JP2004037282A5 - - Google Patents

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JP2004037282A5
JP2004037282A5 JP2002195414A JP2002195414A JP2004037282A5 JP 2004037282 A5 JP2004037282 A5 JP 2004037282A5 JP 2002195414 A JP2002195414 A JP 2002195414A JP 2002195414 A JP2002195414 A JP 2002195414A JP 2004037282 A5 JP2004037282 A5 JP 2004037282A5
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Japan
Prior art keywords
photoelectric conversion
conversion element
order diffracted
light
diffracted light
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JP2002195414A
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Japanese (ja)
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JP2004037282A (en
JP4089314B2 (en
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Priority claimed from JP2002195414A external-priority patent/JP4089314B2/en
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Publication of JP2004037282A5 publication Critical patent/JP2004037282A5/ja
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Claims (5)

被測定光を分光する回折手段と、
前記回折手段からの０次回折光を受光する第一光電変換素子と、
前記回折手段からの高次回折光を受光する第二光電変換素子と、
前記第一光電変換素子で光電変換された０次回折光の受光出力に基づいて、第二光電変換素子での受光を制御する制御手段とを備えることを特徴とする分光測定器。Diffractive means for splitting the light under measurement;
A first photoelectric conversion element that receives zero-order diffracted light from the diffraction means;
A second photoelectric conversion element that receives high-order diffracted light from the diffraction means;
A spectrophotometer comprising: control means for controlling light reception by the second photoelectric conversion element based on a light reception output of the 0th-order diffracted light photoelectrically converted by the first photoelectric conversion element. ０次回折光を第一光電変換素子に集光させる集光レンズが、回折手段と第一光電変換素子との間に設けられていることを特徴とする、請求項１記載の分光測定器。  The spectrophotometer according to claim 1, wherein a condensing lens for condensing the 0th-order diffracted light on the first photoelectric conversion element is provided between the diffracting means and the first photoelectric conversion element. 前記制御手段は、第二光電変換素子での積分時間を制御することを特徴とする、請求項１記載の分光測定器。  The spectrophotometer according to claim 1, wherein the control unit controls an integration time in the second photoelectric conversion element. 前記制御手段は、第二光電変換素子の出力ゲインを制御することを特徴とする、請求項１記載の分光測定器。  The spectrophotometer according to claim 1, wherein the control unit controls an output gain of the second photoelectric conversion element. 被測定光を分光する回折手段と、前記回折手段からの０次回折光を受光する第一光電変換素子と、前記回折手段からの高次回折光を受光する第二光電変換素子とを備え、
前記第一光電変換素子で光電変換された０次回折光の受光出力に基づいて、被測定光の経時的変化を計測することを特徴とする分光測定器。 E Bei a diffraction means for spectral light to be measured, a first photoelectric conversion element for receiving the 0-order diffracted light from the diffracting means, and a second photoelectric conversion element for receiving high-order diffracted light from said diffraction means,
A spectroscopic measuring instrument that measures a change with time of light to be measured based on a light reception output of zero-order diffracted light photoelectrically converted by the first photoelectric conversion element.
JP2002195414A 2002-07-04 2002-07-04 Spectrometer using 0th-order diffracted light of diffraction means Expired - Fee Related JP4089314B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002195414A JP4089314B2 (en) 2002-07-04 2002-07-04 Spectrometer using 0th-order diffracted light of diffraction means

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002195414A JP4089314B2 (en) 2002-07-04 2002-07-04 Spectrometer using 0th-order diffracted light of diffraction means

Publications (3)

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JP2004037282A JP2004037282A (en) 2004-02-05
JP2004037282A5 true JP2004037282A5 (en) 2005-06-16
JP4089314B2 JP4089314B2 (en) 2008-05-28

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JP2002195414A Expired - Fee Related JP4089314B2 (en) 2002-07-04 2002-07-04 Spectrometer using 0th-order diffracted light of diffraction means

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Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04290714A (en) * 1991-03-20 1992-10-15 Shin Kobe Electric Mach Co Ltd Molding method of molded object with hole
AU2003296166A1 (en) * 2003-01-08 2004-08-10 Nikon Corporation Optical device, monitor device, inverse dispersion double spectroscope, and method for controlling inverse dispersion double spectroscope
JP5115796B2 (en) * 2007-11-29 2013-01-09 横河電機株式会社 Spectrometer
JP2010261861A (en) * 2009-05-08 2010-11-18 Ricoh Co Ltd Spectral characteristics acquisition apparatus, image evaluation apparatus, and image forming apparatus
JP2015219153A (en) * 2014-05-19 2015-12-07 パナソニックＩｐマネジメント株式会社 Spectrum sensor
CN105938013B (en) * 2016-04-20 2019-12-17 杭州远方光电信息股份有限公司 Spectrometer and correction method thereof
NL2025681B1 (en) * 2020-05-26 2021-12-13 Admesy B V Optical instrument for measuring at least one property of a beam of light

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