. There is a problem in that the transfer is transferred and the contamination of the measuring terminal due to foreign matter or dust cannot be cleaned. If such dirt accumulates on the measuring terminal, a poor contact between the measuring terminal and the external electrode of the capacitor occurs, causing an error in the measured value of the electrical characteristics.
[0010]
Therefore, an object of the present invention is to provide a characteristic measuring device which can surely clean dirt on a spherical measuring terminal which comes into contact with an external electrode of a chip-type electronic component and can always measure the electrical characteristics of the chip-type electronic component without error. Is to do.
[0011]
Means and Action for Solving the Problems
In order to achieve the above object, a characteristic measuring device according to the present invention is a device for measuring an electrical characteristic of a chip-type electronic component, and is in contact with an external electrode of the chip-type electronic component to be electrically connected. A spherical measuring terminal, a holder for rotatably holding the measuring terminal, and gas cleaning means for supplying a cleaning gas to the measuring terminal through the holder to clean the measuring terminal. And
[0012]
In the characteristic measuring device according to the present invention having the above configuration, since the lubricant such as grease is not supplied to the rotatable spherical measuring terminal, foreign matter in the lubricant does not adhere, The supply of the cleaning gas to the measuring terminal removes dust and the like from the surface of the measuring terminal. Therefore, the surface of the measurement terminal is kept clean at all times, and the electrical characteristics of the chip-type electronic component can be measured without errors. When a filter is used for the cleaning gas, unlike a lubricant, minute foreign matter and dust can be surely removed in advance.
[0013]
It is preferable that the cleaning gas is supplied from the rear end thereof to the inside of the holder, either of air, an antioxidant gas, or an inert gas. That is, the supply of the cleaning gas may be turned off at the time of measurement, or may be turned on at all times during operation of the apparatus including non-measurement.
[0014]
In the characteristic measuring device according to the present invention, the holder can be made of a conductive material that functions as an electrically conductive relay. In this case, the electric signal passes from the power supply circuit to the external electrode of the chip-type electronic component via the holder and the measuring terminal, and the measuring signal passes to the measuring circuit in a reverse flow.
[0015]
Further, it is preferable that the holder is supported by a support member via a spring member so that the measurement terminal can be elastically pressed against an external electrode of the chip-type electronic component. Good contact between the measurement terminal and the external electrode can be maintained.
[0016]
Further, a pair of measurement units each including the measurement terminal and the holder may be installed to face each other with the conveyance path of the chip-type electronic component interposed therebetween, or may be juxtaposed on the conveyance path of the chip-type electronic component. You may.
[0017]
Further, the diameter of the measuring terminal is preferably 0.2 to 0.5 mm in the present situation where the chip-type electronic component which is not measured is downsized.
[0018]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, an embodiment of an electronic component characteristic measuring device according to the present invention will be described with reference to the accompanying drawings.
[0019]
(Refer to the first embodiment, FIGS. 1 and 2)
As shown in FIG. 1, the characteristic measuring device according to the first embodiment generally includes a pair of measuring units 10, a measuring device 30, and a gas supply device 40. The pair of measurement units 10 are vertically opposed to each other across a transport path of the condenser 65 held by the holding portion 51 of the turntable 50 shown in FIG. 4 (the circumferential direction of the turntable 50 shown by an arrow a in FIG. 1). For example, it is installed at a capacitance measurement position B.
[0020]
Each measuring unit 10 includes a spherical measuring terminal 11, a holder 15 that rotatably holds the measuring terminal 11 at its tip, and a support member 20 that elastically supports the holder 15 so as to be vertically movable. Have been.
[0021]
The measuring terminal 11 is made of a conductive material (for example, made of steel). The holder 15 is also made of a conductive material (for example, made of brass), and is connected to the measuring instrument 30 via a lead wire 31.
[0022]
As shown in FIG. 2, the holder 15 is a cylindrical body having a through hole 16 at an axis portion, and has a holding space 17 for holding the spherical measuring terminal 11 at a tip portion. The holding space 17 includes a seat surface 17a on the back side and a seat member 17b on the distal end side, and the seat surface 17a and the seat member 17b are in contact with the measuring terminal 11. The measurement terminal 11 is slidably held in any direction so as to be rotatable, and a part of the measurement terminal 11 is held in a state of protruding outside from the tip of the holder 15.
[0023]
Returning to FIG. 1 again, the through hole 16 of the holder 15 is connected to the gas supply device 40 via the supply pipe 41 at the rear end. The gas supply device 40 supplies clean compressed air to the through hole 16 of the holder 15 via the pipe 41, and the compressed air is jetted into the holding space 17. Then, a minute gap is generated between the rear seating surface 17a, the front seating member 17b, and the measuring terminal 11, whereby foreign matter such as dust is removed from between the seating member 17b and the measuring terminal 11. It is discharged outside, and the surface of the measuring terminal 11 is cleaned. Even if the minute gap described above does not occur, the foreign matter is discharged to the outside by the spherical measurement terminal 11 sliding and rotating.
[0024]
On the other hand, the holder 15 is supported by a support member 20 so as to be vertically movable at a fixed position. That is, the holder 15 is inserted into the hole 22 of the horizontal bar 21 of the support member 20 and can move up and down. Also, the vertical bar 23 may be configured to guide the holder 15 in the vertical direction.
[0025]
The holder 15 is elastically urged downward in the upper unit 10 and elastically urged upward in the lower unit 10 by a coil spring 24 wound around its shaft. Have been. A stopper 18 is attached to the rear end of the holder 15, and the stopper 18 determines the lower limit position of the holder 15 in the upper unit 10, and the upper limit position of the holder 15 in the lower unit 10. I can decide.
[0026]
That is, the lower limit position and the upper limit position of the measurement terminals 11 of the measurement units 10 arranged vertically are determined by the stopper 18, and the pair of measurement terminals 11 are vertically It comes into contact elastically from the direction.
[0027]
The capacitance of the capacitor 65 is set in this state (see FIG. 1). The measuring device 30 has a built-in power supply circuit and measuring circuit (not shown), and an electric signal passes from the power supply circuit to the external electrode 66 of the capacitor 65 via the lead wire 31, the holder 15, and the measuring terminal 11. The measurement signal is transmitted from the external electrode 66 to the measurement circuit via the measurement terminal 11, the holder 15, and the lead wire 31.
[0028]
In the first embodiment, while the condenser is conveyed from the measurement position B to the next step and the next condenser is conveyed (when not measuring), the gas supply device 40 is turned on and the compressed air is supplied to the holder 15. The surface of the measuring terminal 11 is cleaned by the supply of the air to the through hole 16 and the ejection of the compressed air to the measuring terminal 11, so that the measuring terminal 11 is always kept clean. In addition, in the first embodiment, since lubricant such as grease is not supplied to the rotatable measurement terminal 11 unlike the related art, there is no possibility that foreign matter in the lubricant adheres.
[0029]
By the way, in recent years, chip-type capacitors, which are non-measurement objects, have been reduced in size, and their sizes are often prisms of 1.6 × 0.8 mm, 1.0 × 0.5 mm, and 0.6 × 0.3 mm. . In view of such a current situation, the diameter of the measuring terminal 11 is, for example, preferably 0.2 to 0.5 mm.
[0030]
(Second embodiment, see FIG. 3)
As shown in FIG. 3, the characteristic measuring device according to the second embodiment has a pair of measuring units 10 arranged side by side on a transport path of a condenser 65 held by a holding portion 51 of a turntable 50. In this case, the measuring terminal 11 of each measuring unit 10 elastically contacts the pair of external electrodes 66 of the capacitor 65 conveyed to the measuring position B from above to measure the capacitance.
[0031]
The configuration and operation of each measurement unit 10, measuring device 30, and gas supply device 40 are as described in the first embodiment. In FIG. 3, the same members as those in FIG. The explanation given above is omitted.
[0032]
(Other embodiments)
The electronic component characteristic measuring device according to the present invention is not limited to the above-described embodiment, but can be variously modified within the scope of the gist.
[0033]
In particular, the configuration of the holder for rotatably holding the spherical measurement terminal and the configuration of the support member are arbitrary, and the gas supply device may have any configuration.
[0034]
Further, the characteristic measuring device according to the present invention can be used for measuring not only the capacitance but also the insulation resistance of the chip type capacitor. The device under test may be a chip-type coil, a chip-type common mode choke coil, a high-frequency composite component, or the like, in addition to the chip-type capacitor. In the case of a chip coil, the direct current resistance (Rdc) and / or the inductance are measured. In the case of a common mode choke coil, DC resistance (Rdc), inductance and / or insulation resistance are measured. In the case of a high-frequency composite component, the frequency characteristics of the circuit are to be measured. The number of measurement terminals may be two or more in accordance with the external electrodes of the chip-type electronic component.
[0035]
【The invention's effect】
As is clear from the above description, according to the present invention, the surface of the spherical measuring terminal is cleaned by the ejection of the cleaning gas, and the electrical characteristics of the chip-type electronic component can always be measured without errors.
[Brief description of the drawings]
FIG. 1 is an elevation view showing a first embodiment of a characteristic measuring device according to the present invention.
FIG. 2 is a sectional view of a main part of the first embodiment.
FIG. 3 is an elevation view showing a second embodiment of the characteristic measuring device according to the present invention.
FIG. 4 is a schematic explanatory view showing an example of a conventional characteristic measuring device.
[Explanation of symbols]
Reference Signs List 10 measuring unit 11 measuring terminal 15 holder 17 measuring terminal holding space 20 support member 24 coil spring 30 measuring device 40 gas supply device 50 turntable 65 chip capacitor 66 external electrode

Claims (9)

An apparatus for measuring electrical characteristics of a chip-type electronic component,
A spherical measuring terminal that contacts and electrically conducts the external electrode of the chip-type electronic component;
A holder for rotatably holding the measurement terminal,
Gas cleaning means for supplying a cleaning gas to the measurement terminal through the holder to clean the measurement terminal,
A characteristic measuring device for an electronic component, comprising: The device for measuring characteristics of an electronic component according to claim 1, wherein the cleaning gas is one of air, an antioxidant gas, and an inert gas. 3. The characteristic measuring apparatus for an electronic component according to claim 1, wherein the cleaning gas is supplied into the holder from a rear end thereof. 4. The characteristic measuring device for an electronic component according to claim 1, wherein the cleaning gas is supplied at least at the time of non-measurement. The device according to claim 1, wherein the holder is made of a conductive material that functions as an electrically conductive relay. 6. The electronic component according to claim 1, wherein the holder is supported by a support member via a spring member so that the measurement terminal can be elastically pressed against an external electrode of the chip-type electronic component. Characteristic measuring device. The measurement terminal, a pair of measurement units provided with a holder, is installed facing the chip-type electronic component transport path sandwiched, and that the measurement terminal contacts the external electrode of the chip-type electronic component, respectively. The characteristic measuring device for an electronic component according to any one of claims 1 to 6, wherein: A pair of measurement units each including the measurement terminal and the holder are juxtaposed on a transport path of the chip-type electronic component, and the measurement terminals respectively contact external electrodes of the chip-type electronic component. The characteristic measuring device for an electronic component according to claim 1. 9. The characteristic measuring apparatus according to claim 1, wherein the measuring terminal has a diameter of 0.2 to 0.5 mm.

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