JP2003258384A5 - - Google Patents
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- JP2003258384A5 JP2003258384A5 JP2003048070A JP2003048070A JP2003258384A5 JP 2003258384 A5 JP2003258384 A5 JP 2003258384A5 JP 2003048070 A JP2003048070 A JP 2003048070A JP 2003048070 A JP2003048070 A JP 2003048070A JP 2003258384 A5 JP2003258384 A5 JP 2003258384A5
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- JP
- Japan
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Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US087422 | 2002-02-28 | ||
US10/087,422 US6711195B2 (en) | 2002-02-28 | 2002-02-28 | Long-wavelength photonic device with GaAsSb quantum-well layer |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2003258384A JP2003258384A (ja) | 2003-09-12 |
JP2003258384A5 true JP2003258384A5 (ja) | 2006-04-20 |
JP4663964B2 JP4663964B2 (ja) | 2011-04-06 |
Family
ID=27733428
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003048070A Expired - Fee Related JP4663964B2 (ja) | 2002-02-28 | 2003-02-25 | GaAsSb量子井戸層を含む長波長フォトニクスデバイス |
Country Status (4)
Country | Link |
---|---|
US (1) | US6711195B2 (ja) |
EP (1) | EP1341279B1 (ja) |
JP (1) | JP4663964B2 (ja) |
DE (1) | DE60225781T2 (ja) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100499128B1 (ko) * | 2002-07-19 | 2005-07-04 | 삼성전기주식회사 | 전류제한층이 형성된 반도체 레이저 다이오드 및 그제조방법 |
US6931044B2 (en) * | 2003-02-18 | 2005-08-16 | Agilent Technologies, Inc. | Method and apparatus for improving temperature performance for GaAsSb/GaAs devices |
US20050184303A1 (en) * | 2004-02-25 | 2005-08-25 | Ashish Tandon | Strain compensating structure to reduce oxide-induced defects in semiconductor devices |
US7781777B2 (en) * | 2004-03-08 | 2010-08-24 | Showa Denko K.K. | Pn junction type group III nitride semiconductor light-emitting device |
US7402831B2 (en) * | 2004-12-09 | 2008-07-22 | 3M Innovative Properties Company | Adapting short-wavelength LED's for polychromatic, broadband, or “white” emission |
US7745814B2 (en) * | 2004-12-09 | 2010-06-29 | 3M Innovative Properties Company | Polychromatic LED's and related semiconductor devices |
US7719015B2 (en) * | 2004-12-09 | 2010-05-18 | 3M Innovative Properties Company | Type II broadband or polychromatic LED's |
US20070006801A1 (en) * | 2005-07-09 | 2007-01-11 | Stringfellow Gerald B | Use of surfactants to control unintentional dopant in semiconductors |
JP2007165501A (ja) * | 2005-12-13 | 2007-06-28 | Seiko Epson Corp | 面発光型半導体レーザ及びその製造方法 |
DE102006035627A1 (de) * | 2006-07-31 | 2008-02-07 | Osram Opto Semiconductors Gmbh | LED-Halbleiterkörper |
DE102007025092A1 (de) * | 2007-05-30 | 2008-12-04 | Osram Opto Semiconductors Gmbh | Lumineszenzdiodenchip |
US8124959B2 (en) * | 2007-06-28 | 2012-02-28 | Intel Corporation | High hole mobility semiconductor device |
DE102007030062A1 (de) * | 2007-06-29 | 2009-01-02 | Osram Opto Semiconductors Gmbh | Monolithisch integrierter Laserdiodenchip mit einem Aufbau als Mehrfachstrahl-Laserdiode |
US20110096332A1 (en) * | 2008-04-03 | 2011-04-28 | Renato Bugge | Method and device for gas analysis using an interferometric laser |
JP5649157B2 (ja) * | 2009-08-01 | 2015-01-07 | 住友電気工業株式会社 | 半導体素子およびその製造方法 |
FR2953335B1 (fr) * | 2009-11-27 | 2012-04-27 | Centre Nat Rech Scient | Systeme d'emission laser, heterostructure et zone active a sous-puits quantiques couples, utilisation pour une emission laser a 1,55 micrometres |
KR101248383B1 (ko) | 2009-12-22 | 2013-03-28 | 우리이앤엘 주식회사 | 반도체 발광소자 |
JP2012080010A (ja) * | 2010-10-05 | 2012-04-19 | Sumitomo Electric Ind Ltd | エピタキシャルウエハ、半導体素子、およびこれらの製造方法 |
JP5991018B2 (ja) * | 2012-05-16 | 2016-09-14 | ソニー株式会社 | 半導体装置 |
JP2012156562A (ja) * | 2012-05-21 | 2012-08-16 | Nec Corp | 面発光レーザ |
CN103077979A (zh) * | 2013-01-07 | 2013-05-01 | 中国科学院上海微系统与信息技术研究所 | 一种GaAs衬底上扩展波长InGaAs探测器结构 |
KR102276422B1 (ko) * | 2014-07-18 | 2021-07-12 | 삼성전자주식회사 | 투과형 고흡수 광 변조기 및 그 제조방법 |
CN106033866B (zh) | 2015-03-20 | 2019-12-03 | 云晖科技有限公司 | 垂直腔面发射激光器 |
US10511143B2 (en) | 2017-08-31 | 2019-12-17 | Globalfoundries Inc. | III-V lasers with on-chip integration |
US11563307B2 (en) * | 2018-10-01 | 2023-01-24 | Mellanox Technologies, Ltd. | High speed high bandwidth vertical-cavity surface-emitting laser |
WO2021177591A1 (ko) * | 2020-03-03 | 2021-09-10 | 한국과학기술원 | 저전류 영역에서의 효율 증대 마이크로 발광 다이오드 소자와 그의 제조 방법 및 그를 포함하는 디스플레이 |
CN113345987B (zh) * | 2021-04-16 | 2022-05-13 | 华灿光电(苏州)有限公司 | 红外发光二极管芯片及其制备方法 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4774554A (en) * | 1986-12-16 | 1988-09-27 | American Telephone And Telegraph Company, At&T Bell Laboratories | Semiconductor devices employing Ti-doped Group III-V epitaxial layer |
US6127692A (en) * | 1989-08-04 | 2000-10-03 | Canon Kabushiki Kaisha | Photoelectric conversion apparatus |
US5762706A (en) * | 1993-11-09 | 1998-06-09 | Fujitsu Limited | Method of forming compound semiconductor device |
US5737353A (en) * | 1993-11-26 | 1998-04-07 | Nec Corporation | Multiquantum-well semiconductor laser |
DE59502831D1 (de) * | 1994-03-25 | 1998-08-20 | Fraunhofer Ges Forschung | Quantenschichtstruktur |
JP2991616B2 (ja) * | 1994-06-30 | 1999-12-20 | シャープ株式会社 | 半導体発光素子 |
GB2298735A (en) * | 1995-03-08 | 1996-09-11 | Sharp Kk | Semiconductor device having a miniband |
JP2861858B2 (ja) * | 1995-03-30 | 1999-02-24 | 日本電気株式会社 | 多重量子井戸レーザダイオード |
DE19624514C1 (de) * | 1996-06-19 | 1997-07-17 | Siemens Ag | Laserdiode-Modulator-Kombination |
GB2320610A (en) * | 1996-12-21 | 1998-06-24 | Sharp Kk | laser device |
US5959239A (en) * | 1997-06-02 | 1999-09-28 | The United States Of America As Represented By The United States Department Of Energy | Thermovoltaic semiconductor device including a plasma filter |
TW412889B (en) * | 1997-09-24 | 2000-11-21 | Nippon Oxygen Co Ltd | Semiconductor laser |
JP3189791B2 (ja) * | 1998-06-19 | 2001-07-16 | 日本電気株式会社 | 半導体レーザ |
US7058112B2 (en) * | 2001-12-27 | 2006-06-06 | Finisar Corporation | Indium free vertical cavity surface emitting laser |
JP2001068790A (ja) * | 1999-08-27 | 2001-03-16 | Canon Inc | 半導体レーザ構造 |
GB2353899A (en) * | 1999-09-01 | 2001-03-07 | Sharp Kk | A quantum well semiconductor device with strained barrier layer |
WO2001033677A2 (en) * | 1999-11-01 | 2001-05-10 | Arizona Board Of Regents | LONG WAVELENGTH PSEUDOMORPHIC InGaNPAsSb TYPE-I AND TYPE-II ACTIVE LAYERS FOR THE GAAS MATERIAL SYSTEM |
US6898224B2 (en) * | 2001-08-22 | 2005-05-24 | The Furukawa Electric Co., Ltd. | Semiconductor laser device |
-
2002
- 2002-02-28 US US10/087,422 patent/US6711195B2/en not_active Expired - Lifetime
- 2002-11-08 EP EP02025120A patent/EP1341279B1/en not_active Expired - Fee Related
- 2002-11-08 DE DE60225781T patent/DE60225781T2/de not_active Expired - Lifetime
-
2003
- 2003-02-25 JP JP2003048070A patent/JP4663964B2/ja not_active Expired - Fee Related