JP2004004037A5 - - Google Patents

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Publication number
JP2004004037A5
JP2004004037A5 JP2003106374A JP2003106374A JP2004004037A5 JP 2004004037 A5 JP2004004037 A5 JP 2004004037A5 JP 2003106374 A JP2003106374 A JP 2003106374A JP 2003106374 A JP2003106374 A JP 2003106374A JP 2004004037 A5 JP2004004037 A5 JP 2004004037A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003106374A
Other languages
Japanese (ja)
Other versions
JP2004004037A (ja
Filing date
Publication date
Priority claimed from US10/135,481 external-priority patent/US6690454B2/en
Application filed filed Critical
Publication of JP2004004037A publication Critical patent/JP2004004037A/ja
Publication of JP2004004037A5 publication Critical patent/JP2004004037A5/ja
Pending legal-status Critical Current

Links

JP2003106374A 2002-04-29 2003-04-10 光学デバイスの1つ又は複数の導波路をテストするシステム Pending JP2004004037A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/135,481 US6690454B2 (en) 2002-04-29 2002-04-29 Method, apparatus and system for testing one or more waveguides of an optical device

Publications (2)

Publication Number Publication Date
JP2004004037A JP2004004037A (ja) 2004-01-08
JP2004004037A5 true JP2004004037A5 (enExample) 2006-03-09

Family

ID=29249466

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003106374A Pending JP2004004037A (ja) 2002-04-29 2003-04-10 光学デバイスの1つ又は複数の導波路をテストするシステム

Country Status (3)

Country Link
US (1) US6690454B2 (enExample)
JP (1) JP2004004037A (enExample)
DE (1) DE10306045A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4053389B2 (ja) * 2002-09-19 2008-02-27 富士通株式会社 光信号対雑音比のモニタ方法およびそれを用いた光伝送システム
US7128264B2 (en) * 2004-07-23 2006-10-31 Symbol Technologies, Inc: Electro-optical reader with improved performance in high intensity ambient light
WO2009112239A1 (de) * 2008-03-10 2009-09-17 Heidelberg Instruments Mikrotechnik Gmbh Verfahren und anordnung zur verschiebung
JP2011007655A (ja) * 2009-06-26 2011-01-13 Nippon Telegr & Teleph Corp <Ntt> 光デバイスの特性測定装置および特性測定方法
JP5483474B2 (ja) * 2011-08-08 2014-05-07 日本電信電話株式会社 光ファイバコネクタ接続点の接続不良検出器および接続不良検出方法
KR102733464B1 (ko) * 2016-11-22 2024-11-25 삼성전자주식회사 전자 장치 및 그 제어 방법
CN112098048B (zh) * 2019-12-03 2023-01-10 科大国盾量子技术股份有限公司 一种电动偏振控制器自动调试装置及其调试方法
US20240283531A1 (en) * 2023-02-20 2024-08-22 Exfo Inc. Methods and systems for characterization of polarization-dependent loss or gain in optical links and components

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6204924B1 (en) * 1999-02-23 2001-03-20 Exfo Electro-Optical Engineering Inc. Method and apparatus for measuring polarization mode dispersion of optical devices
US6147757A (en) * 1999-02-23 2000-11-14 Alliance Fiber Optics Products, Inc. Apparatus and method employing depolarization to eliminate effect of polarization dependent loss
US6449033B2 (en) * 1999-04-26 2002-09-10 Corning Incorporated Apparatus and method for measuring polarization dependent loss
US6373614B1 (en) * 2000-08-31 2002-04-16 Cambridge Research Instrumentation Inc. High performance polarization controller and polarization sensor

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