JP2003532909A - 半絶縁材料の試験および最適化法 - Google Patents

半絶縁材料の試験および最適化法

Info

Publication number
JP2003532909A
JP2003532909A JP2001532155A JP2001532155A JP2003532909A JP 2003532909 A JP2003532909 A JP 2003532909A JP 2001532155 A JP2001532155 A JP 2001532155A JP 2001532155 A JP2001532155 A JP 2001532155A JP 2003532909 A JP2003532909 A JP 2003532909A
Authority
JP
Japan
Prior art keywords
charge
current
applying
determining
mobility
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001532155A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003532909A5 (enExample
Inventor
ツェ，ミン−カイ
Original Assignee
クオリティー エンジニアリング アソシエーツ インコーポレイテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from PCT/US2000/012728 external-priority patent/WO2000068758A2/en
Application filed by クオリティー エンジニアリング アソシエーツ インコーポレイテッド filed Critical クオリティー エンジニアリング アソシエーツ インコーポレイテッド
Publication of JP2003532909A publication Critical patent/JP2003532909A/ja
Publication of JP2003532909A5 publication Critical patent/JP2003532909A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G15/00—Apparatus for electrographic processes using a charge pattern
    • G03G15/75—Details relating to xerographic drum, band or plate, e.g. replacing, testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/60—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrostatic variables, e.g. electrographic flaw testing
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G15/00—Apparatus for electrographic processes using a charge pattern
    • G03G15/65—Apparatus which relate to the handling of copy material

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electrostatic Charge, Transfer And Separation In Electrography (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Dry Development In Electrophotography (AREA)
  • Cleaning In Electrography (AREA)
JP2001532155A 1999-10-15 2000-10-16 半絶縁材料の試験および最適化法 Pending JP2003532909A (ja)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US15985799P 1999-10-15 1999-10-15
US60/159,857 1999-10-15
US19220300P 2000-03-27 2000-03-27
US60/192,203 2000-03-27
US00/12728 2000-05-10
PCT/US2000/012728 WO2000068758A2 (en) 1999-05-10 2000-05-10 An automated stationary/portable test system for dielectrics
PCT/US2000/028644 WO2001029621A2 (en) 1999-10-15 2000-10-16 Semi-insulating material testing and optimization

Publications (2)

Publication Number Publication Date
JP2003532909A true JP2003532909A (ja) 2003-11-05
JP2003532909A5 JP2003532909A5 (enExample) 2007-07-05

Family

ID=26856381

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001532155A Pending JP2003532909A (ja) 1999-10-15 2000-10-16 半絶縁材料の試験および最適化法

Country Status (3)

Country Link
US (1) US6670814B2 (enExample)
JP (1) JP2003532909A (enExample)
WO (1) WO2001029621A2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010152024A (ja) * 2008-12-25 2010-07-08 Oki Data Corp 現像剤担持体、現像ローラ、現像装置及び画像形成装置

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100430719C (zh) * 2005-10-28 2008-11-05 中国石油大学(北京) 岩石微电扫描成像系统及成像方法
WO2007137404A1 (en) * 2006-05-25 2007-12-06 Fpinnovations Dielectric mapping device and method
JP2009042876A (ja) * 2007-08-07 2009-02-26 Toshiba Corp 画像処理装置及びその方法
CN113671234B (zh) * 2021-08-24 2023-09-12 华北电力大学（保定） 短空气间隙流注放电路径观测系统及预测方法
CN117080206A (zh) * 2023-09-28 2023-11-17 深圳市昇维旭技术有限公司 介电弛豫量测结构、系统和方法以及半导体器件

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5566744A (en) * 1978-11-08 1980-05-20 Ici Ltd Method and device for monitoring web conductivity
US4443764A (en) * 1980-10-30 1984-04-17 Massachusetts Institute Of Technology Method for non-destructive detection and characterization of flaws
JPH02275976A (ja) * 1989-01-17 1990-11-09 Ricoh Co Ltd 現像装置
US5119030A (en) * 1990-05-18 1992-06-02 Trek, Inc Apparatus for electrically inspecting the surface of a drum
JPH051973A (ja) * 1990-12-28 1993-01-08 Xerox Corp 感光体の評価方法
US5732311A (en) * 1996-12-26 1998-03-24 Eastman Kodak Company Compliant electrographic recording member and method and apparatus for using same
JPH10282057A (ja) * 1997-04-04 1998-10-23 Ricoh Co Ltd 電子写真用感光体の静電容量測定装置
US5929640A (en) * 1992-11-12 1999-07-27 Quality Engineering Associates Automated stationary/portable test system for photoconductive drums

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3406334A (en) * 1964-07-27 1968-10-15 Nuclear Corp Of America Apparatus for testing electrostatic copy material
NL8501886A (nl) * 1985-07-01 1987-02-02 Oce Nederland Bv Werkwijze en inrichting voor het bepalen van een maat voor de oppervlaktepotentiaal van een medium dat met behulp van een coronaoplaadinrichting wordt opgeladen.
DE69330060T2 (de) * 1992-10-26 2001-11-15 Dai Nippon Printing Co., Ltd. Photoelektrischer Sensor, Informationsaufzeichnungssystem und Methode zur Informationsaufzeichnung
US5359393A (en) * 1992-12-22 1994-10-25 Xerox Corporation Method and apparatus for measuring photoreceptor voltage potential using a charging device
US5498974A (en) * 1994-12-30 1996-03-12 International Business Machines Corporation Contactless corona-oxide-semiconductor Q-V mobile charge measurement method and apparatus
US5848322A (en) * 1998-01-08 1998-12-08 Xerox Corporation Series capacitor ink sensor for monitoring liquid developer material

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5566744A (en) * 1978-11-08 1980-05-20 Ici Ltd Method and device for monitoring web conductivity
US4443764A (en) * 1980-10-30 1984-04-17 Massachusetts Institute Of Technology Method for non-destructive detection and characterization of flaws
JPH02275976A (ja) * 1989-01-17 1990-11-09 Ricoh Co Ltd 現像装置
US5119030A (en) * 1990-05-18 1992-06-02 Trek, Inc Apparatus for electrically inspecting the surface of a drum
JPH051973A (ja) * 1990-12-28 1993-01-08 Xerox Corp 感光体の評価方法
US5929640A (en) * 1992-11-12 1999-07-27 Quality Engineering Associates Automated stationary/portable test system for photoconductive drums
US5732311A (en) * 1996-12-26 1998-03-24 Eastman Kodak Company Compliant electrographic recording member and method and apparatus for using same
JPH10282057A (ja) * 1997-04-04 1998-10-23 Ricoh Co Ltd 電子写真用感光体の静電容量測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010152024A (ja) * 2008-12-25 2010-07-08 Oki Data Corp 現像剤担持体、現像ローラ、現像装置及び画像形成装置

Also Published As

Publication number Publication date
US6670814B2 (en) 2003-12-30
WO2001029621A9 (en) 2002-08-15
WO2001029621A3 (en) 2001-06-14
US20020196028A1 (en) 2002-12-26
WO2001029621A2 (en) 2001-04-26

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