JP2004004037A - 光学デバイスの１つ又は複数の導波路をテストするシステム - Google Patents

光学デバイスの１つ又は複数の導波路をテストするシステム Download PDF

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Publication number
JP2004004037A
JP2004004037A JP2003106374A JP2003106374A JP2004004037A JP 2004004037 A JP2004004037 A JP 2004004037A JP 2003106374 A JP2003106374 A JP 2003106374A JP 2003106374 A JP2003106374 A JP 2003106374A JP 2004004037 A JP2004004037 A JP 2004004037A
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Japan
Prior art keywords
waveguide
light
polarization
output
polarization state
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Pending
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JP2003106374A
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English (en)
Japanese (ja)
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JP2004004037A5 (enExample
Inventor
William P Kennedy
ウィリアム・ピー・ケネディ
Amanda J Price
アマンダ・ジェイ・プライス
Max Seminario
マックス・セミナリオ
John Bernard Medberry
ジョン・バーナード・メドベリー
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2004004037A publication Critical patent/JP2004004037A/ja
Publication of JP2004004037A5 publication Critical patent/JP2004004037A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/337—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring polarization dependent loss [PDL]

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2003106374A 2002-04-29 2003-04-10 光学デバイスの１つ又は複数の導波路をテストするシステム Pending JP2004004037A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/135,481 US6690454B2 (en) 2002-04-29 2002-04-29 Method, apparatus and system for testing one or more waveguides of an optical device

Publications (2)

Publication Number Publication Date
JP2004004037A true JP2004004037A (ja) 2004-01-08
JP2004004037A5 JP2004004037A5 (enExample) 2006-03-09

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JP2003106374A Pending JP2004004037A (ja) 2002-04-29 2003-04-10 光学デバイスの１つ又は複数の導波路をテストするシステム

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US (1) US6690454B2 (enExample)
JP (1) JP2004004037A (enExample)
DE (1) DE10306045A1 (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008507760A (ja) * 2004-07-23 2008-03-13 シンボル テクノロジーズ， インコーポレイテッド 高い強度の周辺光において性能を改善された電気光学リーダ
JP2011007655A (ja) * 2009-06-26 2011-01-13 Nippon Telegr & Teleph Corp <Ntt> 光デバイスの特性測定装置および特性測定方法
JP2013036826A (ja) * 2011-08-08 2013-02-21 Nippon Telegr & Teleph Corp <Ntt> 光ファイバコネクタ接続点の接続不良検出器および接続不良検出方法
CN112098048A (zh) * 2019-12-03 2020-12-18 科大国盾量子技术股份有限公司 一种电动偏振控制器自动调试装置及其调试方法
EP4418569A1 (en) * 2023-02-20 2024-08-21 EXFO Inc. Methods and systems for characterization of polarization-dependent loss or gain in optical links and components

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4053389B2 (ja) * 2002-09-19 2008-02-27 富士通株式会社 光信号対雑音比のモニタ方法およびそれを用いた光伝送システム
WO2009112239A1 (de) * 2008-03-10 2009-09-17 Heidelberg Instruments Mikrotechnik Gmbh Verfahren und anordnung zur verschiebung
KR102733464B1 (ko) * 2016-11-22 2024-11-25 삼성전자주식회사 전자 장치 및 그 제어 방법

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6204924B1 (en) * 1999-02-23 2001-03-20 Exfo Electro-Optical Engineering Inc. Method and apparatus for measuring polarization mode dispersion of optical devices
US6147757A (en) * 1999-02-23 2000-11-14 Alliance Fiber Optics Products, Inc. Apparatus and method employing depolarization to eliminate effect of polarization dependent loss
US6449033B2 (en) * 1999-04-26 2002-09-10 Corning Incorporated Apparatus and method for measuring polarization dependent loss
US6373614B1 (en) * 2000-08-31 2002-04-16 Cambridge Research Instrumentation Inc. High performance polarization controller and polarization sensor

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008507760A (ja) * 2004-07-23 2008-03-13 シンボル テクノロジーズ， インコーポレイテッド 高い強度の周辺光において性能を改善された電気光学リーダ
JP2011007655A (ja) * 2009-06-26 2011-01-13 Nippon Telegr & Teleph Corp <Ntt> 光デバイスの特性測定装置および特性測定方法
JP2013036826A (ja) * 2011-08-08 2013-02-21 Nippon Telegr & Teleph Corp <Ntt> 光ファイバコネクタ接続点の接続不良検出器および接続不良検出方法
CN112098048A (zh) * 2019-12-03 2020-12-18 科大国盾量子技术股份有限公司 一种电动偏振控制器自动调试装置及其调试方法
EP4418569A1 (en) * 2023-02-20 2024-08-21 EXFO Inc. Methods and systems for characterization of polarization-dependent loss or gain in optical links and components

Also Published As

Publication number Publication date
US6690454B2 (en) 2004-02-10
US20030202171A1 (en) 2003-10-30
DE10306045A1 (de) 2003-11-13

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