JP2003532909A5 - - Google Patents
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- Publication number
- JP2003532909A5 JP2003532909A5 JP2001532155A JP2001532155A JP2003532909A5 JP 2003532909 A5 JP2003532909 A5 JP 2003532909A5 JP 2001532155 A JP2001532155 A JP 2001532155A JP 2001532155 A JP2001532155 A JP 2001532155A JP 2003532909 A5 JP2003532909 A5 JP 2003532909A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15985799P | 1999-10-15 | 1999-10-15 | |
| US60/159,857 | 1999-10-15 | ||
| US19220300P | 2000-03-27 | 2000-03-27 | |
| US60/192,203 | 2000-03-27 | ||
| US00/12728 | 2000-05-10 | ||
| PCT/US2000/012728 WO2000068758A2 (en) | 1999-05-10 | 2000-05-10 | An automated stationary/portable test system for dielectrics |
| PCT/US2000/028644 WO2001029621A2 (en) | 1999-10-15 | 2000-10-16 | Semi-insulating material testing and optimization |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2003532909A JP2003532909A (ja) | 2003-11-05 |
| JP2003532909A5 true JP2003532909A5 (enExample) | 2007-07-05 |
Family
ID=26856381
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001532155A Pending JP2003532909A (ja) | 1999-10-15 | 2000-10-16 | 半絶縁材料の試験および最適化法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6670814B2 (enExample) |
| JP (1) | JP2003532909A (enExample) |
| WO (1) | WO2001029621A2 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100430719C (zh) * | 2005-10-28 | 2008-11-05 | 中国石油大学(北京) | 岩石微电扫描成像系统及成像方法 |
| WO2007137404A1 (en) * | 2006-05-25 | 2007-12-06 | Fpinnovations | Dielectric mapping device and method |
| JP2009042876A (ja) * | 2007-08-07 | 2009-02-26 | Toshiba Corp | 画像処理装置及びその方法 |
| JP2010152024A (ja) * | 2008-12-25 | 2010-07-08 | Oki Data Corp | 現像剤担持体、現像ローラ、現像装置及び画像形成装置 |
| CN113671234B (zh) * | 2021-08-24 | 2023-09-12 | 华北电力大学（保定） | 短空气间隙流注放电路径观测系统及预测方法 |
| CN117080206A (zh) * | 2023-09-28 | 2023-11-17 | 深圳市昇维旭技术有限公司 | 介电弛豫量测结构、系统和方法以及半导体器件 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3406334A (en) * | 1964-07-27 | 1968-10-15 | Nuclear Corp Of America | Apparatus for testing electrostatic copy material |
| US4233562A (en) * | 1978-11-08 | 1980-11-11 | Imperial Chemical Industries Limited | Apparatus and method for monitoring web conductivity |
| US4443764A (en) * | 1980-10-30 | 1984-04-17 | Massachusetts Institute Of Technology | Method for non-destructive detection and characterization of flaws |
| NL8501886A (nl) * | 1985-07-01 | 1987-02-02 | Oce Nederland Bv | Werkwijze en inrichting voor het bepalen van een maat voor de oppervlaktepotentiaal van een medium dat met behulp van een coronaoplaadinrichting wordt opgeladen. |
| JP2889616B2 (ja) * | 1989-01-17 | 1999-05-10 | 株式会社リコー | 現像装置 |
| US5119030A (en) * | 1990-05-18 | 1992-06-02 | Trek, Inc | Apparatus for electrically inspecting the surface of a drum |
| US5175503A (en) * | 1990-12-28 | 1992-12-29 | Xerox Corporation | Ascertaining imaging cycle life of a photoreceptor |
| DE69330060T2 (de) * | 1992-10-26 | 2001-11-15 | Dai Nippon Printing Co., Ltd. | Photoelektrischer Sensor, Informationsaufzeichnungssystem und Methode zur Informationsaufzeichnung |
| US5929640A (en) * | 1992-11-12 | 1999-07-27 | Quality Engineering Associates | Automated stationary/portable test system for photoconductive drums |
| US5359393A (en) * | 1992-12-22 | 1994-10-25 | Xerox Corporation | Method and apparatus for measuring photoreceptor voltage potential using a charging device |
| US5498974A (en) * | 1994-12-30 | 1996-03-12 | International Business Machines Corporation | Contactless corona-oxide-semiconductor Q-V mobile charge measurement method and apparatus |
| US5732311A (en) * | 1996-12-26 | 1998-03-24 | Eastman Kodak Company | Compliant electrographic recording member and method and apparatus for using same |
| JP3644788B2 (ja) * | 1997-04-04 | 2005-05-11 | 株式会社リコー | 電子写真用感光体の静電容量測定装置 |
| US5848322A (en) * | 1998-01-08 | 1998-12-08 | Xerox Corporation | Series capacitor ink sensor for monitoring liquid developer material |
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2000
- 2000-10-16 WO PCT/US2000/028644 patent/WO2001029621A2/en not_active Ceased
- 2000-10-16 JP JP2001532155A patent/JP2003532909A/ja active Pending
-
2002
- 2002-04-12 US US10/121,436 patent/US6670814B2/en not_active Expired - Fee Related