JP2003347255A - Method of polishing semiconductor substrate - Google Patents

Method of polishing semiconductor substrate

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Publication number
JP2003347255A
JP2003347255A JP2002154893A JP2002154893A JP2003347255A JP 2003347255 A JP2003347255 A JP 2003347255A JP 2002154893 A JP2002154893 A JP 2002154893A JP 2002154893 A JP2002154893 A JP 2002154893A JP 2003347255 A JP2003347255 A JP 2003347255A
Authority
JP
Japan
Prior art keywords
semiconductor substrate
polishing
protective sheet
fixture
sheet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002154893A
Other languages
Japanese (ja)
Inventor
Shinji Araki
伸治 荒木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Original Assignee
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Semiconductor Manufacturing Co Ltd, Kansai Nippon Electric Co Ltd filed Critical Renesas Semiconductor Manufacturing Co Ltd
Priority to JP2002154893A priority Critical patent/JP2003347255A/en
Publication of JP2003347255A publication Critical patent/JP2003347255A/en
Pending legal-status Critical Current

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Abstract

<P>PROBLEM TO BE SOLVED: To provide a method of polishing a semiconductor substrate by the use of a protective sheet which is capable of reducing irregularities which are caused by insufficient conformity between the sheet and wax, its own irregularities, or its own dust. <P>SOLUTION: As to its material, the protective sheet 101 is formed of dust-free paper so that conformity between the sheet 101 and wax 3a and 3b is better than that between a synthetic resin and the wax 3a and 3b. The sheet 101 has less irregularities on its surface and makes less dust than parchment paper and possesses both proper conformity and smoothness. As to its form, the sheet 101 is formed with an opening 102 at its center so as to reduce the area of contact between the sheet and the surface 1a of the semiconductor substrate 1 and to lower probability that a wiring pattern is crushed by the irregularities of the protective sheet 101. <P>COPYRIGHT: (C)2004,JPO

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、保護シートを介し
て半導体基板の一方の面をフィクスチャーに貼付けて、
他方の面を研磨する半導体基板の研磨方法に関する。
BACKGROUND OF THE INVENTION The present invention relates to a method of attaching one surface of a semiconductor substrate to a fixture via a protective sheet,
The present invention relates to a method for polishing a semiconductor substrate for polishing the other surface.

【0002】[0002]

【従来の技術】従来の半導体基板の研磨方法の一例を図
3〜図5に示す。図3は、半導体基板をフィクスチャー
に貼付ける方法を示す斜視図及び断面図であり、図4
は、フィクスチャーに貼付けた半導体基板の裏面を研磨
する方法を示す斜視図であり、図5は、裏面研磨が完了
した半導体基板をフィクスチャーから離脱する方法を示
す断面図である。
2. Description of the Related Art An example of a conventional method for polishing a semiconductor substrate is shown in FIGS. FIG. 3 is a perspective view and a sectional view showing a method of attaching a semiconductor substrate to a fixture.
FIG. 5 is a perspective view showing a method of polishing the back surface of the semiconductor substrate attached to the fixture, and FIG. 5 is a cross-sectional view showing a method of removing the semiconductor substrate whose back surface polishing has been completed from the fixture.

【0003】先ず、半導体基板1をフィクスチャー2に
貼付ける方法は、図3(a)に示すように、フィクスチ
ャー2の上に固形ワックス(ホットメルト型)3a、保
護シート4、固形ワックス(ホットメルト型)3bをこ
の順に積層し、その上に、半導体基板1を表面1a(配
線パターン形成面)を下向きにして載置する。そして、
加熱用ヒータ5を内蔵したホットプレート6上で加熱
し、接着剤としての固形ワックス3a,3bを溶融して
各接着面に馴染ませる。
First, as shown in FIG. 3A, a method of attaching a semiconductor substrate 1 to a fixture 2 is as follows: a solid wax (hot melt type) 3a, a protective sheet 4, a solid wax ( Hot-melt type) 3b are laminated in this order, and the semiconductor substrate 1 is placed thereon with the front surface 1a (wiring pattern forming surface) facing downward. And
Heating is performed on a hot plate 6 having a built-in heating heater 5 to melt the solid waxes 3a and 3b as adhesives, so that the solid waxes 3a and 3b adapt to the respective bonding surfaces.

【0004】尚、保護シート4を半導体基板1とフィク
スチャー2との間に介在させる目的は、半導体基板1の
表面1aに形成した配線パターン(図示せず)が、この
貼付け作業や、後工程の研磨作業の加圧で押しつぶされ
ることを保護シート4の有する弾性を利用して防止する
とともに、裏面研磨完了後、半導体基板1をフィクスチ
ャー2から離脱するため横方向に滑らせる際に、半導体
基板1の表面1aが直接、フィクスチャー2と擦れない
ようにして半導体基板1の表面1aに傷が付くことを防
止するためである。保護シート4としては、通常、フッ
素樹脂などの表面が平滑で摩擦係数が小さい性質を有す
る合成樹脂から成るシートを用いる。また、合成樹脂と
比較すると摩擦係数は大きいが、ワックスとの馴染み性
がよいため、比較的緻密な組織を有する硫酸紙(クラフ
トパルプシートを濃度62〜68%の硫酸で処理してセ
ルロースを膨潤させた紙)を用いることもある。
The purpose of interposing the protective sheet 4 between the semiconductor substrate 1 and the fixture 2 is that a wiring pattern (not shown) formed on the front surface 1a of the semiconductor substrate 1 is used for this bonding operation and subsequent steps. In addition to using the elasticity of the protective sheet 4 to prevent the semiconductor substrate 1 from being crushed by the pressure of the polishing operation, after the back surface polishing is completed, the semiconductor substrate 1 is slid laterally to separate from the fixture 2. This is for preventing the surface 1a of the semiconductor substrate 1 from being scratched by preventing the surface 1a of the substrate 1 from directly rubbing against the fixture 2. As the protective sheet 4, a sheet made of a synthetic resin such as a fluororesin, which has a smooth surface and a small coefficient of friction, is usually used. In addition, although the coefficient of friction is larger than that of synthetic resin, it has good compatibility with wax. Therefore, sulfuric acid paper having a relatively dense structure (kraft pulp sheet is treated with sulfuric acid having a concentration of 62 to 68% to swell cellulose. Paper).

【0005】次に、固形ワックス3a,3bが溶融した
ら、図3(b)に示すように、フィクスチャー2をホッ
トプレート6からプレス機のプレスステージ7に移し
て、液状になったワックス3a,3bが冷えて固まる前
に、上方から加圧部8を降下させ半導体基板1の裏面1
bを加圧する。尚、加圧部8の先端部分は例えば、シリ
コンゴムなどで出来ており半導体基板1の裏面1bに傷
や割れが生じないようになっている。
Next, when the solid waxes 3a and 3b are melted, the fixture 2 is transferred from the hot plate 6 to the press stage 7 of the press as shown in FIG. Before the 3b cools down and hardens, the pressing unit 8 is lowered from above and the back surface 1 of the semiconductor substrate 1 is lowered.
b. The tip of the pressurizing section 8 is made of, for example, silicon rubber so that the back surface 1b of the semiconductor substrate 1 is not damaged or cracked.

【0006】次に、フィクスチャー2と半導体基板1と
の貼付けが完了したら、図4に示すように、半導体基板
1を貼付けたフィクスチャー2を研磨装置9にセットし
て、裏面研磨を行う。研磨装置9は、回転駆動部(図示
せず)と連結した定盤10と、フィクスチャー2を定盤
10に押しつける回転自在な支持軸11と、研磨砥液1
2を供給するノズル13とで構成されており、フィクス
チャー2を定盤10に任意の圧力で押圧し、研磨砥液1
2を供給しながら定盤10を回転させることでフィクス
チャー2を自転させ、半導体基板1の裏面1bを所望の
厚さに研磨する。
Next, when the attachment of the fixture 2 and the semiconductor substrate 1 is completed, as shown in FIG. 4, the fixture 2 to which the semiconductor substrate 1 has been attached is set in a polishing apparatus 9 and the back surface is polished. The polishing apparatus 9 includes a surface plate 10 connected to a rotation drive unit (not shown), a rotatable support shaft 11 for pressing the fixture 2 against the surface plate 10, and a polishing liquid 1.
And a nozzle 13 for supplying the polishing liquid 2 to the surface plate 10 at an arbitrary pressure.
The fixture 2 is rotated by rotating the platen 10 while supplying the substrate 2, and the back surface 1b of the semiconductor substrate 1 is polished to a desired thickness.

【0007】次に、裏面研磨が完了したら、フィクスチ
ャー2から半導体基板1を離脱する。離脱方法は、図5
(a)に示すように、半導体基板1が貼付いたフィクス
チャー2をホットプレート6上に載置し、加熱しワック
ス3a,3bを溶融させ、先端が半導体基板1の外形に
倣った形状をした専用の剥し治具14で半導体基板1側
面を押して、フィクスチャー2上を横滑りさせて離脱す
る。このとき、半導体基板1とフィクスチャー2との間
に保護シート4が介在することで半導体基板1の表面1
aに傷が付くことを防止できる。その後、図5(b)に
示すように、ピンセット15で保護シート4を半導体基
板1の表面1aから剥す。そして、図5(c)に示すよ
うに、半導体基板1上に残ったワックス3bを、例え
ば、IPA(イソプロピルアルコール)などの溶剤で溶
解し除去し裏面研磨が完了する。
Next, when the back surface polishing is completed, the semiconductor substrate 1 is separated from the fixture 2. Fig. 5
As shown in (a), the fixture 2 to which the semiconductor substrate 1 is attached is placed on a hot plate 6 and heated to melt the waxes 3a and 3b, and the tip has a shape following the outer shape of the semiconductor substrate 1. The side surface of the semiconductor substrate 1 is pushed by the exclusive peeling jig 14 and is slid over the fixture 2 to be separated. At this time, since the protective sheet 4 is interposed between the semiconductor substrate 1 and the fixture 2, the surface 1 of the semiconductor substrate 1
a can be prevented from being damaged. After that, as shown in FIG. 5B, the protection sheet 4 is peeled off from the front surface 1a of the semiconductor substrate 1 with tweezers 15. Then, as shown in FIG. 5C, the wax 3b remaining on the semiconductor substrate 1 is dissolved and removed with a solvent such as IPA (isopropyl alcohol) to complete the back surface polishing.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、従来の
半導体基板の研磨方法には以下の問題があった。上述し
たように、保護シートの材料としては、表面が平滑な合
成樹脂、または、硫酸紙を用いるが、合成樹脂の場合、
組織が非常に緻密であるため半導体基板の表面を保護す
る点においては良好であるが、これに反して撥水性が強
過ぎるためワックスとの馴染み性が悪く、ワックスを液
状に溶融した際、その表面張力によりワックスの平滑性
が悪くなり、その表面に緩やかな凹凸が生じることがあ
った。一方、硫酸紙の場合、パルプ繊維にセルロースが
膨潤させてあるとは言え、まだ平坦化されない繊維形状
が多く残っており、ワックスとの馴染み性はよいが、ど
うしても繊維形状が表面に比較的大きい凹凸となって表
われる。また、パルプ繊維から発生する塵埃(5μm程
度)による凹凸が生じることも避けられなかった。
However, the conventional method of polishing a semiconductor substrate has the following problems. As described above, as the material of the protective sheet, a synthetic resin having a smooth surface, or sulfuric acid paper is used.
Although the structure is very dense, it is good in protecting the surface of the semiconductor substrate, but on the contrary, the water repellency is too strong and the compatibility with the wax is poor. Due to the surface tension, the smoothness of the wax was deteriorated, and gently unevenness was sometimes generated on the surface. On the other hand, in the case of parchment paper, although the cellulose is swollen in the pulp fiber, many fiber shapes that have not been flattened still remain, and the compatibility with the wax is good, but the fiber shape is inevitably relatively large on the surface. Appears as irregularities. In addition, it was unavoidable that irregularities due to dust (about 5 μm) generated from the pulp fiber were generated.

【0009】即ち、保護シートとして合成樹脂を用いた
場合、ワックスとの馴染み性が悪いために凹凸が生じ、
硫酸紙を用いた場合、ワックスとの馴染み性は問題ない
が、繊維形状そのもの、あるいは、繊維から発生する塵
埃による凹凸が生じると言う問題があった。特に、半導
体基板に高周波回路配線の寄生容量を低減するために施
す空中配線(エアブリッジ配線)構造が形成されている
場合など配線パターンが潰れやすいため、従来、大きな
問題とならなかった僅かな凹凸が無視できない問題とな
った。
That is, when a synthetic resin is used as the protective sheet, unevenness occurs due to poor compatibility with wax,
When parchment paper is used, there is no problem in compatibility with the wax, but there is a problem that irregularities due to the fiber shape itself or dust generated from the fiber occur. In particular, when the semiconductor substrate has an aerial wiring (air bridge wiring) structure provided to reduce the parasitic capacitance of the high-frequency circuit wiring, the wiring pattern is easily broken, so that slight unevenness which has not been a major problem in the past. Became a problem that could not be ignored.

【0010】本発明の目的は、保護シートとワックスと
の馴染み不足によって生じる凹凸や、保護シート自身の
凹凸あるいは保護シートからの塵埃による凹凸の少ない
保護シートを使用した半導体基板の研磨方法を提供する
ものである。
An object of the present invention is to provide a method for polishing a semiconductor substrate using a protective sheet having less irregularities caused by insufficient adaptation between the protective sheet and wax, irregularities of the protective sheet itself or irregularities due to dust from the protective sheet. Things.

【0011】[0011]

【課題を解決するための手段】本発明の半導体基板の研
磨方法は、保護シートを介して半導体基板の一方の面を
フィクスチャーに貼付けて、半導体基板の他方の面を研
磨する研磨方法において、保護シートは無塵紙で成るこ
とを特徴とする半導体基板の研磨方法である。
According to a polishing method for a semiconductor substrate of the present invention, one surface of a semiconductor substrate is attached to a fixture via a protective sheet, and the other surface of the semiconductor substrate is polished. The method for polishing a semiconductor substrate is characterized in that the protective sheet is made of dust-free paper.

【0012】[0012]

【発明の実施の形態】本発明の半導体基板の研磨方法の
一例を図1,図2に示す。図1は、半導体基板をフィク
スチャーに貼付ける方法を示す斜視図及び断面図であ
り、図2は、裏面研磨が完了した半導体基板をフィクス
チャーから離脱する方法を示す断面図である。尚、図3
〜図5と同一部分には同一符号を付し、裏面研磨方法
は、従来技術と同様であるため図4を用いて説明する。
1 and 2 show an example of a method for polishing a semiconductor substrate according to the present invention. FIG. 1 is a perspective view and a cross-sectional view illustrating a method of attaching a semiconductor substrate to a fixture, and FIG. 2 is a cross-sectional view illustrating a method of detaching the semiconductor substrate, whose back surface has been polished, from the fixture. Note that FIG.
5 are denoted by the same reference numerals, and the method of polishing the back surface is the same as that of the prior art, and will be described with reference to FIG.

【0013】先ず、図1(a)に示すように、半導体基
板1をフィクスチャー2に貼付ける方法は、フィクスチ
ャー2の上に固形ワックス(ホットメルト型)3a、保
護シート101、固形ワックス(ホットメルト型)3b
をこの順に積層し、その上に、半導体基板1を表面1a
(配線パターン形成面)を下向きにして載置する。ここ
で、保護シート101は、天然パルプに樹脂エマルジョ
ンを含浸した無塵紙(一般にクリーンルームで使用され
る紙)で成り、保護シート101の外形は、半導体基板
1より若干大きく、中央部に半導体基板1のより若干小
さい開口部102を設けたリング状である。半導体基板
1を保護シート101上に載置する際には、半導体基板
1の全外周部がリング状の保護シート101上に当接す
るように載置する。そして、加熱用ヒータ5を内蔵した
ホットプレート6上で加熱し、接着剤としての固形ワッ
クス3a,3bを溶融して各接着面に馴染ませる。この
とき、保護シート101の開口部102には、溶融した
ワックス3a,3bが入り込み互いに混じり合う。即
ち、半導体基板1とフィクスチャー2とは、半導体基板
1の外周部においては、リング状の保護シート101を
介して接着され、開口部102においては、ワックス3
a,3bで直接、接着される格好となる。
First, as shown in FIG. 1A, a method of attaching a semiconductor substrate 1 to a fixture 2 is as follows: solid wax (hot melt type) 3a, protective sheet 101, solid wax Hot melt type) 3b
Are stacked in this order, and the semiconductor substrate 1 is placed on the surface 1a.
(Wiring pattern formation surface) is placed face down. Here, the protection sheet 101 is made of dust-free paper (paper generally used in a clean room) in which natural pulp is impregnated with a resin emulsion. The outer shape of the protection sheet 101 is slightly larger than the semiconductor substrate 1 and the semiconductor substrate 1 is located at the center. It has a ring shape provided with an opening 102 which is slightly smaller than that of FIG. When the semiconductor substrate 1 is placed on the protective sheet 101, the semiconductor substrate 1 is placed so that the entire outer peripheral portion of the semiconductor substrate 1 is in contact with the ring-shaped protective sheet 101. Then, it is heated on a hot plate 6 having a built-in heating heater 5 to melt the solid waxes 3a and 3b as adhesives and to make them conform to the respective bonding surfaces. At this time, the melted waxes 3a and 3b enter the openings 102 of the protective sheet 101 and mix with each other. That is, the semiconductor substrate 1 and the fixture 2 are bonded via a ring-shaped protective sheet 101 on the outer peripheral portion of the semiconductor substrate 1, and the wax 3 is provided on the opening 102.
In a, 3b, it is directly bonded.

【0014】尚、保護シート101を半導体基板1とフ
ィクスチャー2との間に介在させる目的は、半導体基板
1の表面1aに形成した配線パターン(図示せず)が、
この貼付け作業や、後工程の研磨作業の加圧で押しつぶ
されることを保護シート4の有する弾性を利用して防止
するとともに、裏面研磨完了後、半導体基板1をフィク
スチャー2から離脱するため横方向に滑らせる際に、半
導体基板1の表面1aが直接、フィクスチャー2と擦れ
ないようにして半導体基板1の表面1aに傷が付くこと
を防止するためである。
The purpose of interposing the protective sheet 101 between the semiconductor substrate 1 and the fixture 2 is that a wiring pattern (not shown) formed on the surface 1a of the semiconductor substrate 1
By using the elasticity of the protective sheet 4 to prevent the semiconductor substrate 1 from being crushed by the pressure of the pasting operation and the polishing operation in the subsequent step, and to remove the semiconductor substrate 1 from the fixture 2 after the back surface polishing is completed, the semiconductor device 1 is moved in the horizontal direction. This is to prevent the surface 1a of the semiconductor substrate 1 from being directly rubbed against the fixture 2 when the semiconductor substrate 1 is slid, and to prevent the surface 1a of the semiconductor substrate 1 from being scratched.

【0015】ここで、保護シート101は、その材質の
点において、無塵紙で成るため、合成樹脂ほどワックス
3a,3bとの馴染み性は悪くなく、かつ、硫酸紙ほど
表面の凹凸や発埃はなく、適度な馴染み性と平滑性の両
方を兼ね備えている。また、その形状の点において、中
央部に開口部102を設けて、半導体基板1の表面1a
との接触面積を減らし、保護シート101の凹凸で配線
パターンを潰す確率を低減している。尚、保護シート1
01は、半導体基板1の全外周に亘って接触しているた
め半導体基板1の表面1aとフィクスチャー2とが直
接、擦れ合うことを防止するスペーサとしての役目も充
分果たすことができ、開口部102では、2つのワック
ス3a,3bが互いに混じり合うため半導体基板1とフ
ィクスチャー2との接着強度も充分確保できる。
Since the protective sheet 101 is made of dust-free paper in terms of its material, it does not have as good a compatibility with the waxes 3a and 3b as synthetic resin, and has less unevenness and dust on the surface than parchment paper. It has both moderate familiarity and smoothness. In addition, in terms of its shape, an opening 102 is provided at the center, and the surface 1a of the semiconductor substrate 1 is formed.
The area of contact with the protective sheet 101 is reduced, and the probability that the wiring pattern is crushed by unevenness of the protective sheet 101 is reduced. In addition, the protection sheet 1
01 is in contact with the entire outer periphery of the semiconductor substrate 1, and can sufficiently serve as a spacer for preventing the front surface 1 a of the semiconductor substrate 1 from directly rubbing against the fixture 2. In this case, since the two waxes 3a and 3b are mixed with each other, the adhesive strength between the semiconductor substrate 1 and the fixture 2 can be sufficiently secured.

【0016】次に、固形ワックス3a,3bが溶融した
ら、図1(b)に示すように、フィクスチャー2をホッ
トプレート6からプレス機のプレスステージ7に移し
て、液状になったワックス3a,3bが冷えて固まる前
に、上方から加圧部8を降下させ半導体基板1の裏面1
bを加圧する。加圧部8の先端部分は例えば、シリコン
ゴムなどで出来ており半導体基板1の裏面1bに傷や割
れが生じないようになっている。
Next, when the solid waxes 3a and 3b are melted, the fixture 2 is transferred from the hot plate 6 to the press stage 7 of the press machine as shown in FIG. Before the 3b cools down and hardens, the pressing unit 8 is lowered from above and the back surface 1 of the semiconductor substrate 1 is lowered.
b. The tip portion of the pressing portion 8 is made of, for example, silicon rubber or the like so that the back surface 1b of the semiconductor substrate 1 is not damaged or cracked.

【0017】次に、フィクスチャー2と半導体基板1と
の貼付けが完了したら、図4に示すように、半導体基板
1を貼付けたフィクスチャー2を研磨装置9にセットし
て、裏面研磨を行う。研磨装置9は、回転駆動部(図示
せず)と連結した定盤10と、フィクスチャー2を定盤
10に押しつける回転自在な支持軸11と、研磨砥液1
2を供給するノズル13とで構成されており、フィクス
チャー2を定盤10に任意の圧力で押圧し、研磨砥液1
2を供給しながら定盤10を回転させることでフィクス
チャー2を自転させ、半導体基板1の裏面1bを所望の
厚さに研磨する。
Next, when the attachment of the fixture 2 and the semiconductor substrate 1 is completed, as shown in FIG. 4, the fixture 2 to which the semiconductor substrate 1 has been attached is set in a polishing device 9 and the back surface is polished. The polishing apparatus 9 includes a surface plate 10 connected to a rotation drive unit (not shown), a rotatable support shaft 11 for pressing the fixture 2 against the surface plate 10, and a polishing liquid 1.
And a nozzle 13 for supplying the polishing liquid 2 to the surface plate 10 at an arbitrary pressure.
The fixture 2 is rotated by rotating the platen 10 while supplying the substrate 2, and the back surface 1b of the semiconductor substrate 1 is polished to a desired thickness.

【0018】次に、裏面研磨が完了したら、フィクスチ
ャー2から半導体基板1を離脱する。離脱方法は、図2
(a)に示すように、半導体基板1が貼付いたフィクス
チャー2をホットプレート6上に載置し、加熱しワック
ス3a,3bを溶融させ、先端が半導体基板1の外形に
倣った形状をした専用の剥し治具14で半導体基板1側
面を押して、フィクスチャー2上を横滑りさせて離脱す
る。このとき、半導体基板1とフィクスチャー2との間
に保護シート101が介在することで半導体基板1の表
面1aに傷が付くことを防止できる。その後、図2
(b)に示すように、ピンセット15で保護シート10
1を半導体基板1の表面1aから剥す。そして、図2
(c)に示すように、半導体基板1上に残ったワックス
3a,3bは、例えば、IPA(イソプロピルアルコー
ル)などの溶剤で溶解し除去し裏面研磨が完了する。
Next, when the back surface polishing is completed, the semiconductor substrate 1 is separated from the fixture 2. Fig. 2
As shown in (a), the fixture 2 to which the semiconductor substrate 1 is attached is placed on a hot plate 6 and heated to melt the waxes 3a and 3b, and the tip has a shape following the outer shape of the semiconductor substrate 1. The side surface of the semiconductor substrate 1 is pushed by the exclusive peeling jig 14 and is slid over the fixture 2 to be separated. At this time, it is possible to prevent the surface 1a of the semiconductor substrate 1 from being damaged due to the interposition of the protective sheet 101 between the semiconductor substrate 1 and the fixture 2. Then, FIG.
(B) As shown in FIG.
1 is peeled off from the surface 1 a of the semiconductor substrate 1. And FIG.
As shown in (c), the waxes 3a and 3b remaining on the semiconductor substrate 1 are dissolved and removed with a solvent such as IPA (isopropyl alcohol), and the backside polishing is completed.

【0019】尚、上記の例では、保護シートの形状を中
央部に開口部を1箇所設けたリング状としたが、開口部
の形状・個数は、特にこれに限るものではなく、例え
ば、多数の小孔を設けてもよい。また、保護シートの外
形を半導体基板より小さい構成としてもよいが、半導体
基板より若干大きくしておくと、保護シート上に半導体
基板を載置する際に、保護シートが見えており位置合せ
が容易であるし、半導体基板から保護シートをピンセッ
トで剥す際にも、保護シートを挟み易く好適である。
In the above example, the shape of the protective sheet is a ring shape having one opening at the center, but the shape and number of the openings are not particularly limited. May be provided. The outer shape of the protective sheet may be smaller than that of the semiconductor substrate, but if it is slightly larger than the semiconductor substrate, the protective sheet is visible when the semiconductor substrate is placed on the protective sheet, and the alignment is easy. However, when the protective sheet is peeled from the semiconductor substrate with tweezers, the protective sheet is easily sandwiched, which is suitable.

【0020】[0020]

【発明の効果】本発明の半導体基板の研磨方法によれ
ば、保護シートの材質を平滑性とワックスとの馴染み性
との両方を兼ね備えた無塵紙とするため、保護シートと
ワックスとの馴染み不足によって生じる凹凸や、保護シ
ート自身の凹凸あるいは、保護シートからの塵埃による
凹凸が少ない。また、保護シートに開口部を設けると、
半導体基板と直接、接触する面積を低減でき、半導体基
板に形成した配線パターンを潰すおそれの少ない研磨が
可能となる。特に、空中配線(エアブリッジ配線)構造
を施した半導体基板の研磨に好適である。
According to the method for polishing a semiconductor substrate of the present invention, since the material of the protective sheet is made of dust-free paper having both smoothness and compatibility with wax, lack of familiarity between the protective sheet and wax. Unevenness caused by the protective sheet itself, or unevenness due to dust from the protective sheet. Also, if an opening is provided in the protective sheet,
The area in direct contact with the semiconductor substrate can be reduced, and polishing with less risk of crushing the wiring pattern formed on the semiconductor substrate can be performed. In particular, it is suitable for polishing a semiconductor substrate having an aerial wiring (air bridge wiring) structure.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の半導体基板の研磨方法の一例を示す
斜視図及び断面図
FIG. 1 is a perspective view and a sectional view showing an example of a method for polishing a semiconductor substrate of the present invention.

【図2】 本発明の半導体基板の研磨方法の一例を示す
断面図
FIG. 2 is a cross-sectional view illustrating an example of a method for polishing a semiconductor substrate according to the present invention.

【図3】 従来の半導体基板の研磨方法の一例を示す斜
視図及び断面図
FIG. 3 is a perspective view and a sectional view showing an example of a conventional method for polishing a semiconductor substrate.

【図4】 半導体基板の研磨方法の一例を示す斜視図FIG. 4 is a perspective view showing an example of a method for polishing a semiconductor substrate.

【図5】 従来の半導体基板の研磨方法の一例を示す断
面図
FIG. 5 is a sectional view showing an example of a conventional semiconductor substrate polishing method.

【符号の説明】[Explanation of symbols]

1 半導体基板 1a 半導体基板の表面 1b 半導体基板の裏面 2 フィクスチャー 101 保護シート 1 semiconductor substrate 1a Surface of semiconductor substrate 1b Backside of semiconductor substrate 2 Fixture 101 Protective sheet

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】保護シートを介して半導体基板の一方の面
をフィクスチャーに貼付けて、前記半導体基板の他方の
面を研磨する研磨方法において、前記保護シートは無塵
紙で成ることを特徴とする半導体基板の研磨方法。
1. A polishing method for affixing one surface of a semiconductor substrate to a fixture via a protective sheet and polishing the other surface of the semiconductor substrate, wherein the protective sheet is made of dust-free paper. A method for polishing a semiconductor substrate.
【請求項2】前記無塵紙は、天然パルプに樹脂エマルジ
ョンを含浸させた無塵紙であることを特徴とする請求項
1に記載の半導体基板の研磨方法。
2. The method for polishing a semiconductor substrate according to claim 1, wherein the dust-free paper is a dust-free paper obtained by impregnating a natural pulp with a resin emulsion.
【請求項3】前記保護シートは、開口部を有することを
特徴とする請求項1に記載の半導体基板の研磨方法。
3. The method according to claim 1, wherein the protective sheet has an opening.
【請求項4】前記半導体基板は、空中配線(エアブリッ
ジ配線)構造を有することを特徴とする請求項1に記載
の半導体基板の研磨方法。
4. The method according to claim 1, wherein the semiconductor substrate has an aerial wiring (air bridge wiring) structure.
JP2002154893A 2002-05-29 2002-05-29 Method of polishing semiconductor substrate Pending JP2003347255A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002154893A JP2003347255A (en) 2002-05-29 2002-05-29 Method of polishing semiconductor substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002154893A JP2003347255A (en) 2002-05-29 2002-05-29 Method of polishing semiconductor substrate

Publications (1)

Publication Number Publication Date
JP2003347255A true JP2003347255A (en) 2003-12-05

Family

ID=29771536

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002154893A Pending JP2003347255A (en) 2002-05-29 2002-05-29 Method of polishing semiconductor substrate

Country Status (1)

Country Link
JP (1) JP2003347255A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010045262A (en) * 2008-08-15 2010-02-25 Showa Denko Kk Method of manufacturing semiconductor light emitting device
WO2011089979A1 (en) * 2010-01-20 2011-07-28 昭和電工株式会社 Method for producing semiconductor wafer

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010045262A (en) * 2008-08-15 2010-02-25 Showa Denko Kk Method of manufacturing semiconductor light emitting device
WO2011089979A1 (en) * 2010-01-20 2011-07-28 昭和電工株式会社 Method for producing semiconductor wafer
JP2011151153A (en) * 2010-01-20 2011-08-04 Showa Denko Kk Method of manufacturing semiconductor wafer
US20120295383A1 (en) * 2010-01-20 2012-11-22 Showa Denko K.K. Method for producing semiconductor wafer
US8637336B2 (en) 2010-01-20 2014-01-28 Toyoda Gosei Co., Ltd. Method for producing semiconductor wafer

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