JP6048998B1 - Electronic component inspection equipment - Google Patents

Abstract

An electronic component inspection apparatus capable of bringing a plurality of probe pins into contact with a small electronic component without contact with other probe pins. In an electronic component inspection apparatus (10) for inspecting electrical characteristics of an electronic component (W) provided with external electrodes (E1, E2) having a flat surface (F), the axis is obliquely arranged with respect to the flat surface (F). A plurality of probe pins 11 to 14 whose tips are in contact with the flat surface F are provided, and the tips of the probe pins 11 to 14 approach each other in a state of being arranged in parallel with the flat surface F and come into surface contact with the flat surface F. A contact surface 38 is provided. [Selection] Figure 1

Description

The present invention relates to an electronic component inspection apparatus for inspecting electrical characteristics of electronic components.

The electrical characteristics of the electronic component can be inspected by bringing a probe into contact with the electronic component and applying a voltage to the electronic component. There are various types of probes, and specific examples of inspecting electronic components using rod-shaped probe pins are described in Patent Documents 1 and 2. Patent Documents 1 and 2 describe that tips of a plurality of probe pins are brought into contact with connection terminals and the like of electronic components. Each probe pin needs to be non-contact with other probe pins, and in the examples described in Patent Documents 1 and 2, a plurality of probe pins are arranged in parallel in a state of being spaced apart by a member such as an insulating substrate. Has been.

JP 2003-215210 A Japanese Patent Laying-Open No. 2015-105834

By the way, in recent years, electronic components have been downsized. Therefore, when the electronic component to be inspected is small, depending on the size, there is a problem that a plurality of probe pins cannot be arranged in parallel in a non-contact state with other probe pins.
The present invention has been made in view of such circumstances, and an object thereof is to provide an electronic component inspection apparatus capable of bringing a plurality of probe pins into contact with small electronic components in a non-contact state with other probe pins. .

The electronic component inspection apparatus according to the present invention that meets the above-described object is an electronic component inspection apparatus that inspects the electrical characteristics of an electronic component provided with an external electrode having a flat surface. A plurality of probe pins whose tip contact surfaces are in contact with the flat surface from below and the electronic component supported and lowered so that the electronic component approaches the probe pins, and the flat surface Each of the probe pins , and a stop mechanism for stopping the lowering chuck. The probe pins are fixed on the base side and the front side advances and retreats with respect to the base side. The abutting surface approaches and comes into surface contact with the flat surface in a state of being arranged parallel to the flat surface, and the chuck places the electronic component on the abutting surface of each probe pin. The place where the surface contacts By a predetermined distance lowered from a predetermined contact predetermined position as the stop mechanism, when the load generated in the chuck exceeds a predetermined value, stopping said chuck that is lowered the electronic component from the contact position scheduled .

In the electronic component inspection apparatus according to the present invention, a plurality of through holes are formed, which are arranged at positions having a distance to the electronic component in contact with the contact surface, and through which the front sides of the plurality of probe pins are respectively inserted. It is preferable to further include a pin support member.

In the electronic component inspection apparatus according to the present invention, it is preferable that each probe pin advances and retracts with respect to the base side in a state where the front side is inserted through each through hole of the pin support member.

In the electronic component inspection apparatus according to the present invention, it is preferable that the electronic component inspection device further includes a position correction mechanism that adjusts the position of the electronic component with respect to the chuck before the contact surface contacts the flat surface.

In the electronic component inspection apparatus according to the present invention, it is preferable that a guide member for guiding the electronic component approaching the probe pin to a predetermined position is attached to the pin support member.

In the electronic component inspection apparatus according to the present invention, the interval between the probe pins is preferably wider between the base sides than between the front sides.

In the electronic component inspection apparatus according to the present invention, an imaging unit that images the flat surface that is in contact with the contact surface (that is, an electronic component that has been inspected for electrical characteristics), and an image captured by the imaging unit. It is preferable to further include an appearance inspection unit for inspecting the appearance of the flat surface.

In the electronic component inspection apparatus according to the present invention, it is preferable that each probe pin has a contact surface that is non-perpendicular to an axis of the probe pin.

The electronic component inspection apparatus according to the present invention includes a plurality of probe pins whose tips are in contact with the flat surface in a state where the shaft center is arranged obliquely with respect to the flat surface. Compared to the above, there is no restriction on the arrangement of the probe pins, and each probe pin can be arranged in a non-contact state with respect to other probe pins even for a small electronic component. In addition, since a contact surface is provided at the tip of each probe pin so as to approach and come into surface contact with the flat surface of the external electrode of the electronic component, the unit area of the external electrode is reduced. This burden can be suppressed and the probe pin can be brought into contact with the external electrode.

It is a front view of the electrical measurement means of the electronic component inspection apparatus which concerns on one embodiment of this invention. It is a side view of the electric measurement means of the electronic component inspection apparatus. It is a partially omitted plan view of the same electronic component inspection apparatus. It is explanatory drawing which shows the state by which the chuck | zipper was distribute | arranged to the primary stop position. It is description which shows the state by which the electronic component was distribute | arranged to the contact scheduled position.

Next, embodiments of the present invention will be described with reference to the accompanying drawings for understanding of the present invention.
As shown in FIGS. 1 to 3, an electronic component inspection apparatus 10 according to an embodiment of the present invention includes a plurality of probe pins 11 to 14 whose tips contact with external electrodes E1 and E2 of an electronic component W, respectively. Thus, the electrical property of the electronic component W is inspected. Details will be described below.

As shown in FIGS. 1 and 2, the electronic component W to be inspected for electric characteristics has a rectangular parallelepiped shape (including a cubic shape), and two external electrodes E1 and E2 arranged at intervals are provided on the bottom surface (that is, One side). The long side length of the bottom surface of the electronic component W is not less than 0.2 mm and not more than 1.0 mm, and is 0.6 mm in the present embodiment.
Each of the external electrodes E1 and E2 has a flat surface F on the lower side.

As shown in FIGS. 1 to 3, the electronic component inspection apparatus 10 includes a circular rotary table 16 to which a plurality of chucks 15 are attached so as to be movable up and down, and a plurality of pressing means 17 that respectively press down the chucks 15.
As shown in FIG. 3, the rotary table 16 is horizontally arranged, and a rotary shaft 18 arranged in the vertical direction is connected to the center, and a driving force is applied from a servo motor (not shown) via the rotary shaft 18 to be intermittently predetermined. Rotate the angle. In the present embodiment, the turntable 16 rotates 30 ° by one rotation operation.
The chucks 15 that are long in the vertical direction are provided at equal intervals along the circumferential direction on the outer peripheral portion of the rotary table 16, and as shown in FIGS. 1 and 2, the upper part of the electronic component W is adsorbed by vacuum pressure. Support W.

The chuck 15 is attached to the rotary table 16 at equal intervals while being urged upward by an elastic body (not shown), and the rotary table 16 is moved intermittently and temporarily stopped by intermittent rotation of the rotary table 16. repeat.
The electronic component W is supported by the chuck 15, and the flat surfaces F of the external electricity E <b> 1 and E <b> 2 are horizontally arranged, and moves together with the chuck 15 as the rotary table 16 rotates.

As shown in FIGS. 1 and 2, the pressing means 17 is provided above the rotary table 16 at the primary stop position of the chuck 15. In FIG. 3, the pressing means 17 is not shown.
The pressing means 17 includes a lifting piece 20 attached to the guide portion 19 so as to be movable up and down, and a drive source (servo motor in this embodiment) 21 for raising and lowering the lifting piece 20. The elevating piece 20 comes into contact with the chuck 15 by descending and pushes down the electronic component W supported by the chuck 15 together with the chuck 15.
When the rotary table 16 rotates, as shown in FIG. 4, the lifting piece 20 is disposed at the uppermost position and is in a non-contact state with the chuck 15 disposed at the primary stop position. Therefore, the chuck 15 is disposed at the uppermost position when disposed at the primary stop position.

In the vicinity of the turntable 16, as shown in FIG. 3, the position of the electronic component W with respect to the chuck 15 and the ball feeder 22 for supplying the electronic component W to the chuck 15 are adjusted in order along the rotation direction of the turntable 16. Position correction mechanism 23, marking unit 24 for marking electronic component W with a laser, electrical measuring means 25 for measuring the electrical characteristics of electronic component W, imaging means 26 and 27 for imaging the appearance of electronic component W, and electronic component W as a tape And a sorter 29 for discharging the electronic component W in which an abnormality is found as a defective product. In FIG. 3, the description of the chuck 15 above the taping unit 28 is omitted.

The position correction mechanism 23 receives the electronic component W supported by the chuck 15 from the chuck 15 and places the electronic component W at a predetermined position by a jig (not shown). The chuck 15 acquires the electronic component W arranged at a predetermined position from the position correction mechanism 23 and moves to the vicinity of the marking unit 24 together with the electronic component W by the rotation operation of the rotary table 16. The electronic component W disposed in the vicinity of the marking unit 24 is subjected to the marking process by the marking unit 24 and is then disposed in the vicinity of the electrical measuring means 25 by the rotation operation of the rotary table 16.

As shown in FIGS. 1 and 2, the electric measuring means 25 is provided below the electronic component W supported by the chuck 15 that has been temporarily stopped. In the following description, it is assumed that the electronic component W is supported by the chuck 15 and is located above the electric measuring means 25 .
The electric measuring means 25 includes a plurality of (four in the present embodiment) rod-like probe pins 11 to 14 whose base side is attached to the base body 30 and a pin support member 31 into which the front side of the probe pins 11 to 14 is inserted. ing.

The probe pins 11 to 14 are provided so that their tips have the same height, and each has a long base portion 32 fixed to the base member 30 on the base side, and is attached to the long base portion 32 on the front side so as to be able to advance and retreat. The pin portion 33 is provided. In the probe pins 11 to 14, the long base portion 32 is thicker than the pin portion 33, and the pin portion 33 is biased in the direction of approaching the electronic component W from the long base portion 32 by an elastic body (not shown) attached to the long base portion 32. Has been.

The pin support member 31 is formed with through holes 34 to 37 through which the pin portions 33 of the probe pins 11 to 14 are inserted, respectively. In this Embodiment, the pin part 33 of the probe pins 11-14 advances / retreats with respect to the elongate base part 32 in the state inserted in the through-holes 34-37, respectively.
Each of the probe pins 11 to 14 is fixed to the base member 30 in a state where the axis is obliquely arranged on each flat surface F of the external electrodes E1 and E2 of the electronic component W, and the interval between the probe pins 11 and 12 is as shown in FIG. 1, the distance between the long base portions 32 (between the base sides) is wider than that between the pin portions 33 (between the front sides). As shown in FIGS. 1 and 2, the relationship between the probe pins 11 and 12 includes the probe pins 11 and 13, the probe pins 11 and 14, the probe pins 12 and 13, the probe pins 12 and 14, and the probe pins 13 and 14. The same applies to each relationship.

Each of the probe pins 11 to 14 is provided with a contact surface 38 horizontally disposed at the tip of the pin portion 33. Therefore, the probe pin 11 has a contact surface 38 of the pin portion 33 that is non-perpendicular to the axis of the probe pin 11, and the same applies to the probe pins 12 to 14.
When the chuck 15 is disposed at the uppermost position and disposed at the primary stop position above the electric measuring means 25, the contact surface 38 of the pin portion 33 of the probe pins 11 and 13 is not connected to the external electrode as shown in FIG. The contact surface 38 of the pin portion 33 of the probe pins 12 and 14 is arranged in parallel to the flat surface F of E1 and is below the flat surface F of the external electrode E1, and the flat surface F of the external electrode E2 Are arranged in parallel and are below the flat surface F of the external electrode E2.

From this state, the chuck 15 starts to descend (that is, approaches the probe pins 11 to 14) by the operation of the pressing means 17, and causes the electronic component W to approach the probe pins 11 to 14. At this time, the contact surface 38 of the pin portion 33 of the probe pins 11 and 13 approaches in a state of being arranged in parallel to the flat surface F of the external electrode E1, and the contact portion of the pin portion 33 of the probe pins 12 and 14 contacts. The surface 38 approaches in a state of being arranged in parallel to the flat surface F of the external electrode E2.

In the present embodiment, the flat surface F of the external electrode E1 is in contact with the contact surface 38 of the pin portion 33 of the probe pins 11 and 13, and the flat surface F of the external electrode E2 is of the pin portion 33 of the probe pins 12 and 14. A scheduled contact position is determined in advance as the height position of the electronic component W that contacts the contact surface 38. As shown in FIGS. 1 and 2, the pressing means 17 pushes down the chuck 15 until the chuck 15 lowers the electronic component W from the expected contact position by a predetermined distance (for example, 0.05 to 0.3 mm). The contact surface 38 of the pin portion 33 of the probe pins 11 and 13 comes into contact with the flat surface F of the electrode E1 from below, and the contact surface of the pin portion 33 of the probe pins 12 and 14 contacts the flat surface F of the external electrode E2. Ensure that 38 is in contact from below. This is because the thickness varies depending on the electronic component W.

As shown in FIG. 5, in the electronic component W having the assumed thickness, the contact surfaces 38 of the pin portions 33 of the probe pins 11 and 13 are in surface contact with the flat surface F of the external electrode E1, respectively, at a planned contact position. First, the contact surfaces 38 of the pin portions 33 of the probe pins 12 and 14 start to come into surface contact with the flat surface F of the external electrode E2, respectively. Therefore, the load applied per unit area of the flat surface of the external electrode is small compared to the case where the pin portion of the probe pin is not in surface contact with the flat surface of the external electrode, and the generation of wrinkles on the flat surface of the external electrode is suppressed. Is possible.
Further, the position correction mechanism 23 adjusts the position of the electronic component W with respect to the chuck 15 before the contact surfaces 38 of the pin portions 33 of the probe pins 11 to 14 contact the flat surfaces F of the external electrodes E1 and E2. Become.

As shown in FIGS. 1 and 2, the probe pins 11 to 14 are in a state in which the pin portion 33 is retracted and pushed into the long base 32 when the electronic component W descends a predetermined distance from the expected contact position. It becomes.
The pin support member 31 is disposed at a position having a distance (for example, 0.05 to 0.2 mm) to the electronic component W below the electronic component W that has been lowered a predetermined distance from the planned contact position. While the pin portions 33 of the probe pins 11 to 14 are lowered together with the electronic component W, the state where a part of the pin portions 33 is inserted into the through holes 34 to 37 of the pin support member 31 is maintained, and the horizontal movement is restricted. ing.

Therefore, when the pin portion 33 of the probe pins 11 to 14 moves back and forth with respect to the long base portion 32, the contact surface 38 of the pin portion 33 of the probe pins 11 and 13 is in surface contact with the flat surface F of the external electrode E1. Is stably maintained, and the contact surface 38 of the pin portion 33 of the probe pins 12 and 14 is stably maintained in surface contact with the flat surface F of the external electrode E2.
The electronic component W is lowered by a predetermined distance from the planned contact position, stops, is energized by the probe pins 11 to 14, and is inspected for electrical characteristics.

In addition, a guide member 39 that guides the electronic component W approaching the probe pins 11 to 14 to a predetermined position is attached to the pin support member 31.
As shown in FIG. 1, a stop mechanism 40 that stops the lowering of the lifting piece 20 is attached to the pressing means 17. When the load generated on the chuck 15 exceeds a predetermined value, the stop mechanism 40 stops the elevating piece 20 that is descending, and stops the chuck 15 that is descending the electronic component W from the expected contact position. As a result, it is possible to prevent wrinkles and the like from being generated in the external electrodes E1 and E2 due to the force exceeding the predetermined range generated in the external electrodes E1 and E2. The case where the load generated on the chuck 15 exceeds a predetermined value is, for example, a case where dust enters between the pin portion 33 and the long base portion 32 and the pin portion 33 does not retreat.

The electronic component W whose electrical characteristics have been inspected is lifted together with the chuck 15 until the chuck 15 is placed at the uppermost position, and then conveyed to the vicinity of the imaging means 26 as shown in FIG. The flat surface F of the electrodes E1 and E2 is imaged together with the two opposite side surfaces of the electronic component W. The electronic component W picked up by the image pickup means 26 is conveyed to the vicinity of the image pickup means 27, and two opposite side surfaces different from those picked up by the image pickup means 26 are picked up by the image pickup means 27. An external appearance inspection unit 41 that inspects the external appearance of the electronic component W based on images captured by the imaging means 26 and 27 is connected to the imaging means 26 and 27. The appearance inspection unit 41 inspects the appearance of the flat surface F of the external electrodes E1 and E2 based on the captured image of the imaging means 26.

The electronic component W determined to have no abnormality by the inspection of the electrical characteristics and the appearance inspection is accommodated in the tape by the taping unit 28, and the electronic component W determined to be abnormal is not accommodated in the tape by the taping unit 28 by the sorter 29. It is ejected and placed in the tray.

Although the embodiments of the present invention have been described above, the present invention is not limited to the above-described embodiments, and all changes in conditions and the like that do not depart from the gist are within the scope of the present invention.
For example, the chuck may acquire electronic components from a tape feeder, a tray, or a wafer sheet instead of from a ball feeder. When the chuck acquires an electronic component from the wafer sheet, the chuck can acquire the electronic component from a mechanism that removes the electronic component from the wafer sheet.
Further, the position correction mechanism, the marking unit, and the imaging means are not always necessary.
The electronic component to be inspected for electrical characteristics is not limited to one having two external electrodes, and the long side of the bottom surface on which the external electrodes are provided may exceed 1.0 mm.

And it is not necessary to convey an electronic component with a rotary table. In addition, when a rotary table is used, it is not necessary to use a rotary table in which the rotary shaft is vertically arranged. For example, a rotary table in which the rotary shaft is horizontally arranged may be used. When a rotary table having a rotary shaft arranged horizontally is employed, the electronic component moves forward and backward in the horizontal direction together with the chuck.
Furthermore, it is not necessary to store the electronic component in which no abnormality is detected in the tape, and for example, it may be stored in a tray or may be attached to a wafer sheet.
Further, it is not necessary to have only one electrical measuring unit, and a plurality of electrical measuring units may be provided to inspect electrical characteristics for a plurality of electronic components at a time.

DESCRIPTION OF SYMBOLS 10: Electronic component inspection apparatus, 11-14: Probe pin, 15: Chuck, 16: Rotary table, 17: Pushing means, 18: Rotating shaft, 19: Guide part, 20: Lifting piece, 21: Drive source, 22: Ball feeder, 23: Position correction mechanism, 24: Marking unit, 25: Electrical measuring means, 26, 27: Imaging means, 28: Taping unit, 29: Sorter, 30: Base member, 31: Pin support member, 32: Long Scale base, 33: pin part, 34 to 37: through hole, 38: contact surface, 39: guide member, 40: stop mechanism, 41: appearance inspection part, E1, E2: external electrode, F: flat surface, W : Electronic components

Claims (8)

In an electronic component inspection apparatus for inspecting electrical characteristics of an electronic component provided with an external electrode having a flat surface,
A plurality of probe pins whose tip contact surfaces are in contact with the flat surface from below in a state where the shaft center is obliquely arranged with respect to the flat surface, and the electronic component are supported and lowered to mount the electronic component. A chuck that brings the plurality of probe pins closer to each other and a chuck that makes the flat surface contact the contact surface of each probe pin; and a stop mechanism that stops the lowered chuck .
Each probe pin is fixed on the base side, the front side advances and retreats with respect to the base side, and the contact surface approaches the flat surface in a state of being arranged in parallel to the flat surface ,
The chuck lowers the electronic component by a predetermined distance from a predetermined contact position as a position where the flat surface contacts the contact surface of each probe pin,
The stop mechanism stops the chuck that lowers the electronic component from the planned contact position when a load generated on the chuck exceeds a predetermined value . 2. The electronic component inspection apparatus according to claim 1, wherein a plurality of through holes are formed at positions where the contact surfaces are in contact with the electronic component that is in contact with each other and through which the tip sides of the plurality of probe pins are inserted. An electronic component inspection apparatus, further comprising a pin support member. The electronic component testing apparatus according to claim 2, wherein each probe pin, previously side is, the electronic component inspection apparatus characterized by forward and backward with respect to base side in a state inserted through each through hole of the pin support member. 4. The electronic component inspection apparatus according to claim 2 , wherein a guide member for guiding the electronic component approaching the probe pin to a predetermined position is attached to the pin support member. Inspection device. The electronic component testing apparatus according to any one of claims 1 to 4, the position correcting mechanism for adjusting the position with respect to said chuck of the electronic component before the abutment surface on the flat surface is in contact, further comprising An electronic component inspection apparatus characterized by. The electronic component testing apparatus according to any one of claims 1 to 5, the spacing between the probe pins, the electronic component testing device between group side is equal to or wider than between the front side. The electronic component testing apparatus according to any one of claims 1-6, wherein the imaging means for abutment surface for imaging the flat surface of contact, the appearance of the flat surface on the basis of the image the imaging means has captured An electronic component inspection apparatus, further comprising an appearance inspection unit for inspecting The electronic component testing apparatus according to any one of claims 1-7, wherein each probe pin, electronic component testing said abutment surface is characterized in that it is a non-perpendicular to the axis of the probe pins apparatus.

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